JP3998658B2 - 弾性波デバイスおよびパッケージ基板 - Google Patents
弾性波デバイスおよびパッケージ基板 Download PDFInfo
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- H—ELECTRICITY
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- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/05—Holders; Supports
- H03H9/10—Mounting in enclosures
- H03H9/1064—Mounting in enclosures for surface acoustic wave [SAW] devices
- H03H9/1071—Mounting in enclosures for surface acoustic wave [SAW] devices the enclosure being defined by a frame built on a substrate and a cap, the frame having no mechanical contact with the SAW device
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- E—FIXED CONSTRUCTIONS
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- E02D—FOUNDATIONS; EXCAVATIONS; EMBANKMENTS; UNDERGROUND OR UNDERWATER STRUCTURES
- E02D29/00—Independent underground or underwater structures; Retaining walls
- E02D29/12—Manhole shafts; Other inspection or access chambers; Accessories therefor
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- E—FIXED CONSTRUCTIONS
- E02—HYDRAULIC ENGINEERING; FOUNDATIONS; SOIL SHIFTING
- E02D—FOUNDATIONS; EXCAVATIONS; EMBANKMENTS; UNDERGROUND OR UNDERWATER STRUCTURES
- E02D29/00—Independent underground or underwater structures; Retaining walls
- E02D29/12—Manhole shafts; Other inspection or access chambers; Accessories therefor
- E02D29/124—Shaft entirely made of synthetic material
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/0023—Balance-unbalance or balance-balance networks
- H03H9/0028—Balance-unbalance or balance-balance networks using surface acoustic wave devices
- H03H9/0047—Balance-unbalance or balance-balance networks using surface acoustic wave devices having two acoustic tracks
- H03H9/0066—Balance-unbalance or balance-balance networks using surface acoustic wave devices having two acoustic tracks being electrically parallel
- H03H9/0071—Balance-unbalance or balance-balance networks using surface acoustic wave devices having two acoustic tracks being electrically parallel the balanced terminals being on the same side of the tracks
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/05—Holders; Supports
- H03H9/058—Holders; Supports for surface acoustic wave devices
- H03H9/059—Holders; Supports for surface acoustic wave devices consisting of mounting pads or bumps
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/05—Holders; Supports
- H03H9/10—Mounting in enclosures
- H03H9/1064—Mounting in enclosures for surface acoustic wave [SAW] devices
- H03H9/1078—Mounting in enclosures for surface acoustic wave [SAW] devices the enclosure being defined by a foil covering the non-active sides of the SAW device
-
- E—FIXED CONSTRUCTIONS
- E02—HYDRAULIC ENGINEERING; FOUNDATIONS; SOIL SHIFTING
- E02D—FOUNDATIONS; EXCAVATIONS; EMBANKMENTS; UNDERGROUND OR UNDERWATER STRUCTURES
- E02D2300/00—Materials
- E02D2300/0004—Synthetics
- E02D2300/0006—Plastics
- E02D2300/0009—PE
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/0556—Disposition
- H01L2224/05568—Disposition the whole external layer protruding from the surface
