|
JP2879798B2
(ja)
*
|
1988-09-13 |
1999-04-05 |
パーティクル、メジュアリング、システムズ インコーポレーテッド |
粒子寸法検出装置に使用するための粒子検出装置
|
|
US4984889A
(en)
*
|
1989-03-10 |
1991-01-15 |
Pacific Scientific Company |
Particle size measuring system with coincidence detection
|
|
US5061065A
(en)
*
|
1989-10-20 |
1991-10-29 |
Pacific Scientific Company |
Particle contamination detection in fluids through the external section of a laser
|
|
US5092675A
(en)
*
|
1989-11-14 |
1992-03-03 |
Pacific Scientific Company |
Vacuum line particle detector with slab laser
|
|
US5084629A
(en)
*
|
1990-05-07 |
1992-01-28 |
Met One, Inc. |
Split flow uniform multisensor detection
|
|
US5282151A
(en)
*
|
1991-02-28 |
1994-01-25 |
Particle Measuring Systems, Inc. |
Submicron diameter particle detection utilizing high density array
|
|
JP3318397B2
(ja)
*
|
1992-08-27 |
2002-08-26 |
興和株式会社 |
微粒子計測装置
|
|
US5467189A
(en)
*
|
1993-01-22 |
1995-11-14 |
Venturedyne, Ltd. |
Improved particle sensor and method for assaying a particle
|
|
US5459569A
(en)
*
|
1993-04-21 |
1995-10-17 |
Particle Measuring Systems, Inc. |
Nonintrusive modular particle detecting device
|
|
JP2529661B2
(ja)
*
|
1993-08-20 |
1996-08-28 |
アネルバ株式会社 |
粒子検出装置
|
|
JPH07306133A
(ja)
*
|
1994-03-14 |
1995-11-21 |
Hitachi Electron Eng Co Ltd |
微粒子検出器
|
|
US5493123A
(en)
*
|
1994-04-28 |
1996-02-20 |
Particle Measuring Systems, Inc. |
Surface defect inspection system and method
|
|
US5565984A
(en)
*
|
1995-06-12 |
1996-10-15 |
Met One, Inc. |
Re-entrant illumination system for particle measuring device
|
|
US5751422A
(en)
*
|
1996-02-26 |
1998-05-12 |
Particle Measuring Systems, Inc. |
In-situ particle detection utilizing optical coupling
|
|
US5726753A
(en)
*
|
1996-02-26 |
1998-03-10 |
Research Electro-Optics, Inc. |
Intracavity particle detection using optically pumped laser media
|
|
US5642193A
(en)
*
|
1996-03-08 |
1997-06-24 |
Met One, Inc. |
Particle counter employing a solid-state laser with an intracavity view volume
|
|
US5671046A
(en)
*
|
1996-07-01 |
1997-09-23 |
Particle Measuring Systems, Inc. |
Device and method for optically detecting particles in a free liquid stream
|
|
US5920388A
(en)
*
|
1996-10-15 |
1999-07-06 |
Research Electro-Optics, Inc. |
Small particle characteristic determination
|
|
JP2956653B2
(ja)
*
|
1996-12-16 |
1999-10-04 |
日本電気株式会社 |
パーティクルモニター装置
|
|
US5805281A
(en)
*
|
1997-04-21 |
1998-09-08 |
Particle Measuring Systems |
Noise reduction utilizing signal multiplication
|
|
US6031610A
(en)
*
|
1997-10-06 |
2000-02-29 |
Pacific Scientific Instruments Company |
Multi-lobe pump for particle counters
|
|
DE19752033A1
(de)
*
|
1997-11-24 |
1999-06-10 |
Andreas Trampe |
Vorrichtung zur Detektion von Partikeln mit nicht abbildenden optischen Strukturen
|
|
US6346983B1
(en)
|
1998-01-29 |
2002-02-12 |
Aleksandr L. Yufa |
Methods and wireless communicating particle counting and measuring apparatus
|
|
US6137572A
(en)
*
|
1998-02-27 |
2000-10-24 |
Pacific Scientific Instruments Company |
High sensitivity optical fluid-borne particle detection
|
|
US5946092A
(en)
*
|
1998-02-27 |
1999-08-31 |
Pacific Scientific Instruments Company |
Dual laser heterodyne optical particle detection technique
|
|
US6061132A
(en)
*
|
1998-07-20 |
2000-05-09 |
Pacific Scientific Instruments Company |
Dual detector array with noise cancellation for a particle size detection device
|
|
EP0992829A1
(en)
*
|
1998-10-07 |
2000-04-12 |
Scott R. Johnson |
Image projection system
|
|
US7006682B1
(en)
*
|
1999-09-09 |
2006-02-28 |
Nec Corporation |
Apparatus for monitoring particles and method of doing the same
|
|
JP3818867B2
(ja)
*
|
2000-05-12 |
2006-09-06 |
リオン株式会社 |
