JP2817685B2 - 半導体メモリ - Google Patents
半導体メモリInfo
- Publication number
- JP2817685B2 JP2817685B2 JP7311238A JP31123895A JP2817685B2 JP 2817685 B2 JP2817685 B2 JP 2817685B2 JP 7311238 A JP7311238 A JP 7311238A JP 31123895 A JP31123895 A JP 31123895A JP 2817685 B2 JP2817685 B2 JP 2817685B2
- Authority
- JP
- Japan
- Prior art keywords
- data
- output
- signal
- input
- reference clock
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000004065 semiconductor Substances 0.000 title claims description 21
- 238000000034 method Methods 0.000 claims description 35
- 230000006870 function Effects 0.000 claims description 15
- 238000003491 array Methods 0.000 claims description 4
- 230000001360 synchronised effect Effects 0.000 description 12
- 238000010586 diagram Methods 0.000 description 11
- 102100023882 Endoribonuclease ZC3H12A Human genes 0.000 description 7
- 101710112715 Endoribonuclease ZC3H12A Proteins 0.000 description 7
- 238000006243 chemical reaction Methods 0.000 description 7
- QGVYYLZOAMMKAH-UHFFFAOYSA-N pegnivacogin Chemical compound COCCOC(=O)NCCCCC(NC(=O)OCCOC)C(=O)NCCCCCCOP(=O)(O)O QGVYYLZOAMMKAH-UHFFFAOYSA-N 0.000 description 7
- 230000008569 process Effects 0.000 description 7
- 241000497429 Obus Species 0.000 description 4
- 102100037364 Craniofacial development protein 1 Human genes 0.000 description 3
- 101000880187 Homo sapiens Craniofacial development protein 1 Proteins 0.000 description 3
- 230000004913 activation Effects 0.000 description 3
- XJCLWVXTCRQIDI-UHFFFAOYSA-N Sulfallate Chemical compound CCN(CC)C(=S)SCC(Cl)=C XJCLWVXTCRQIDI-UHFFFAOYSA-N 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 230000000295 complement effect Effects 0.000 description 2
- 230000007257 malfunction Effects 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 102100027152 Dihydrolipoyllysine-residue acetyltransferase component of pyruvate dehydrogenase complex, mitochondrial Human genes 0.000 description 1
- 101001122360 Homo sapiens Dihydrolipoyllysine-residue acetyltransferase component of pyruvate dehydrogenase complex, mitochondrial Proteins 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1015—Read-write modes for single port memories, i.e. having either a random port or a serial port
- G11C7/1018—Serial bit line access mode, e.g. using bit line address shift registers, bit line address counters, bit line burst counters
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1072—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers for memories with random access ports synchronised on clock signal pulse trains, e.g. synchronous memories, self timed memories
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Dram (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7311238A JP2817685B2 (ja) | 1995-11-29 | 1995-11-29 | 半導体メモリ |
| KR1019960061457A KR100225189B1 (ko) | 1995-11-29 | 1996-11-29 | 반도체 메모리 |
| US08/758,367 US5805504A (en) | 1995-11-29 | 1996-11-29 | Synchronous semiconductor memory having a burst transfer mode with a plurality of subarrays accessible in parallel via an input buffer |
| TW085114750A TW314626B (enExample) | 1995-11-29 | 1996-11-29 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7311238A JP2817685B2 (ja) | 1995-11-29 | 1995-11-29 | 半導体メモリ |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH09153278A JPH09153278A (ja) | 1997-06-10 |
| JP2817685B2 true JP2817685B2 (ja) | 1998-10-30 |
Family
ID=18014761
