JP2017517873A - 集積回路の動的な経年変化除去 - Google Patents

集積回路の動的な経年変化除去 Download PDF

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Publication number
JP2017517873A
JP2017517873A JP2016560003A JP2016560003A JP2017517873A JP 2017517873 A JP2017517873 A JP 2017517873A JP 2016560003 A JP2016560003 A JP 2016560003A JP 2016560003 A JP2016560003 A JP 2016560003A JP 2017517873 A JP2017517873 A JP 2017517873A
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Japan
Prior art keywords
aging
integrated circuit
delay chain
frequency
circuit
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Pending
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JP2016560003A
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English (en)
Japanese (ja)
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JP2017517873A5 (enExample
Inventor
リウ、ジョナサン
イブラヒモビク、ジャスミン・スマイラ
ディフェンダーファー、ジャン・クリスチャン
アウヨン、カルロス
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Qualcomm Inc
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Qualcomm Inc
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Publication date
Application filed by Qualcomm Inc filed Critical Qualcomm Inc
Publication of JP2017517873A publication Critical patent/JP2017517873A/ja
Publication of JP2017517873A5 publication Critical patent/JP2017517873A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B11/00—Automatic controllers
    • G05B11/01—Automatic controllers electric
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2882—Testing timing characteristics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/003—Modifications for increasing the reliability for protection
    • H03K19/00369—Modifications for compensating variations of temperature, supply voltage or other physical parameters
    • H03K19/00384—Modifications for compensating variations of temperature, supply voltage or other physical parameters in field effect transistor circuits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/01—Details
    • H03K3/012—Modifications of generator to improve response time or to decrease power consumption
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
    • H03K3/03—Astable circuits
    • H03K3/0315—Ring oscillators
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/01—Shaping pulses
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K2005/00013—Delay, i.e. output pulse is delayed after input pulse and pulse length of output pulse is dependent on pulse length of input pulse

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Nonlinear Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computing Systems (AREA)
  • Mathematical Physics (AREA)
  • Automation & Control Theory (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP2016560003A 2014-04-01 2015-03-04 集積回路の動的な経年変化除去 Pending JP2017517873A (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201461973765P 2014-04-01 2014-04-01
US61/973,765 2014-04-01
US14/507,679 US20150277393A1 (en) 2014-04-01 2014-10-06 Integrated circuit dynamic de-aging
US14/507,679 2014-10-06
PCT/US2015/018785 WO2015153048A1 (en) 2014-04-01 2015-03-04 Integrated circuit dynamic de-aging

Publications (2)

Publication Number Publication Date
JP2017517873A true JP2017517873A (ja) 2017-06-29
JP2017517873A5 JP2017517873A5 (enExample) 2018-03-29

Family

ID=54190208

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016560003A Pending JP2017517873A (ja) 2014-04-01 2015-03-04 集積回路の動的な経年変化除去

Country Status (6)

Country Link
US (1) US20150277393A1 (enExample)
EP (1) EP3127239B1 (enExample)
JP (1) JP2017517873A (enExample)
KR (1) KR20160140667A (enExample)
CN (1) CN106133536B (enExample)
WO (1) WO2015153048A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7399358B1 (ja) 2020-12-14 2023-12-15 アドバンスト・マイクロ・ディバイシズ・インコーポレイテッド ミッションモードｖｍｉｎ予測及び較正

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9465373B2 (en) 2013-09-17 2016-10-11 International Business Machines Corporation Dynamic adjustment of operational parameters to compensate for sensor based measurements of circuit degradation
US9780793B2 (en) * 2016-01-06 2017-10-03 Altera Corporation Methods and apparatuses for offsetting aging in pass transistors
CN106569120B (zh) * 2016-10-26 2019-01-22 宁波大学 一种对温度不敏感的检测集成电路老化状态传感器
US10128248B1 (en) 2017-07-14 2018-11-13 Intel Corporation Aging tolerant apparatus
US10666242B1 (en) * 2017-10-05 2020-05-26 Cadence Design Systems, Inc. Circuits and methods for reducing asymmetric aging effects of devices
CN108627760B (zh) * 2018-05-15 2020-07-14 中国空间技术研究院 一种fpga芯片自激励变频动态老炼电路
CN109856525A (zh) * 2018-11-07 2019-06-07 宁波大学 一种基于查找表的电路老化检测传感器
US11402413B1 (en) 2018-12-12 2022-08-02 Marvell Asia Pte, Ltd. Droop detection and mitigation
US11545987B1 (en) * 2018-12-12 2023-01-03 Marvell Asia Pte, Ltd. Traversing a variable delay line in a deterministic number of clock cycles
US11545981B1 (en) 2018-12-31 2023-01-03 Marvell Asia Pte, Ltd. DLL-based clocking architecture with programmable delay at phase detector inputs
CN109766233B (zh) * 2019-03-08 2023-04-07 江南大学 一种感知处理器nbti效应延时的检测电路及其方法
FR3107983B1 (fr) * 2020-03-05 2022-05-27 St Microelectronics Sa Dispositif de surveillance d'un circuit digital
CN112444732B (zh) * 2020-11-10 2023-05-05 海光信息技术股份有限公司 一种芯片老化状态监测电路、方法、芯片及服务器
CN112698181B (zh) * 2020-12-07 2021-09-21 电子科技大学 一种状态可配置的原位老化传感器系统
US11935579B2 (en) 2021-01-19 2024-03-19 Changxin Memory Technologies, Inc. Protection circuit and memory
CN112885387A (zh) * 2021-01-19 2021-06-01 长鑫存储技术有限公司 保护电路和存储器
US12153086B2 (en) * 2022-02-05 2024-11-26 Microchip Technology Incorporated System and method to fix min-delay violation post fabrication
US11927612B1 (en) 2022-04-07 2024-03-12 Marvell Asia Pte Ltd Digital droop detector
US12244312B2 (en) 2022-12-05 2025-03-04 Taiwan Semiconductor Manufacturing Company, Ltd. Low noise ring oscillator devices and methods
WO2025002191A1 (zh) * 2023-06-28 2025-01-02 华为技术有限公司 计算机系统的供电方法及相关装置
WO2025002985A1 (de) * 2023-06-29 2025-01-02 HELLA GmbH & Co. KGaA Anordnung mit mitteln zur ermittlung des gesundheitszustandes und/oder der alterung von komponenten eines schaltkreises oder an den schaltkreis angeschlossener komponenten

