JP6531528B2 - 粒子検出装置 - Google Patents
粒子検出装置 Download PDFInfo
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- JP6531528B2 JP6531528B2 JP2015141328A JP2015141328A JP6531528B2 JP 6531528 B2 JP6531528 B2 JP 6531528B2 JP 2015141328 A JP2015141328 A JP 2015141328A JP 2015141328 A JP2015141328 A JP 2015141328A JP 6531528 B2 JP6531528 B2 JP 6531528B2
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- scattered light
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- incandescent light
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- 239000002245 particle Substances 0.000 title claims description 100
- 238000001514 detection method Methods 0.000 claims description 60
- 238000000034 method Methods 0.000 claims description 17
- 238000006243 chemical reaction Methods 0.000 description 12
- 238000010586 diagram Methods 0.000 description 12
- 230000003287 optical effect Effects 0.000 description 9
- 239000003738 black carbon Substances 0.000 description 8
- 239000013078 crystal Substances 0.000 description 7
- 239000011248 coating agent Substances 0.000 description 4
- 238000000576 coating method Methods 0.000 description 4
- 239000000446 fuel Substances 0.000 description 3
- 238000003384 imaging method Methods 0.000 description 3
- 230000005457 Black-body radiation Effects 0.000 description 2
- 230000006698 induction Effects 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 239000002028 Biomass Substances 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 208000032538 Depersonalisation Diseases 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000003245 coal Substances 0.000 description 1
- 238000002485 combustion reaction Methods 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/10—Investigating individual particles
- G01N15/14—Optical investigation techniques, e.g. flow cytometry
- G01N15/1434—Optical arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/10—Investigating individual particles
- G01N15/14—Optical investigation techniques, e.g. flow cytometry
- G01N15/1456—Optical investigation techniques, e.g. flow cytometry without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals
- G01N15/1459—Optical investigation techniques, e.g. flow cytometry without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals the analysis being performed on a sample stream
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/06—Investigating concentration of particle suspensions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/10—Investigating individual particles
- G01N15/14—Optical investigation techniques, e.g. flow cytometry
- G01N15/1429—Signal processing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/06—Investigating concentration of particle suspensions
- G01N15/075—Investigating concentration of particle suspensions by optical means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N2015/0042—Investigating dispersion of solids
- G01N2015/0046—Investigating dispersion of solids in gas, e.g. smoke
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/10—Investigating individual particles
- G01N15/14—Optical investigation techniques, e.g. flow cytometry
- G01N2015/1486—Counting the particles
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/10—Investigating individual particles
- G01N15/14—Optical investigation techniques, e.g. flow cytometry
- G01N2015/1493—Particle size
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
Landscapes
- Chemical & Material Sciences (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Dispersion Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Signal Processing (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Description
2 白熱光検出部
3 第1のピークホールド回路
4 第2のピークホールド回路
5、6 AD変換回路
7 閾値比較回路
8 CPU
9 粒径設定回路
10、11 リセット回路
12 表示装置
101 検出チャンバ
102 粒子導入部
103 レーザ発光部
104 検出部
105 信号処理部
Claims (1)
- 粒子からの散乱光及び白熱光を検出する粒子検出装置において、
レーザ照射により前記粒子の散乱光強度を検出する散乱光検出部と、
前記レーザ照射により前記粒子の白熱光強度を検出する白熱光検出部と、
前記散乱光検出部及び前記白熱光検出部から取得した信号を処理する信号処理部と、を備え、
前記信号処理部は、
前記散乱光検出部から取得した散乱光強度の波高値をピークホールドする第1のピークホールド回路と、
前記白熱光検出部から取得した白熱光強度の波高値をピークホールドする第2のピークホールド回路と、
前記第1のピークホールド回路からの信号値と閾値とを比較し、前記信号値が前記閾値を超えたときに前記第2のピークホールド回路にリセット信号を送る閾値比較回路と、
を有することを特徴とする粒子検出装置。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015141328A JP6531528B2 (ja) | 2015-07-15 | 2015-07-15 | 粒子検出装置 |
CN201610405269.7A CN106353239B (zh) | 2015-07-15 | 2016-06-08 | 粒子检测装置 |
