JP2018503100A - 複製（製造）光学デバイスの品質を判断するためのシステム及び方法 - Google Patents

複製（製造）光学デバイスの品質を判断するためのシステム及び方法 Download PDF

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JP2018503100A
JP2018503100A JP2017543853A JP2017543853A JP2018503100A JP 2018503100 A JP2018503100 A JP 2018503100A JP 2017543853 A JP2017543853 A JP 2017543853A JP 2017543853 A JP2017543853 A JP 2017543853A JP 2018503100 A JP2018503100 A JP 2018503100A
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JP2018503100A5 (OSRAM
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コンラッド ファビアン
コンラッド ファビアン
チャンドラ バカラジュ ラビ
チャンドラ バカラジュ ラビ
エフルマン クラウス
エフルマン クラウス
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ブリエン ホールデン ビジョン インスティチュート
ブリエン ホールデン ビジョン インスティチュート
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0228—Testing optical properties by measuring refractive power
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
    • G02B27/4205—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive optical element [DOE] contributing to image formation, e.g. whereby modulation transfer function MTF or optical aberrations are relevant
    • G02B27/4211—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive optical element [DOE] contributing to image formation, e.g. whereby modulation transfer function MTF or optical aberrations are relevant correcting chromatic aberrations
    • G—PHYSICS
    • G02—OPTICS
    • G02C—SPECTACLES; SUNGLASSES OR GOGGLES INSOFAR AS THEY HAVE THE SAME FEATURES AS SPECTACLES; CONTACT LENSES
    • G02C7/00—Optical parts

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Geometry (AREA)
  • Health & Medical Sciences (AREA)
  • Ophthalmology & Optometry (AREA)
  • General Health & Medical Sciences (AREA)
  • Eyeglasses (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Lenses (AREA)
JP2017543853A 2014-11-11 2015-11-11 複製（製造）光学デバイスの品質を判断するためのシステム及び方法 Pending JP2018503100A (ja)

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US201462078310P 2014-11-11 2014-11-11
US62/078,310 2014-11-11
PCT/AU2015/050700 WO2016074034A2 (en) 2014-11-11 2015-11-11 Systems and methods for determining the quality of a reproduced (manufactured) optic device

Related Child Applications (1)

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JP2021000650A Division JP2021060420A (ja) 2014-11-11 2021-01-06 複製（製造）光学デバイスの品質を判断するためのシステム及び方法

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JP2018503100A true JP2018503100A (ja) 2018-02-01
JP2018503100A5 JP2018503100A5 (OSRAM) 2018-12-20

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JP2017543853A Pending JP2018503100A (ja) 2014-11-11 2015-11-11 複製（製造）光学デバイスの品質を判断するためのシステム及び方法
JP2021000650A Pending JP2021060420A (ja) 2014-11-11 2021-01-06 複製（製造）光学デバイスの品質を判断するためのシステム及び方法
JP2023027890A Pending JP2023078153A (ja) 2014-11-11 2023-02-27 複製（製造）光学デバイスの品質を判断するためのシステム及び方法

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JP2021000650A Pending JP2021060420A (ja) 2014-11-11 2021-01-06 複製（製造）光学デバイスの品質を判断するためのシステム及び方法
JP2023027890A Pending JP2023078153A (ja) 2014-11-11 2023-02-27 複製（製造）光学デバイスの品質を判断するためのシステム及び方法

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US (2) US10352816B2 (OSRAM)
EP (1) EP3218685B1 (OSRAM)
JP (3) JP2018503100A (OSRAM)
KR (1) KR20170080696A (OSRAM)
CN (1) CN107110740B (OSRAM)
ES (1) ES2887113T3 (OSRAM)
HU (1) HUE055799T2 (OSRAM)
SG (1) SG11201703751YA (OSRAM)
TW (1) TWI679466B (OSRAM)
WO (1) WO2016074034A2 (OSRAM)

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EP3218685B1 (en) * 2014-11-11 2021-06-16 Brien Holden Vision Institute Systems and methods for determining the quality of a reproduced (manufactured) optic device
US10036685B2 (en) * 2016-05-18 2018-07-31 Jand, Inc. Fixtureless lensmeter and methods of operating same
US10557773B2 (en) 2016-05-18 2020-02-11 Jand, Inc. Fixtureless lensmeter system
US11488239B2 (en) 2019-08-26 2022-11-01 Warby Parker Inc. Virtual fitting systems and methods for spectacles
EP4136563B8 (en) 2020-04-15 2025-10-01 Warby Parker Inc. Virtual try-on systems for spectacles using reference frames
JP7664953B2 (ja) 2020-06-17 2025-04-18 ワービー・パーカー・インコーポレイテッド 瞳孔間距離を測定するためのシステムおよび方法ならびにそれらの使用

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JP2009031109A (ja) * 2007-07-26 2009-02-12 Tokyo Institute Of Technology 画像解析方法
JP2012132689A (ja) * 2010-12-20 2012-07-12 Tokai Kogaku Kk 眼鏡レンズの評価方法
WO2014080207A2 (en) * 2012-11-26 2014-05-30 Taylor Hobson Limited Analysing and machining an optical profile

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TW475171B (en) * 1998-07-27 2002-02-01 Matsushita Electric Industrial Co Ltd Method and apparatus for evaluating aberrations of optical element for use with optical device
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WO2003098181A1 (en) 2002-05-16 2003-11-27 Hoya Corporation Method and device for evaluating spectacle lens or mold for molding spectacle lens, and method and system for manufacturing spectacle lens
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TWI588560B (zh) * 2012-04-05 2017-06-21 布萊恩荷登視覺協會 用於屈光不正之鏡片、裝置、方法及系統
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EP3218685B1 (en) * 2014-11-11 2021-06-16 Brien Holden Vision Institute Systems and methods for determining the quality of a reproduced (manufactured) optic device

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007170888A (ja) * 2005-12-20 2007-07-05 Olympus Corp 光学素子検査装置
JP2007281003A (ja) * 2006-04-03 2007-10-25 Canon Inc 測定方法及び装置、並びに、露光装置
JP2008172004A (ja) * 2007-01-11 2008-07-24 Nikon Corp 収差評価方法、調整方法、露光装置、露光方法、およびデバイス製造方法
JP2009031109A (ja) * 2007-07-26 2009-02-12 Tokyo Institute Of Technology 画像解析方法
JP2012132689A (ja) * 2010-12-20 2012-07-12 Tokai Kogaku Kk 眼鏡レンズの評価方法
WO2014080207A2 (en) * 2012-11-26 2014-05-30 Taylor Hobson Limited Analysing and machining an optical profile

Also Published As

Publication number Publication date
TWI679466B (zh) 2019-12-11
US10352816B2 (en) 2019-07-16
HUE055799T2 (hu) 2021-12-28
KR20170080696A (ko) 2017-07-10
WO2016074034A3 (en) 2016-06-23
US20170322110A1 (en) 2017-11-09
ES2887113T3 (es) 2021-12-21
EP3218685A2 (en) 2017-09-20
CN107110740B (zh) 2021-04-30
EP3218685A4 (en) 2018-07-04
SG11201703751YA (en) 2017-06-29
CN107110740A (zh) 2017-08-29
WO2016074034A2 (en) 2016-05-19
TW201632953A (zh) 2016-09-16
US20190391039A1 (en) 2019-12-26
JP2021060420A (ja) 2021-04-15
JP2023078153A (ja) 2023-06-06
US10670495B2 (en) 2020-06-02
EP3218685B1 (en) 2021-06-16

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