光散乱式粒子検出器
|
|
US6723975B2
(en)
*
|
2001-02-07 |
2004-04-20 |
Honeywell International Inc. |
Scanner for airborne laser system
|
|
US6696362B2
(en)
*
|
2001-02-08 |
2004-02-24 |
Applied Materials Inc. |
Method for using an in situ particle sensor for monitoring particle performance in plasma deposition processes
|
|
EP1432972A1
(en)
*
|
2001-09-07 |
2004-06-30 |
Inficon, Inc. |
Signal processing method for in-situ, scanned-beam particle monitoring
|
|
US6639671B1
(en)
|
2002-03-01 |
2003-10-28 |
Msp Corporation |
Wide-range particle counter
|
|
US6879398B2
(en)
*
|
2002-05-22 |
2005-04-12 |
Lockheed Martin Corporation |
Distributed contaminant optical monitoring system
|
|
AU2003253959A1
(en)
*
|
2002-07-16 |
2004-02-02 |
Research Electro-Optics, Inc. |
Method of noise cancellation in an unpolarized-laser instrument
|
|
US7295585B2
(en)
*
|
2002-07-16 |
2007-11-13 |
Research Electro-Optics, Inc. |
Method for noise cancellation by spectral flattening of laser output in a multi-line-laser instrument
|
|
US7576857B2
(en)
*
|
2002-08-27 |
2009-08-18 |
Particle Measuring Systems, Inc. |
Particle counter with laser diode
|
|
US6936828B2
(en)
*
|
2003-02-14 |
2005-08-30 |
Honeywell International Inc. |
Particle detection system and method
|
|
US7023620B1
(en)
|
2003-07-03 |
2006-04-04 |
Research Electro-Optics, Inc. |
Beam array pitch controller
|
|
US6909102B1
(en)
|
2004-01-21 |
2005-06-21 |
Varian Semiconductor Equipment Associates, Inc. |
Ion implanter system, method and program product including particle detection
|
|
GB2411002B
(en)
*
|
2004-02-11 |
2006-12-20 |
Facility Monitoring Systems Lt |
Particle counter for liquids
|
|
US20060014300A1
(en)
*
|
2004-07-15 |
2006-01-19 |
Maurer Scott M |
Sensor for detection and identification of biological particles
|
|
US7030980B1
(en)
|
2004-12-29 |
2006-04-18 |
Particle Measuring Systems, Inc. |
Diode pumped intracavity laser particle counter with improved reliability and reduced noise
|
|
US7456960B2
(en)
*
|
2005-06-06 |
2008-11-25 |
Particle Measuring Systems, Inc. |
Particle counter with improved image sensor array
|
|
JP2010522333A
(ja)
*
|
2007-03-23 |
2010-07-01 |
パーティクル・メージャーリング・システムズ・インコーポレーテッド |
排出冷却式光源を備えた光学式パーティクルセンサ
|
|
WO2009073649A1
(en)
*
|
2007-12-04 |
2009-06-11 |
Particle Measuring Systems, Inc. |
Non-orthogonal particle detection systems and methods
|
|
JPWO2011016355A1
(ja)
*
|
2009-08-04 |
2013-01-10 |
シャープ株式会社 |
微生物を検出するための検出装置および検出方法
|
|
CN102625909B
(zh)
|
2009-08-24 |
2015-06-17 |
粒子监测系统有限公司 |
流监测的粒子传感器
|
|
DE102011000099A1
(de)
*
|
2011-01-11 |
2012-07-12 |
Universität Duisburg-Essen |
Analyseeinrichtung zur Analyse eines Aerosols
|
|
SG11201402528TA
(en)
|
2011-12-01 |
2014-10-30 |
P M L Particles Monitoring Technologies Ltd |
Detection scheme for particle size and concentration measurement
|
|
US8477307B1
(en)
|
2012-01-26 |
2013-07-02 |
Ann Rachel Yufa |
Methods and apparatus for biomedical agent multi-dimension measuring and analysis
|
|
US11579072B2
(en)
|
2013-03-15 |
2023-02-14 |
Particles Plus, Inc. |
Personal air quality monitoring system
|
|
US10352844B2
(en)
|
2013-03-15 |
2019-07-16 |
Particles Plus, Inc. |
Multiple particle sensors in a particle counter
|
|
US12044611B2
(en)
|
2013-03-15 |
2024-07-23 |
Particles Plus, Inc. |
Particle counter with integrated bootloader
|
|
US9677990B2
(en)
|
2014-04-30 |
2017-06-13 |
Particles Plus, Inc. |
Particle counter with advanced features
|
|
US10983040B2
(en)
|
2013-03-15 |
2021-04-20 |
Particles Plus, Inc. |
Particle counter with integrated bootloader
|
|
ITRM20130128U1
(it)
|
2013-07-23 |
2015-01-24 |
Particle Measuring Systems S R L |
