JP2019525362A5 - - Google Patents

Download PDF

Info

Publication number
JP2019525362A5
JP2019525362A5 JP2019511460A JP2019511460A JP2019525362A5 JP 2019525362 A5 JP2019525362 A5 JP 2019525362A5 JP 2019511460 A JP2019511460 A JP 2019511460A JP 2019511460 A JP2019511460 A JP 2019511460A JP 2019525362 A5 JP2019525362 A5 JP 2019525362A5
Authority
JP
Japan
Prior art keywords
ecc
read
memory
input
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2019511460A
Other languages
English (en)
Japanese (ja)
Other versions
JP7303408B2 (ja
JP2019525362A (ja
Filing date
Publication date
Priority claimed from US15/244,739 external-priority patent/US9904595B1/en
Application filed filed Critical
Publication of JP2019525362A publication Critical patent/JP2019525362A/ja
Publication of JP2019525362A5 publication Critical patent/JP2019525362A5/ja
Priority to JP2022096954A priority Critical patent/JP7769181B2/ja
Application granted granted Critical
Publication of JP7303408B2 publication Critical patent/JP7303408B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2019511460A 2016-08-23 2017-08-22 欠陥検出を備えるエラー補正ハードウェア Active JP7303408B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2022096954A JP7769181B2 (ja) 2016-08-23 2022-06-16 欠陥検出を備えるエラー補正ハードウェア

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US15/244,739 2016-08-23
US15/244,739 US9904595B1 (en) 2016-08-23 2016-08-23 Error correction hardware with fault detection
PCT/US2017/047890 WO2018039156A1 (en) 2016-08-23 2017-08-22 Error correction hardware with fault detection

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2022096954A Division JP7769181B2 (ja) 2016-08-23 2022-06-16 欠陥検出を備えるエラー補正ハードウェア

Publications (3)

Publication Number Publication Date
JP2019525362A JP2019525362A (ja) 2019-09-05
JP2019525362A5 true JP2019525362A5 (enExample) 2020-10-08
JP7303408B2 JP7303408B2 (ja) 2023-07-05

Family

ID=61225790

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2019511460A Active JP7303408B2 (ja) 2016-08-23 2017-08-22 欠陥検出を備えるエラー補正ハードウェア
JP2022096954A Active JP7769181B2 (ja) 2016-08-23 2022-06-16 欠陥検出を備えるエラー補正ハードウェア

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2022096954A Active JP7769181B2 (ja) 2016-08-23 2022-06-16 欠陥検出を備えるエラー補正ハードウェア

Country Status (6)

Country Link
US (4) US9904595B1 (enExample)
EP (1) EP3504624B1 (enExample)
JP (2) JP7303408B2 (enExample)
KR (2) KR102399843B1 (enExample)
CN (1) CN109643262B (enExample)
WO (1) WO2018039156A1 (enExample)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9904595B1 (en) * 2016-08-23 2018-02-27 Texas Instruments Incorporated Error correction hardware with fault detection
US10417077B2 (en) * 2016-09-29 2019-09-17 2236008 Ontario Inc. Software handling of hardware errors
GB201710839D0 (en) * 2017-07-05 2017-08-16 Irdeto Bv Data protection
US10901840B2 (en) * 2018-06-28 2021-01-26 Western Digital Technologies, Inc. Error correction decoding with redundancy data
US10985765B2 (en) 2018-08-07 2021-04-20 Samsung Electronics Co., Ltd. Apparatus including safety logic
US10977109B2 (en) 2018-08-07 2021-04-13 Samsung Electronics Co., Ltd. Apparatus including safety logic
US11119909B2 (en) * 2018-12-11 2021-09-14 Texas Instmments Incorporated Method and system for in-line ECC protection
US11069421B1 (en) 2020-06-16 2021-07-20 Nxp Usa, Inc. Circuitry for checking operation of error correction code (ECC) circuitry
CN114446370B (zh) * 2020-11-06 2024-08-09 长鑫存储技术有限公司 信号校验系统
US12235720B2 (en) 2020-12-26 2025-02-25 Intel Corporation Adaptive error correction to improve system memory reliability, availability, and serviceability (RAS)
EP4222746A1 (en) * 2021-09-29 2023-08-09 Dream CHIP Technologies GmbH Electronic circuit and method for self-diagnosis of a data memory
US12176919B2 (en) 2021-11-25 2024-12-24 Samsung Electronics Co., Ltd. Error correction code circuit, memory device including error correction code circuit, and operation method of error correction code circuit
US11921580B2 (en) * 2022-07-08 2024-03-05 Micron Technology, Inc. Redundant multiport memory for vehicle applications
DE102023102337A1 (de) 2023-01-31 2024-08-01 Infineon Technologies Ag Fehlererkennung
KR20250104649A (ko) * 2023-12-29 2025-07-08 에스케이하이닉스 주식회사 메모리 장치 및 그의 테스트방법

