JP2001524675A5 - - Google Patents

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Publication number
JP2001524675A5
JP2001524675A5 JP2000522455A JP2000522455A JP2001524675A5 JP 2001524675 A5 JP2001524675 A5 JP 2001524675A5 JP 2000522455 A JP2000522455 A JP 2000522455A JP 2000522455 A JP2000522455 A JP 2000522455A JP 2001524675 A5 JP2001524675 A5 JP 2001524675A5
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Japan
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JP2000522455A
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JP2001524675A (ja
JP3760096B2 (ja
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Priority claimed from US08/975,569 external-priority patent/US6046585A/en
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JP2000522455A 1997-11-21 1998-08-27 磁気粒子の局部的蓄積を定量的に測定する方法及び装置 Expired - Lifetime JP3760096B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US08/975,569 US6046585A (en) 1997-11-21 1997-11-21 Method and apparatus for making quantitative measurements of localized accumulations of target particles having magnetic particles bound thereto
US08/975,569 1997-11-21
PCT/US1998/017815 WO1999027369A1 (en) 1997-11-21 1998-08-27 Method and apparatus for making quantitave measurements of localized accumulations of magnetic particles

Publications (3)

Publication Number Publication Date
JP2001524675A JP2001524675A (ja) 2001-12-04
JP2001524675A5 true JP2001524675A5 (enExample) 2006-02-09
JP3760096B2 JP3760096B2 (ja) 2006-03-29

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JP2000522455A Expired - Lifetime JP3760096B2 (ja) 1997-11-21 1998-08-27 磁気粒子の局部的蓄積を定量的に測定する方法及び装置

Country Status (14)

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US (2) US6046585A (enExample)
EP (1) EP1036328B1 (enExample)
JP (1) JP3760096B2 (enExample)
KR (1) KR100389778B1 (enExample)
CN (1) CN1128365C (enExample)
AT (1) ATE280390T1 (enExample)
AU (1) AU9207998A (enExample)
BR (1) BR9815566B1 (enExample)
CA (1) CA2311301C (enExample)
DE (1) DE69827158T2 (enExample)
DK (1) DK1036328T3 (enExample)
ES (1) ES2232020T3 (enExample)
IL (1) IL136211A (enExample)
WO (1) WO1999027369A1 (enExample)

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