JP2018002496A - シリコン単結晶の製造方法 - Google Patents
シリコン単結晶の製造方法 Download PDFInfo
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- JP2018002496A JP2018002496A JP2016127283A JP2016127283A JP2018002496A JP 2018002496 A JP2018002496 A JP 2018002496A JP 2016127283 A JP2016127283 A JP 2016127283A JP 2016127283 A JP2016127283 A JP 2016127283A JP 2018002496 A JP2018002496 A JP 2018002496A
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- Prior art keywords
- single crystal
- oxygen concentration
- magnetic field
- crystal
- limit value
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- 239000013078 crystal Substances 0.000 title claims abstract description 177
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title claims abstract description 70
- 229910052710 silicon Inorganic materials 0.000 title claims abstract description 70
- 239000010703 silicon Substances 0.000 title claims abstract description 70
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 59
- 238000000034 method Methods 0.000 title claims abstract description 12
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims abstract description 73
- 239000001301 oxygen Substances 0.000 claims abstract description 73
- 229910052760 oxygen Inorganic materials 0.000 claims abstract description 73
- 230000002093 peripheral effect Effects 0.000 claims abstract description 28
- 239000000155 melt Substances 0.000 claims abstract description 14
- 239000010453 quartz Substances 0.000 description 9
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 9
- 239000007789 gas Substances 0.000 description 8
- 239000007788 liquid Substances 0.000 description 5
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 4
- 230000007423 decrease Effects 0.000 description 4
- 239000011261 inert gas Substances 0.000 description 4
- 238000013459 approach Methods 0.000 description 3
- 229910002804 graphite Inorganic materials 0.000 description 3
- 239000010439 graphite Substances 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 238000005033 Fourier transform infrared spectroscopy Methods 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 239000002994 raw material Substances 0.000 description 2
- 238000004088 simulation Methods 0.000 description 2
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 239000002019 doping agent Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 238000000611 regression analysis Methods 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 238000002798 spectrophotometry method Methods 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
- 239000002344 surface layer Substances 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/20—Controlling or regulating
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/30—Mechanisms for rotating or moving either the melt or the crystal
- C30B15/305—Stirring of the melt
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/06—Silicon
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
Description
[数1]
δ=aD+bG+cV+d…(式1)
なる式により相関関係を定義した。定数a,b,c,dは、水平磁場強度、シリコン単結晶の回転速度及び直径のそれぞれに対する重みに相当する。
[数2]
δ=−0.0166D+0.0005G−0.4836V+8.1984…(式2)
11…第1チャンバ
12…第2チャンバ
13…ガス導入口
14…ガス排出口
21…石英製の坩堝
22…黒鉛製の坩堝
23…支持軸
24…駆動機構
25…ヒータ
26…保温筒
27…熱遮蔽部材
28…ブラケット
31…ワイヤ
32…引上げ機構
41…磁場発生装置
M…シリコン融液
C…シリコン単結晶
S…種結晶
Claims (4)
- CZ法により引き上げる際の単結晶の直径と、融液に印加する水平磁場強度と、引き上げる際の単結晶の結晶回転と、ウェーハ外周部における酸素濃度の分布特性と、の相関関係を、所定の製造条件について予め求め、
前記ウェーハ外周部における酸素濃度の分布特性の限界値と、前記水平磁場強度の限界値と、前記引き上げる際の単結晶の結晶回転の限界値と、前記相関関係とから、引き上げる際の単結晶の最小の直径を求め、
当該求められた最小の直径を目標直径としてシリコン単結晶を前記所定の製造条件の下で製造するシリコン単結晶の製造方法。 - CZ法により引き上げる際の単結晶の直径と、融液に印加する水平磁場強度と、引き上げる際の単結晶の結晶回転と、ウェーハ外周部における酸素濃度の分布特性と、の相関関係を、所定の製造条件について予め求め、
前記ウェーハ外周部における酸素濃度の分布特性の限界値と、前記引き上げる際の単結晶の直径の限界値と、前記引き上げる際の単結晶の結晶回転の限界値と、前記相関関係とから、印加する水平磁場強度を求め、
当該求められた水平磁場強度と前記所定の製造条件の下で単結晶を製造するシリコン単結晶の製造方法。 - CZ法により引き上げる際の単結晶の直径と、融液に印加する水平磁場強度と、引き上げる際の単結晶の結晶回転と、ウェーハ外周部における酸素濃度の分布特性と、の相関関係を、所定の製造条件について予め求め、
前記ウェーハ外周部における酸素濃度の分布特性の限界値と、前記引き上げる際の単結晶の直径の限界値と、前記水平磁場強度の限界値と、前記相関関係とから、前記引き上げる際の単結晶の結晶回転を求め、
