JP2023003153A5 - - Google Patents
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- Publication number
- JP2023003153A5 JP2023003153A5 JP2021104157A JP2021104157A JP2023003153A5 JP 2023003153 A5 JP2023003153 A5 JP 2023003153A5 JP 2021104157 A JP2021104157 A JP 2021104157A JP 2021104157 A JP2021104157 A JP 2021104157A JP 2023003153 A5 JP2023003153 A5 JP 2023003153A5
- Authority
- JP
- Japan
- Prior art keywords
- illumination light
- optical system
- exposure apparatus
- wavelength
- original
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005286 illumination Methods 0.000 claims description 37
- 230000003287 optical effect Effects 0.000 claims description 27
- 239000000758 substrate Substances 0.000 claims description 9
- 238000000034 method Methods 0.000 claims 3
- 230000004075 alteration Effects 0.000 claims 2
- 206010010071 Coma Diseases 0.000 claims 1
Priority Applications (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2021104157A JP2023003153A (ja) | 2021-06-23 | 2021-06-23 | 露光装置、露光方法および物品の製造方法 |
| TW111121379A TWI873429B (zh) | 2021-06-23 | 2022-06-09 | 曝光設備、曝光方法和產品的製造方法 |
| KR1020220072669A KR20220170754A (ko) | 2021-06-23 | 2022-06-15 | 노광 장치, 노광 방법 및 물품의 제조 방법 |
| EP22179902.6A EP4109179A3 (en) | 2021-06-23 | 2022-06-20 | Exposure apparatus, exposure method, and manufacturing method for product |
| US17/847,037 US11835863B2 (en) | 2021-06-23 | 2022-06-22 | Exposure apparatus, exposure method, and manufacturing method for product |
| CN202210717284.0A CN115509091A (zh) | 2021-06-23 | 2022-06-23 | 曝光装置、曝光方法和产品的制造方法 |
| US18/499,883 US12105430B2 (en) | 2021-06-23 | 2023-11-01 | Exposure apparatus, exposure method, and manufacturing method for product |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2021104157A JP2023003153A (ja) | 2021-06-23 | 2021-06-23 | 露光装置、露光方法および物品の製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2023003153A JP2023003153A (ja) | 2023-01-11 |
| JP2023003153A5 true JP2023003153A5 (enExample) | 2024-06-19 |
Family
ID=82117158
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2021104157A Pending JP2023003153A (ja) | 2021-06-23 | 2021-06-23 | 露光装置、露光方法および物品の製造方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US11835863B2 (enExample) |
| EP (1) | EP4109179A3 (enExample) |
| JP (1) | JP2023003153A (enExample) |
| KR (1) | KR20220170754A (enExample) |
| CN (1) | CN115509091A (enExample) |
| TW (1) | TWI873429B (enExample) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI855513B (zh) * | 2023-01-18 | 2024-09-11 | 南亞科技股份有限公司 | 曝光設備及其操作方法 |
Family Cites Families (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0669014B2 (ja) * | 1986-02-24 | 1994-08-31 | 株式会社ニコン | 露光装置 |
| JP2619473B2 (ja) | 1987-06-17 | 1997-06-11 | 株式会社日立製作所 | 縮小投影露光方法 |
| JP2940553B2 (ja) * | 1988-12-21 | 1999-08-25 | 株式会社ニコン | 露光方法 |
| US6885433B2 (en) * | 1990-11-15 | 2005-04-26 | Nikon Corporation | Projection exposure apparatus and method |
| US6078380A (en) * | 1991-10-08 | 2000-06-20 | Nikon Corporation | Projection exposure apparatus and method involving variation and correction of light intensity distributions, detection and control of imaging characteristics, and control of exposure |
| JP3325350B2 (ja) * | 1993-08-16 | 2002-09-17 | 株式会社東芝 | レーザ露光装置及び半導体装置の製造方法 |
| JP4066085B2 (ja) * | 1997-10-07 | 2008-03-26 | 株式会社ニコン | 投影露光装置、該装置を用いた半導体デバイスの製造方法、及び露光方法 |
| US6833904B1 (en) * | 1998-02-27 | 2004-12-21 | Nikon Corporation | Exposure apparatus and method of fabricating a micro-device using the exposure apparatus |
| JP3347692B2 (ja) * | 1998-10-06 | 2002-11-20 | キヤノン株式会社 | 光学特性調整方法及びデバイス製造方法 |
| JP2001217174A (ja) * | 2000-02-01 | 2001-08-10 | Nikon Corp | 位置検出方法、位置検出装置、露光方法、及び露光装置 |
| EP1422562B1 (en) * | 2001-08-31 | 2013-04-17 | Canon Kabushiki Kaisha | Reticle and optical characteristic measuring method |
| JP4046961B2 (ja) * | 2001-09-03 | 2008-02-13 | キヤノン株式会社 | 位置検出方法、位置検出装置、露光装置及び露光方法 |
| JP2003151884A (ja) * | 2001-11-14 | 2003-05-23 | Nikon Corp | 合焦方法、位置計測方法および露光方法並びにデバイス製造方法 |
| JP3984950B2 (ja) * | 2003-11-12 | 2007-10-03 | キヤノン株式会社 | 照明光学系及びそれを有する露光装置 |
| US7262110B2 (en) * | 2004-08-23 | 2007-08-28 | Micron Technology, Inc. | Trench isolation structure and method of formation |
| EP2109143B1 (en) * | 2008-04-09 | 2013-05-29 | Sony Corporation | Solid-state imaging device, production method thereof, and electronic device |
| JP2014179446A (ja) * | 2013-03-14 | 2014-09-25 | Sharp Corp | 半導体撮像素子およびその製造方法 |
| JP6980443B2 (ja) * | 2017-07-28 | 2021-12-15 | キヤノン株式会社 | 露光装置及び物品製造方法 |
| JP6567005B2 (ja) * | 2017-08-31 | 2019-08-28 | キヤノン株式会社 | 露光装置、調整方法、および、物品製造方法 |
| CN111656284B (zh) * | 2018-01-24 | 2024-04-12 | 株式会社尼康 | 曝光装置及曝光方法 |
-
2021
- 2021-06-23 JP JP2021104157A patent/JP2023003153A/ja active Pending
-
2022
- 2022-06-09 TW TW111121379A patent/TWI873429B/zh active
- 2022-06-15 KR KR1020220072669A patent/KR20220170754A/ko not_active Ceased
- 2022-06-20 EP EP22179902.6A patent/EP4109179A3/en not_active Withdrawn
- 2022-06-22 US US17/847,037 patent/US11835863B2/en active Active
- 2022-06-23 CN CN202210717284.0A patent/CN115509091A/zh not_active Withdrawn
-
2023
- 2023-11-01 US US18/499,883 patent/US12105430B2/en active Active
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