JP3010784B2 - 低温紫外線硬化型エポキシ封止を有する半導体デバイスとその製法 - Google Patents

低温紫外線硬化型エポキシ封止を有する半導体デバイスとその製法

Info

Publication number
JP3010784B2
JP3010784B2 JP3130804A JP13080491A JP3010784B2 JP 3010784 B2 JP3010784 B2 JP 3010784B2 JP 3130804 A JP3130804 A JP 3130804A JP 13080491 A JP13080491 A JP 13080491A JP 3010784 B2 JP3010784 B2 JP 3010784B2
Authority
JP
Japan
Prior art keywords
semiconductor device
electronic component
package
ultraviolet
epoxy
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP3130804A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0621251A (ja
Inventor
モーリス・エス・カープマン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Motorola Solutions Inc
Original Assignee
Motorola Solutions Inc
Motorola Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Motorola Solutions Inc, Motorola Inc filed Critical Motorola Solutions Inc
Publication of JPH0621251A publication Critical patent/JPH0621251A/ja
Application granted granted Critical
Publication of JP3010784B2 publication Critical patent/JP3010784B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07 e.g. sealing of a cap to a base of a container
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/02Containers; Seals
    • H01L23/10Containers; Seals characterised by the material or arrangement of seals between parts, e.g. between cap and base of the container or between leads and walls of the container
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/29Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
    • H01L23/293Organic, e.g. plastic
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/31Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
    • H01L23/3107Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
    • H01L23/3121Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed a substrate forming part of the encapsulation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42Wire connectors; Manufacturing methods related thereto
    • H01L24/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/00014Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/14Integrated circuits
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/1515Shape
    • H01L2924/15153Shape the die mounting substrate comprising a recess for hosting the device
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/15165Monolayer substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/156Material
    • H01L2924/157Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
    • H01L2924/15738Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950 C and less than 1550 C
    • H01L2924/15747Copper [Cu] as principal constituent
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/161Cap
    • H01L2924/1615Shape
    • H01L2924/16152Cap comprising a cavity for hosting the device, e.g. U-shaped cap
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Adhesives Or Adhesive Processes (AREA)
JP3130804A 1990-03-23 1991-03-22 低温紫外線硬化型エポキシ封止を有する半導体デバイスとその製法 Expired - Fee Related JP3010784B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US498156 1990-03-23
US07/498,156 US5117279A (en) 1990-03-23 1990-03-23 Semiconductor device having a low temperature uv-cured epoxy seal

Publications (2)

Publication Number Publication Date
JPH0621251A JPH0621251A (ja) 1994-01-28
JP3010784B2 true JP3010784B2 (ja) 2000-02-21

Family

ID=23979815

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3130804A Expired - Fee Related JP3010784B2 (ja) 1990-03-23 1991-03-22 低温紫外線硬化型エポキシ封止を有する半導体デバイスとその製法

Country Status (4)

Country Link
US (1) US5117279A (cg-RX-API-DMAC7.html)
EP (1) EP0447884B1 (cg-RX-API-DMAC7.html)
JP (1) JP3010784B2 (cg-RX-API-DMAC7.html)
DE (1) DE69129668T2 (cg-RX-API-DMAC7.html)

