JP2020534904A5 - - Google Patents

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Publication number
JP2020534904A5
JP2020534904A5 JP2020516732A JP2020516732A JP2020534904A5 JP 2020534904 A5 JP2020534904 A5 JP 2020534904A5 JP 2020516732 A JP2020516732 A JP 2020516732A JP 2020516732 A JP2020516732 A JP 2020516732A JP 2020534904 A5 JP2020534904 A5 JP 2020534904A5
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JP
Japan
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ray
imaging device
scan data
ray detector
respect
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JP2020516732A
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English (en)
Japanese (ja)
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JP2020534904A (ja
JP6961077B2 (ja
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Priority claimed from EP17192846.8A external-priority patent/EP3459461A1/en
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JP2020516732A 2017-09-25 2018-09-21 X線撮像参照スキャン Active JP6961077B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP17192846.8 2017-09-25
EP17192846.8A EP3459461A1 (en) 2017-09-25 2017-09-25 X-ray imaging reference scan
PCT/EP2018/075643 WO2019057915A1 (en) 2017-09-25 2018-09-21 X-RAY IMAGING REFERENCE SCAN

Publications (3)

Publication Number Publication Date
JP2020534904A JP2020534904A (ja) 2020-12-03
JP2020534904A5 true JP2020534904A5 (enExample) 2021-04-22
JP6961077B2 JP6961077B2 (ja) 2021-11-05

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JP2020516732A Active JP6961077B2 (ja) 2017-09-25 2018-09-21 X線撮像参照スキャン

Country Status (5)

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US (1) US11231378B2 (enExample)
EP (2) EP3459461A1 (enExample)
JP (1) JP6961077B2 (enExample)
CN (1) CN111107787B (enExample)
WO (1) WO2019057915A1 (enExample)

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DE112019003777B4 (de) 2018-07-26 2025-09-11 Sigray, Inc. Röntgenreflexionsquelle mit hoher helligkeit
CN112823280B (zh) 2018-09-07 2024-11-05 斯格瑞公司 用于深度可选x射线分析的系统和方法
WO2021046059A1 (en) 2019-09-03 2021-03-11 Sigray, Inc. System and method for computed laminography x-ray fluorescence imaging
US11175243B1 (en) 2020-02-06 2021-11-16 Sigray, Inc. X-ray dark-field in-line inspection for semiconductor samples
WO2021237237A1 (en) 2020-05-18 2021-11-25 Sigray, Inc. System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements
WO2022061347A1 (en) 2020-09-17 2022-03-24 Sigray, Inc. System and method using x-rays for depth-resolving metrology and analysis
US11686692B2 (en) 2020-12-07 2023-06-27 Sigray, Inc. High throughput 3D x-ray imaging system using a transmission x-ray source
US12480892B2 (en) 2020-12-07 2025-11-25 Sigray, Inc. High throughput 3D x-ray imaging system using a transmission x-ray source
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CN115861250B (zh) * 2022-12-14 2023-09-22 深圳技术大学 自适应数据集的半监督医学图像器官分割方法及系统
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