JP3582982B2 - 可搬型蛍光x線分析計 - Google Patents

可搬型蛍光x線分析計 Download PDF

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Publication number
JP3582982B2
JP3582982B2 JP10831298A JP10831298A JP3582982B2 JP 3582982 B2 JP3582982 B2 JP 3582982B2 JP 10831298 A JP10831298 A JP 10831298A JP 10831298 A JP10831298 A JP 10831298A JP 3582982 B2 JP3582982 B2 JP 3582982B2
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Japan
Prior art keywords
ray
ray fluorescence
portable
switch
fluorescence analyzer
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Expired - Fee Related
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JP10831298A
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JPH11304733A (ja
Inventor
正雄 佐藤
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Hitachi High Tech Science Corp
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SII NanoTechnology Inc
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Priority to JP10831298A priority Critical patent/JP3582982B2/ja
Priority to US09/293,091 priority patent/US6178227B1/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K5/00Irradiation devices
    • G21K5/04Irradiation devices with beam-forming means
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05GX-RAY TECHNIQUE
    • H05G1/00X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/02Constructional details
    • H05G1/04Mounting the X-ray tube within a closed housing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence

Description

【発明の属する技術分野】
本発明は考古学資料や犯罪現場捜査、火災初動捜査のための屋外での元素分析を主目的とした可搬型の蛍光X線分析計に関する。
【従来の技術】
従来、屋外で元素分析する場合はラジオアイソトープを線源とした可搬型X線分析計か、もしくは卓上型のような小型蛍光X線分析計を車に搭載してサンプリングの後、車上で元素分析を実行していた。
【発明が解決しようとする課題】
従来ラジオアイソトープを線源とした可搬型X線分析計はシャッターの開閉でのみ安全性を確保し、シャッター開時は作業者の責に帰するところがあった。また、ラジオアイソトープを使用することから取り扱いに専任の責任者を設けなければならないことや届け出が大変であるなど問題を抱えていた。
卓上型の小型蛍光X線分析計を車に搭載する方法は、現場近くで分析する目的は叶えられるものの、サンプリングできない試料に寄って分析することは不可能であった。
適当な硬度、厚みの試料は破壊式となってしまうが、ノコギリやトンカチ等で切断または破断させることによってサンプリングできるが、超鋼のような堅い試料は、そのような前処理すら困難な場合があった。
また、一般的な蛍光X線分析計の場合、測定対象物を密閉遮蔽型の試料室構造体内部に包含させることができるため、装置外部での漏洩X線に対する防御は容易に行えたが、屋外使用目的で可搬型の蛍光X線分析計を実現する場合、X線照射方向には測定対象物のみの完全オープン型となり、X線被爆の可能性が大きな構造となっていた。
【課題を解決するための手段】
ラジオアイソトープの代わりにX線管球を使用し、シャッター開閉の動作を各種スイッチとシーケンスにより安全性を確保することによって、屋外での安全な蛍光X線分析を可能とする。
【発明の実施の形態】
図1に小型可搬型の蛍光X線分析計の安全スイッチの配置を示す。通常持ち運び時は取手部1のマイクロスイッチ2を握り、信号ONとなる。取手部から手を離すと信号はOFFとなる。筐体の測定部先端のマイクロスイッチ3は、測定実行時に試料4に接触させると信号ONとなる。試料に非接触時はOFFとなる。非測定時は測定部先端の窓内側にX線を完全に遮蔽することができる十分な厚みの金属からなるシャッタ5がX線照射口を塞いでおり、筐体外部ではX線漏洩が無い構造となっている。測定時はシャッタ5が開状態となりX線管球6からの1次X線7が試料4に照射され、試料4を構成している元素特有の蛍光X線8がX線検出器9で計数される。本実施例では、屋外の試料4のあるところまで取手部を持ちながら運び、測定位置に筐体測定部先端を接触させてマイクロスイッチ3がONで、取手部から手を離しマイクロスイッチ2をOFFとさせた場合のみシャッタ5開状態を実行させ、蛍光X線分析法を原理とした測定を可能とさせる。図2は上記動作を実現させるための回路実施例。取手部のマイクロスイッチはオープンなので、RY2のコイルには電流が流れず、RY2接点はC(コモン端子)とN.C.(ノーマルコモン端子)が接触している状態になる。一方、測定部先端のマイクロスイッチは試料に接触させることで閉じた状態になっているのでRY1のコイルには電流が流れ、RY1の接点は、C(コモン端子)とN.O.(ノーマルオープン端子)とが接触している状態になり、その結果、RY3のコイルに電流を流すことになる。従って、RY3の接点はCとN.O.が接触している状態になり、ソレノイド3に電流が供給されシャッタが開くことになる。
【発明の効果】
X線漏洩の安全を確保して,操作性を悪くすることなく屋外で元素分析が実現できる。
【図面の簡単な説明】
【図1】小型可搬型蛍光X線分析計の安全スイッチの配置実施例を示す。
【図2】回路実施例を示す。
【符号の説明】
1 取手部
2 マイクロスイッチ
3 マイクロスイッチ
4 試料
5 シャッタ
6 X線管球
7 1次X線
8 蛍光X線
9 X線検出器
21 リレー
22 リレー
23 ソレノイド