Families Citing this family (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW332348B (en) * 1992-06-23 1998-05-21 Sony Co Ltd Manufacturing method for solid state motion picture device provides a highly accurate and low cost solid state motion picture device by use of empty package made of resin.
US5390082A (en) * 1992-07-06 1995-02-14 International Business Machines, Corp. Chip carrier with protective coating for circuitized surface
WO1994014193A1 (en) * 1992-12-09 1994-06-23 Olin Corporation Electronic package sealed with a dispensable adhesive
US5477008A (en) * 1993-03-19 1995-12-19 Olin Corporation Polymer plug for electronic packages
JPH0837252A (ja) * 1994-07-22 1996-02-06 Nec Corp 半導体装置
DE69528515T2 (de) * 1994-07-26 2003-04-24 Koninklijke Philips Electronics N.V., Eindhoven Herstellungsmethode eines oberflächen-montierbaren bauteils und dieser selbst
US6184575B1 (en) * 1994-08-26 2001-02-06 National Semiconductor Corporation Ultra-thin composite package for integrated circuits
WO1996034517A1 (en) * 1995-04-26 1996-10-31 Buztronics, Inc. Electronic novelty assembly including a pin switch and embedded printed circuit component
US7041771B1 (en) 1995-08-11 2006-05-09 Kac Holdings, Inc. Encapsulant with fluxing properties and method of use in flip-chip surface mount reflow soldering
US6426484B1 (en) 1996-09-10 2002-07-30 Micron Technology, Inc. Circuit and method for heating an adhesive to package or rework a semiconductor die
US5938956A (en) * 1996-09-10 1999-08-17 Micron Technology, Inc. Circuit and method for heating an adhesive to package or rework a semiconductor die
US5689089A (en) * 1996-09-20 1997-11-18 Motorola, Inc. Electronic control module having fluid-tight seals of a polymer material which expands when wet
US6274927B1 (en) 1999-06-03 2001-08-14 Amkor Technology, Inc. Plastic package for an optical integrated circuit device and method of making
JP4588837B2 (ja) * 2000-04-11 2010-12-01 浜松ホトニクス株式会社 半導体受光装置
US6432752B1 (en) * 2000-08-17 2002-08-13 Micron Technology, Inc. Stereolithographic methods for fabricating hermetic semiconductor device packages and semiconductor devices including stereolithographically fabricated hermetic packages
US7127362B2 (en) 2000-08-22 2006-10-24 Mundt Randall S Process tolerant methods and apparatus for obtaining data
JP4003860B2 (ja) * 2000-11-02 2007-11-07 富士通株式会社 マイクロアクチュエータ及びその製造方法
US6376266B1 (en) * 2000-11-06 2002-04-23 Semiconductor Components Industries Llc Semiconductor package and method for forming same
US6747298B2 (en) 2001-07-23 2004-06-08 Cree, Inc. Collets for bonding of light emitting diodes having shaped substrates
US6888167B2 (en) * 2001-07-23 2005-05-03 Cree, Inc. Flip-chip bonding of light emitting devices and light emitting devices suitable for flip-chip bonding
US6692610B2 (en) * 2001-07-26 2004-02-17 Osram Opto Semiconductors Gmbh Oled packaging
US6861720B1 (en) 2001-08-29 2005-03-01 Amkor Technology, Inc. Placement template and method for placing optical dies
US6759266B1 (en) * 2001-09-04 2004-07-06 Amkor Technology, Inc. Quick sealing glass-lidded package fabrication method
US7276394B2 (en) * 2001-09-20 2007-10-02 Eastman Kodak Company Large area flat image sensor assembly
US20030054583A1 (en) * 2001-09-20 2003-03-20 Eastman Kodak Company Method for producing an image sensor assembly
US6507097B1 (en) * 2001-11-29 2003-01-14 Clarisay, Inc. Hermetic package for pyroelectric-sensitive electronic device and method of manufacturing the same
US6784534B1 (en) 2002-02-06 2004-08-31 Amkor Technology, Inc. Thin integrated circuit package having an optically transparent window
JP3560161B1 (ja) * 2003-01-30 2004-09-02 日立化成工業株式会社 半導体封止用エポキシ樹脂組成物の製造方法
US7195953B2 (en) * 2003-04-02 2007-03-27 Yamaha Corporation Method of manufacturing a semiconductor package using a lead frame having through holes or hollows therein
DE102004013816A1 (de) * 2004-03-20 2005-10-06 Robert Bosch Gmbh Verfahren zum Herstellen eines Sensormoduls und Sensormodul
US7517728B2 (en) * 2004-03-31 2009-04-14 Cree, Inc. Semiconductor light emitting devices including a luminescent conversion element
EP1619726A1 (fr) * 2004-07-22 2006-01-25 St Microelectronics S.A. Boîtier optique pour capteur semiconducteur
KR100782798B1 (ko) * 2006-02-22 2007-12-05 삼성전기주식회사 기판 패키지 및 그 제조 방법
DE102006008793A1 (de) * 2006-02-24 2007-09-13 Osram Opto Semiconductors Gmbh Elektronisches Bauteil
EP2019424B1 (de) 2007-07-26 2016-11-23 SEMIKRON Elektronik GmbH & Co. KG Leistungshalbleitermodul mit Dichteinrichtung zum Substratträger und Herstellungsverfahren hierzu
US8421214B2 (en) * 2007-10-10 2013-04-16 Vishay General Semiconductor Llc Semiconductor device and method for manufacturing a semiconductor device
US9147813B2 (en) 2011-09-09 2015-09-29 Avago Technologies General Ip (Singapore) Pte. Ltd. High thermal conductivity and low degradation die attach with dual adhesive
WO2015092999A1 (ja) 2013-12-19 2015-06-25 株式会社大真空 電子部品用パッケージ及び圧電デバイス
US10170304B1 (en) 2017-10-25 2019-01-01 Globalfoundries Inc. Self-aligned nanotube structures

