JP2021120924A5 - - Google Patents

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Publication number
JP2021120924A5
JP2021120924A5 JP2020013689A JP2020013689A JP2021120924A5 JP 2021120924 A5 JP2021120924 A5 JP 2021120924A5 JP 2020013689 A JP2020013689 A JP 2020013689A JP 2020013689 A JP2020013689 A JP 2020013689A JP 2021120924 A5 JP2021120924 A5 JP 2021120924A5
Authority
JP
Japan
Prior art keywords
pressing
contact probe
package
inspection socket
inspected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2020013689A
Other languages
English (en)
Japanese (ja)
Other versions
JP2021120924A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2020013689A priority Critical patent/JP2021120924A/ja
Priority claimed from JP2020013689A external-priority patent/JP2021120924A/ja
Priority to US17/792,146 priority patent/US20230050000A1/en
Priority to PCT/JP2020/046951 priority patent/WO2021153061A1/ja
Priority to CN202080094969.3A priority patent/CN115023865A/zh
Priority to TW109145500A priority patent/TW202129292A/zh
Publication of JP2021120924A publication Critical patent/JP2021120924A/ja
Publication of JP2021120924A5 publication Critical patent/JP2021120924A5/ja
Pending legal-status Critical Current

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JP2020013689A 2020-01-30 2020-01-30 検査用ソケット Pending JP2021120924A (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2020013689A JP2021120924A (ja) 2020-01-30 2020-01-30 検査用ソケット
US17/792,146 US20230050000A1 (en) 2020-01-30 2020-12-16 Inspection socket
PCT/JP2020/046951 WO2021153061A1 (ja) 2020-01-30 2020-12-16 検査用ソケット
CN202080094969.3A CN115023865A (zh) 2020-01-30 2020-12-16 检查用插座
TW109145500A TW202129292A (zh) 2020-01-30 2020-12-22 檢查用插座

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2020013689A JP2021120924A (ja) 2020-01-30 2020-01-30 検査用ソケット

Publications (2)

Publication Number Publication Date
JP2021120924A JP2021120924A (ja) 2021-08-19
JP2021120924A5 true JP2021120924A5 (https=) 2022-07-11

Family

ID=77078884

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2020013689A Pending JP2021120924A (ja) 2020-01-30 2020-01-30 検査用ソケット

Country Status (5)

Country Link
US (1) US20230050000A1 (https=)
JP (1) JP2021120924A (https=)
CN (1) CN115023865A (https=)
TW (1) TW202129292A (https=)
WO (1) WO2021153061A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102788961B1 (ko) * 2022-08-02 2025-04-01 주식회사 오킨스전자 반도체 패키지 테스트 장치

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5476211A (en) * 1993-11-16 1995-12-19 Form Factor, Inc. Method of manufacturing electrical contacts, using a sacrificial member
JP2000195626A (ja) * 1998-12-25 2000-07-14 Yokowo Co Ltd Ｉｃソケットおよびｉｃソケットへのｉｃパッケ―ジの装着機構
US7247035B2 (en) * 2000-06-20 2007-07-24 Nanonexus, Inc. Enhanced stress metal spring contactor
US6917525B2 (en) * 2001-11-27 2005-07-12 Nanonexus, Inc. Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs
JP2002043004A (ja) * 2000-07-19 2002-02-08 Nec Yamagata Ltd Ｉｃソケット
TWM253096U (en) * 2003-10-31 2004-12-11 Hon Hai Prec Ind Co Ltd LGA socket
JP2006200975A (ja) * 2005-01-19 2006-08-03 Matsushita Electric Ind Co Ltd 半導体装置の検査方法および検査装置および接触端子
JP4825610B2 (ja) * 2006-07-27 2011-11-30 株式会社ヨコオ 検査用ソケット
US9766268B2 (en) * 2006-12-21 2017-09-19 Essai, Inc. Contactor with angled spring probes
US7479794B2 (en) * 2007-02-28 2009-01-20 Sv Probe Pte Ltd Spring loaded probe pin assembly
TWM361740U (en) * 2008-12-22 2009-07-21 Hon Hai Prec Ind Co Ltd Electrical connector
JP5636908B2 (ja) * 2010-11-24 2014-12-10 富士通株式会社 ソケットおよび電子装置
JP5991823B2 (ja) * 2012-02-14 2016-09-14 株式会社日本マイクロニクス 電気的接続装置及びその組立方法

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