JP3926510B2 - 蛍光ｘ線分析計 - Google Patents

蛍光ｘ線分析計 Download PDF

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Publication number
JP3926510B2
JP3926510B2 JP16890799A JP16890799A JP3926510B2 JP 3926510 B2 JP3926510 B2 JP 3926510B2 JP 16890799 A JP16890799 A JP 16890799A JP 16890799 A JP16890799 A JP 16890799A JP 3926510 B2 JP3926510 B2 JP 3926510B2
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JP
Japan
Prior art keywords
ray
sample
measured
fluorescent
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP16890799A
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English (en)
Japanese (ja)
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JP2000356607A5 (enExample
JP2000356607A (ja
Inventor
茂樹 八木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Science Corp
Original Assignee
SII NanoTechnology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SII NanoTechnology Inc filed Critical SII NanoTechnology Inc
Priority to JP16890799A priority Critical patent/JP3926510B2/ja
Priority to US09/590,200 priority patent/US6359962B1/en
Publication of JP2000356607A publication Critical patent/JP2000356607A/ja
Publication of JP2000356607A5 publication Critical patent/JP2000356607A5/ja
Application granted granted Critical
Publication of JP3926510B2 publication Critical patent/JP3926510B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP16890799A 1999-06-15 1999-06-15 蛍光ｘ線分析計 Expired - Fee Related JP3926510B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP16890799A JP3926510B2 (ja) 1999-06-15 1999-06-15 蛍光ｘ線分析計
US09/590,200 US6359962B1 (en) 1999-06-15 2000-06-08 Flourescent X-ray analyzer

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP16890799A JP3926510B2 (ja) 1999-06-15 1999-06-15 蛍光ｘ線分析計
US09/590,200 US6359962B1 (en) 1999-06-15 2000-06-08 Flourescent X-ray analyzer

Publications (3)

Publication Number Publication Date
JP2000356607A JP2000356607A (ja) 2000-12-26
JP2000356607A5 JP2000356607A5 (enExample) 2005-10-27
JP3926510B2 true JP3926510B2 (ja) 2007-06-06

Family

ID=26492427

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16890799A Expired - Fee Related JP3926510B2 (ja) 1999-06-15 1999-06-15 蛍光ｘ線分析計

Country Status (2)

Country Link
US (1) US6359962B1 (enExample)
JP (1) JP3926510B2 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10122279A1 (de) * 2001-05-08 2002-12-12 Heimann Systems Gmbh & Co Röntgenanlage
US7180981B2 (en) * 2002-04-08 2007-02-20 Nanodynamics-88, Inc. High quantum energy efficiency X-ray tube and targets
US7515685B2 (en) 2004-04-28 2009-04-07 Panasonic Corporation Fluorescent X-ray analysis method and device
US7796726B1 (en) * 2006-02-14 2010-09-14 University Of Maryland, Baltimore County Instrument and method for X-ray diffraction, fluorescence, and crystal texture analysis without sample preparation
JP4848846B2 (ja) * 2006-06-02 2011-12-28 大同特殊鋼株式会社 携帯ｘ線分析装置を用いた鋼材の流通チェック方法及びチェック装置
JP4985090B2 (ja) * 2007-05-15 2012-07-25 株式会社島津製作所 蛍光ｘ線分析装置、蛍光ｘ線分析方法及びプログラム
US7623621B1 (en) * 2008-03-13 2009-11-24 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Method and system for identifying and authenticating an object
JP5269521B2 (ja) * 2008-08-22 2013-08-21 株式会社日立ハイテクサイエンス Ｘ線分析装置及びｘ線分析方法
GB2551980A (en) * 2016-06-30 2018-01-10 Commw Scient Ind Res Org Method and system for low level metal analysis of mineral samples

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5892809A (en) * 1997-09-10 1999-04-06 Wittry; David B. Simplified system for local excitation by monochromatic x-rays

Also Published As

Publication number Publication date
JP2000356607A (ja) 2000-12-26
US6359962B1 (en) 2002-03-19

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