Claims (1)

  1. 蛍光X線法を原理とし、X線発生系とX線検出系を有する小型、可搬型の蛍光X線分析計の箱体の測定部窓周辺に測定対象物との接触を検知する第一のスイッチと箱体を運ぶための取手部に第二のスイッチを有し、前記第一のスイッチがオン、前記第二のスイッチがオフの条件でのみX線が発生できる安全機構を有することを特徴とする蛍光X線分析
JP10831298A 1998-04-17 1998-04-17 可搬型蛍光x線分析計 Expired - Fee Related JP3582982B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP10831298A JP3582982B2 (ja) 1998-04-17 1998-04-17 可搬型蛍光x線分析計
US09/293,091 US6178227B1 (en) 1998-04-17 1999-04-16 Portable-type fluorescent X-ray analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10831298A JP3582982B2 (ja) 1998-04-17 1998-04-17 可搬型蛍光x線分析計

Publications (2)

Publication Number Publication Date
JPH11304733A JPH11304733A (ja) 1999-11-05
JP3582982B2 true JP3582982B2 (ja) 2004-10-27

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JP (1) JP3582982B2 (ja)

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JP4933702B2 (ja) * 2000-04-06 2012-05-16 エスアイアイ・ナノテクノロジー株式会社 可搬型蛍光x線分析計
US20040022355A1 (en) * 2001-12-05 2004-02-05 Bruce Kaiser Methods for identification and verification of materials containing elemental constituents
US6909770B2 (en) * 2001-12-05 2005-06-21 The United States Of America As Represented By The United States National Aeronautics And Space Administration Methods for identification and verification using vacuum XRF system
US7106826B2 (en) * 2002-01-07 2006-09-12 Cdex, Inc. System and method for adapting a software control in an operating environment
US6850592B2 (en) 2002-04-12 2005-02-01 Keymaster Technologies, Inc. Methods for identification and verification using digital equivalent data system
JP2006507503A (ja) * 2002-11-21 2006-03-02 シーデックス, インコーポレイテッド 紫外蛍光を使用して、分子種を検出し、検査し、分類するための方法および装置
CA2520261A1 (en) * 2003-02-24 2005-01-06 Cdex, Inc. System and methods for detection and identification of chemical substances
WO2004089056A2 (en) * 2003-04-01 2004-10-21 Keymaster Technologies, Inc. Exempt source for an x-ray fluorescence device
CN1965228B (zh) * 2004-04-28 2010-12-08 松下电器产业株式会社 荧光x射线分析方法及装置
US7020238B1 (en) * 2005-01-31 2006-03-28 Oxford Instruments Analytical Oy Adapter and analyzer device for performing X-ray fluorescence analysis on hot surfaces
US7381972B1 (en) 2006-07-24 2008-06-03 Science Applications International Corporation System and method for light fluorescence detection
US8134133B1 (en) * 2008-05-26 2012-03-13 David Hunter Walley Method and system for authenticating archeological artifacts
US8194237B2 (en) 2009-10-15 2012-06-05 Authentix, Inc. Document sensor
JP5633702B2 (ja) * 2011-04-01 2014-12-03 株式会社島津製作所 蛍光x線分析装置
JP5569510B2 (ja) * 2011-11-29 2014-08-13 パルステック工業株式会社 X線回折測定装置
JP5728753B2 (ja) * 2012-09-25 2015-06-03 パルステック工業株式会社 X線回折測定装置
CN111710034B (zh) * 2020-06-24 2022-06-21 四川长虹空调有限公司 空调器室外机百叶窗内出风量仿真方法及系统

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US2297042A (en) * 1940-08-02 1942-09-29 X Ray Shoe Fitter Inc X-ray equipment
US4429409A (en) * 1980-12-15 1984-01-31 Ramsey Engineering Company Portable apparatus for analyzing metals by X-ray fluorescence
US4362932A (en) * 1981-01-22 1982-12-07 The United States Of America As Represented By The Secretary Of The Navy Wide band data processing technique

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