JP3760096B2 - 磁気粒子の局部的蓄積を定量的に測定する方法及び装置 - Google Patents

磁気粒子の局部的蓄積を定量的に測定する方法及び装置 Download PDF

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JP3760096B2
JP3760096B2 JP2000522455A JP2000522455A JP3760096B2 JP 3760096 B2 JP3760096 B2 JP 3760096B2 JP 2000522455 A JP2000522455 A JP 2000522455A JP 2000522455 A JP2000522455 A JP 2000522455A JP 3760096 B2 JP3760096 B2 JP 3760096B2
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sample
magnetic field
sensor
sensor element
pattern
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JP2001524675A5 (enExample
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シモンズ,マイケル,バンクロフト
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クォンタム デザイン,インク.
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/48Biological material, e.g. blood, urine; Haemocytometers
    • G01N33/50Chemical analysis of biological material, e.g. blood, urine; Testing involving biospecific ligand binding methods; Immunological testing
    • G01N33/53Immunoassay; Biospecific binding assay; Materials therefor
    • G01N33/543Immunoassay; Biospecific binding assay; Materials therefor with an insoluble carrier for immobilising immunochemicals
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y25/00Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y15/00Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/74Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables of fluids
    • G01N27/745Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables of fluids for detecting magnetic beads used in biochemical assays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/0098Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor involving analyte bound to insoluble magnetic carrier, e.g. using magnetic separation

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  • Urology & Nephrology (AREA)
  • Cell Biology (AREA)
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  • Biotechnology (AREA)
  • Food Science & Technology (AREA)
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  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Measuring Magnetic Variables (AREA)
JP2000522455A 1997-11-21 1998-08-27 磁気粒子の局部的蓄積を定量的に測定する方法及び装置 Expired - Lifetime JP3760096B2 (ja)

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Application Number Priority Date Filing Date Title
US08/975,569 US6046585A (en) 1997-11-21 1997-11-21 Method and apparatus for making quantitative measurements of localized accumulations of target particles having magnetic particles bound thereto
US08/975,569 1997-11-21
PCT/US1998/017815 WO1999027369A1 (en) 1997-11-21 1998-08-27 Method and apparatus for making quantitave measurements of localized accumulations of magnetic particles

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JP2001524675A JP2001524675A (ja) 2001-12-04
JP2001524675A5 JP2001524675A5 (enExample) 2006-02-09
JP3760096B2 true JP3760096B2 (ja) 2006-03-29

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US (2) US6046585A (enExample)
EP (1) EP1036328B1 (enExample)
JP (1) JP3760096B2 (enExample)
KR (1) KR100389778B1 (enExample)
CN (1) CN1128365C (enExample)
AT (1) ATE280390T1 (enExample)
AU (1) AU9207998A (enExample)
BR (1) BR9815566B1 (enExample)
CA (1) CA2311301C (enExample)
DE (1) DE69827158T2 (enExample)
DK (1) DK1036328T3 (enExample)
ES (1) ES2232020T3 (enExample)
IL (1) IL136211A (enExample)
WO (1) WO1999027369A1 (enExample)

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JP5560334B2 (ja) * 2010-07-21 2014-07-23 株式会社日立製作所 磁場計測装置

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CA2311301C (en) 2005-01-18
EP1036328A1 (en) 2000-09-20
IL136211A (en) 2003-04-10
EP1036328B1 (en) 2004-10-20
BR9815566B1 (pt) 2011-02-08
ES2232020T3 (es) 2005-05-16
CN1128365C (zh) 2003-11-19
IL136211A0 (en) 2001-05-20
AU9207998A (en) 1999-06-15
DE69827158T2 (de) 2005-10-13
CN1279764A (zh) 2001-01-10
US6046585A (en) 2000-04-04
KR100389778B1 (ko) 2003-07-02
KR20010032302A (ko) 2001-04-16
HK1033771A1 (en) 2001-09-21
CA2311301A1 (en) 1999-06-03
ATE280390T1 (de) 2004-11-15
US6275031B1 (en) 2001-08-14
WO1999027369A1 (en) 1999-06-03
DE69827158D1 (de) 2004-11-25
DK1036328T3 (da) 2005-01-31
JP2001524675A (ja) 2001-12-04

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