JP3092722B2 - コーティング厚さ測定計器 - Google Patents

コーティング厚さ測定計器

Info

Publication number
JP3092722B2
JP3092722B2 JP03130117A JP13011791A JP3092722B2 JP 3092722 B2 JP3092722 B2 JP 3092722B2 JP 03130117 A JP03130117 A JP 03130117A JP 13011791 A JP13011791 A JP 13011791A JP 3092722 B2 JP3092722 B2 JP 3092722B2
Authority
JP
Japan
Prior art keywords
probe
housing
instrument
probe set
coating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP03130117A
Other languages
English (en)
Japanese (ja)
Other versions
JPH04231801A (ja
Inventor
ケイ．エイダン ラシド
ジェイ．コッホ フランク
Original Assignee
デフェルスコ コーポレイション
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by デフェルスコ コーポレイション filed Critical デフェルスコ コーポレイション
Publication of JPH04231801A publication Critical patent/JPH04231801A/ja
Application granted granted Critical
Publication of JP3092722B2 publication Critical patent/JP3092722B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
    • G01B7/105—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring thickness of coating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/08—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using capacitive means
    • G01B7/085—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using capacitive means for measuring thickness of coating

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP03130117A 1990-06-01 1991-06-01 コーティング厚さ測定計器 Expired - Fee Related JP3092722B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US533444 1990-06-01
US07/533,444 US5241280A (en) 1990-06-05 1990-06-05 Coating thickness measurement gauge

Publications (2)

Publication Number Publication Date
JPH04231801A JPH04231801A (ja) 1992-08-20
JP3092722B2 true JP3092722B2 (ja) 2000-09-25

Family

ID=24125995

Family Applications (1)

Application Number Title Priority Date Filing Date
JP03130117A Expired - Fee Related JP3092722B2 (ja) 1990-06-01 1991-06-01 コーティング厚さ測定計器

Country Status (5)

Country Link
US (2) US5241280A (enExample)
EP (1) EP0460552B1 (enExample)
JP (1) JP3092722B2 (enExample)
AT (1) ATE155876T1 (enExample)
DE (1) DE69126920D1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8988668B2 (en) 2011-08-30 2015-03-24 Mitsubishi Hitachi Power Systems, Ltd. Film thickness measurement apparatus and film thickness measurement method

