JP2021030408A5 - - Google Patents
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- Publication number
- JP2021030408A5 JP2021030408A5 JP2019156921A JP2019156921A JP2021030408A5 JP 2021030408 A5 JP2021030408 A5 JP 2021030408A5 JP 2019156921 A JP2019156921 A JP 2019156921A JP 2019156921 A JP2019156921 A JP 2019156921A JP 2021030408 A5 JP2021030408 A5 JP 2021030408A5
- Authority
- JP
- Japan
- Prior art keywords
- pure water
- polishing
- height
- polished surface
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims 41
- 238000005498 polishing Methods 0.000 claims 34
- 239000000758 substrate Substances 0.000 claims 22
- 230000007423 decrease Effects 0.000 claims 8
- 239000012788 optical film Substances 0.000 claims 8
- 238000000034 method Methods 0.000 claims 6
- 239000010408 film Substances 0.000 claims 4
- 238000007517 polishing process Methods 0.000 claims 2
- 239000002002 slurry Substances 0.000 claims 2
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2019156921A JP7403998B2 (ja) | 2019-08-29 | 2019-08-29 | 研磨装置および研磨方法 |
| CN202080060537.0A CN114302789B (zh) | 2019-08-29 | 2020-08-12 | 研磨装置及研磨方法 |
| US17/638,109 US20220288742A1 (en) | 2019-08-29 | 2020-08-12 | Polishing apparatus and polishing method |
| PCT/JP2020/030688 WO2021039401A1 (ja) | 2019-08-29 | 2020-08-12 | 研磨装置および研磨方法 |
| KR1020227009633A KR102846970B1 (ko) | 2019-08-29 | 2020-08-12 | 연마 장치 및 연마 방법 |
| TW109129026A TWI848173B (zh) | 2019-08-29 | 2020-08-26 | 研磨裝置及研磨方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2019156921A JP7403998B2 (ja) | 2019-08-29 | 2019-08-29 | 研磨装置および研磨方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2021030408A JP2021030408A (ja) | 2021-03-01 |
| JP2021030408A5 true JP2021030408A5 (enExample) | 2022-05-09 |
| JP7403998B2 JP7403998B2 (ja) | 2023-12-25 |
Family
ID=74674667
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2019156921A Active JP7403998B2 (ja) | 2019-08-29 | 2019-08-29 | 研磨装置および研磨方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20220288742A1 (enExample) |
| JP (1) | JP7403998B2 (enExample) |
| KR (1) | KR102846970B1 (enExample) |
| CN (1) | CN114302789B (enExample) |
| TW (1) | TWI848173B (enExample) |
| WO (1) | WO2021039401A1 (enExample) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7008307B2 (ja) * | 2019-11-20 | 2022-02-10 | 株式会社ロジストラボ | 光学素子の製造方法及び光学素子製造システム |
| JP7709281B2 (ja) * | 2021-01-14 | 2025-07-16 | 株式会社荏原製作所 | 研磨装置、研磨方法、および基板の膜厚分布の可視化情報を出力する方法 |
Family Cites Families (35)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2782506B1 (fr) * | 1998-08-18 | 2000-09-22 | Labeille Ets | Dispositif et procede de distribution de suspension abrasive pour le polissage mecanique de substrat |
| US6159073A (en) * | 1998-11-02 | 2000-12-12 | Applied Materials, Inc. | Method and apparatus for measuring substrate layer thickness during chemical mechanical polishing |
| US6628397B1 (en) * | 1999-09-15 | 2003-09-30 | Kla-Tencor | Apparatus and methods for performing self-clearing optical measurements |
| JP2001088021A (ja) * | 1999-09-22 | 2001-04-03 | Speedfam Co Ltd | 研磨終点検出機構付き研磨装置 |
| JP3854056B2 (ja) * | 1999-12-13 | 2006-12-06 | 株式会社荏原製作所 | 基板膜厚測定方法、基板膜厚測定装置、基板処理方法及び基板処理装置 |
| US6599765B1 (en) * | 2001-12-12 | 2003-07-29 | Lam Research Corporation | Apparatus and method for providing a signal port in a polishing pad for optical endpoint detection |
