JP2023161934A - コンタクトプローブ - Google Patents

コンタクトプローブ Download PDF

Info

Publication number
JP2023161934A
JP2023161934A JP2022072595A JP2022072595A JP2023161934A JP 2023161934 A JP2023161934 A JP 2023161934A JP 2022072595 A JP2022072595 A JP 2022072595A JP 2022072595 A JP2022072595 A JP 2022072595A JP 2023161934 A JP2023161934 A JP 2023161934A
Authority
JP
Japan
Prior art keywords
contact probe
metal conductor
contact
insulating coating
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2022072595A
Other languages
English (en)
Japanese (ja)
Inventor
遼太 小路
Ryota Shoji
雅章 深澤
Masaaki Fukazawa
宏平 長澤
Kohei Nagasawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Totoku
TOTOKU CO Ltd
Original Assignee
Totoku
TOTOKU CO Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Totoku, TOTOKU CO Ltd filed Critical Totoku
Priority to JP2022072595A priority Critical patent/JP2023161934A/ja
Priority to KR1020230020588A priority patent/KR20230151879A/ko
Priority to CN202310431544.2A priority patent/CN116990557A/zh
Publication of JP2023161934A publication Critical patent/JP2023161934A/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06755Material aspects
    • G01R1/06761Material aspects related to layers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733Geometry aspects
    • G01R1/06738Geometry aspects related to tip portion
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733Geometry aspects
    • G01R1/0675Needle-like
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2855Environmental, reliability or burn-in testing
    • G01R31/286External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863Contacting devices, e.g. sockets, burn-in boards or mounting fixtures

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
  • Environmental & Geological Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
JP2022072595A 2022-04-26 2022-04-26 コンタクトプローブ Pending JP2023161934A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2022072595A JP2023161934A (ja) 2022-04-26 2022-04-26 コンタクトプローブ
KR1020230020588A KR20230151879A (ko) 2022-04-26 2023-02-16 콘택트 프로브
CN202310431544.2A CN116990557A (zh) 2022-04-26 2023-04-21 接触探针

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2022072595A JP2023161934A (ja) 2022-04-26 2022-04-26 コンタクトプローブ

Publications (1)

Publication Number Publication Date
JP2023161934A true JP2023161934A (ja) 2023-11-08

Family

ID=88528996

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022072595A Pending JP2023161934A (ja) 2022-04-26 2022-04-26 コンタクトプローブ

Country Status (3)

Country Link
JP (1) JP2023161934A (ko)
KR (1) KR20230151879A (ko)
CN (1) CN116990557A (ko)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006317412A (ja) * 2005-05-16 2006-11-24 Totoku Electric Co Ltd 絶縁被膜付きプローブ針及びその製造方法
JP2012127869A (ja) * 2010-12-16 2012-07-05 Mitsubishi Cable Ind Ltd 絶縁被膜プローブピン及びその製造方法
JP2015025697A (ja) * 2013-07-25 2015-02-05 東京特殊電線株式会社 プローブユニット
JP2017215221A (ja) * 2016-06-01 2017-12-07 イビデン株式会社 プローブ及びその製造方法
JP2020183911A (ja) * 2019-05-09 2020-11-12 東京特殊電線株式会社 プローブ針及びプローブユニット
JP2021189066A (ja) * 2020-06-01 2021-12-13 東京特殊電線株式会社 プローブ針及びプローブユニット

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007322369A (ja) 2006-06-05 2007-12-13 Totoku Electric Co Ltd コンタクトプローブ及びその製造方法
JP2021105547A (ja) 2019-12-26 2021-07-26 日本発條株式会社 コンタクトプローブ

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006317412A (ja) * 2005-05-16 2006-11-24 Totoku Electric Co Ltd 絶縁被膜付きプローブ針及びその製造方法
JP2012127869A (ja) * 2010-12-16 2012-07-05 Mitsubishi Cable Ind Ltd 絶縁被膜プローブピン及びその製造方法
JP2015025697A (ja) * 2013-07-25 2015-02-05 東京特殊電線株式会社 プローブユニット
JP2017215221A (ja) * 2016-06-01 2017-12-07 イビデン株式会社 プローブ及びその製造方法
JP2020183911A (ja) * 2019-05-09 2020-11-12 東京特殊電線株式会社 プローブ針及びプローブユニット
JP2021189066A (ja) * 2020-06-01 2021-12-13 東京特殊電線株式会社 プローブ針及びプローブユニット

Also Published As

Publication number Publication date
KR20230151879A (ko) 2023-11-02
CN116990557A (zh) 2023-11-03

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