WO2008037818A1 - Método para la determinación del espesor de recubrimiento sobre un material compuesto - Google Patents
Método para la determinación del espesor de recubrimiento sobre un material compuesto Download PDFInfo
- Publication number
- WO2008037818A1 WO2008037818A1 PCT/ES2006/070140 ES2006070140W WO2008037818A1 WO 2008037818 A1 WO2008037818 A1 WO 2008037818A1 ES 2006070140 W ES2006070140 W ES 2006070140W WO 2008037818 A1 WO2008037818 A1 WO 2008037818A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- coating
- composite material
- thickness
- measurement
- determining
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
- G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
- G01B7/105—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring thickness of coating
Definitions
- the present invention relates to a method for determining thicknesses of coatings on composite materials by means of the application of induced currents.
- Eddy currents also known as stray currents or Focault currents
- stray currents or Focault currents are circulating electric currents induced by an alternating magnetic field in an insulated conductor. Eddy currents are not induced on an insulating material, the said non-conductive material crossing the alternating magnetic field.
- the present invention proposes an indirect measurement method for determining the thickness of a coating on a material! compound, such as carbon fiber, comprising the following steps:
- Figure 1 shows the on-screen representation of the zero calibration of the measurement method object of the invention.
- Figure 2 shows the on-screen representation of the calibration, using 175 ⁇ m Mylar polyester fiber as reference, of the measurement method object of the invention.
- Figure 3 shows one of the test specimens object of the measurement method object of the invention.
- Figure 4 shows a micrograph depicting the roughness of a subject! compound with textured surface, which constitutes an additional difficulty to the method of measurement of the invention.
- Figure 5 shows the micrographs performed on one of the specimens examined with the method of measurement of the invention.
- Figure 6 shows the curve of the results obtained from the test of the test specimens examined with the method object of the invention against the actual data.
- Figure 7 shows the placement of! measuring probe on the composite material to be measured according to the measurement method of the present invention.
- Composite such as carbon fiber
- developed by the present invention consists in performing an indirect measurement, considering the composite material or carbon fiber and the coating as a separation ⁇ Lift-Off) against a metal sheet metal, such as a aluminum alloy sheet.
- the method described in this invention is applicable to a wide range of coating thicknesses, ranging from 20 ⁇ m to 300 ⁇ m, since in no cases are thick enough to not be traversed by the low frequency technique proposed here.
- Fine thicknesses of carbon fiber mainly from 1 to 5 mm, allow to obtain very reliable results in the measurement of the thicknesses of the coating, since they have greater relative importance in the separation of variables.
- the aluminum sheet must have a suitable thickness, preferably more than 2 mm, and must be unplated. Veneers of 2024, 7075, etc., and in different treatment states, are suitable for performing the calibration and, therefore, the measurements.
- micrographic cutting measures which are the determinants in litigation situations.
- the zero calibration is carried out using a paint-free carbon fiber test tube, which is the coating measured in this specific case.
- Figure 1 which shows the representation on the screen of the equipment, in which, as it is the measurement of the separation or Lift-off effect, the angle or phase of the impedance vector has been adjusted to 233 ° to obtain a representation vertical, the downward vertical line is located in the first frame of the screen height, thus reaching a height of 1 frame (about 8 in total), which corresponds to the carbon fiber test tube udder, that is, at zero of the calibration.
- the calibration is carried out based on a 175 ⁇ m calibrated Mylar polyester sheet on a carbon fiber specimen, as shown in Figure 2.
- the test specimen of Figure 3 has a nominal fiber thickness of 1.6 mm. Obviously, smaller or greater thicknesses would require an adjustment of the gain of the low frequency probe to achieve the same amplitude, in the same direction as the thickness. Thus, for example, fiber thicknesses of 3.2 mm require 44 dB instead of the ios 41 dB used in the previous calibration.
- micrograph of Figure 4 represents the roughness of a composite material with a textured surface, which reaches a maximum value of almost 125 ⁇ m.