| JP3878016B2 (ja) * | 2001-12-28 | 2007-02-07 | 株式会社荏原製作所 | 基板研磨装置 |
| US6913514B2 (en) * | 2003-03-14 | 2005-07-05 | Ebara Technologies, Inc. | Chemical mechanical polishing endpoint detection system and method |
| US20040242121A1 (en) * | 2003-05-16 | 2004-12-02 | Kazuto Hirokawa | Substrate polishing apparatus |
| US7101257B2 (en) * | 2003-05-21 | 2006-09-05 | Ebara Corporation | Substrate polishing apparatus |
| JP2005011977A (ja) * | 2003-06-18 | 2005-01-13 | Ebara Corp | 基板研磨装置および基板研磨方法 |
| US20070254558A1 (en) * | 2004-08-27 | 2007-11-01 | Masako Kodera | Polishing Apparatus and Polishing Method |
| JP4292179B2 (ja) * | 2005-10-27 | 2009-07-08 | 株式会社ナノテム | 砥石 |
| JP2011000647A (ja) * | 2009-06-16 | 2011-01-06 | Ebara Corp | 研磨監視方法 |
| US8694144B2 (en) * | 2010-08-30 | 2014-04-08 | Applied Materials, Inc. | Endpoint control of multiple substrates of varying thickness on the same platen in chemical mechanical polishing |
| JP5980476B2 (ja) * | 2010-12-27 | 2016-08-31 | 株式会社荏原製作所 | ポリッシング装置およびポリッシング方法 |
| US9080576B2 (en) * | 2011-02-13 | 2015-07-14 | Applied Materials, Inc. | Method and apparatus for controlling a processing system |
| JP5896625B2 (ja) * | 2011-06-02 | 2016-03-30 | 株式会社荏原製作所 | 研磨装置に使用される研磨パッドの研磨面を監視する方法および装置 |
| US9592585B2 (en) * | 2012-12-28 | 2017-03-14 | Taiwan Semiconductor Manufacturing Company, Ltd. | System and method for CMP station cleanliness |
| TWI635929B (zh) * | 2013-07-11 | 2018-09-21 | 日商荏原製作所股份有限公司 | 研磨裝置及研磨狀態監視方法 |
| JP6145342B2 (ja) * | 2013-07-12 | 2017-06-07 | 株式会社荏原製作所 | 膜厚測定装置、膜厚測定方法、および膜厚測定装置を備えた研磨装置 |
| KR20160065478A (ko) * | 2014-12-01 | 2016-06-09 | 주식회사 케이씨텍 | 화학 기계적 연마 장치의 컨디셔너 |
| JP6592355B2 (ja) * | 2015-01-30 | 2019-10-16 | 株式会社荏原製作所 | 連結機構および基板研磨装置 |
| JP2016165771A (ja) * | 2015-03-10 | 2016-09-15 | 株式会社ディスコ | 加工液循環型加工システム |
| KR20160115394A (ko) * | 2015-03-27 | 2016-10-06 | 주식회사 케이씨텍 | 화학 기계적 연마 장치 |
| JP6404172B2 (ja) * | 2015-04-08 | 2018-10-10 | 株式会社荏原製作所 | 膜厚測定方法、膜厚測定装置、研磨方法、および研磨装置 |
| JP6357260B2 (ja) * | 2016-09-30 | 2018-07-11 | 株式会社荏原製作所 | 研磨装置、及び研磨方法 |
| KR102652045B1 (ko) * | 2017-01-11 | 2024-03-29 | 주식회사 케이씨텍 | 화학 기계적 연마장치 및 그 제어방법 |
| JP6948868B2 (ja) * | 2017-07-24 | 2021-10-13 | 株式会社荏原製作所 | 研磨装置および研磨方法 |
| JP7023062B2 (ja) * | 2017-07-24 | 2022-02-21 | 株式会社荏原製作所 | 基板研磨装置及び方法 |
| JP7023063B2 (ja) * | 2017-08-08 | 2022-02-21 | 株式会社荏原製作所 | 基板研磨装置及び方法 |
| AU2018340857B2 (en) * | 2017-09-26 | 2023-12-07 | Commonwealth Scientific And Industrial Research Organisation | Detecting settled solids in a conduit for transporting a slurry |
| JP7197999B2 (ja) * | 2018-05-11 | 2022-12-28 | キオクシア株式会社 | 研磨装置および研磨パッド |
| JP7316785B2 (ja) * | 2018-12-26 | 2023-07-28 | 株式会社荏原製作所 | 光学式膜厚測定システムの洗浄方法 |
| US11679468B2 (en) * | 2019-05-16 | 2023-06-20 | Taiwan Semiconductor Manufacturing Co., Ltd. | Chemical-mechanical polishing system and method |
-
2019
- 2019-08-29 JP JP2019156921A patent/JP7403998B2/ja active Active
-
2020
- 2020-08-12 CN CN202080060537.0A patent/CN114302789B/zh active Active
- 2020-08-12 US US17/638,109 patent/US20220288742A1/en active Pending
- 2020-08-12 WO PCT/JP2020/030688 patent/WO2021039401A1/ja not_active Ceased
- 2020-08-12 KR KR1020227009633A patent/KR102846970B1/ko active Active
- 2020-08-26 TW TW109129026A patent/TWI848173B/zh active
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