US15/177,593 US9851292B2 (en) | 2015-07-15 | 2016-06-09 | Particle detection device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015141328A JP6531528B2 (ja) | 2015-07-15 | 2015-07-15 | 粒子検出装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2017020995A JP2017020995A (ja) | 2017-01-26 |
JP6531528B2 true JP6531528B2 (ja) | 2019-06-19 |
Family
ID=57775818
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2015141328A Expired - Fee Related JP6531528B2 (ja) | 2015-07-15 | 2015-07-15 | 粒子検出装置 |
Country Status (3)
Country | Link |
---|---|
US (1) | US9851292B2 (ja) |
JP (1) | JP6531528B2 (ja) |
CN (1) | CN106353239B (ja) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7056178B2 (ja) * | 2018-01-30 | 2022-04-19 | 富士通株式会社 | 測定装置及び測定方法 |
EP3640878B1 (fr) * | 2018-10-17 | 2023-06-21 | Swatch Ag | Procede et systeme d'activation d'un objet portable de paiement sans contact |
CN111122400B (zh) * | 2018-10-30 | 2021-10-22 | 宁波方太厨具有限公司 | 一种油烟检测装置及油烟检测方法 |
DE102018219891A1 (de) * | 2018-11-20 | 2020-05-20 | Robert Bosch Gmbh | Verfahren zum Betreiben eines Partikelsensors |
DE102018221701A1 (de) * | 2018-12-13 | 2020-06-18 | Robert Bosch Gmbh | Verfahren zur Verarbeitung des Signals eines Partikelsensors, der nach dem Prinzip der laserinduzierten Inkandeszenz arbeitet, Anordnung zur Verarbeitung eines solchen Signals, sowie Partikelsensor |
DE102019200775A1 (de) * | 2019-01-23 | 2020-07-23 | Robert Bosch Gmbh | Sensoreinrichtung zur Detektion von Partikeln oder Aerosol in einem strömenden Fluid unter Verwendung des Prinzips der laserinduzierten Inkandeszenz |
IT202000012256A1 (it) * | 2020-05-25 | 2021-11-25 | Rigel S R L | Metodo e dispositivo di monitoraggio particellare in continuo |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
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JPS5385452A (en) * | 1977-01-06 | 1978-07-27 | Canon Inc | Range finder |
US4361825A (en) * | 1980-05-16 | 1982-11-30 | Southern Railway Company | Automatic train-line air brake pressure monitoring system |
US4571079A (en) * | 1983-12-29 | 1986-02-18 | Particle Measuring Systems, Inc. | Aerosol sampling device and method with improved sample flow characteristics |
JPS6135332A (ja) * | 1984-07-28 | 1986-02-19 | Japan Spectroscopic Co | 微小粒子分析装置 |
US4798465B2 (en) * | 1986-04-14 | 1994-08-30 | Particle Measuring Syst | Particle size detection device having high sensitivity in high molecular scattering environment |
JPH0652232B2 (ja) * | 1986-08-29 | 1994-07-06 | 東亜医用電子株式会社 | 信号処理方法および装置 |
US5367474A (en) * | 1993-02-08 | 1994-11-22 | Coulter Corporation | Flow cytometer |
JP2962218B2 (ja) * | 1995-02-24 | 1999-10-12 | 日本電気株式会社 | ディジタル光受信回路 |
US5822104A (en) * | 1995-02-24 | 1998-10-13 | Nec Corporation | Digital optical receiving apparatus |
US5920388A (en) * | 1996-10-15 | 1999-07-06 | Research Electro-Optics, Inc. | Small particle characteristic determination |
JP3928347B2 (ja) * | 2000-10-10 | 2007-06-13 | 富士電機システムズ株式会社 | 微粒子カウント式濁度計および微粒子カウンタ用の電子回路 |
US20030048433A1 (en) * | 2001-06-01 | 2003-03-13 | Jean-Marie Desjonqueres | Cytometer signal processing system and method |
BR0312793A (pt) * | 2002-07-19 | 2005-05-03 | Columbian Chem | Amostragem de negro de carbono para medição de área de superfìcie de partìcula usando incandescência induzida por laser e processo de controle em reator baseado nisso |
JP4093971B2 (ja) * | 2004-02-12 | 2008-06-04 | シャープ株式会社 | 光学式移動情報検出装置および移動情報検出システムおよび電子機器およびエンコーダ |
US7327977B2 (en) * | 2004-11-30 | 2008-02-05 | Seiko Epson Corporation | Image forming apparatus and correction method for color registration offset |
WO2008118353A1 (en) * | 2007-03-23 | 2008-10-02 | Beckman Coulter, Inc. | Multi-gain adaptive linear processing and gated digital system for use in flow cytometry |
CN102135492A (zh) * | 2010-01-25 | 2011-07-27 | 北京汇丰隆生物科技发展有限公司 | 一种连续光激光粒子分析仪 |
JP2012088178A (ja) | 2010-10-20 | 2012-05-10 | Univ Of Tokyo | 微粒子形状分析装置 |
JPWO2012140867A1 (ja) * | 2011-04-11 | 2014-07-28 | パナソニック株式会社 | 情報記録媒体、トラッキング方法及び光情報装置 |
-
2015
- 2015-07-15 JP JP2015141328A patent/JP6531528B2/ja not_active Expired - Fee Related
-
2016
- 2016-06-08 CN CN201610405269.7A patent/CN106353239B/zh not_active Expired - Fee Related
- 2016-06-09 US US15/177,593 patent/US9851292B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
US20170016820A1 (en) | 2017-01-19 |
CN106353239A (zh) | 2017-01-25 |
US9851292B2 (en) | 2017-12-26 |
JP2017020995A (ja) | 2017-01-26 |
CN106353239B (zh) | 2020-05-15 |
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