JPH0464784U - - Google Patents
Info
- Publication number
- JPH0464784U JPH0464784U JP10769490U JP10769490U JPH0464784U JP H0464784 U JPH0464784 U JP H0464784U JP 10769490 U JP10769490 U JP 10769490U JP 10769490 U JP10769490 U JP 10769490U JP H0464784 U JPH0464784 U JP H0464784U
- Authority
- JP
- Japan
- Prior art keywords
- rod
- unit
- contact
- measured
- board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10769490U JP2533881Y2 (ja) | 1990-10-15 | 1990-10-15 | 回路基板検査装置におけるピンボード構造 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10769490U JP2533881Y2 (ja) | 1990-10-15 | 1990-10-15 | 回路基板検査装置におけるピンボード構造 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0464784U true JPH0464784U (enrdf_load_stackoverflow) | 1992-06-03 |
JP2533881Y2 JP2533881Y2 (ja) | 1997-04-23 |
Family
ID=31854336
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10769490U Expired - Lifetime JP2533881Y2 (ja) | 1990-10-15 | 1990-10-15 | 回路基板検査装置におけるピンボード構造 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2533881Y2 (enrdf_load_stackoverflow) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012018043A (ja) * | 2010-07-07 | 2012-01-26 | Hioki Ee Corp | 基板検査装置 |
WO2017195300A1 (ja) * | 2016-05-11 | 2017-11-16 | Wit株式会社 | 多機能型基板検査装置および多機能型基板検査方法 |
-
1990
- 1990-10-15 JP JP10769490U patent/JP2533881Y2/ja not_active Expired - Lifetime
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012018043A (ja) * | 2010-07-07 | 2012-01-26 | Hioki Ee Corp | 基板検査装置 |
WO2017195300A1 (ja) * | 2016-05-11 | 2017-11-16 | Wit株式会社 | 多機能型基板検査装置および多機能型基板検査方法 |
WO2017195470A1 (ja) * | 2016-05-11 | 2017-11-16 | Wit株式会社 | 多機能型基板検査装置および多機能型基板検査方法 |
JP6233946B1 (ja) * | 2016-05-11 | 2017-11-22 | Wit株式会社 | 多機能型基板検査装置および多機能型基板検査方法 |
US10718792B2 (en) | 2016-05-11 | 2020-07-21 | Wit Co., Ltd. | Multifunctional substrate inspection apparatus and multifunctional substrate inspection method |
Also Published As
Publication number | Publication date |
---|---|
JP2533881Y2 (ja) | 1997-04-23 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
EXPY | Cancellation because of completion of term |