- Table 1 shows the results obtained in the test specimens tested by the induced currents method of the invention versus the real data of the micrographic cut of these specimens, as well as two Mylar-type reference polyester fibers used in the calibration of the method , in the measurement margins.
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Abstract
Description
Claims
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
ES200950015A ES2365291B1 (es) | 2006-09-29 | 2006-09-29 | Método para la determinación del espesor de un recubrimiento sobre un material compuesto. |
PCT/ES2006/070140 WO2008037818A1 (es) | 2006-09-29 | 2006-09-29 | Método para la determinación del espesor de recubrimiento sobre un material compuesto |
CN2006800559851A CN101657693B (zh) | 2006-09-29 | 2006-09-29 | 测定复合材料上的涂层的厚度的方法 |
US11/589,677 US7352194B1 (en) | 2006-09-29 | 2006-10-30 | Method for determining the thickness of a coating on a composite material |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/ES2006/070140 WO2008037818A1 (es) | 2006-09-29 | 2006-09-29 | Método para la determinación del espesor de recubrimiento sobre un material compuesto |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2008037818A1 true WO2008037818A1 (es) | 2008-04-03 |
Family
ID=39227290
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/ES2006/070140 WO2008037818A1 (es) | 2006-09-29 | 2006-09-29 | Método para la determinación del espesor de recubrimiento sobre un material compuesto |
Country Status (4)
Country | Link |
---|---|
US (1) | US7352194B1 (es) |
CN (1) | CN101657693B (es) |
ES (1) | ES2365291B1 (es) |
WO (1) | WO2008037818A1 (es) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2495868B (en) * | 2009-03-18 | 2013-10-23 | Helmut Fischer Gmbh Inst Fur Elektronik Und Messtechnik | Measurement stand and method of its electrical control |
US9194687B1 (en) | 2010-02-04 | 2015-11-24 | Textron Innovations Inc. | System and method for measuring non-conductive coating thickness using eddy currents |
US9927233B2 (en) | 2013-01-10 | 2018-03-27 | Elcometer Limited | Coating thickness measuring instrument and methods |
CN103344174B (zh) * | 2013-07-12 | 2016-03-09 | 爱德森(厦门)电子有限公司 | 一种不均匀导电材料表面覆盖层厚度的涡流测厚方法 |
CN103615965B (zh) * | 2013-12-20 | 2017-01-25 | 爱德森(厦门)电子有限公司 | 一种曲率变化的曲面金属表面覆盖层厚度的涡流测厚方法 |
CN105115411B (zh) * | 2015-09-09 | 2018-03-02 | 海安迪斯凯瑞探测仪器有限公司 | 一种涂层测厚仪探头 |
CN107782235A (zh) * | 2017-10-26 | 2018-03-09 | 内蒙古航天红峡化工有限公司 | 一种碳纤维火箭壳体表面涂层厚度的测量方法 |
US10876882B1 (en) * | 2019-06-26 | 2020-12-29 | Honeywell International Inc. | Online grade selection for weight measurements of composite sheets |
CN112831767A (zh) * | 2021-01-04 | 2021-05-25 | 中国航空制造技术研究院 | 一种复合材料表面金属化薄膜复合加工方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4715007A (en) * | 1984-07-31 | 1987-12-22 | Kett Electric Laboratory | Instrument for measuring film thickness |
EP0524204A1 (de) * | 1990-04-11 | 1993-01-27 | Micro Epsilon Messtechnik | Verfahren zum kalibrieren einer dickenmesseinrichtung und dickenmesseinrichtung zur dickenmessung bzw. überwachung von schichtdicken, bändern, folien oder dgl. |
US5731697A (en) * | 1995-04-10 | 1998-03-24 | International Business Machines Corporation | In-situ monitoring of the change in thickness of films |
US20040058545A1 (en) * | 2002-09-25 | 2004-03-25 | Lam Research Corporation | Enhancement of eddy current based measurement capabilities |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3404720A1 (de) * | 1984-02-10 | 1985-08-14 | Karl Deutsch Prüf- und Meßgerätebau GmbH + Co KG, 5600 Wuppertal | Verfahren und vorrichtung zur schichtdickenmessung |
US4747310A (en) * | 1986-08-12 | 1988-05-31 | Grumman Aerospace Corporation | Probe for composite analyzer tester |
US4745809A (en) * | 1986-08-12 | 1988-05-24 | Grumman Aerospace Corporation | Composite analyzer tester |
KR0126400B1 (ko) * | 1989-02-17 | 1997-12-24 | 로버트 엔.콘 | 복합물질 위의 보호층을 검출하는 방법 |
US5241280A (en) * | 1990-06-05 | 1993-08-31 | Defelsko Corporation | Coating thickness measurement gauge |
CN2132151Y (zh) * | 1992-08-16 | 1993-05-05 | 陕西机械学院 | 金属、塑料宽幅复合带塑膜测厚仪 |
US5847562A (en) * | 1996-05-08 | 1998-12-08 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Thickness gauging of single-layer conductive materials with two-point non linear calibration algorithm |
US6297648B1 (en) * | 1996-08-16 | 2001-10-02 | The Boeing Company | Oscillating cavity paint meter |
US6793865B2 (en) * | 2000-02-11 | 2004-09-21 | Textron Automotive Company Inc. | Gage thickness measurement by use of inductive sensors |
US6670808B2 (en) * | 2001-08-27 | 2003-12-30 | General Electric Company | Self reference eddy current probe, measurement system, and measurement method |
US6794886B1 (en) * | 2001-11-01 | 2004-09-21 | Kla-Tencor Technologies Corporation | Tank probe for measuring surface conductance |
US7411390B2 (en) * | 2002-06-04 | 2008-08-12 | Jentek Sensors, Inc. | High resolution inductive sensor arrays for UXO |
IL153894A (en) * | 2003-01-12 | 2010-05-31 | Nova Measuring Instr Ltd | Method and system for measuring the thickness of thin conductive layers |
US6815958B2 (en) * | 2003-02-07 | 2004-11-09 | Multimetrixs, Llc | Method and apparatus for measuring thickness of thin films with improved accuracy |
US20040227524A1 (en) * | 2003-05-12 | 2004-11-18 | Boris Kesil | Method and system for measuring thickness of thin films with automatic stabilization of measurement accuracy |
US6989675B2 (en) * | 2003-03-13 | 2006-01-24 | Multimetrixs Llc | Method and apparatus for precision measurement of film thickness |
US7173435B1 (en) * | 2006-01-27 | 2007-02-06 | The Boeing Company | Thickness measuring apparatus and method using a microwave cavity resonator |
-
2006
- 2006-09-29 WO PCT/ES2006/070140 patent/WO2008037818A1/es active Application Filing
- 2006-09-29 ES ES200950015A patent/ES2365291B1/es active Active
- 2006-09-29 CN CN2006800559851A patent/CN101657693B/zh not_active Expired - Fee Related
- 2006-10-30 US US11/589,677 patent/US7352194B1/en not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4715007A (en) * | 1984-07-31 | 1987-12-22 | Kett Electric Laboratory | Instrument for measuring film thickness |
EP0524204A1 (de) * | 1990-04-11 | 1993-01-27 | Micro Epsilon Messtechnik | Verfahren zum kalibrieren einer dickenmesseinrichtung und dickenmesseinrichtung zur dickenmessung bzw. überwachung von schichtdicken, bändern, folien oder dgl. |
US5731697A (en) * | 1995-04-10 | 1998-03-24 | International Business Machines Corporation | In-situ monitoring of the change in thickness of films |
US20040058545A1 (en) * | 2002-09-25 | 2004-03-25 | Lam Research Corporation | Enhancement of eddy current based measurement capabilities |
Also Published As
Publication number | Publication date |
---|---|
CN101657693B (zh) | 2012-02-15 |
ES2365291A1 (es) | 2011-09-28 |
US7352194B1 (en) | 2008-04-01 |
ES2365291B1 (es) | 2012-08-08 |
US20080079425A1 (en) | 2008-04-03 |
CN101657693A (zh) | 2010-02-24 |
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