Family Cites Families (61)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5823678B2 (ja) * 1974-11-20 1983-05-17 日本電気株式会社 ジコチエツクキノウオユウスルアヤマリテイセイカイロ
US4531213A (en) * 1982-03-03 1985-07-23 Sperry Corporation Memory through checking system with comparison of data word parity before and after ECC processing
JP2583547B2 (ja) * 1988-01-13 1997-02-19 株式会社日立製作所 半導体メモリ
US5173905A (en) * 1990-03-29 1992-12-22 Micron Technology, Inc. Parity and error correction coding on integrated circuit addresses
US5488691A (en) 1993-11-17 1996-01-30 International Business Machines Corporation Memory card, computer system and method of operation for differentiating the use of read-modify-write cycles in operating and initializaiton modes
US5509129A (en) * 1993-11-30 1996-04-16 Guttag; Karl M. Long instruction word controlling plural independent processor operations
US5928349A (en) * 1995-02-24 1999-07-27 International Business Machines Corporation Mixed-endian computing environment for a conventional bi-endian computer system
US5758050A (en) * 1996-03-12 1998-05-26 International Business Machines Corporation Reconfigurable data storage system
US6216247B1 (en) * 1998-05-29 2001-04-10 Intel Corporation 32-bit mode for a 64-bit ECC capable memory subsystem
US7134069B1 (en) * 1999-06-16 2006-11-07 Madrone Solutions, Inc. Method and apparatus for error detection and correction
US6957378B2 (en) * 2001-06-04 2005-10-18 Kabushiki Kaisha Toshiba Semiconductor memory device
US20030009721A1 (en) 2001-07-06 2003-01-09 International Business Machines Corporation Method and system for background ECC scrubbing for a memory array
CN1409492A (zh) * 2001-09-07 2003-04-09 萧正杰 纠错码电路
US7028213B2 (en) 2001-09-28 2006-04-11 Hewlett-Packard Development Company, L.P. Error indication in a raid memory system
US7051264B2 (en) * 2001-11-14 2006-05-23 Monolithic System Technology, Inc. Error correcting memory and method of operating same
US7320100B2 (en) * 2003-05-20 2008-01-15 Cray Inc. Apparatus and method for memory with bit swapping on the fly and testing
US7437593B2 (en) * 2003-07-14 2008-10-14 International Business Machines Corporation Apparatus, system, and method for managing errors in prefetched data
JP2005196680A (ja) * 2004-01-09 2005-07-21 Ricoh Co Ltd コンピュータシステム
US7392456B2 (en) * 2004-11-23 2008-06-24 Mosys, Inc. Predictive error correction code generation facilitating high-speed byte-write in a semiconductor memory
JP4905839B2 (ja) * 2005-10-18 2012-03-28 日本電気株式会社 Ｍｒａｍの動作方法
JP2007257791A (ja) * 2006-03-24 2007-10-04 Fujitsu Ltd 半導体記憶装置
US7861138B2 (en) * 2006-12-05 2010-12-28 Qimonda Ag Error correction in memory devices
JP4343945B2 (ja) * 2006-12-28 2009-10-14 三菱電機株式会社 電子制御装置
US8510633B2 (en) * 2007-04-17 2013-08-13 Nec Corporation Semiconductor storage device and method of operating the same
JP4994112B2 (ja) * 2007-05-22 2012-08-08 ルネサスエレクトロニクス株式会社 半導体集積回路装置およびメモリ制御方法
US8250452B2 (en) 2007-08-20 2012-08-21 Infineon Technologies Ag Method and apparatus for embedded memory security
JP4564520B2 (ja) * 2007-08-31 2010-10-20 株式会社東芝 半導体記憶装置およびその制御方法
KR101489827B1 (ko) * 2008-03-25 2015-02-04 삼성전자주식회사 낸드 플래시 메모리와 컨트롤러 간의 효율적인 프로토콜을사용하는 반도체 메모리 장치
JP5259343B2 (ja) * 2008-10-31 2013-08-07 株式会社東芝 メモリ装置
US8090984B2 (en) * 2008-12-10 2012-01-03 Freescale Semiconductor, Inc. Error detection and communication of an error location in multi-processor data processing system having processors operating in Lockstep
