KR20170080696A - 재생된(제조된) 광학 장치의 품질을 결정하는 시스템 및 방법 - Google Patents

재생된(제조된) 광학 장치의 품질을 결정하는 시스템 및 방법 Download PDF

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Publication number
KR20170080696A
KR20170080696A KR1020177015920A KR20177015920A KR20170080696A KR 20170080696 A KR20170080696 A KR 20170080696A KR 1020177015920 A KR1020177015920 A KR 1020177015920A KR 20177015920 A KR20177015920 A KR 20177015920A KR 20170080696 A KR20170080696 A KR 20170080696A
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South Korea
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frequency
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offset
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Korean (ko)
Inventor
페이비언 콘래드
라비 찬드라 바카라주
클라우즈 에르만
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브리엔 홀덴 비전 인스티튜트
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Publication of KR20170080696A publication Critical patent/KR20170080696A/ko
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0228—Testing optical properties by measuring refractive power
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
    • G02B27/4205—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive optical element [DOE] contributing to image formation, e.g. whereby modulation transfer function MTF or optical aberrations are relevant
    • G02B27/4211—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive optical element [DOE] contributing to image formation, e.g. whereby modulation transfer function MTF or optical aberrations are relevant correcting chromatic aberrations
    • G—PHYSICS
    • G02—OPTICS
    • G02C—SPECTACLES; SUNGLASSES OR GOGGLES INSOFAR AS THEY HAVE THE SAME FEATURES AS SPECTACLES; CONTACT LENSES
    • G02C7/00—Optical parts

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Geometry (AREA)
  • Health & Medical Sciences (AREA)
  • Ophthalmology & Optometry (AREA)
  • General Health & Medical Sciences (AREA)
  • Eyeglasses (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Lenses (AREA)
KR1020177015920A 2014-11-11 2015-11-11 재생된(제조된) 광학 장치의 품질을 결정하는 시스템 및 방법 Withdrawn KR20170080696A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201462078310P 2014-11-11 2014-11-11
US62/078,310 2014-11-11
PCT/AU2015/050700 WO2016074034A2 (en) 2014-11-11 2015-11-11 Systems and methods for determining the quality of a reproduced (manufactured) optic device

Publications (1)

Publication Number Publication Date
KR20170080696A true KR20170080696A (ko) 2017-07-10

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ID=55955207

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020177015920A Withdrawn KR20170080696A (ko) 2014-11-11 2015-11-11 재생된(제조된) 광학 장치의 품질을 결정하는 시스템 및 방법

Country Status (10)

Country Link
US (2) US10352816B2 (OSRAM)
EP (1) EP3218685B1 (OSRAM)
JP (3) JP2018503100A (OSRAM)
KR (1) KR20170080696A (OSRAM)
CN (1) CN107110740B (OSRAM)
ES (1) ES2887113T3 (OSRAM)
HU (1) HUE055799T2 (OSRAM)
SG (1) SG11201703751YA (OSRAM)
TW (1) TWI679466B (OSRAM)
WO (1) WO2016074034A2 (OSRAM)

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* Cited by examiner, † Cited by third party
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EP3218685B1 (en) * 2014-11-11 2021-06-16 Brien Holden Vision Institute Systems and methods for determining the quality of a reproduced (manufactured) optic device
US10036685B2 (en) * 2016-05-18 2018-07-31 Jand, Inc. Fixtureless lensmeter and methods of operating same
US10557773B2 (en) 2016-05-18 2020-02-11 Jand, Inc. Fixtureless lensmeter system
US11488239B2 (en) 2019-08-26 2022-11-01 Warby Parker Inc. Virtual fitting systems and methods for spectacles
EP4136563B8 (en) 2020-04-15 2025-10-01 Warby Parker Inc. Virtual try-on systems for spectacles using reference frames
JP7664953B2 (ja) 2020-06-17 2025-04-18 ワービー・パーカー・インコーポレイテッド 瞳孔間距離を測定するためのシステムおよび方法ならびにそれらの使用

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JP2007170888A (ja) * 2005-12-20 2007-07-05 Olympus Corp 光学素子検査装置
JP2007281003A (ja) * 2006-04-03 2007-10-25 Canon Inc 測定方法及び装置、並びに、露光装置
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WO2009057709A1 (ja) * 2007-10-31 2009-05-07 Hoya Corporation 眼鏡レンズ評価方法、これを用いた眼鏡レンズ設計方法、眼鏡レンズ製造方法、眼鏡レンズ製造システム及び眼鏡レンズ
JP2009181689A (ja) * 2008-01-30 2009-08-13 Jds Uniphase Corp ２ミラー位相シフタを有する光ピックアップ・ユニット
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TWI588560B (zh) * 2012-04-05 2017-06-21 布萊恩荷登視覺協會 用於屈光不正之鏡片、裝置、方法及系統
US9201250B2 (en) * 2012-10-17 2015-12-01 Brien Holden Vision Institute Lenses, devices, methods and systems for refractive error
MY179138A (en) * 2012-10-17 2020-10-28 Holden Brien Vision Inst Lenses, devices, methods and systems for refractive error
KR102100726B1 (ko) 2012-11-14 2020-04-14 에씰로 앙터나시오날 안과용 렌즈의 광학 파라미터 결정 방법
GB2508219A (en) * 2012-11-26 2014-05-28 Taylor Hobson Ltd Analysing and machining an optical profile
EP3218685B1 (en) * 2014-11-11 2021-06-16 Brien Holden Vision Institute Systems and methods for determining the quality of a reproduced (manufactured) optic device

Also Published As

Publication number Publication date
TWI679466B (zh) 2019-12-11
US10352816B2 (en) 2019-07-16
JP2018503100A (ja) 2018-02-01
HUE055799T2 (hu) 2021-12-28
WO2016074034A3 (en) 2016-06-23
US20170322110A1 (en) 2017-11-09
ES2887113T3 (es) 2021-12-21
EP3218685A2 (en) 2017-09-20
CN107110740B (zh) 2021-04-30
EP3218685A4 (en) 2018-07-04
SG11201703751YA (en) 2017-06-29
CN107110740A (zh) 2017-08-29
WO2016074034A2 (en) 2016-05-19
TW201632953A (zh) 2016-09-16
US20190391039A1 (en) 2019-12-26
JP2021060420A (ja) 2021-04-15
JP2023078153A (ja) 2023-06-06
US10670495B2 (en) 2020-06-02
EP3218685B1 (en) 2021-06-16

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PA0105 International application

Patent event date: 20170609

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination