JP2019514001A5 - - Google Patents

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Publication number
JP2019514001A5
JP2019514001A5 JP2018553881A JP2018553881A JP2019514001A5 JP 2019514001 A5 JP2019514001 A5 JP 2019514001A5 JP 2018553881 A JP2018553881 A JP 2018553881A JP 2018553881 A JP2018553881 A JP 2018553881A JP 2019514001 A5 JP2019514001 A5 JP 2019514001A5
Authority
JP
Japan
Prior art keywords
spring arm
spring
contact
contact pin
central region
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2018553881A
Other languages
English (en)
Japanese (ja)
Other versions
JP2019514001A (ja
JP6818986B2 (ja
Filing date
Publication date
Priority claimed from DE102016004520.5A external-priority patent/DE102016004520A1/de
Application filed filed Critical
Publication of JP2019514001A publication Critical patent/JP2019514001A/ja
Publication of JP2019514001A5 publication Critical patent/JP2019514001A5/ja
Application granted granted Critical
Publication of JP6818986B2 publication Critical patent/JP6818986B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2018553881A 2016-04-13 2017-04-07 コンタクトピン及びそれを有する試験台 Active JP6818986B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102016004520.5 2016-04-13
DE102016004520.5A DE102016004520A1 (de) 2016-04-13 2016-04-13 Kontaktstift und Testsockel mit Kontaktstiften
PCT/EP2017/000445 WO2017178105A1 (de) 2016-04-13 2017-04-07 Kontaktstift und testsockel mit kontaktstiften

Publications (3)

Publication Number Publication Date
JP2019514001A JP2019514001A (ja) 2019-05-30
JP2019514001A5 true JP2019514001A5 (enExample) 2019-07-18
JP6818986B2 JP6818986B2 (ja) 2021-01-27

Family

ID=58503566

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2018553881A Active JP6818986B2 (ja) 2016-04-13 2017-04-07 コンタクトピン及びそれを有する試験台

Country Status (8)

Country Link
US (1) US10641793B2 (enExample)
EP (1) EP3265831B1 (enExample)
JP (1) JP6818986B2 (enExample)
KR (1) KR101927678B1 (enExample)
CN (1) CN109416374B (enExample)
DE (1) DE102016004520A1 (enExample)
TW (1) TWI721151B (enExample)
WO (1) WO2017178105A1 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102590407B1 (ko) * 2017-10-31 2023-10-16 폼팩터, 인크. 디커플링된 전기 및 기계 프로브 연결들을 갖는 mems 프로브 카드 조립체
CN108306138A (zh) * 2018-01-09 2018-07-20 番禺得意精密电子工业有限公司 电连接器
DE102018104264A1 (de) 2018-02-26 2019-08-29 Rosenberger Hochfrequenztechnik Gmbh & Co. Kg Verfahren zur herstellung von mindestens einem hochfrequenz-kontaktelement oder einer hochfrequenz-kontaktelement-anordnung sowie zugehörige vorrichtung
CN111880067B (zh) * 2019-04-15 2023-05-05 台湾中华精测科技股份有限公司 晶片测试组件及其电性连接模块
TWI745182B (zh) * 2020-11-30 2021-11-01 中華精測科技股份有限公司 探針卡裝置及雙臂式探針
WO2023196438A1 (en) * 2022-04-07 2023-10-12 Microfabrica Inc. Probes with planar unbiased spring elements for electronic component contact, methods for making such probes, and methods for using such probes
EP4372388A1 (en) 2022-11-18 2024-05-22 Cohu GmbH A test socket for and method of testing electronic components, in particular high-power semiconductor components

Family Cites Families (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0447689A (ja) * 1990-06-13 1992-02-17 Sansei Denshi Japan Kk Ｉｃタブ用ソケット
US5440231A (en) 1993-04-19 1995-08-08 Motorola, Inc. Method and apparatus for coupling a semiconductor device with a tester
JPH0747689A (ja) 1993-08-03 1995-02-21 Canon Inc 記録装置
JPH07254468A (ja) * 1994-03-15 1995-10-03 Sony Corp Ｉｃ測定用ソケット
US6034534A (en) * 1995-05-25 2000-03-07 Kiyota; Shigeo Laminated contact probe for inspection of ultra-microscopic pitch
US5764072A (en) * 1996-12-20 1998-06-09 Probe Technology Dual contact probe assembly for testing integrated circuits
US6064218A (en) 1997-03-11 2000-05-16 Primeyield Systems, Inc. Peripherally leaded package test contactor
US6045367A (en) 1997-09-24 2000-04-04 Teledyne Industries, Inc. Multi-pin connector
US6491968B1 (en) * 1998-12-02 2002-12-10 Formfactor, Inc. Methods for making spring interconnect structures
TW490832B (en) * 1999-12-29 2002-06-11 Formfactor Inc Spring interconnect structures and methods for making spring interconnect structures
JP3810977B2 (ja) * 2000-02-25 2006-08-16 株式会社エンプラス 電気部品用ソケット
US6604950B2 (en) 2001-04-26 2003-08-12 Teledyne Technologies Incorporated Low pitch, high density connector
JP2002365308A (ja) * 2001-06-08 2002-12-18 Japan Electronic Materials Corp 垂直ブレード型プローブ、垂直ブレード型プローブユニット及びそれを用いた垂直ブレード型プローブカード
US7265565B2 (en) * 2003-02-04 2007-09-04 Microfabrica Inc. Cantilever microprobes for contacting electronic components and methods for making such probes
US20040157476A1 (en) 2003-02-12 2004-08-12 Ralph Maldonado Perimeter sealed high density multi-pin connector
US6921270B2 (en) * 2003-06-11 2005-07-26 Cinch Connectors, Inc. Electrical connector
JP3860561B2 (ja) 2003-06-27 2006-12-20 タイコエレクトロニクスアンプ株式会社 Ｉｃソケット
JP2005069711A (ja) * 2003-08-27 2005-03-17 Japan Electronic Materials Corp プローブカード及びそれに使用する接触子
US7217139B2 (en) 2004-08-11 2007-05-15 Antares Advanced Test Technologies, Inc. Interconnect assembly for a probe card
JP2006132982A (ja) * 2004-11-02 2006-05-25 Tokyo Electron Ltd プローブ
JP2008532011A (ja) * 2005-02-24 2008-08-14 エス ヴィ プルーブ ピーティーイー リミテッド ウェハ試験装置のプローブ
US7438556B2 (en) * 2006-08-15 2008-10-21 Hon Hai Precision Ind. Co., Ltd. Electrical interconnection between multiple printed circuit boards
KR100947862B1 (ko) * 2008-06-30 2010-03-18 한국기계연구원 힌지 구조를 갖는 캔틸레버형 미세 접촉 프로브
TW201010187A (en) * 2008-08-18 2010-03-01 Hon Hai Prec Ind Co Ltd Electrical connector
WO2014003003A1 (ja) 2012-06-25 2014-01-03 山一電機株式会社 電気テスト用コンタクトおよびそれを用いた電気テスト用ソケット
JP5968158B2 (ja) 2012-08-10 2016-08-10 株式会社日本マイクロニクス コンタクトプローブ及びプローブカード
WO2014073368A1 (ja) * 2012-11-07 2014-05-15 オムロン株式会社 接続端子およびこれを用いた導通検査器具
SG11201510024VA (en) * 2013-05-06 2016-01-28 Formfactor Inc A probe card assembly for testing electronic devices

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