当該求められた結晶回転と前記所定の製造条件の下で単結晶を製造するシリコン単結晶の製造方法。 - 前記引き上げる際の単結晶の直径をD(mm)、水平磁場強度をG(ガウス)、前記引き上げる際の単結晶の結晶回転をV(rpm)、前記ウェーハ外周部における酸素濃度の分布特性をδ(1017atoms/cm3)、a,b,c,dを定数としたときに、δ=aD+bG+cV+dなる式により前記相関関係を定義し、前記所定の製造条件の下で予め前記定数a,b,c,dを求めておく請求項1〜3のいずれか一項に記載のシリコン単結晶の製造方法。
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
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JP2016127283A JP6680108B2 (ja) | 2016-06-28 | 2016-06-28 | シリコン単結晶の製造方法 |
TW106105220A TWI635199B (zh) | 2016-06-28 | 2017-02-17 | 單晶矽的製造方法 |
CN201780040672.7A CN109415843A (zh) | 2016-06-28 | 2017-02-23 | 单晶硅的制造方法 |
KR1020187030618A KR102157389B1 (ko) | 2016-06-28 | 2017-02-23 | 실리콘 단결정 제조 방법 |
PCT/JP2017/006782 WO2018003167A1 (ja) | 2016-06-28 | 2017-02-23 | シリコン単結晶の製造方法 |
DE112017003224.5T DE112017003224B4 (de) | 2016-06-28 | 2017-02-23 | Verfahren zur Herstellung von Silicium-Einkristall |
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JP2016127283A JP6680108B2 (ja) | 2016-06-28 | 2016-06-28 | シリコン単結晶の製造方法 |
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JP2018002496A true JP2018002496A (ja) | 2018-01-11 |
JP6680108B2 JP6680108B2 (ja) | 2020-04-15 |
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JP (1) | JP6680108B2 (ja) |
KR (1) | KR102157389B1 (ja) |
CN (1) | CN109415843A (ja) |
DE (1) | DE112017003224B4 (ja) |
TW (1) | TWI635199B (ja) |
WO (1) | WO2018003167A1 (ja) |
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JP7249913B2 (ja) * | 2019-08-28 | 2023-03-31 | グローバルウェーハズ・ジャパン株式会社 | シリコン単結晶の製造方法 |
CN112831836A (zh) * | 2020-12-30 | 2021-05-25 | 上海新昇半导体科技有限公司 | 拉晶方法和拉晶装置 |
CN115404541B (zh) * | 2022-10-18 | 2023-08-25 | 四川晶科能源有限公司 | 一种拉晶方法 |
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JPH0244799B2 (ja) | 1981-10-26 | 1990-10-05 | Sony Corp | Ketsushoseichohoho |
US5178720A (en) * | 1991-08-14 | 1993-01-12 | Memc Electronic Materials, Inc. | Method for controlling oxygen content of silicon crystals using a combination of cusp magnetic field and crystal and crucible rotation rates |
JPH06172080A (ja) * | 1992-12-02 | 1994-06-21 | Kawasaki Steel Corp | 単結晶の引上方法 |
JP3520883B2 (ja) | 1995-12-29 | 2004-04-19 | 信越半導体株式会社 | 単結晶の製造方法 |
JPH09235192A (ja) * | 1996-03-01 | 1997-09-09 | Mitsubishi Materials Shilicon Corp | 低酸素濃度単結晶インゴット及び単結晶引上方法 |
JP3601340B2 (ja) * | 1999-02-01 | 2004-12-15 | 信越半導体株式会社 | エピタキシャルシリコンウエーハおよびその製造方法並びにエピタキシャルシリコンウエーハ用基板 |
JP4484540B2 (ja) * | 2004-02-19 | 2010-06-16 | Sumco Techxiv株式会社 | 単結晶半導体の製造方法 |
CN1332072C (zh) * | 2005-01-20 | 2007-08-15 | 上海合晶硅材料有限公司 | 直拉硅单晶中低氧控制方法 |
KR100840751B1 (ko) * | 2005-07-26 | 2008-06-24 | 주식회사 실트론 | 고품질 실리콘 단결정 잉곳 제조 방법, 성장 장치 및그로부터 제조된 잉곳 , 웨이퍼 |
KR100746374B1 (ko) | 2005-12-20 | 2007-08-03 | 주식회사 실트론 | 결정 성장 조건의 예측방법 및 이를 이용한 단결정 잉곳성장방법 |
JP5056603B2 (ja) * | 2008-06-11 | 2012-10-24 | 株式会社Sumco | シリコン単結晶の引上げ方法及び該方法により引上げられたインゴットから得られたシリコン単結晶ウェーハ |
JP2010100474A (ja) * | 2008-10-23 | 2010-05-06 | Covalent Materials Corp | シリコン単結晶引上げ水平磁場の最適化方法およびシリコン単結晶の製造方法 |
KR101472349B1 (ko) * | 2013-05-21 | 2014-12-12 | 주식회사 엘지실트론 | 반도체용 실리콘 단결정 잉곳 및 웨이퍼 |
JP5921498B2 (ja) | 2013-07-12 | 2016-05-24 | グローバルウェーハズ・ジャパン株式会社 | シリコン単結晶の製造方法 |
CN105239154A (zh) * | 2015-09-10 | 2016-01-13 | 上海超硅半导体有限公司 | 提拉法单晶硅生长流场控制技术 |
DE102015226399A1 (de) | 2015-12-22 | 2017-06-22 | Siltronic Ag | Siliciumscheibe mit homogener radialer Sauerstoffvariation |
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- 2017-02-23 CN CN201780040672.7A patent/CN109415843A/zh active Pending
- 2017-02-23 DE DE112017003224.5T patent/DE112017003224B4/de active Active
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Also Published As
Publication number | Publication date |
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JP6680108B2 (ja) | 2020-04-15 |
CN109415843A (zh) | 2019-03-01 |
KR20180124975A (ko) | 2018-11-21 |
TWI635199B (zh) | 2018-09-11 |
DE112017003224T5 (de) | 2019-03-21 |
WO2018003167A1 (ja) | 2018-01-04 |
TW201800626A (zh) | 2018-01-01 |
DE112017003224B4 (de) | 2021-09-30 |
KR102157389B1 (ko) | 2020-09-17 |
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