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7311238A Expired - Fee Related JP2817685B2 (ja) | 1995-11-29 | 1995-11-29 | 半導体メモリ |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US5805504A (enExample) |
| JP (1) | JP2817685B2 (enExample) |
| KR (1) | KR100225189B1 (enExample) |
| TW (1) | TW314626B (enExample) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USRE39579E1 (en) * | 1997-04-04 | 2007-04-17 | Renesas Technology Corp. | Semiconductor integrated circuit device comprising RAM with command decode system and logic circuit integrated into a single chip and testing method of the RAM with command decode system |
| JP3001475B2 (ja) * | 1997-08-28 | 2000-01-24 | 日本電気アイシーマイコンシステム株式会社 | 半導体記憶装置 |
| US6078987A (en) * | 1997-09-30 | 2000-06-20 | Sun Microsystems, Inc. | Translation look aside buffer having separate RAM arrays which are accessable with separate enable signals |
| JPH11203860A (ja) | 1998-01-07 | 1999-07-30 | Nec Corp | 半導体記憶装置 |
| DE19964449B4 (de) * | 1998-06-30 | 2013-01-31 | Fujitsu Semiconductor Ltd. | Integrierte Halbleiterschaltung |
| JP4756724B2 (ja) | 2000-02-24 | 2011-08-24 | エルピーダメモリ株式会社 | 半導体記憶装置 |
| KR100496857B1 (ko) * | 2002-05-17 | 2005-06-22 | 삼성전자주식회사 | 외부적으로 데이터 로드 신호를 갖는 반도체 메모리 장치및 이 반도체 메모리 장치의 직렬 데이터의 병렬데이터로의 프리패치 방법 |
| KR100582411B1 (ko) * | 2003-10-31 | 2006-05-22 | 주식회사 하이닉스반도체 | 출력되는 데이터의 스큐 및 타이밍 에러를 방지할 수 있는반도체 메모리 장치 |
| US7558933B2 (en) * | 2003-12-24 | 2009-07-07 | Ati Technologies Inc. | Synchronous dynamic random access memory interface and method |
| KR101510452B1 (ko) * | 2008-06-11 | 2015-04-10 | 삼성전자주식회사 | 그래픽 메모리의 데이터 라이트 제어 방법 및 그 장치 |
| US10395753B2 (en) * | 2014-08-28 | 2019-08-27 | Winbond Electronics Corp. | Semiconductor memory device and programming method thereof |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4683555A (en) * | 1985-01-22 | 1987-07-28 | Texas Instruments Incorporated | Serial accessed semiconductor memory with reconfigureable shift registers |
| JPS63250149A (ja) * | 1987-04-07 | 1988-10-18 | Mitsubishi Electric Corp | 半導体装置 |
| US5222047A (en) * | 1987-05-15 | 1993-06-22 | Mitsubishi Denki Kabushiki Kaisha | Method and apparatus for driving word line in block access memory |
| JPH04176089A (ja) * | 1990-11-08 | 1992-06-23 | Nec Corp | メモリ装置 |
| JPH04326138A (ja) * | 1991-04-25 | 1992-11-16 | Fujitsu Ltd | 高速メモリic |
| US5384745A (en) * | 1992-04-27 | 1995-01-24 | Mitsubishi Denki Kabushiki Kaisha | Synchronous semiconductor memory device |
| JPH0636560A (ja) * | 1992-07-21 | 1994-02-10 | Mitsubishi Electric Corp | 半導体記憶装置 |
| US5617555A (en) * | 1995-11-30 | 1997-04-01 | Alliance Semiconductor Corporation | Burst random access memory employing sequenced banks of local tri-state drivers |
-
1995
- 1995-11-29 JP JP7311238A patent/JP2817685B2/ja not_active Expired - Fee Related
-
1996
- 1996-11-29 US US08/758,367 patent/US5805504A/en not_active Expired - Lifetime
- 1996-11-29 TW TW085114750A patent/TW314626B/zh active
- 1996-11-29 KR KR1019960061457A patent/KR100225189B1/ko not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| TW314626B (enExample) | 1997-09-01 |
| JPH09153278A (ja) | 1997-06-10 |
| KR970029843A (ko) | 1997-06-26 |
| US5805504A (en) | 1998-09-08 |
| KR100225189B1 (ko) | 1999-10-15 |
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|---|---|---|
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| KR100578233B1 (ko) | 동기식메모리장치의 데이터 입출력 가변제어장치 | |
| KR100194571B1 (ko) | 반도체 메모리 및 그 기입 방법 | |
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