US8281227B2 (en) * 2009-05-18 2012-10-02 Fusion-10, Inc. Apparatus, system, and method to increase data integrity in a redundant storage system
JP2010277352A (ja) * 2009-05-28 2010-12-09 Toshiba Corp メモリシステム
WO2010147730A1 (en) * 2009-06-16 2010-12-23 Tele Atlas North America Inc. Methods and systems for creating digital street network database
KR101062755B1 (ko) * 2009-07-29 2011-09-06 주식회사 하이닉스반도체 Ｅｃｃ 회로를 포함하는 반도체 메모리 시스템 및 그 제어 방법
US8381083B2 (en) * 2009-10-22 2013-02-19 Arm Limited Error control coding for single error correction and double error detection
KR20110087036A (ko) * 2010-01-25 2011-08-02 삼성전자주식회사 덮어쓰기 가능한 불휘발성 메모리 장치 및 그것의 데이터 쓰기 방법
US8438344B2 (en) * 2010-03-12 2013-05-07 Texas Instruments Incorporated Low overhead and timing improved architecture for performing error checking and correction for memories and buses in system-on-chips, and other circuits, systems and processes
US8612814B1 (en) * 2010-06-14 2013-12-17 Altera Corporation Memory error detection circuitry
US8560927B1 (en) * 2010-08-26 2013-10-15 Altera Corporation Memory error detection circuitry
US8972821B2 (en) * 2010-12-23 2015-03-03 Texas Instruments Incorporated Encode and multiplex, register, and decode and error correction circuitry
US8984367B2 (en) * 2011-02-25 2015-03-17 Altera Corporation Error detection and correction circuitry
US8516339B1 (en) * 2011-04-01 2013-08-20 Xilinx, Inc. Method of and circuit for correcting adjacent bit errors in a memory
FR2983597B1 (fr) 2011-12-01 2014-01-24 Viaccess Sa Procede de detection d'une erreur de lecture d'une donnee
US9081588B2 (en) 2012-01-31 2015-07-14 Mentor Graphics Corporation Execution time profiling for interpreted programming languages
US9081568B1 (en) * 2012-09-25 2015-07-14 Amazon Technologies, Inc. Electrical power system with automatic transfer switch failure protection
US9013921B2 (en) * 2012-12-06 2015-04-21 Samsung Electronics Co., Ltd. Semiconductor memory device
US10796617B2 (en) * 2013-06-12 2020-10-06 Infineon Technologies Ag Device, method and system for processing an image data stream
CN105340022B (zh) * 2013-06-24 2019-11-12 美光科技公司 用于校正数据错误的电路、设备及方法
JPWO2015037159A1 (ja) * 2013-09-13 2017-03-02 株式会社東芝 半導体記憶装置及びメモリシステム
GB201320983D0 (en) * 2013-11-28 2014-01-15 Ibm Data encoding in solid-state storage apparatus
KR101611261B1 (ko) * 2013-12-12 2016-04-12 엘지전자 주식회사 스테레오 카메라, 이를 구비한 차량 운전 보조 장치, 및 차량
US9342404B2 (en) * 2013-12-12 2016-05-17 Phison Electronics Corp. Decoding method, memory storage device, and memory controlling circuit unit
JP6212396B2 (ja) * 2014-01-08 2017-10-11 ルネサスエレクトロニクス株式会社 データ処理装置
US9854707B2 (en) 2014-01-10 2017-12-26 Rosemount Aerospace Inc. Integrated pipe heat exchanger
US9430328B2 (en) * 2014-01-24 2016-08-30 Stmicroelectronics S.R.L. Error correction in memory devices by multiple readings with different references
US9495232B2 (en) 2014-03-28 2016-11-15 Intel IP Corporation Error correcting (ECC) memory compatibility
CA2945957C (en) 2014-04-14 2023-03-14 Sirius Xm Radio Inc. Systems, methods and applications for using and enhancing vehicle to vehicle communications, including synergies and interoperation with satellite radio
US9535782B2 (en) 2014-04-16 2017-01-03 Intel Corporation Method, apparatus and system for handling data error events with a memory controller
JP6332134B2 (ja) * 2014-09-16 2018-05-30 株式会社デンソー メモリ診断回路
WO2016082141A1 (zh) * 2014-11-27 2016-06-02 京微雅格（北京）科技有限公司 块存储器配置结构和配置方法
US9904595B1 (en) * 2016-08-23 2018-02-27 Texas Instruments Incorporated Error correction hardware with fault detection

