|
US5153444A
(en)
*
|
1988-12-23 |
1992-10-06 |
Hitachi, Ltd. |
Method and apparatus for detecting patterns
|
|
US6292582B1
(en)
*
|
1996-05-31 |
2001-09-18 |
Lin Youling |
Method and system for identifying defects in a semiconductor
|
|
JPH10335399A
(ja)
*
|
1997-06-03 |
1998-12-18 |
Advantest Corp |
試料処理装置および方法
|
|
JP3371764B2
(ja)
*
|
1997-06-27 |
2003-01-27 |
株式会社日立製作所 |
撮像方法及び装置
|
|
US6366357B1
(en)
*
|
1998-03-05 |
2002-04-02 |
General Scanning, Inc. |
Method and system for high speed measuring of microscopic targets
|
|
JP2000182066A
(ja)
*
|
1998-10-07 |
2000-06-30 |
Advantest Corp |
画像処理装置
|
|
JP3812185B2
(ja)
*
|
1998-12-01 |
2006-08-23 |
株式会社日立製作所 |
欠陥分類方法およびその装置
|
|
US7966078B2
(en)
*
|
1999-02-01 |
2011-06-21 |
Steven Hoffberg |
Network media appliance system and method
|
|
JP4526661B2
(ja)
*
|
2000-06-28 |
2010-08-18 |
株式会社日立製作所 |
検査装置および検査方法
|
|
JP2002076071A
(ja)
*
|
2000-08-25 |
2002-03-15 |
Matsushita Electric Ind Co Ltd |
部品実装部の信頼性評価方法および信頼性評価装置
|
|
US7248716B2
(en)
*
|
2001-07-06 |
2007-07-24 |
Palantyr Research, Llc |
Imaging system, methodology, and applications employing reciprocal space optical design
|
|
CA2484549A1
(en)
*
|
2002-05-10 |
2003-11-20 |
Phase-1 Molecular Toxicology, Inc. |
Liver inflammation predictive genes
|
|
JP2003339659A
(ja)
*
|
2002-05-23 |
2003-12-02 |
Hitachi Ltd |
超電導磁気シールド装置
|
|
US9955551B2
(en)
*
|
2002-07-12 |
2018-04-24 |
Yechezkal Evan Spero |
Detector controlled illuminating system
|
|
JP4222927B2
(ja)
*
|
2002-09-20 |
2009-02-12 |
エーエスエムエル ネザーランズ ビー．ブイ． |
少なくとも２波長を使用するリソグラフィ装置用アライメント・システム
|
|
US8712118B2
(en)
*
|
2003-04-10 |
2014-04-29 |
Carl Zeiss Microimaging Gmbh |
Automated measurement of concentration and/or amount in a biological sample
|
|
TWI254792B
(en)
*
|
2003-07-01 |
2006-05-11 |
Au Optronics Corp |
Detecting method and device of laser crystalline silicon
|
|
US20050031188A1
(en)
*
|
2003-08-10 |
2005-02-10 |
Luu Victor Van |
Systems and methods for characterizing a sample
|
|
JP4842533B2
(ja)
*
|
2004-10-27 |
2011-12-21 |
株式会社日立ハイテクノロジーズ |
不良検査装置
|
|
JP2006238802A
(ja)
*
|
2005-03-03 |
2006-09-14 |
Olympus Corp |
細胞観察装置、細胞観察方法、顕微鏡システム、及び細胞観察プログラム
|
|
RU2305270C2
(ru)
*
|
2005-05-18 |
2007-08-27 |
Андрей Алексеевич Климов |
Способ флуоресцентной наноскопии (варианты)
|
|
JP4537277B2
(ja)
*
|
2005-07-08 |
2010-09-01 |
株式会社日立ハイテクノロジーズ |
半導体検査装置
|
|
CN101611324B
(zh)
*
|
2005-10-18 |
2012-11-21 |
Gsi集团公司 |
利用光学基准的方法和器件
|
|
US7676077B2
(en)
*
|
2005-11-18 |
2010-03-09 |
Kla-Tencor Technologies Corp. |
Methods and systems for utilizing design data in combination with inspection data
|
|
DE112006003790A5
(de)
*
|
2006-01-04 |
2008-12-04 |
Jpk Instruments Ag |
Verfahren zum Betreiben eines Messsystems mit einem Rastersondenmikroskop und Messsystem
|
|