Dispositivo per il campionamento microbico dell'aria
|
|
US9631222B2
(en)
|
2014-03-14 |
2017-04-25 |
Particle Measuring Systems, Inc. |
Filter and blower geometry for particle sampler
|
|
US9810558B2
(en)
|
2014-03-14 |
2017-11-07 |
Particle Measuring Systems, Inc. |
Pressure-based airflow sensing in particle impactor systems
|
|
JP6531528B2
(ja)
*
|
2015-07-15 |
2019-06-19 |
富士電機株式会社 |
粒子検出装置
|
|
US10094755B1
(en)
|
2017-10-25 |
2018-10-09 |
Venturedyne, Ltd |
Environmental sensor and method of operating the same
|
|
KR102601473B1
(ko)
|
2017-10-26 |
2023-11-10 |
파티클 머슈어링 시스템즈, 인크. |
입자 측정을 위한 시스템 및 방법
|
|
US10359350B1
(en)
*
|
2018-01-23 |
2019-07-23 |
Hai Lin |
Method and system for particle characterization in harsh environments
|
|
US10444137B2
(en)
|
2018-01-23 |
2019-10-15 |
Cbrn International, Ltd. |
Bioaerosol detector having safeguards
|
|
US11320360B2
(en)
|
2018-08-31 |
2022-05-03 |
Particle Measuring Systems, Inc. |
Fluid refractive index optimizing particle counter
|
|
WO2020051131A1
(en)
|
2018-09-04 |
2020-03-12 |
Particle Measuring Systems, Inc. |
Detecting nanoparticles on production equipment and surfaces
|
|
US11181455B2
(en)
|
2018-11-12 |
2021-11-23 |
Particle Measuring Systems, Inc. |
Calibration verification for optical particle analyzers
|
|
US11385161B2
(en)
|
2018-11-12 |
2022-07-12 |
Particle Measuring Systems, Inc. |
Calibration verification for optical particle analyzers
|
|
CN113039423B
(zh)
|
2018-11-16 |
2024-09-06 |
粒子监测系统有限公司 |
用于机器人控制的制造屏障系统的粒子采样系统和方法
|
|
WO2020102299A1
(en)
|
2018-11-16 |
2020-05-22 |
Particle Measuring Systems, Inc. |
Slurry monitor coupling bulk size distribution and single particle detection
|
|
EP3959505B1
(en)
|
2019-04-25 |
2024-05-08 |
Particle Measuring Systems, Inc. |
Particle detection systems and methods for on-axis particle detection and/or differential detection
|
|
WO2021041420A1
(en)
|
2019-08-26 |
2021-03-04 |
Particle Measuring Systems, Inc |
Triggered sampling systems and methods
|
|
WO2021071793A1
(en)
|
2019-10-07 |
2021-04-15 |
Particle Measuring Systems, Inc. |
Antimicrobial particle detectors
|
|
WO2021071792A1
(en)
|
2019-10-07 |
2021-04-15 |
Particle Measuring Systems, Inc. |
Particle detectors with remote alarm monitoring and control
|
|
IT201900020248A1
(it)
|
2019-11-04 |
2021-05-04 |
Particle Measuring Systems S R L |
Dispositivo di monitoraggio mobile per aree a contaminazione controllata
|
|
KR102886900B1
(ko)
|
2019-11-22 |
2025-11-14 |
파티클 머슈어링 시스템즈, 인크. |
간섭 입자 검출 및 작은 크기의 입자들 검출을 위한 고급 시스템 및 방법
|
|
WO2021150472A1
(en)
|
2020-01-21 |
2021-07-29 |
Particle Measuring Systems, Inc. |
Robotic control for aseptic processing
|
|
US11988591B2
(en)
|
2020-07-01 |
2024-05-21 |
Particles Plus, Inc. |
Modular optical particle counter sensor and apparatus
|
|
US11846578B2
(en)
*
|
2020-09-28 |
2023-12-19 |
Lighthouse Worldwide Solutions |
Apparatus and method for characterization of particles
|
|
WO2022266029A1
(en)
|
2021-06-15 |
2022-12-22 |
Particle Measuring Systems, Inc. |
Condensation particle counters and methods of use
|
|
KR20240019343A
(ko)
|
2021-06-15 |
2024-02-14 |
파티클 머슈어링 시스템즈, 인크. |
도킹 스테이션을 갖춘 모듈식 입자 계수기
|
|
CN117501087A
(zh)
|
2021-06-15 |
2024-02-02 |
粒子监测系统有限公司 |
紧凑型智能气溶胶和流体歧管
|
|
US12326393B2
(en)
|
2022-01-21 |
2025-06-10 |
Particle Measuring Systems, Inc. |
Enhanced dual-pass and multi-pass particle detection
|
|
US12461010B2
(en)
|
2023-11-16 |
2025-11-04 |
Particle Measuring Systems, Inc. |
Systems and methods for reducing false positive particle detection events in a particle detector
|
|
CN121026889A
(zh)
*
|
2025-10-31 |
2025-11-28 |
雅安宇焜芯材材料科技有限公司 |
一种氮化镓生产用排气粉尘检测装置及处理系统、方法
|