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4000054A (en) * 1970-11-06 1976-12-28 Microsystems International Limited Method of making thin film crossover structure
US4141055A (en) * 1977-04-27 1979-02-20 Bell Telephone Laboratories, Incorporated Crossover structure for microelectronic circuits
US4480009A (en) * 1980-12-15 1984-10-30 M&T Chemicals Inc. Siloxane-containing polymers
EP0114258A1 (en) * 1982-11-30 1984-08-01 Kabushiki Kaisha Toshiba Resin encapsulation type photo-semiconductor devices
US4524238A (en) * 1982-12-29 1985-06-18 Olin Corporation Semiconductor packages
US4703338A (en) * 1983-10-14 1987-10-27 Daicel Chemical Industries, Ltd. Resin composition to seal electronic device
US4783697A (en) * 1985-01-07 1988-11-08 Motorola, Inc. Leadless chip carrier for RF power transistors or the like

Also Published As

Publication number Publication date
EP0447884B1 (en) 1998-07-01
US5117279A (en) 1992-05-26
DE69129668D1 (de) 1998-08-06
DE69129668T2 (de) 1999-03-11
EP0447884A2 (en) 1991-09-25
EP0447884A3 (cg-RX-API-DMAC7.html) 1994-02-23
JPH0621251A (ja) 1994-01-28

Similar Documents

Publication Publication Date Title
JP3010784B2 (ja) 低温紫外線硬化型エポキシ封止を有する半導体デバイスとその製法
KR100336329B1 (ko) 반도체장치의제조방법
TWI316740B (en) Package having exposed integrated circuit device
US6984545B2 (en) Methods of encapsulating selected locations of a semiconductor die assembly using a thick solder mask
US5958100A (en) Process of making a glass semiconductor package
US5650915A (en) Thermally enhanced molded cavity package having a parallel lid
KR100237328B1 (ko) 반도체 패키지의 구조 및 제조방법
JP4362366B2 (ja) 半導体回路素子のエアキャビティパッケージの形成方法
US7413926B2 (en) Methods of making microelectronic packages
JPWO2000002243A1 (ja) 半導体装置及びその製造方法、回路基板並びに電子機器
CN1306476A (zh) 电子器件胶粘剂预制盖的制造方法
JPH02342A (ja) 集積回路チツプ取付けおよびパツケ−ジ組立体
US6989296B2 (en) Fabrication method of semiconductor package with photosensitive chip
US5757068A (en) Carrier film with peripheral slits
JP3305477B2 (ja) 半導体装置とその製造方法及びその実装構造と実装方法
JPH08107167A (ja) 半導体装置
US20050029641A1 (en) Semiconductor device and manufacturing method of the same
JP3414755B2 (ja) マイクロエレクトロニクス部品の液体樹脂カプセル化素材をマイクロ波エネルギーによって硬化するためのシステムおよび方法
EP1251566A1 (en) Low profile optically-sensitive semiconductor package
JP2002100710A (ja) 半導体装置および半導体装置の製造方法
JP2000124401A (ja) 半導体装置
EP0892986A1 (en) Curing liquid resin encapsulants of microelectronics components with microwave energy
JPH0883870A (ja) 樹脂封止型半導体装置
JP2002057182A (ja) 半導体装置
JPH06310621A (ja) 半導体パッケージ及びその製造方法

Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees