JP3616999B2 - コンフォーカル顕微鏡 - Google Patents

コンフォーカル顕微鏡 Download PDF

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Publication number
JP3616999B2
JP3616999B2 JP2001369958A JP2001369958A JP3616999B2 JP 3616999 B2 JP3616999 B2 JP 3616999B2 JP 2001369958 A JP2001369958 A JP 2001369958A JP 2001369958 A JP2001369958 A JP 2001369958A JP 3616999 B2 JP3616999 B2 JP 3616999B2
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Japanese (ja)
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JP2003167197A (ja
JP2003167197A5 (enrdf_load_stackoverflow
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治彦 楠瀬
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Lasertec Corp
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Lasertec Corp
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  • Microscoopes, Condenser (AREA)
  • Liquid Crystal (AREA)
  • Color Television Image Signal Generators (AREA)
  • Studio Devices (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2001369958A 2001-12-04 2001-12-04 コンフォーカル顕微鏡 Expired - Fee Related JP3616999B2 (ja)

Priority Applications (1)

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JP2001369958A JP3616999B2 (ja) 2001-12-04 2001-12-04 コンフォーカル顕微鏡

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001369958A JP3616999B2 (ja) 2001-12-04 2001-12-04 コンフォーカル顕微鏡

Publications (3)

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JP2003167197A JP2003167197A (ja) 2003-06-13
JP3616999B2 true JP3616999B2 (ja) 2005-02-02
JP2003167197A5 JP2003167197A5 (enrdf_load_stackoverflow) 2005-05-26

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JP2001369958A Expired - Fee Related JP3616999B2 (ja) 2001-12-04 2001-12-04 コンフォーカル顕微鏡

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JP (1) JP3616999B2 (enrdf_load_stackoverflow)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005024596A (ja) * 2003-06-30 2005-01-27 Susumu Terakawa 共焦点走査顕微鏡
JP4233416B2 (ja) * 2003-08-29 2009-03-04 株式会社ニデック 眼底カメラ
JP4635145B2 (ja) * 2004-03-17 2011-02-16 レーザーテック株式会社 コンフォーカル顕微鏡及び膜厚測定装置
JP4445796B2 (ja) 2004-05-17 2010-04-07 オリンパス株式会社 顕微鏡
JP4434829B2 (ja) 2004-05-17 2010-03-17 オリンパス株式会社 顕微鏡
JP2006133499A (ja) * 2004-11-05 2006-05-25 Shimadzu Corp 共焦点スキャナ及び共焦点顕微鏡
JP4538633B2 (ja) * 2005-03-29 2010-09-08 国立大学法人浜松医科大学 Ｄｌｐ式スリット光走査顕微鏡
US7329860B2 (en) 2005-11-23 2008-02-12 Illumina, Inc. Confocal imaging methods and apparatus
DE102006047912A1 (de) * 2006-10-06 2008-04-10 Carl Zeiss Microimaging Gmbh Verfahren und Anordnung zur parallelisierten mikroskopischen Bildgebung
JP5024864B2 (ja) * 2006-12-18 2012-09-12 レーザーテック株式会社 コンフォーカル顕微鏡、及びコンフォーカル画像の撮像方法
US8319971B2 (en) 2008-05-06 2012-11-27 Industrial Technology Research Institute Scatterfield microscopical measuring method and apparatus
TWI392861B (zh) * 2008-07-08 2013-04-11 Ind Tech Res Inst 散射光學量測方法與裝置
JP2010039438A (ja) * 2008-08-08 2010-02-18 Yokogawa Electric Corp 共焦点顕微鏡システム
JP2010133840A (ja) * 2008-12-05 2010-06-17 Nokodai Tlo Kk 形状測定装置及び形状測定方法
JP2010145735A (ja) * 2008-12-18 2010-07-01 Mitsubishi Heavy Ind Ltd 撮像装置及び撮像方法
JP5268115B2 (ja) * 2010-06-09 2013-08-21 レーザーテック株式会社 膜厚測定装置、及び膜厚測定方法
JP2012117920A (ja) * 2010-12-01 2012-06-21 Djtech Co Ltd 外観検査装置及び印刷半田検査装置
WO2013105922A2 (en) * 2011-12-12 2013-07-18 Zygo Corporation Non-contact surface characterization using modulated illumination
JP2016109530A (ja) * 2014-12-05 2016-06-20 大日本印刷株式会社 光学装置及び光学装置が搭載された車両
CN113358030B (zh) * 2021-07-15 2022-09-30 中国科学院长春光学精密机械与物理研究所 色散共焦测量系统及其误差修正方法
CN115015040B (zh) * 2022-08-09 2022-11-11 中国空气动力研究与发展中心高速空气动力研究所 一种分体积木和功能分层式结构的多适用型纹影系统
CN119960176B (zh) * 2025-04-11 2025-06-27 上海季丰电子股份有限公司 显微物镜的优化方法及电子设备

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