JP2533881Y2 - 回路基板検査装置におけるピンボード構造 - Google Patents
回路基板検査装置におけるピンボード構造Info
- Publication number
- JP2533881Y2 JP2533881Y2 JP10769490U JP10769490U JP2533881Y2 JP 2533881 Y2 JP2533881 Y2 JP 2533881Y2 JP 10769490 U JP10769490 U JP 10769490U JP 10769490 U JP10769490 U JP 10769490U JP 2533881 Y2 JP2533881 Y2 JP 2533881Y2
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- measured
- pin board
- unit
- rod
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000007689 inspection Methods 0.000 title claims description 13
- 239000000758 substrate Substances 0.000 claims description 57
- 239000000523 sample Substances 0.000 claims description 38
- 230000003028 elevating effect Effects 0.000 claims description 27
- 239000000463 material Substances 0.000 claims description 22
- 230000006835 compression Effects 0.000 claims description 2
- 238000007906 compression Methods 0.000 claims description 2
- 230000002411 adverse Effects 0.000 description 4
- 238000003780 insertion Methods 0.000 description 3
- 230000037431 insertion Effects 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000005476 soldering Methods 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000011990 functional testing Methods 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 230000008646 thermal stress Effects 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10769490U JP2533881Y2 (ja) | 1990-10-15 | 1990-10-15 | 回路基板検査装置におけるピンボード構造 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10769490U JP2533881Y2 (ja) | 1990-10-15 | 1990-10-15 | 回路基板検査装置におけるピンボード構造 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0464784U JPH0464784U (enrdf_load_stackoverflow) | 1992-06-03 |
| JP2533881Y2 true JP2533881Y2 (ja) | 1997-04-23 |
Family
ID=31854336
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10769490U Expired - Lifetime JP2533881Y2 (ja) | 1990-10-15 | 1990-10-15 | 回路基板検査装置におけるピンボード構造 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2533881Y2 (enrdf_load_stackoverflow) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5544226B2 (ja) * | 2010-07-07 | 2014-07-09 | 日置電機株式会社 | 基板検査装置 |
| WO2017195300A1 (ja) | 2016-05-11 | 2017-11-16 | Wit株式会社 | 多機能型基板検査装置および多機能型基板検査方法 |
-
1990
- 1990-10-15 JP JP10769490U patent/JP2533881Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0464784U (enrdf_load_stackoverflow) | 1992-06-03 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |