JP2020534904A5 - - Google Patents

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Publication number
JP2020534904A5
JP2020534904A5 JP2020516732A JP2020516732A JP2020534904A5 JP 2020534904 A5 JP2020534904 A5 JP 2020534904A5 JP 2020516732 A JP2020516732 A JP 2020516732A JP 2020516732 A JP2020516732 A JP 2020516732A JP 2020534904 A5 JP2020534904 A5 JP 2020534904A5
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JP
Japan
Prior art keywords
ray
imaging device
scan data
ray detector
respect
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JP2020516732A
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English (en)
Japanese (ja)
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JP2020534904A (ja
JP6961077B2 (ja
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Priority claimed from EP17192846.8A external-priority patent/EP3459461A1/en
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JP2020516732A 2017-09-25 2018-09-21 X線撮像参照スキャン Active JP6961077B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP17192846.8 2017-09-25
EP17192846.8A EP3459461A1 (en) 2017-09-25 2017-09-25 X-ray imaging reference scan
PCT/EP2018/075643 WO2019057915A1 (en) 2017-09-25 2018-09-21 X-RAY IMAGING REFERENCE SCAN

Publications (3)

Publication Number Publication Date
JP2020534904A JP2020534904A (ja) 2020-12-03
JP2020534904A5 true JP2020534904A5 (enExample) 2021-04-22
JP6961077B2 JP6961077B2 (ja) 2021-11-05

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Family Applications (1)

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JP2020516732A Active JP6961077B2 (ja) 2017-09-25 2018-09-21 X線撮像参照スキャン

Country Status (5)

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US (1) US11231378B2 (enExample)
EP (2) EP3459461A1 (enExample)
JP (1) JP6961077B2 (enExample)
CN (1) CN111107787B (enExample)
WO (1) WO2019057915A1 (enExample)

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US10295485B2 (en) 2013-12-05 2019-05-21 Sigray, Inc. X-ray transmission spectrometer system
WO2019236384A1 (en) 2018-06-04 2019-12-12 Sigray, Inc. Wavelength dispersive x-ray spectrometer
CN112470245B (zh) 2018-07-26 2025-03-18 斯格瑞公司 高亮度x射线反射源
US11056308B2 (en) 2018-09-07 2021-07-06 Sigray, Inc. System and method for depth-selectable x-ray analysis
DE112020004169T5 (de) 2019-09-03 2022-05-25 Sigray, Inc. System und verfahren zur computergestützten laminografieröntgenfluoreszenz-bildgebung
US11175243B1 (en) 2020-02-06 2021-11-16 Sigray, Inc. X-ray dark-field in-line inspection for semiconductor samples
CN115667896B (zh) 2020-05-18 2024-06-21 斯格瑞公司 使用晶体分析器和多个检测元件的x射线吸收光谱的系统和方法
US11549895B2 (en) 2020-09-17 2023-01-10 Sigray, Inc. System and method using x-rays for depth-resolving metrology and analysis
WO2022126071A1 (en) 2020-12-07 2022-06-16 Sigray, Inc. High throughput 3d x-ray imaging system using a transmission x-ray source
US12480892B2 (en) 2020-12-07 2025-11-25 Sigray, Inc. High throughput 3D x-ray imaging system using a transmission x-ray source
US12360067B2 (en) 2022-03-02 2025-07-15 Sigray, Inc. X-ray fluorescence system and x-ray source with electrically insulative target material
WO2023177981A1 (en) 2022-03-15 2023-09-21 Sigray, Inc. System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector
WO2023215204A1 (en) 2022-05-02 2023-11-09 Sigray, Inc. X-ray sequential array wavelength dispersive spectrometer
CN115861250B (zh) * 2022-12-14 2023-09-22 深圳技术大学 自适应数据集的半监督医学图像器官分割方法及系统
US12209977B2 (en) 2023-02-16 2025-01-28 Sigray, Inc. X-ray detector system with at least two stacked flat Bragg diffractors
US12181423B1 (en) 2023-09-07 2024-12-31 Sigray, Inc. Secondary image removal using high resolution x-ray transmission sources
US12429437B2 (en) 2023-11-07 2025-09-30 Sigray, Inc. System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes
CN120195197A (zh) * 2023-12-21 2025-06-24 清华大学 辐射成像设备和方法
US12429436B2 (en) 2024-01-08 2025-09-30 Sigray, Inc. X-ray analysis system with focused x-ray beam and non-x-ray microscope
US12431256B2 (en) 2024-02-15 2025-09-30 Sigray, Inc. System and method for generating a focused x-ray beam
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