JP2021525974A5 - - Google Patents

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Publication number
JP2021525974A5
JP2021525974A5 JP2021516521A JP2021516521A JP2021525974A5 JP 2021525974 A5 JP2021525974 A5 JP 2021525974A5 JP 2021516521 A JP2021516521 A JP 2021516521A JP 2021516521 A JP2021516521 A JP 2021516521A JP 2021525974 A5 JP2021525974 A5 JP 2021525974A5
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JP
Japan
Prior art keywords
gate
contacts
gem
metal
source
Prior art date
Application number
JP2021516521A
Other languages
English (en)
Japanese (ja)
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JP2021525974A (ja
JPWO2019226229A5 (https=
JP7572948B2 (ja
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Priority claimed from US15/989,604 external-priority patent/US10818762B2/en
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Publication of JP2021525974A publication Critical patent/JP2021525974A/ja
Publication of JPWO2019226229A5 publication Critical patent/JPWO2019226229A5/ja
Publication of JP2021525974A5 publication Critical patent/JP2021525974A5/ja
Application granted granted Critical
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JP2021516521A 2018-05-25 2019-03-27 セル内のアクティブ領域でのゲート接点 Active JP7572948B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US15/989,604 2018-05-25
US15/989,604 US10818762B2 (en) 2018-05-25 2018-05-25 Gate contact over active region in cell
PCT/US2019/024364 WO2019226229A1 (en) 2018-05-25 2019-03-27 Gate contact over active region in cell

Publications (4)

Publication Number Publication Date
JP2021525974A JP2021525974A (ja) 2021-09-27
JPWO2019226229A5 JPWO2019226229A5 (https=) 2022-04-21
JP2021525974A5 true JP2021525974A5 (https=) 2022-04-21
JP7572948B2 JP7572948B2 (ja) 2024-10-24

Family

ID=66102798

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021516521A Active JP7572948B2 (ja) 2018-05-25 2019-03-27 セル内のアクティブ領域でのゲート接点

Country Status (6)

Country Link
US (2) US10818762B2 (https=)
EP (1) EP3803962A1 (https=)
JP (1) JP7572948B2 (https=)
KR (2) KR20210002649A (https=)
CN (1) CN112166498B (https=)
WO (1) WO2019226229A1 (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11152347B2 (en) * 2018-04-13 2021-10-19 Qualcomm Incorporated Cell circuits formed in circuit cells employing offset gate cut areas in a non-active area for routing transistor gate cross-connections
US10818762B2 (en) * 2018-05-25 2020-10-27 Advanced Micro Devices, Inc. Gate contact over active region in cell
US10846327B2 (en) * 2018-11-02 2020-11-24 A9.Com, Inc. Visual attribute determination for content selection
EP3723127A1 (en) * 2019-04-10 2020-10-14 IMEC vzw A standard cell device and a method for forming an interconnect structure for a standard cell device
US10796061B1 (en) * 2019-08-29 2020-10-06 Advanced Micro Devices, Inc. Standard cell and power grid architectures with EUV lithography
US11362090B2 (en) 2020-01-31 2022-06-14 Taiwan Semiconductor Manufacturing Company, Ltd. Semiconductor device having buried logic conductor type of complementary field effect transistor, method of generating layout diagram and system for same
DE102020125647A1 (de) * 2020-01-31 2021-08-05 Taiwan Semiconductor Manufacturing Co., Ltd. Halbleitervorrichtung mit Komplementärfeldeffekttransistor des Typs mit vergrabenenen Logikleitern, Layout-Diagramm-Herstellungsverfahren und System dafür
US12205897B2 (en) 2021-09-23 2025-01-21 Advanced Micro Devices, Inc. Standard cell design architecture for reduced voltage droop utilizing reduced contacted gate poly pitch and dual height cells

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5889329A (en) 1994-11-02 1999-03-30 Lsi Logic Corporation Tri-directional interconnect architecture for SRAM
DE102004063926B4 (de) 2004-03-24 2017-10-19 Infineon Technologies Ag Konfigurierbare Treiberzelle eines logischen Zellenfeldes
US7761831B2 (en) 2005-12-29 2010-07-20 Mosaid Technologies Incorporated ASIC design using clock and power grid standard cell
JP4322888B2 (ja) 2006-06-01 2009-09-02 エルピーダメモリ株式会社 半導体装置
US7984395B2 (en) 2008-01-17 2011-07-19 Synopsys, Inc. Hierarchical compression for metal one logic layer
JP5410082B2 (ja) 2008-12-12 2014-02-05 ルネサスエレクトロニクス株式会社 半導体集積回路装置
US8533641B2 (en) 2011-10-07 2013-09-10 Baysand Inc. Gate array architecture with multiple programmable regions
US8716124B2 (en) * 2011-11-14 2014-05-06 Advanced Micro Devices Trench silicide and gate open with local interconnect with replacement gate process
KR20130070252A (ko) 2011-12-19 2013-06-27 에스케이하이닉스 주식회사 반도체 메모리 소자의 스페어 로직 구현방법 및 그 구조
EP2803077A4 (en) * 2012-01-13 2015-11-04 Tela Innovations Inc CIRCUITS WITH LINEAR FINFET STRUCTURES
US8743580B2 (en) * 2012-03-30 2014-06-03 Taiwan Semiconductor Manufacturing Company, Ltd. Apparatus for high speed ROM cells
US9461143B2 (en) * 2012-09-19 2016-10-04 Intel Corporation Gate contact structure over active gate and method to fabricate same
US10283437B2 (en) 2012-11-27 2019-05-07 Advanced Micro Devices, Inc. Metal density distribution for double pattern lithography
US9331013B2 (en) 2013-03-14 2016-05-03 Taiwan Semiconductor Manufacturing Company, Ltd. Integrated capacitor
US20160276287A1 (en) 2013-12-06 2016-09-22 Renesas Electronics Corporation Semiconductor device
US9653346B2 (en) * 2015-05-07 2017-05-16 United Microelectronics Corp. Integrated FinFET structure having a contact plug pitch larger than fin and first metal pitch
KR102369511B1 (ko) 2015-07-08 2022-03-03 삼성전자주식회사 반도체 집적 회로 및 이를 포함하는 전자 시스템
US10672708B2 (en) 2015-11-30 2020-06-02 Taiwan Semiconductor Manufacturing Co., Ltd. Standard-cell layout structure with horn power and smart metal cut
US9881872B2 (en) 2016-01-15 2018-01-30 Taiwan Semiconductor Manufacturing Co., Ltd. Method for fabricating a local interconnect in a semiconductor device
WO2018042986A1 (ja) 2016-08-29 2018-03-08 株式会社ソシオネクスト 半導体集積回路装置
US11189569B2 (en) 2016-09-23 2021-11-30 Advanced Micro Devices, Inc. Power grid layout designs for integrated circuits
US9837398B1 (en) 2016-11-23 2017-12-05 Advanced Micro Devices, Inc. Metal track cutting in standard cell layouts
US10270430B2 (en) 2016-12-28 2019-04-23 Taiwan Semiconductor Manufacturing Co., Ltd. Cell of transmission gate free circuit and integrated circuit and integrated circuit layout including the same
US10503859B2 (en) 2017-08-30 2019-12-10 Arm Limited Integrated circuit design and/or fabrication
US11120190B2 (en) 2017-11-21 2021-09-14 Advanced Micro Devices, Inc. Metal zero power ground stub route to reduce cell area and improve cell placement at the chip level
US10818762B2 (en) * 2018-05-25 2020-10-27 Advanced Micro Devices, Inc. Gate contact over active region in cell

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