JPH11304733A - 可搬型蛍光ｘ線分析計 - Google Patents

可搬型蛍光ｘ線分析計

Info

Publication number
JPH11304733A
JPH11304733A JP10108312A JP10831298A JPH11304733A JP H11304733 A JPH11304733 A JP H11304733A JP 10108312 A JP10108312 A JP 10108312A JP 10831298 A JP10831298 A JP 10831298A JP H11304733 A JPH11304733 A JP H11304733A
Authority
JP
Japan
Prior art keywords
ray
rays
sample
measurement
shutter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10108312A
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English (en)
Other versions
JP3582982B2 (ja
Inventor
Masao Sato
正雄 佐藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Instruments Inc
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Priority to JP10831298A priority Critical patent/JP3582982B2/ja
Priority to US09/293,091 priority patent/US6178227B1/en
Publication of JPH11304733A publication Critical patent/JPH11304733A/ja
Application granted granted Critical
Publication of JP3582982B2 publication Critical patent/JP3582982B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K5/00—Irradiation devices
    • G21K5/04—Irradiation devices with beam-forming means
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/02—Constructional details
    • H05G1/04—Mounting the X-ray tube within a closed housing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

(57)【要約】 【課題】 屋外で使用する蛍光Ｘ線分析計のＸ線被曝に
対する安全機構 【解決手段】 蛍光Ｘ線法を原理とし，筐体測定部およ
び取手部にマイクロスイッチを有し、前者がオン、後者
がオフの条件かでのみＸ線が発生する、すなわち、Ｘ線
シャッタが開状態となる安全機構を有したことを特徴と
する小型可搬型な蛍光Ｘ線分析計。

Description

【発明の詳細な説明】
【発明の属する技術分野】本発明は考古学資料や犯罪現
場捜査、火災初動捜査のための屋外での元素分析を主目
的とした可搬型の蛍光Ｘ線分析計に関する。
【従来の技術】従来、屋外で元素分析する場合はラジオ
アイソトープを線源とした可搬型Ｘ線分析計か、もしく
は卓上型のような小型蛍光Ｘ線分析計を車に搭載してサ
ンプリングの後、車上で元素分析を実行していた。
【発明が解決しようとする課題】従来ラジオアイソトー
プを線源とした可搬型Ｘ線分析計はシャッターの開閉で
のみ安全性を確保し、シャッター開時は作業者の責に帰
するところがあった。また、ラジオアイソトープを使用
することから取り扱いに専任の責任者を設けなければな
らないことや届け出が大変であるなど問題を抱えてい
た。卓上型の小型蛍光Ｘ線分析計を車に搭載する方法
は、現場近くで分析する目的は叶えられるものの、サン
プリングできない試料に寄って分析することは不可能で
あった。適当な硬度、厚みの試料は破壊式となってしま
うが、ノコギリやトンカチ等で切断または破断させるこ
とによってサンプリングできるが、超鋼のような堅い試
料は、そのような前処理すら困難な場合があった。ま
た、一般的な蛍光Ｘ線分析計の場合、測定対象物を密閉
遮蔽型の試料室構造体内部に包含させることができるた
め、装置外部での漏洩Ｘ線に対する防御は容易に行えた
が、屋外使用目的で可搬型の蛍光Ｘ線分析計を実現する
場合、Ｘ線照射方向には測定対象物のみの完全オープン
型となり、Ｘ線被爆の可能性が大きな構造となってい
た。
【課題を解決するための手段】ラジオアイソトープの代
わりにＸ線管球を使用し、シャッター開閉の動作を各種
スイッチとシーケンスにより安全性を確保することによ
って、屋外での安全な蛍光Ｘ線分析を可能とする。
【発明の実施の形態】図１に小型可搬型の蛍光Ｘ線分析
計の安全スイッチの配置を示す。通常持ち運び時は取手
部１のマイクロスイッチ２を握り、信号ＯＮとなる。取
手部から手を離すと信号はＯＦＦとなる。筐体の測定部
先端のマイクロスイッチ３は、測定実行時に試料４に接
触させると信号ＯＮとなる。試料に非接触時はＯＦＦと
なる。非測定時は測定部先端の窓内側にＸ線を完全に遮
蔽することができる十分な厚みの金属からなるシャッタ
５がＸ線照射口を塞いでおり、筐体外部ではＸ線漏洩が
無い構造となっている。測定時はシャッタ５が開状態と
なりＸ線管球６からの１次Ｘ線７が試料４に照射され、
試料４を構成している元素特有の蛍光Ｘ線８がＸ線検出
器９で計数される。本実施例では、屋外の試料４のある
ところまで取手部を持ちながら運び、測定位置に筐体測
定部先端を接触させてマイクロスイッチ３がＯＮで、取
手部から手を離しマイクロスイッチ２をＯＦＦとさせた
場合のみシャッタ５開状態を実行させ、蛍光Ｘ線分析法
を原理とした測定を可能とさせる。図２は上記動作を実
現させるための回路実施例。取手部のマイクロスイッチ
はオープンなので、ＲＹ２のコイルには電流が流れず、
ＲＹ２接点はＣ（コモン端子）とＮ．Ｃ．（ノーマルコ
モン端子）が接触している状態になる。一方、測定部先
端のマイクロスイッチは試料に接触させることで閉じた
状態になっているのでＲＹ１のコイルには電流が流れ、
ＲＹ１の接点は、Ｃ（コモン端子）とＮ．Ｏ．（ノーマ
ルオープン端子）とが接触している状態になり、その結
果、ＲＹ３のコイルに電流を流すことになる。従って、
ＲＹ３の接点はＣとＮ．Ｏ．が接触している状態にな
り、ソレノイド３に電流が供給されシャッタが開くこと
になる。
【発明の効果】Ｘ線漏洩の安全を確保して，操作性を悪
くすることなく屋外で元素分析が実現できる。
【図面の簡単な説明】
【図１】小型可搬型蛍光Ｘ線分析計の安全スイッチの配
置実施例を示す。
【図２】回路実施例を示す。
【符号の説明】
１ 取手部 ２ マイクロスイッチ ３ マイクロスイッチ ４ 試料 ５ シャッタ ６ Ｘ線管球 ７ １次Ｘ線 ８ 蛍光Ｘ線 ９ Ｘ線検出器 ２１ リレー ２２ リレー ２３ ソレノイド

Claims (1)

    【特許請求の範囲】
  1. 【請求項１】 蛍光Ｘ線法を原理とし，Ｘ線発生系とＸ
    線検出系を有する小型、可搬型の蛍光Ｘ線分析計の箱体
    の測定部窓周辺に測定対象物との接触を検知するスイッ
    チと箱体を運ぶための取手部にスイッチを有し、前者が
    オン、後者がオフの条件でのみＸ線が発生できる安全機
    構を有したことを特徴とする蛍光Ｘ線分析計。
JP10831298A 1998-04-17 1998-04-17 可搬型蛍光ｘ線分析計 Expired - Fee Related JP3582982B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP10831298A JP3582982B2 (ja) 1998-04-17 1998-04-17 可搬型蛍光ｘ線分析計
US09/293,091 US6178227B1 (en) 1998-04-17 1999-04-16 Portable-type fluorescent X-ray analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10831298A JP3582982B2 (ja) 1998-04-17 1998-04-17 可搬型蛍光ｘ線分析計

Publications (2)

Publication Number Publication Date
JPH11304733A true JPH11304733A (ja) 1999-11-05
JP3582982B2 JP3582982B2 (ja) 2004-10-27

Family

ID=14481528

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10831298A Expired - Fee Related JP3582982B2 (ja) 1998-04-17 1998-04-17 可搬型蛍光ｘ線分析計

Country Status (2)