Similar Documents

Publication Publication Date Title
JP2019525362A5 (enExample)
JP7769181B2 (ja) 欠陥検出を備えるエラー補正ハードウェア
CN112527549B (zh) 存储器控制器和包括该存储器控制器的存储器系统
TWI792682B (zh) 帶有糾錯及數據刷洗電路的記憶體系統
US9148176B2 (en) Circuits, apparatuses, and methods for correcting data errors
CN107924349B (zh) 存储器装置管芯上错误校验和纠正代码
TWI777894B (zh) 半導體記憶體裝置
TWI587308B (zh) 於非依電性記憶體中之回復演算法
TWI635503B (zh) 半導體記憶體裝置及操作該半導體記憶體裝置的方法
TW201729213A (zh) 記憶體系統中之獨立鏈路及陣列錯誤校正
US20170123892A1 (en) Parity check circuit and memory device including the same
US9524209B2 (en) Methods of computer memory access and computer memory error correction
FR3038752A1 (enExample)
KR20190069805A (ko) 반도체시스템
TW202029210A (zh) 具有階層式錯誤校正碼層的記憶體裝置
US20150280745A1 (en) Data processing block and data storage device including the same
TWI517176B (zh) 降低ｎａｎｄ快閃記憶體裝置與控制器之間匯流排流量的半導體記憶體裝置
US20170102992A1 (en) Memory Module with Integrated Error Correction
TWI798250B (zh) 錯誤校正方法和使用其的半導體裝置
JP2020150515A (ja) 誤り訂正回路及びメモリシステム
KR20180026868A (ko) 집적회로
US9092354B2 (en) Storage device, CRC generation device, and CRC generation method
JP2001202793A (ja) 半導体記憶装置におけるエラー訂正符号化方法および半導体記憶装置
TWI703572B (zh) 記憶體儲存裝置及其記憶體測試方法
US20130238963A1 (en) Digital Architectures For Serial Data Stream Operations