JP4908934B2
(ja)
*
|
2006-06-08 |
2012-04-04 |
株式会社日立ハイテクノロジーズ |
半導体ウェーハ検査装置および半導体ウェーハ検査方法
|
|
US8392418B2
(en)
*
|
2009-06-25 |
2013-03-05 |
University Of Tennessee Research Foundation |
Method and apparatus for predicting object properties and events using similarity-based information retrieval and model
|
|
US8396582B2
(en)
*
|
2008-03-08 |
2013-03-12 |
Tokyo Electron Limited |
Method and apparatus for self-learning and self-improving a semiconductor manufacturing tool
|
|
DE102008041821A1
(de)
*
|
2008-09-04 |
2010-03-11 |
Leica Microsystems (Schweiz) Ag |
Videoadapter für eine Mikroskopkamera
|
|
JP2010079221A
(ja)
*
|
2008-09-29 |
2010-04-08 |
Olympus Corp |
生体観察装置
|
|
US8373113B2
(en)
*
|
2008-11-05 |
2013-02-12 |
Hitachi High-Technologies Corporation |
Calibration standard member, method for manufacturing the member and scanning electronic microscope using the member
|
|
US8488863B2
(en)
*
|
2008-11-06 |
2013-07-16 |
Los Alamos National Security, Llc |
Combinational pixel-by-pixel and object-level classifying, segmenting, and agglomerating in performing quantitative image analysis that distinguishes between healthy non-cancerous and cancerous cell nuclei and delineates nuclear, cytoplasm, and stromal material objects from stained biological tissue materials
|
|
JP5301970B2
(ja)
*
|
2008-12-08 |
2013-09-25 |
オリンパス株式会社 |
顕微鏡用デジタルカメラシステム及び顕微鏡システム
|
|
JP5152077B2
(ja)
*
|
2009-04-01 |
2013-02-27 |
ソニー株式会社 |
生体像提示装置、生体像提示方法及びプログラム並びに生体像提示システム
|
|
US8729470B2
(en)
*
|
2009-06-14 |
2014-05-20 |
DLA Instruments |
Electron microscope with an emitter operating in medium vacuum
|
|
US9995766B2
(en)
*
|
2009-06-16 |
2018-06-12 |
The Regents Of The University Of California |
Methods and systems for measuring a property of a macromolecule
|
|
JP5091976B2
(ja)
*
|
2010-04-09 |
2012-12-05 |
株式会社東芝 |
映像表示装置、映像表示方法及び映像表示プログラム
|
|
EP2617011A1
(en)
*
|
2010-09-14 |
2013-07-24 |
Ramot at Tel Aviv University, Ltd. |
Cell occupancy measurement
|
|
JP2012237566A
(ja)
*
|
2011-05-10 |
2012-12-06 |
Hitachi High-Technologies Corp |
欠陥観察方法及びその装置
|
|
KR20130035061A
(ko)
|
2011-09-29 |
2013-04-08 |
삼성전기주식회사 |
솔더볼 검사장치
|
|
JP5894854B2
(ja)
*
|
2012-05-11 |
2016-03-30 |
株式会社日立ハイテクノロジーズ |
検査装置
|
|
JP5608209B2
(ja)
*
|
2012-11-28 |
2014-10-15 |
株式会社日立ハイテクノロジーズ |
欠陥レビュー装置
|
|
JP6194450B2
(ja)
*
|
2013-04-15 |
2017-09-13 |
株式会社メガチップス |
状態推定装置、プログラムおよび集積回路
|
|
JP6070420B2
(ja)
*
|
2013-05-31 |
2017-02-01 |
富士ゼロックス株式会社 |
画像処理装置及びプログラム
|
|
JP2015031831A
(ja)
*
|
2013-08-02 |
2015-02-16 |
オリンパス株式会社 |
細胞追跡装置及び方法、細胞追跡プログラム
|
|
US9263233B2
(en)
*
|
2013-09-29 |
2016-02-16 |
Carl Zeiss Microscopy Gmbh |
Charged particle multi-beam inspection system and method of operating the same
|
|
JP6253368B2
(ja)
*
|
2013-11-25 |
2017-12-27 |
キヤノン株式会社 |
三次元形状計測装置およびその制御方法