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/05573—Single external layer
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/1517—Multilayer substrate
- H01L2924/15172—Fan-out arrangement of the internal vias
- H01L2924/15174—Fan-out arrangement of the internal vias in different layers of the multilayer substrate
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/1517—Multilayer substrate
- H01L2924/15182—Fan-in arrangement of the internal vias
- H01L2924/15184—Fan-in arrangement of the internal vias in different layers of the multilayer substrate
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- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Mining & Mineral Resources (AREA)
- Paleontology (AREA)
- Civil Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Structural Engineering (AREA)
- Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
Description
11 下部基板
12 上部基板
13 櫛型電極接続用電極
14 フットパッド
15 ビア(VIA)
16 配線
17 シール電極
18、18a、18b メッキ用引出電極
19 ダイシングライン
20 シール材
21 導電性樹脂
Claims (12)
- 搭載される基板との信号のやりとりを行うために主面に設けられたパッケージ用信号パッドと、外部との電気的接続を形成するために裏面に設けられたフットパッドとが電気的に接続されており、前記搭載される基板との間に気密封止された空間を形成するシール材を設けるために、前記主面には前記信号用パッドを取り囲んで設けられたパッケージ用シール電極とを備えたパッケージ基板であって、
前記シール電極は前記フットパッドと絶縁されており、
前記パッケージ基板は、前記パッケージ用信号パッド、前記フットパッド、および前記パッケージ用シール電極を複数対有し、該複数対の各々の対は互いに隣接して区画された画定領域に配置され、前記パッケージ基板の主面外周部には複数の前記画定領域を含む領域をその外側から取り囲むように設けられた引出電極が設けられており、
該引出電極は、前記パッケージ用信号パッドに接続された第1の引出電極と、前記シール電極に接続された第2の引出電極とで構成されていることを特徴とするパッケージ基板。 - 前記第1及び第2の引出電極はメッキ工程時に通電される電極であることを特徴とする請求項1記載のパッケージ基板。
- 前記パッケージ用シール電極の表面は、前記第2の引出電極への通電により電解メッキされたシール材で被覆されていることを特徴とする請求項1または2に記載のパッケージ基板。
- 互いに隣接する前記パッケージ用シール電極の間隔をW1とし、前記パッケージ用シール電極と前記パッケージ用信号パッドとの最近接間隔をW2としたとき、前記シール材の頂点部の高さと前記パッケージ用信号パッドの上面の高さとの差hが、W1≧2.5h、かつ、W2≧1.5hを満足していることを特徴とする請求項3に記載のパッケージ基板。
- 励振電極が形成された弾性波デバイス用基板の主面と請求項1乃至4の何れかに記載のパッケージ基板の主面とが空隙をもって対向配置され、前記パッケージ基板の主面に設けられたパッケージ用シール電極に対応する形状を有すると共に前記弾性波デバイス用基板の主面上であって前記励振電極を取り囲むように設けられたシール電極と前記パッケージ基板の主面に設けられたパッケージ用シール電極とが当接して気密封止されていることを特徴とする弾性波デバイス。
- 前記弾性波デバイス用基板の主面には、前記励振電極と該励振電極に接続された複数の信号パッドが設けられており、前記シール電極と前記複数の信号パッドのうちの一部のパッドとを電気的に接続する電極部が設けられていることを特徴とする請求項5に記載の弾性波デバイス。
- 前記電極部は、前記シール材との濡れ性が低い材質で形成されていることを特徴とする請求項6に記載の弾性波デバイス。
- 前記電極部の少なくとも一部領域は、該電極部よりも前記シール材との濡れ性が低い材質で被覆されていることを特徴とする請求項7に記載の弾性波デバイス。
- 前記弾性波デバイス用基板の裏面と前記パッケージ基板裏面のフットパッドの一部とを、前記電極部を介して電気的に接続する導電部を備えていることを特徴とする請求項6乃至8に記載の弾性波デバイス。
- 前記導電部は、前記弾性波デバイス用基板の裏面と側面を被覆する導電性樹脂であることを特徴とする請求項9に記載の弾性波デバイス。
- 前記弾性波デバイスは、SAWデバイスまたはFBARデバイスであることを特徴とする請求項5乃至10に記載の弾性波デバイス。
- 基板の主面に設けられるパッケージ用信号パッドと、該パッケージ用信号パッドを取り囲んで設けられるパッケージ用シール電極と、前記パッケージ用信号パッドに接続される一方前記パッケージ用シール電極とは絶縁されて前記基板の裏面に設けられるフットパッドと、を要素とする対を少なくとも一対形成する第1のステップと、
前記パッケージ基板の主面外周部に、前記少なくとも一対の要素を取り囲む単一の引出電極を形成する第2のステップと、
前記単一の引出電極を、前記パッケージ用信号パッドに接続された第1の電極と、前記パッケージ用シール電極に接続された第2の電極とに分断する第3のステップと、
前記分断により得られた第2の電極に通電して前記パッケージ用シール電極のみを電解メッキする第4のステップと、を備えていることを特徴とするパッケージ基板の製造方法。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
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JP2004132513A JP3998658B2 (ja) | 2004-04-28 | 2004-04-28 | 弾性波デバイスおよびパッケージ基板 |
