JPH0464784U - - Google Patents

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Publication number
JPH0464784U
JPH0464784U JP10769490U JP10769490U JPH0464784U JP H0464784 U JPH0464784 U JP H0464784U JP 10769490 U JP10769490 U JP 10769490U JP 10769490 U JP10769490 U JP 10769490U JP H0464784 U JPH0464784 U JP H0464784U
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JP
Japan
Prior art keywords
rod
unit
contact
measured
board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10769490U
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English (en)
Japanese (ja)
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JP2533881Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10769490U priority Critical patent/JP2533881Y2/ja
Publication of JPH0464784U publication Critical patent/JPH0464784U/ja
Application granted granted Critical
Publication of JP2533881Y2 publication Critical patent/JP2533881Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)
JP10769490U 1990-10-15 1990-10-15 回路基板検査装置におけるピンボード構造 Expired - Lifetime JP2533881Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10769490U JP2533881Y2 (ja) 1990-10-15 1990-10-15 回路基板検査装置におけるピンボード構造

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10769490U JP2533881Y2 (ja) 1990-10-15 1990-10-15 回路基板検査装置におけるピンボード構造

Publications (2)

Publication Number Publication Date
JPH0464784U true JPH0464784U (enrdf_load_stackoverflow) 1992-06-03
JP2533881Y2 JP2533881Y2 (ja) 1997-04-23

Family

ID=31854336

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10769490U Expired - Lifetime JP2533881Y2 (ja) 1990-10-15 1990-10-15 回路基板検査装置におけるピンボード構造

Country Status (1)

Country Link
JP (1) JP2533881Y2 (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012018043A (ja) * 2010-07-07 2012-01-26 Hioki Ee Corp 基板検査装置
WO2017195470A1 (ja) * 2016-05-11 2017-11-16 Ｗｉｔ株式会社 多機能型基板検査装置および多機能型基板検査方法

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012018043A (ja) * 2010-07-07 2012-01-26 Hioki Ee Corp 基板検査装置
WO2017195470A1 (ja) * 2016-05-11 2017-11-16 Ｗｉｔ株式会社 多機能型基板検査装置および多機能型基板検査方法
WO2017195300A1 (ja) * 2016-05-11 2017-11-16 Ｗｉｔ株式会社 多機能型基板検査装置および多機能型基板検査方法
JP6233946B1 (ja) * 2016-05-11 2017-11-22 Ｗｉｔ株式会社 多機能型基板検査装置および多機能型基板検査方法
US10718792B2 (en) 2016-05-11 2020-07-21 Wit Co., Ltd. Multifunctional substrate inspection apparatus and multifunctional substrate inspection method

Also Published As

Publication number Publication date
JP2533881Y2 (ja) 1997-04-23

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term