|
|
US10290092B2
(en)
*
|
2014-05-15 |
2019-05-14 |
Applied Materials Israel, Ltd |
System, a method and a computer program product for fitting based defect detection
|
|
WO2015189026A2
(en)
*
|
2014-06-10 |
2015-12-17 |
Asml Netherlands B.V. |
Computational wafer inspection
|
|
US10325057B2
(en)
*
|
2015-08-17 |
2019-06-18 |
Amber Precision Instruments, Inc. |
Using computer-aided design layout in scanning system
|
|
US10186028B2
(en)
*
|
2015-12-09 |
2019-01-22 |
Kla-Tencor Corporation |
Defect signal to noise enhancement by reducing die to die process noise
|
|
JP6643072B2
(ja)
*
|
2015-12-10 |
2020-02-12 |
キヤノン株式会社 |
顕微鏡システムおよびその制御方法
|
|
WO2017145172A1
(en)
*
|
2016-02-23 |
2017-08-31 |
Sigtuple Technologies Private Limited |
System and method for extraction and analysis of samples under a microscope
|
|
EP3432783B1
(en)
*
|
2016-03-25 |
2024-02-14 |
Thorlabs, Inc. |
Mems tunable vcsel powered swept source oct for 3d metrology applications
|
|
US10754334B2
(en)
*
|
2016-05-09 |
2020-08-25 |
Strong Force Iot Portfolio 2016, Llc |
Methods and systems for industrial internet of things data collection for process adjustment in an upstream oil and gas environment
|
|
US10085162B2
(en)
*
|
2016-07-22 |
2018-09-25 |
Ets-Lindgren, Inc. |
System and method for over-the-air testing of milli-meter wave and other beamforming technologies
|
|
US10239178B2
(en)
*
|
2016-10-17 |
2019-03-26 |
Virtek Vision International, ULC |
Laser projector with dynamically adaptable focus
|
|
EP3557521B1
(en)
*
|
2016-12-19 |
2024-09-25 |
Kabushiki Kaisha Yaskawa Denki |
Industrial device image recognition processor and controller
|
|
KR102668955B1
(ko)
*
|
2017-02-10 |
2024-05-23 |
나노트로닉스 이미징, 인코포레이티드 |
현미경 검사에서 대 영역 이미징을 용이하게 하는 카메라 및 표본 정렬
|
|
US10333632B2
(en)
*
|
2017-04-03 |
2019-06-25 |
Ets-Lindgren, Inc. |
Method and system for testing beam forming capabilities of wireless devices
|
|
US10311573B2
(en)
*
|
2017-05-02 |
2019-06-04 |
Techcyte, Inc. |
Training and machine learning classification of mold in digital microscopy images
|
|
EP3664705A4
(en)
*
|
2017-08-09 |
2021-09-29 |
Allen Institute |
IMAGE PROCESSING SYSTEMS, DEVICES AND METHODS FOR GENERATING AN IMAGE WITH PREDICTIVE MARKING
|
|
EP3811287B1
(en)
*
|
2018-06-19 |
2025-09-17 |
MetaSystems Hard & Software GmbH |
System and method for detection and classification of objects of interest in microscope images by supervised machine learning
|
|
US10169852B1
(en)
*
|
2018-07-03 |
2019-01-01 |
Nanotronics Imaging, Inc. |
Systems, devices, and methods for providing feedback on and improving the accuracy of super-resolution imaging
|
|
US10481379B1
(en)
|
2018-10-19 |
2019-11-19 |
Nanotronics Imaging, Inc. |
Method and system for automatically mapping fluid objects on a substrate
|