KR1020050035116A KR100661428B1 (ko) | 2004-04-28 | 2005-04-27 | 탄성파 디바이스 및 패키지 기판 |
CNB2005100682393A CN100474767C (zh) | 2004-04-28 | 2005-04-27 | 弹性波器件和封装基板 |
US11/115,253 US7291904B2 (en) | 2004-04-28 | 2005-04-27 | Downsized package for electric wave device |
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JP2004132513A JP3998658B2 (ja) | 2004-04-28 | 2004-04-28 | 弾性波デバイスおよびパッケージ基板 |
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JP2005318157A JP2005318157A (ja) | 2005-11-10 |
JP3998658B2 true JP3998658B2 (ja) | 2007-10-31 |
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US (1) | US7291904B2 (ja) |
JP (1) | JP3998658B2 (ja) |
KR (1) | KR100661428B1 (ja) |
CN (1) | CN100474767C (ja) |
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DE102005008512B4 (de) | 2005-02-24 | 2016-06-23 | Epcos Ag | Elektrisches Modul mit einem MEMS-Mikrofon |
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DE102005053767B4 (de) | 2005-11-10 | 2014-10-30 | Epcos Ag | MEMS-Mikrofon, Verfahren zur Herstellung und Verfahren zum Einbau |
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DE19818824B4 (de) | 1998-04-27 | 2008-07-31 | Epcos Ag | Elektronisches Bauelement und Verfahren zu dessen Herstellung |
JP3303791B2 (ja) | 1998-09-02 | 2002-07-22 | 株式会社村田製作所 | 電子部品の製造方法 |
CN1214524C (zh) * | 2000-07-21 | 2005-08-10 | 株式会社东芝 | 声表面波滤波器 |
EP1381156A4 (en) | 2001-04-19 | 2004-09-08 | Matsushita Electric Ind Co Ltd | SURFACE ACOUSTIC WAVE PROCESSING DEVICE AND MANUFACTURING METHOD THEREOF, AND ELECTRONIC COMPONENT USING THE SAME |
KR100484078B1 (ko) | 2001-04-19 | 2005-04-20 | 마츠시타 덴끼 산교 가부시키가이샤 | 탄성 표면파 장치 및 그 제조 방법과 이것을 이용한 전자부품 |
US6943447B2 (en) * | 2002-01-10 | 2005-09-13 | Fujitsu Limited | Thin film multi-layer wiring substrate having a coaxial wiring structure in at least one layer |
US7154206B2 (en) * | 2002-07-31 | 2006-12-26 | Kyocera Corporation | Surface acoustic wave device and method for manufacturing same |
DE10238523B4 (de) | 2002-08-22 | 2014-10-02 | Epcos Ag | Verkapseltes elektronisches Bauelement und Verfahren zur Herstellung |
KR100480641B1 (ko) * | 2002-10-17 | 2005-03-31 | 삼성전자주식회사 | 고 커패시턴스를 지니는 금속-절연체-금속 커패시터, 이를구비하는 집적회로 칩 및 이의 제조 방법 |
US7134343B2 (en) * | 2003-07-25 | 2006-11-14 | Kabushiki Kaisha Toshiba | Opto-acoustoelectric device and methods for analyzing mechanical vibration and sound |
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2004
- 2004-04-28 JP JP2004132513A patent/JP3998658B2/ja not_active Expired - Fee Related
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2005
- 2005-04-27 CN CNB2005100682393A patent/CN100474767C/zh not_active Expired - Fee Related
- 2005-04-27 KR KR1020050035116A patent/KR100661428B1/ko not_active IP Right Cessation
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US7291904B2 (en) | 2007-11-06 |
KR100661428B1 (ko) | 2006-12-27 |
JP2005318157A (ja) | 2005-11-10 |
CN100474767C (zh) | 2009-04-01 |
CN1691500A (zh) | 2005-11-02 |
US20050242420A1 (en) | 2005-11-03 |
KR20060047542A (ko) | 2006-05-18 |
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