JP2018054571A5 - - Google Patents

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JP2018054571A5
JP2018054571A5 JP2016194356A JP2016194356A JP2018054571A5 JP 2018054571 A5 JP2018054571 A5 JP 2018054571A5 JP 2016194356 A JP2016194356 A JP 2016194356A JP 2016194356 A JP2016194356 A JP 2016194356A JP 2018054571 A5 JP2018054571 A5 JP 2018054571A5
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Japan
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detection
intensity
background
area
measured
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JP2016194356A
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English (en)
Japanese (ja)
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JP6467600B2 (ja
JP2018054571A (ja
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Priority claimed from JP2016194356A external-priority patent/JP6467600B2/ja
Priority to JP2016194356A priority Critical patent/JP6467600B2/ja
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Priority to EP17855565.2A priority patent/EP3521813B1/en
Priority to CN201780059601.1A priority patent/CN109791116B/zh
Priority to PCT/JP2017/031494 priority patent/WO2018061607A1/ja
Publication of JP2018054571A publication Critical patent/JP2018054571A/ja
Publication of JP2018054571A5 publication Critical patent/JP2018054571A5/ja
Publication of JP6467600B2 publication Critical patent/JP6467600B2/ja
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Priority to US16/370,363 priority patent/US10948436B2/en
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JP2016194356A 2016-09-30 2016-09-30 波長分散型蛍光ｘ線分析装置 Active JP6467600B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2016194356A JP6467600B2 (ja) 2016-09-30 2016-09-30 波長分散型蛍光ｘ線分析装置
EP17855565.2A EP3521813B1 (en) 2016-09-30 2017-08-31 Wavelength dispersive x-ray fluorescence spectrometer
CN201780059601.1A CN109791116B (zh) 2016-09-30 2017-08-31 波长色散型荧光x射线分析装置
PCT/JP2017/031494 WO2018061607A1 (ja) 2016-09-30 2017-08-31 波長分散型蛍光ｘ線分析装置
US16/370,363 US10948436B2 (en) 2016-09-30 2019-03-29 Wavelength dispersive X-ray fluorescence spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2016194356A JP6467600B2 (ja) 2016-09-30 2016-09-30 波長分散型蛍光ｘ線分析装置

Publications (3)

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JP2018054571A JP2018054571A (ja) 2018-04-05
JP2018054571A5 true JP2018054571A5 (enExample) 2018-05-24
JP6467600B2 JP6467600B2 (ja) 2019-02-13

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JP2016194356A Active JP6467600B2 (ja) 2016-09-30 2016-09-30 波長分散型蛍光ｘ線分析装置

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US (1) US10948436B2 (enExample)
EP (1) EP3521813B1 (enExample)
JP (1) JP6467600B2 (enExample)
CN (1) CN109791116B (enExample)
WO (1) WO2018061607A1 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6467600B2 (ja) * 2016-09-30 2019-02-13 株式会社リガク 波長分散型蛍光ｘ線分析装置
US11680913B2 (en) * 2018-04-20 2023-06-20 Outotec (Finland) Oy X-ray fluorescence analyzer system and a method for performing X-ray fluorescence analysis of an element of interest in slurry
JP6962951B2 (ja) * 2019-03-08 2021-11-05 日本電子株式会社 分析装置およびスペクトル生成方法
JP7100910B2 (ja) * 2020-12-01 2022-07-14 株式会社リガク 全反射蛍光ｘ線分析装置
JP7726044B2 (ja) * 2021-01-05 2025-08-20 株式会社島津製作所 Ｘ線分光分析装置および元素分析方法
JP2024108448A (ja) * 2023-01-31 2024-08-13 株式会社リガク 検出器台座及びｘ線回折装置

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49118493A (enExample) * 1973-03-12 1974-11-12
JPH05340897A (ja) * 1992-06-11 1993-12-24 Shimadzu Corp Ｘ線分光器
JP2685726B2 (ja) * 1994-10-31 1997-12-03 理学電機工業株式会社 Ｘ線分析装置
CN1270176C (zh) * 2002-12-02 2006-08-16 中国科学技术大学 对组合样品的结构和成分进行测量分析的方法及装置
US20060153332A1 (en) * 2003-03-27 2006-07-13 Hisayuki Kohno X-ray fluorescence analyzer
US7190762B2 (en) * 2004-10-29 2007-03-13 Broker Axs, Inc Scanning line detector for two-dimensional x-ray diffractometer
JP4908119B2 (ja) * 2005-10-19 2012-04-04 株式会社リガク 蛍光ｘ線分析装置
US8283631B2 (en) * 2008-05-08 2012-10-09 Kla-Tencor Corporation In-situ differential spectroscopy
RU2419088C1 (ru) * 2010-02-01 2011-05-20 Учреждение Российской академии наук Физический институт им. П.Н. Лебедева РАН (ФИАН) Рентгеновский спектрометр
JP5441856B2 (ja) * 2010-09-10 2014-03-12 日本電子株式会社 Ｘ線検出システム
JP5412649B2 (ja) 2011-02-01 2014-02-12 株式会社リガク 蛍光ｘ線分析装置
WO2015056305A1 (ja) * 2013-10-15 2015-04-23 株式会社島津製作所 蛍光ｘ線分析方法及び蛍光ｘ線分析装置
JP6346036B2 (ja) * 2014-09-09 2018-06-20 株式会社日立ハイテクサイエンス 蛍光ｘ線分析装置及びその測定位置調整方法
EP3064933B1 (en) * 2015-03-03 2021-04-21 Malvern Panalytical B.V. Quantitative x-ray analysis
US9739730B2 (en) 2015-03-03 2017-08-22 Panalytical B.V. Quantitative X-ray analysis—multi optical path instrument
JP6467600B2 (ja) * 2016-09-30 2019-02-13 株式会社リガク 波長分散型蛍光ｘ線分析装置
JP6383018B2 (ja) * 2017-01-19 2018-08-29 本田技研工業株式会社 Ｘ線回折測定方法及び装置

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