FR2584822B1 - Dispositif de mesure du rapport de deux capacites de faibles valeurs - Google Patents

Dispositif de mesure du rapport de deux capacites de faibles valeurs

Info

Publication number
FR2584822B1
FR2584822B1 FR8510481A FR8510481A FR2584822B1 FR 2584822 B1 FR2584822 B1 FR 2584822B1 FR 8510481 A FR8510481 A FR 8510481A FR 8510481 A FR8510481 A FR 8510481A FR 2584822 B1 FR2584822 B1 FR 2584822B1
Authority
FR
France
Prior art keywords
capacities
report
measuring
low values
values
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8510481A
Other languages
English (en)
Other versions
FR2584822A1 (fr
Inventor
Joel Choisnet
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thales SA
Original Assignee
Thomson CSF SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thomson CSF SA filed Critical Thomson CSF SA
Priority to FR8510481A priority Critical patent/FR2584822B1/fr
Priority to GB08614836A priority patent/GB2177806B/en
Priority to JP61159513A priority patent/JPS6214067A/ja
Priority to DE19863623136 priority patent/DE3623136A1/de
Priority to US06/883,765 priority patent/US4797603A/en
Publication of FR2584822A1 publication Critical patent/FR2584822A1/fr
Application granted granted Critical
Publication of FR2584822B1 publication Critical patent/FR2584822B1/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/10—Measuring sum, difference or ratio
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance
FR8510481A 1985-07-09 1985-07-09 Dispositif de mesure du rapport de deux capacites de faibles valeurs Expired FR2584822B1 (fr)

Priority Applications (5)

Application Number Priority Date Filing Date Title
FR8510481A FR2584822B1 (fr) 1985-07-09 1985-07-09 Dispositif de mesure du rapport de deux capacites de faibles valeurs
GB08614836A GB2177806B (en) 1985-07-09 1986-06-18 A device for measuring the ratio of two low valve capacities
JP61159513A JPS6214067A (ja) 1985-07-09 1986-07-07 ２つの低値容量の比を測定するためのデバイス
DE19863623136 DE3623136A1 (de) 1985-07-09 1986-07-09 Vorrichtung zur messung des verhaeltnisses zwischen zwei kleinen kapazitaeten
US06/883,765 US4797603A (en) 1985-07-09 1986-07-09 Device for measuring the ratio of two low value capacities

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8510481A FR2584822B1 (fr) 1985-07-09 1985-07-09 Dispositif de mesure du rapport de deux capacites de faibles valeurs

Publications (2)

Publication Number Publication Date
FR2584822A1 FR2584822A1 (fr) 1987-01-16
FR2584822B1 true FR2584822B1 (fr) 1988-06-17

Family

ID=9321109

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8510481A Expired FR2584822B1 (fr) 1985-07-09 1985-07-09 Dispositif de mesure du rapport de deux capacites de faibles valeurs

Country Status (5)

Country Link
US (1) US4797603A (fr)
JP (1) JPS6214067A (fr)
DE (1) DE3623136A1 (fr)
FR (1) FR2584822B1 (fr)
GB (1) GB2177806B (fr)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5136251A (en) * 1988-09-23 1992-08-04 John Fluke Mfg. Co., Inc. Capacitance measurement
DE4107366C1 (fr) * 1991-03-08 1992-04-23 Leica Heerbrugg Ag, Heerbrugg, Ch
FR2682768A1 (fr) * 1991-10-21 1993-04-23 Otic Fischer & Porter Methodes de conversion de rapports d'impedances applicables aux appareils de mesure, notamment aux transmetteurs de pression industriels, et leurs dispositifs de mise en óoeuvre.
DE19513022C1 (de) * 1995-04-06 1996-08-14 Siemens Ag Schaltungsanordnung und Verfahren zur Bestimmung von Kapazitätsdifferenzen
FR2768122B1 (fr) * 1997-09-09 1999-11-19 Sextant Avionique Dispositif optique de detection de conditions givrantes sur aeronef
FR2791144B1 (fr) 1999-03-19 2001-11-30 Sextant Avionique Dispositif de surveillance de la circulation d'un courant sensiblement continu dans une charge et procede pour la mise en oeuvre de ce dispositif
FR2791773B1 (fr) 1999-04-02 2001-06-15 Sextant Avionique Girouette destinee a s'orienter dans l'axe d'un ecoulement d'air ambiant
FR2793022B1 (fr) 1999-04-30 2001-07-13 Sextant Avionique Sonde multifonctions fixe pour aeronef
FR2802636B1 (fr) 1999-12-17 2002-03-22 Thomson Csf Sextant Sonde multifonctions pour aeronef
FR2802647B1 (fr) 1999-12-17 2002-03-01 Thomson Csf Sextant Sonde pour aeronef
FR2817044B1 (fr) * 2000-11-17 2003-02-14 Thomson Csf Procede de determination de parametres aerodynamiques et procede de detection de panne d'une sonde utilisee pour determiner les parametres aerodynamiques
FR2823846B1 (fr) 2001-04-24 2003-06-27 Thomson Csf Dispositif de mesure de la pression totale d'un ecoulement
DE50202015D1 (de) * 2002-02-21 2005-02-17 Fraunhofer Ges Forschung Vorrichtung und verfahren zum auslesen einer differentialkapazität mit einer ersten und zweiten teilkapazität
JP3985545B2 (ja) 2002-02-22 2007-10-03 セイコーエプソン株式会社 薄膜形成装置と薄膜形成方法、液晶装置の製造装置と液晶装置の製造方法と液晶装置、及び薄膜構造体の製造装置と薄膜構造体の製造方法と薄膜構造体、及び電子機器
CN104169728B (zh) * 2011-12-23 2016-11-23 Imec公司 用于测量电容性元件之间的电容差的方法和系统

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS539542B2 (fr) * 1972-09-21 1978-04-06
US4054833A (en) * 1976-06-11 1977-10-18 Setra Systems, Inc. Capacitance measuring system
US4039940A (en) * 1976-07-30 1977-08-02 General Electric Company Capacitance sensor
FR2436399A2 (fr) * 1978-09-13 1980-04-11 Testut Aequitas Perfectionnement a l'inhibition des capacites parasites dans un dispositif de mesure de capacite
FR2404229A1 (fr) * 1977-09-23 1979-04-20 Testut Aequitas Dispositif de mesure de capacite d'un condensateur
US4187459A (en) * 1978-02-13 1980-02-05 Automatic Systems Laboratories Limited Digital measurement of impedance ratios
US4282480A (en) * 1978-05-02 1981-08-04 Matsushita Electric Industrial Co., Ltd. Apparatus for humidity detection
GB2036982B (en) * 1978-10-04 1982-12-01 Automatic Systems Lab Ltd Electrical impedance ratios
GB2058364B (en) * 1979-09-01 1983-03-23 Ferranti Ltd Capacitance measuring apparatus
US4404481A (en) * 1980-10-20 1983-09-13 Matsushita Electric Industrial Co., Ltd. Capacitance to voltage conversion apparatus
US4636714A (en) * 1984-01-18 1987-01-13 Wystron, Inc. Capacitive transducer and method
GB2155644B (en) * 1984-03-09 1988-04-20 Automatic Syst Lab Ltd Improvements in the measurement of impedance ratios

Also Published As

Publication number Publication date
DE3623136A1 (de) 1987-01-22
JPS6214067A (ja) 1987-01-22
GB2177806A (en) 1987-01-28
US4797603A (en) 1989-01-10
DE3623136C2 (fr) 1990-02-15
FR2584822A1 (fr) 1987-01-16
GB2177806B (en) 1989-01-18
GB8614836D0 (en) 1986-07-23

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ST Notification of lapse