JP2709230B2 - ２つのコンデンサの容量値の商を測定する回路装置 - Google Patents

２つのコンデンサの容量値の商を測定する回路装置

Info

Publication number
JP2709230B2
JP2709230B2 JP4044614A JP4461492A JP2709230B2 JP 2709230 B2 JP2709230 B2 JP 2709230B2 JP 4044614 A JP4044614 A JP 4044614A JP 4461492 A JP4461492 A JP 4461492A JP 2709230 B2 JP2709230 B2 JP 2709230B2
Authority
JP
Japan
Prior art keywords
signal
capacitors
voltage
capacitor
quotient
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP4044614A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0580096A (ja
Inventor
マリーヌス ファン ゼータース ヨーゼフス
Original Assignee
ライカ ヘールブルッグ アクチエンゲゼルシャフト
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ライカ ヘールブルッグ アクチエンゲゼルシャフト filed Critical ライカ ヘールブルッグ アクチエンゲゼルシャフト
Publication of JPH0580096A publication Critical patent/JPH0580096A/ja
Application granted granted Critical
Publication of JP2709230B2 publication Critical patent/JP2709230B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Measuring Fluid Pressure (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
JP4044614A 1991-03-08 1992-03-02 ２つのコンデンサの容量値の商を測定する回路装置 Expired - Lifetime JP2709230B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE4107366A DE4107366C1 (enrdf_load_stackoverflow) 1991-03-08 1991-03-08
DE4107366.5 1991-03-08

Publications (2)

Publication Number Publication Date
JPH0580096A JPH0580096A (ja) 1993-03-30
JP2709230B2 true JP2709230B2 (ja) 1998-02-04

Family

ID=6426719

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4044614A Expired - Lifetime JP2709230B2 (ja) 1991-03-08 1992-03-02 ２つのコンデンサの容量値の商を測定する回路装置

Country Status (4)

Country Link
US (1) US5283528A (enrdf_load_stackoverflow)
EP (1) EP0503272B1 (enrdf_load_stackoverflow)
JP (1) JP2709230B2 (enrdf_load_stackoverflow)
DE (2) DE4107366C1 (enrdf_load_stackoverflow)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2999088B2 (ja) * 1993-04-28 2000-01-17 株式会社日立製作所 エアバッグシステム
DE4326666C1 (de) * 1993-08-09 1995-02-23 Wild Heerbrugg Ag Kapazitiver Sensor
DE19513022C1 (de) * 1995-04-06 1996-08-14 Siemens Ag Schaltungsanordnung und Verfahren zur Bestimmung von Kapazitätsdifferenzen
US5594353A (en) * 1995-05-11 1997-01-14 Elsag International N.V. Method and apparatus for measuring the change in capacitance values in dual capacitors
DE19528384C2 (de) * 1995-08-02 1999-09-30 Ulrich Pok Kapazitive Meßeinrichtung zur kontinuierlichen Standregelung für Medien unterschiedlicher Dielektrizitätskonstanten
DE19841715A1 (de) * 1998-09-11 2000-03-30 Siemens Ag Überwachungsverfahren und Überwachungsvorrichtung für ein Filter
JP4014326B2 (ja) * 1999-02-18 2007-11-28 本田技研工業株式会社 静電容量式傾斜センサ
US6356086B1 (en) * 1999-04-12 2002-03-12 Sencore, Inc. Method and apparatus for the in-circuit testing of a capacitor
US6509745B1 (en) * 2000-09-25 2003-01-21 Detroit Diesel Corporation Method and apparatus for measuring liquid dielectric behavior
GB2404443B (en) * 2003-07-28 2007-08-01 Automotive Electronics Ltd Ab Capacitive sensor
US7124634B2 (en) * 2003-07-29 2006-10-24 The Boeing Company Single plate capacitive acceleration derivative detector
US7116091B2 (en) * 2004-03-04 2006-10-03 Zircon Corporation Ratiometric stud sensing
US7148703B2 (en) * 2004-05-14 2006-12-12 Zircon Corporation Auto-deep scan for capacitive sensing
US7310577B2 (en) * 2004-09-29 2007-12-18 The Boeing Company Integrated capacitive bridge and integrated flexure functions inertial measurement unit
US7360425B2 (en) * 2004-11-22 2008-04-22 The Boeing Company Compensated composite structure
US7228739B2 (en) 2004-11-23 2007-06-12 The Boeing Company Precision flexure plate
US7331229B2 (en) * 2004-12-09 2008-02-19 The Boeing Company Magnetic null accelerometer
US7137208B2 (en) * 2004-12-14 2006-11-21 The Boeing Company Leveling device
US7296470B2 (en) * 2005-04-14 2007-11-20 The Boeing Company Extended accuracy flexured plate dual capacitance accelerometer
USD642082S1 (en) 2009-09-18 2011-07-26 Abb Technology Ag Capacitance meter
EP2299285A1 (en) * 2009-09-18 2011-03-23 ABB Technology AG Capacitance meter, method, and computer program product for improved capacitance measurement
EP2299284A1 (en) * 2009-09-18 2011-03-23 ABB Technology AG Method, capacitance meter, and computer program product for improved capacitance measurement
ES2376453B1 (es) * 2010-02-25 2013-01-29 Micromag 2000 S.L. Sistema sensor capacitivo para dispositivos de protección perimetral.

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4386312A (en) * 1981-04-24 1983-05-31 Setra Systems, Inc. Linear capacitive sensor system
US4458196A (en) * 1981-08-05 1984-07-03 John Fluke Mfg. Co., Inc. Method and apparatus for high speed resistance, inductance and capacitance measurement
EP0178768A2 (en) * 1984-09-14 1986-04-23 EMI Limited Sensor array
FR2584822B1 (fr) * 1985-07-09 1988-06-17 Thomson Csf Dispositif de mesure du rapport de deux capacites de faibles valeurs
US4820973A (en) * 1986-11-21 1989-04-11 Alvarez Jose A Impedance measuring system
JPH0631650B2 (ja) * 1987-06-15 1994-04-27 山田油機製造株式会社 スプ−ルタイプ切換弁装置
US4794320A (en) * 1987-08-10 1988-12-27 Moore Products Co. Multi-frequency capacitance sensor
FR2642845B1 (fr) * 1989-02-03 1991-07-12 Centre Nat Rech Scient Procede et appareil de mesure de capacites de faible valeur
US5092171A (en) * 1989-06-13 1992-03-03 Vdo Adolf Schindling Ag Acceleration sensor with differential capacitance
DE3919190A1 (de) * 1989-06-13 1990-12-20 Vdo Schindling Beschleunigungssensor
DE4100869A1 (de) * 1990-01-15 1991-07-18 Weiss Dieter Verfahren und vorrichtung zum messen physikalischer groessen

Also Published As

Publication number Publication date
DE59204790D1 (de) 1996-02-08
JPH0580096A (ja) 1993-03-30
EP0503272B1 (de) 1995-12-27
US5283528A (en) 1994-02-01
DE4107366C1 (enrdf_load_stackoverflow) 1992-04-23
EP0503272A1 (de) 1992-09-16

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