Country Link
US (1) US6178227B1 (ja)
JP (1) JP3582982B2 (ja)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002286662A (ja) * 2000-04-06 2002-10-03 Seiko Instruments Inc 可搬型蛍光ｘ線分析計
JPWO2005106439A1 (ja) * 2004-04-28 2007-12-13 松下電器産業株式会社 蛍光ｘ線分析方法および装置
JP2012215483A (ja) * 2011-04-01 2012-11-08 Shimadzu Corp 蛍光ｘ線分析装置
JP2013113737A (ja) * 2011-11-29 2013-06-10 Pulstec Industrial Co Ltd Ｘ線回折測定装置
JP2014066545A (ja) * 2012-09-25 2014-04-17 Pulstec Industrial Co Ltd Ｘ線回折測定装置

Families Citing this family (12)

* Cited by examiner, † Cited by third party
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US6909770B2 (en) * 2001-12-05 2005-06-21 The United States Of America As Represented By The United States National Aeronautics And Space Administration Methods for identification and verification using vacuum XRF system
US20040022355A1 (en) * 2001-12-05 2004-02-05 Bruce Kaiser Methods for identification and verification of materials containing elemental constituents
US7106826B2 (en) * 2002-01-07 2006-09-12 Cdex, Inc. System and method for adapting a software control in an operating environment
US6850592B2 (en) 2002-04-12 2005-02-01 Keymaster Technologies, Inc. Methods for identification and verification using digital equivalent data system
US7154102B2 (en) * 2002-11-21 2006-12-26 Cdex, Inc. System and methods for detection and identification of chemical substances
AU2003295774A1 (en) * 2002-11-21 2004-06-18 Cdex, Inc. Methods and appartus for molecular species detection, inspection and classification using ultraviolet fluorescence
WO2004089056A2 (en) * 2003-04-01 2004-10-21 Keymaster Technologies, Inc. Exempt source for an x-ray fluorescence device
US7020238B1 (en) * 2005-01-31 2006-03-28 Oxford Instruments Analytical Oy Adapter and analyzer device for performing X-ray fluorescence analysis on hot surfaces
US7381972B1 (en) 2006-07-24 2008-06-03 Science Applications International Corporation System and method for light fluorescence detection
US8134133B1 (en) * 2008-05-26 2012-03-13 David Hunter Walley Method and system for authenticating archeological artifacts
US8194237B2 (en) 2009-10-15 2012-06-05 Authentix, Inc. Document sensor
CN111710034B (zh) * 2020-06-24 2022-06-21 四川长虹空调有限公司 空调器室外机百叶窗内出风量仿真方法及系统

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2297042A (en) * 1940-08-02 1942-09-29 X Ray Shoe Fitter Inc X-ray equipment
US4429409A (en) * 1980-12-15 1984-01-31 Ramsey Engineering Company Portable apparatus for analyzing metals by X-ray fluorescence
US4362932A (en) * 1981-01-22 1982-12-07 The United States Of America As Represented By The Secretary Of The Navy Wide band data processing technique

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002286662A (ja) * 2000-04-06 2002-10-03 Seiko Instruments Inc 可搬型蛍光ｘ線分析計
JPWO2005106439A1 (ja) * 2004-04-28 2007-12-13 松下電器産業株式会社 蛍光ｘ線分析方法および装置
JP4575369B2 (ja) * 2004-04-28 2010-11-04 パナソニック株式会社 蛍光ｘ線分析方法および装置
JP2012215483A (ja) * 2011-04-01 2012-11-08 Shimadzu Corp 蛍光ｘ線分析装置
JP2013113737A (ja) * 2011-11-29 2013-06-10 Pulstec Industrial Co Ltd Ｘ線回折測定装置
JP2014066545A (ja) * 2012-09-25 2014-04-17 Pulstec Industrial Co Ltd Ｘ線回折測定装置

Also Published As

Publication number Publication date
JP3582982B2 (ja) 2004-10-27
US6178227B1 (en) 2001-01-23

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