JP2017517873A5 - - Google Patents

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Publication number
JP2017517873A5
JP2017517873A5 JP2016560003A JP2016560003A JP2017517873A5 JP 2017517873 A5 JP2017517873 A5 JP 2017517873A5 JP 2016560003 A JP2016560003 A JP 2016560003A JP 2016560003 A JP2016560003 A JP 2016560003A JP 2017517873 A5 JP2017517873 A5 JP 2017517873A5
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JP
Japan
Prior art keywords
delay
output
input
delay chain
circuit
Prior art date
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Pending
Application number
JP2016560003A
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English (en)
Japanese (ja)
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JP2017517873A (ja
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Publication date
Priority claimed from US14/507,679 external-priority patent/US20150277393A1/en
Application filed filed Critical
Publication of JP2017517873A publication Critical patent/JP2017517873A/ja
Publication of JP2017517873A5 publication Critical patent/JP2017517873A5/ja
Pending legal-status Critical Current

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JP2016560003A 2014-04-01 2015-03-04 集積回路の動的な経年変化除去 Pending JP2017517873A (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201461973765P 2014-04-01 2014-04-01
US61/973,765 2014-04-01
US14/507,679 US20150277393A1 (en) 2014-04-01 2014-10-06 Integrated circuit dynamic de-aging
US14/507,679 2014-10-06
PCT/US2015/018785 WO2015153048A1 (en) 2014-04-01 2015-03-04 Integrated circuit dynamic de-aging

Publications (2)

Publication Number Publication Date
JP2017517873A JP2017517873A (ja) 2017-06-29
JP2017517873A5 true JP2017517873A5 (enExample) 2018-03-29

Family

ID=54190208

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016560003A Pending JP2017517873A (ja) 2014-04-01 2015-03-04 集積回路の動的な経年変化除去

Country Status (6)

Country Link
US (1) US20150277393A1 (enExample)
EP (1) EP3127239B1 (enExample)
JP (1) JP2017517873A (enExample)
KR (1) KR20160140667A (enExample)
CN (1) CN106133536B (enExample)
WO (1) WO2015153048A1 (enExample)

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US9780793B2 (en) * 2016-01-06 2017-10-03 Altera Corporation Methods and apparatuses for offsetting aging in pass transistors
CN106569120B (zh) * 2016-10-26 2019-01-22 宁波大学 一种对温度不敏感的检测集成电路老化状态传感器
US10128248B1 (en) 2017-07-14 2018-11-13 Intel Corporation Aging tolerant apparatus
US10666242B1 (en) * 2017-10-05 2020-05-26 Cadence Design Systems, Inc. Circuits and methods for reducing asymmetric aging effects of devices
CN108627760B (zh) * 2018-05-15 2020-07-14 中国空间技术研究院 一种fpga芯片自激励变频动态老炼电路
CN109856525A (zh) * 2018-11-07 2019-06-07 宁波大学 一种基于查找表的电路老化检测传感器
US11402413B1 (en) 2018-12-12 2022-08-02 Marvell Asia Pte, Ltd. Droop detection and mitigation
US11545987B1 (en) * 2018-12-12 2023-01-03 Marvell Asia Pte, Ltd. Traversing a variable delay line in a deterministic number of clock cycles
US11545981B1 (en) 2018-12-31 2023-01-03 Marvell Asia Pte, Ltd. DLL-based clocking architecture with programmable delay at phase detector inputs
CN109766233B (zh) * 2019-03-08 2023-04-07 江南大学 一种感知处理器nbti效应延时的检测电路及其方法
FR3107983B1 (fr) * 2020-03-05 2022-05-27 St Microelectronics Sa Dispositif de surveillance d'un circuit digital
CN112444732B (zh) * 2020-11-10 2023-05-05 海光信息技术股份有限公司 一种芯片老化状态监测电路、方法、芯片及服务器
CN112698181B (zh) * 2020-12-07 2021-09-21 电子科技大学 一种状态可配置的原位老化传感器系统
US11462294B2 (en) 2020-12-14 2022-10-04 Advanced Micro Devices, Inc. Mission mode Vmin prediction and calibration
US11935579B2 (en) 2021-01-19 2024-03-19 Changxin Memory Technologies, Inc. Protection circuit and memory
CN112885387A (zh) * 2021-01-19 2021-06-01 长鑫存储技术有限公司 保护电路和存储器
US12153086B2 (en) * 2022-02-05 2024-11-26 Microchip Technology Incorporated System and method to fix min-delay violation post fabrication
US11927612B1 (en) 2022-04-07 2024-03-12 Marvell Asia Pte Ltd Digital droop detector
US12244312B2 (en) 2022-12-05 2025-03-04 Taiwan Semiconductor Manufacturing Company, Ltd. Low noise ring oscillator devices and methods
WO2025002191A1 (zh) * 2023-06-28 2025-01-02 华为技术有限公司 计算机系统的供电方法及相关装置
WO2025002985A1 (de) * 2023-06-29 2025-01-02 HELLA GmbH & Co. KGaA Anordnung mit mitteln zur ermittlung des gesundheitszustandes und/oder der alterung von komponenten eines schaltkreises oder an den schaltkreis angeschlossener komponenten

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US7154978B2 (en) * 2001-11-02 2006-12-26 Motorola, Inc. Cascaded delay locked loop circuit
US6903564B1 (en) * 2003-11-12 2005-06-07 Transmeta Corporation Device aging determination circuit
US7126365B2 (en) * 2002-04-16 2006-10-24 Transmeta Corporation System and method for measuring negative bias thermal instability with a ring oscillator
US7205854B2 (en) * 2003-12-23 2007-04-17 Intel Corporation On-chip transistor degradation monitoring
CN101382581A (zh) * 2004-09-02 2009-03-11 松下电器产业株式会社 半导体集成电路器件及其检测方法、半导体晶片、以及老化检测设备
US7338817B2 (en) * 2005-03-31 2008-03-04 Intel Corporation Body bias compensation for aged transistors
JP2010087275A (ja) * 2008-09-30 2010-04-15 Panasonic Corp 半導体集積回路および電子機器
US8299825B2 (en) * 2009-10-30 2012-10-30 Apple Inc. Electronic age detection circuit
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