JP3803999B2 - 欠陥検査装置 - Google Patents

欠陥検査装置 Download PDF

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Publication number
JP3803999B2
JP3803999B2 JP23791799A JP23791799A JP3803999B2 JP 3803999 B2 JP3803999 B2 JP 3803999B2 JP 23791799 A JP23791799 A JP 23791799A JP 23791799 A JP23791799 A JP 23791799A JP 3803999 B2 JP3803999 B2 JP 3803999B2
Authority
JP
Japan
Prior art keywords
film
inspected
compensation filter
liquid crystal
optical compensation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP23791799A
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English (en)
Japanese (ja)
Other versions
JP2001059795A (ja
JP2001059795A5 (enExample
Inventor
行修 黒川
公平 荒川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujifilm Holdings Corp
Original Assignee
Fuji Photo Film Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Photo Film Co Ltd filed Critical Fuji Photo Film Co Ltd
Priority to JP23791799A priority Critical patent/JP3803999B2/ja
Publication of JP2001059795A publication Critical patent/JP2001059795A/ja
Publication of JP2001059795A5 publication Critical patent/JP2001059795A5/ja
Application granted granted Critical
Publication of JP3803999B2 publication Critical patent/JP3803999B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Liquid Crystal (AREA)
  • Polarising Elements (AREA)
  • Controlling Sheets Or Webs (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP23791799A 1999-08-25 1999-08-25 欠陥検査装置 Expired - Fee Related JP3803999B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP23791799A JP3803999B2 (ja) 1999-08-25 1999-08-25 欠陥検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23791799A JP3803999B2 (ja) 1999-08-25 1999-08-25 欠陥検査装置

Publications (3)

Publication Number Publication Date
JP2001059795A JP2001059795A (ja) 2001-03-06
JP2001059795A5 JP2001059795A5 (enExample) 2005-06-09
JP3803999B2 true JP3803999B2 (ja) 2006-08-02

Family

ID=17022369

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23791799A Expired - Fee Related JP3803999B2 (ja) 1999-08-25 1999-08-25 欠陥検査装置

Country Status (1)

Country Link
JP (1) JP3803999B2 (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002148142A (ja) * 2000-11-08 2002-05-22 Sumitomo Chem Co Ltd 液晶用視野角拡大フィルムの検査方法
JP5158468B2 (ja) * 2006-05-15 2013-03-06 大日本印刷株式会社 被検査基板の検査システム及び被検査基板の検査方法
JP4960026B2 (ja) * 2006-06-09 2012-06-27 富士フイルム株式会社 フイルムの欠陥検査装置及びフイルムの製造方法
KR101057626B1 (ko) * 2008-01-07 2011-08-19 주식회사 엘지화학 화상 분석을 이용한 편광판 얼룩 검사 방법 및 이를 이용한 편광판 얼룩 자동 검사 시스템
JP5173047B2 (ja) * 2012-05-15 2013-03-27 株式会社ナナオ 画面光演算装置またはその方法
CN105866986B (zh) * 2016-05-26 2019-09-20 明基材料有限公司 检测装置及检测方法
CN108267450A (zh) * 2018-02-28 2018-07-10 京东方科技集团股份有限公司 基板检测装置和方法
CN111721502B (zh) * 2019-03-22 2024-06-11 住友化学株式会社 检查方法及检查装置
EP4001831A4 (en) * 2019-07-18 2022-09-28 Mitsubishi Electric Corporation INSPECTION DEVICE, INSPECTION PROCEDURE AND PROGRAM
WO2021100192A1 (ja) * 2019-11-22 2021-05-27 シャープ株式会社 表示パネルの製造方法
JP7777746B1 (ja) * 2024-06-04 2025-12-01 Jfeスチール株式会社 フィルムの膜厚偏差測定方法、フィルムの膜厚偏差測定装置、フィルム製造方法およびフィルム製造装置

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Publication number Publication date
JP2001059795A (ja) 2001-03-06

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