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US5241280A (en) * 1990-06-05 1993-08-31 Defelsko Corporation Coating thickness measurement gauge
US5231355A (en) * 1990-06-18 1993-07-27 The Charles Machine Works, Inc. Locator transmitter having an automatically tuned antenna
FR2692978A1 (fr) * 1992-06-30 1993-12-31 Alcatel Fibres Optiques Dispositif et procédé de contrôle de l'épaisseur et de la régularité d'un revêtement déposé sur un corps isolant allongé.
EP0576714B1 (de) * 1992-07-03 1995-03-15 Norbert Dr. Nix Vorrichtung zur Messung einer Schichtdicke
DE4239635C2 (de) * 1992-11-23 1998-02-12 Hartmann & Braun Ag Einrichtung zur Wegerfassung von Ventilstangenbewegungen elektropneumatischer Stellungsregler
US5623427A (en) * 1994-09-02 1997-04-22 Defelsko Corporation Nondestructive anodic capacity gauge
US5596450A (en) * 1995-01-06 1997-01-21 W. L. Gore & Associates, Inc. Light reflectant surface and method for making and using same
US5781342A (en) * 1995-01-06 1998-07-14 W.L. Gore & Associates, Inc. High light diffusive and low light absorbent material and method for making and using same
US5559428A (en) * 1995-04-10 1996-09-24 International Business Machines Corporation In-situ monitoring of the change in thickness of films
US5930744A (en) * 1995-09-15 1999-07-27 Defelsko Corporation Coating thickness gauge
US5831430A (en) * 1995-12-28 1998-11-03 Pfanstiehl; John Multiple remote probe electronic thickness gauge with probe holder
US5686831A (en) * 1996-02-07 1997-11-11 Defelsko Corporation Gauge with reversible display screen
GB9605843D0 (en) * 1996-03-20 1996-05-22 Ormiston Peter T A device for measuring the thickness of a coating
US6072309A (en) * 1996-12-13 2000-06-06 Honeywell-Measurex Corporation, Inc. Paper stock zeta potential measurement and control
US5928475A (en) * 1996-12-13 1999-07-27 Honeywell-Measurex, Corporation High resolution system and method for measurement of traveling web
US6341522B1 (en) * 1996-12-13 2002-01-29 Measurex Corporation Water weight sensor array imbedded in a sheetmaking machine roll
US6087837A (en) 1996-12-13 2000-07-11 Honeywell-Measurex Compact high resolution under wire water weight sensor array
US5891306A (en) * 1996-12-13 1999-04-06 Measurex Corporation Electromagnetic field perturbation sensor and methods for measuring water content in sheetmaking systems
SE508711C2 (sv) * 1996-12-23 1998-10-26 Scania Cv Ab Anordning för en skikttjockleksmätare och ett förfarande för att mäta tjockleken hos ett skikt
US5853543A (en) * 1997-01-27 1998-12-29 Honeywell-Measurex Corporation Method for monitoring and controlling water content in paper stock in a paper making machine
US6168080B1 (en) 1997-04-17 2001-01-02 Translucent Technologies, Llc Capacitive method and apparatus for accessing contents of envelopes and other similarly concealed information
US6055860A (en) * 1997-12-09 2000-05-02 Pfanstiehl; John Method for measuring vehicle damage
US5944955A (en) * 1998-01-15 1999-08-31 Honeywell-Measurex Corporation Fast basis weight control for papermaking machine
US6092003A (en) * 1998-01-26 2000-07-18 Honeywell-Measurex Corporation Paper stock shear and formation control
US6076022A (en) * 1998-01-26 2000-06-13 Honeywell-Measurex Corporation Paper stock shear and formation control
US6080278A (en) * 1998-01-27 2000-06-27 Honeywell-Measurex Corporation Fast CD and MD control in a sheetmaking machine
US6243661B1 (en) * 1998-02-12 2001-06-05 Elcometer Instruments Ltd. Coating thickness gauge
US6149770A (en) * 1998-04-14 2000-11-21 Honeywell-Measurex Corporation Underwire water weight turbulence sensor
US6168687B1 (en) 1998-04-24 2001-01-02 Honeywell-Measurex Corporation System and method for sheet measurement and control in papermaking machine
US6006602A (en) * 1998-04-30 1999-12-28 Honeywell-Measurex Corporation Weight measurement and measurement standardization sensor
US6086716A (en) * 1998-05-11 2000-07-11 Honeywell-Measurex Corporation Wet end control for papermaking machine
US6202929B1 (en) 1999-03-10 2001-03-20 Micro-Epsilon Mess Technik Capacitive method and apparatus for accessing information encoded by a differentially conductive pattern
DE19918064C2 (de) * 1999-04-21 2003-09-18 Norbert Nix Schichtdickenmeßgerät mit automatisierter Nulleinstellung und/oder Kalibrierung
US6446012B1 (en) * 1999-06-23 2002-09-03 Bfcs Technology, Inc. Proximity detector for hard-to-detect materials
DE19949977B4 (de) * 1999-10-13 2005-01-20 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren zur Bestimmung des Vorhandenseins von anorganischen, organischen oder Oxidschichten auf metallischen Substraten oder der Messung von Oberflächentemperaturen von Kunststoffsubstraten
GB2356050B (en) * 1999-11-05 2001-10-24 Elcometer Instr Ltd Apparatus and method for measuring thickness
US6288537B1 (en) * 1999-12-22 2001-09-11 General Electric Company Eddy current probe with foil sensor mounted on flexible probe tip and method of use
US6707540B1 (en) 1999-12-23 2004-03-16 Kla-Tencor Corporation In-situ metalization monitoring using eddy current and optical measurements
US6433541B1 (en) * 1999-12-23 2002-08-13 Kla-Tencor Corporation In-situ metalization monitoring using eddy current measurements during the process for removing the film
US7187947B1 (en) * 2000-03-28 2007-03-06 Affinity Labs, Llc System and method for communicating selected information to an electronic device
USD443537S1 (en) 2000-04-19 2001-06-12 Automation Hans Nix Gmbh Coating thickness gauge
EP1380810A1 (en) * 2002-07-10 2004-01-14 Crown Cork & Seal Technologies Corporation Gauge calibration method
DE10252541B4 (de) * 2002-11-08 2016-08-11 Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg Vorrichtung zur zerstörungsfreien Messung der Dicke dünner Schichten
USD501800S1 (en) * 2003-03-10 2005-02-15 Turner Intellectual Property Ltd Thickness gauge
US6995574B2 (en) * 2003-12-18 2006-02-07 The Boeing Company Measurement of a coating on a composite using capacitance
US7282909B2 (en) * 2005-06-29 2007-10-16 Lam Research Corporation Methods and apparatus for determining the thickness of a conductive layer on a substrate
USD553026S1 (en) * 2005-08-24 2007-10-16 Automation Dr. Nix Gmbh And Co., Kg Coating thickness gauge
JP4825084B2 (ja) * 2006-08-28 2011-11-30 財団法人電力中央研究所 治具、膜厚計測装置及び方法
WO2008037818A1 (es) * 2006-09-29 2008-04-03 Airbus España, S.L. Método para la determinación del espesor de recubrimiento sobre un material compuesto
JP5443605B2 (ja) 2009-08-31 2014-03-19 ミシュラン ルシェルシュ エ テクニーク ソシエテ アノニム ゴム材料またはエラストマー性材料中における金属形体の深さを決定するための方法および装置
CN102141698B (zh) * 2011-03-04 2012-07-11 深圳市华星光电技术有限公司 膜厚量测装置及其校正方法
US20130088222A1 (en) * 2011-05-10 2013-04-11 Bell Helicopter Textron Inc. System and method for measuring wrinkle depth in a composite structure
KR101332308B1 (ko) * 2011-12-08 2013-12-02 한국기계연구원 초정밀 갭 센서의 초기위치 조정장치 및 그 방법
US10746525B2 (en) * 2018-04-20 2020-08-18 The Boeing Company Capacitive-sensing paint borer
CN110261699B (zh) * 2019-06-24 2021-06-22 广东天圣高科股份有限公司 一种数字电参数测量仪
USD1002408S1 (en) * 2022-01-14 2023-10-24 Li-Chuan Chen Coating thickness gauge
CN114577154B (zh) * 2022-04-28 2022-07-15 广东环达工程检测有限公司 一种管道涂层厚度检测装置及其检测方法
WO2024030726A2 (en) * 2022-08-05 2024-02-08 Agr International, Inc. Multi-mode thickness measurement device and methods