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6903564B1 (en) * 2003-11-12 2005-06-07 Transmeta Corporation Device aging determination circuit
US20050134394A1 (en) * 2003-12-23 2005-06-23 Liu Jonathan H. On-chip transistor degradation monitoring
US20060223201A1 (en) * 2005-03-31 2006-10-05 Liu Jonathan H Body bias compensation for aged transistors
JP2008503882A (ja) * 2004-06-16 2008-02-07 トランスメータ・コーポレーション 負バイアス温度不安定性を測定するシステム及び方法
JP2010087275A (ja) * 2008-09-30 2010-04-15 Panasonic Corp 半導体集積回路および電子機器
US20110102064A1 (en) * 2009-10-30 2011-05-05 Date Jan Willem Noorlag Electronic Age Detection Circuit
US20110173432A1 (en) * 2010-01-08 2011-07-14 International Business Machines Corporation Reliability and performance of a system-on-a-chip by predictive wear-out based activation of functional components
US20110227609A1 (en) * 2010-03-19 2011-09-22 Kabushiki Kaisha Toshiba Semiconductor integrated circuit capable of evaluating the characteristics of a transistor

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6980016B2 (en) * 2001-07-02 2005-12-27 Intel Corporation Integrated circuit burn-in systems
US7154978B2 (en) * 2001-11-02 2006-12-26 Motorola, Inc. Cascaded delay locked loop circuit
CN101382581A (zh) * 2004-09-02 2009-03-11 松下电器产业株式会社 半导体集成电路器件及其检测方法、半导体晶片、以及老化检测设备

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6903564B1 (en) * 2003-11-12 2005-06-07 Transmeta Corporation Device aging determination circuit
US20050134394A1 (en) * 2003-12-23 2005-06-23 Liu Jonathan H. On-chip transistor degradation monitoring
JP2008503882A (ja) * 2004-06-16 2008-02-07 トランスメータ・コーポレーション 負バイアス温度不安定性を測定するシステム及び方法
US20060223201A1 (en) * 2005-03-31 2006-10-05 Liu Jonathan H Body bias compensation for aged transistors
JP2010087275A (ja) * 2008-09-30 2010-04-15 Panasonic Corp 半導体集積回路および電子機器
US20110090015A1 (en) * 2008-09-30 2011-04-21 Panasonic Corporation Semiconductor integrated circuit and electronic device
US20110102064A1 (en) * 2009-10-30 2011-05-05 Date Jan Willem Noorlag Electronic Age Detection Circuit
US20110173432A1 (en) * 2010-01-08 2011-07-14 International Business Machines Corporation Reliability and performance of a system-on-a-chip by predictive wear-out based activation of functional components
US20110227609A1 (en) * 2010-03-19 2011-09-22 Kabushiki Kaisha Toshiba Semiconductor integrated circuit capable of evaluating the characteristics of a transistor
JP2011196855A (ja) * 2010-03-19 2011-10-06 Toshiba Corp 半導体集積回路

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7399358B1 (ja) 2020-12-14 2023-12-15 アドバンスト・マイクロ・ディバイシズ・インコーポレイテッド ミッションモードｖｍｉｎ予測及び較正
JP2023553623A (ja) * 2020-12-14 2023-12-25 アドバンスト・マイクロ・ディバイシズ・インコーポレイテッド ミッションモードｖｍｉｎ予測及び較正

Also Published As

Publication number Publication date
EP3127239B1 (en) 2018-12-05
CN106133536A (zh) 2016-11-16
US20150277393A1 (en) 2015-10-01
KR20160140667A (ko) 2016-12-07
EP3127239A1 (en) 2017-02-08
WO2015153048A1 (en) 2015-10-08
CN106133536B (zh) 2019-09-13

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