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US3513555A (en) * 1967-03-30 1970-05-26 Bradstreet J Vachon Thickness gauging apparatus
CH609768A5 (enExample) * 1976-12-22 1979-03-15 Zumbach Electronic Ag
US4349780A (en) * 1979-11-13 1982-09-14 Northern Telecom Limited Sensor device for continuous measurement of jacket thickness on a cable
US4564810A (en) * 1981-09-30 1986-01-14 The Boeing Company Aluminum cladding thickness measurement probe and instrument having an automatic calibration and readout circuit coupled to a differential amplifier circuit
EP0093772A1 (en) * 1981-11-12 1983-11-16 Defelsko Corporation Coatings thickness and surface roughness comparator
US4567436A (en) * 1982-01-21 1986-01-28 Linda Koch Magnetic thickness gauge with adjustable probe
DE3622708A1 (de) * 1986-07-05 1988-01-14 Ford Werke Ag Verfahren und vorrichtung zum messen von ueberzugs-schichtstaerken an kraftfahrzeug-karosserien
US4791367A (en) * 1987-07-15 1988-12-13 Impact Systems, Inc. Contacting thickness gauge for moving sheet material
US5053703A (en) * 1989-02-21 1991-10-01 Helmut Fischer Electromagnetic probe for measuring the thickness of skin layers
US5241280A (en) * 1990-06-05 1993-08-31 Defelsko Corporation Coating thickness measurement gauge

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8988668B2 (en) 2011-08-30 2015-03-24 Mitsubishi Hitachi Power Systems, Ltd. Film thickness measurement apparatus and film thickness measurement method

Also Published As

Publication number Publication date
US5293132A (en) 1994-03-08
ATE155876T1 (de) 1997-08-15
JPH04231801A (ja) 1992-08-20
EP0460552B1 (en) 1997-07-23
EP0460552A2 (en) 1991-12-11
US5241280A (en) 1993-08-31
DE69126920D1 (de) 1997-09-04
EP0460552A3 (enExample) 1994-04-06

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Legal Events

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