JP2017514629A - 位相コントラストx線イメージングのためのシステム及び方法 - Google Patents
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Abstract
Description
本開示は、X線システムに関し、詳しくは、微分位相コントラストX線イメージングシステム及びX線照射システムに関する。
以下の引用文献は、引用によって全体が本願に援用される。
[2] "X-ray phase-contrast imaging: from pre-clinical applications towards clinics" Phys. Med. Biol. 58 (2013) R1-R35
[3] Stutman D., Finkenthal M., "Glancing angle Talbot-Lau grating interferometers for phase contrast imaging at high x-ray energy", Appl. Phys. Lett. 101, 091108 (2012)
[4] D. Stutman ; J. W. Stayman ; M. Finkenthal ; J. H. Siewerdsen "High energy x-ray phase-contrast imaging using glancing angle grating interferometers" Proc. SPIE 8668, Medical Imaging 2013: Physics of Medical Imaging, 866814 (March 19, 2013)
[5] A. Sarapata, J. W. Stayman, M. Finkenthal, J. H. Siewerdsen, F. Pfeiffer and D. Stutman "High energy x-ray phase contrast CT using glancing-angle grating interferometers"
In print in Medical Physics 2014
[6] Zanette, M. Bech, F. Pfeiffer, and T. Weitkamp, "Interlaced phase stepping in phase-contrast x-ray tomography" Appl. Phys. Lett. 98, 094101 (2011)
[6] www.teledynedalsa.com/imaging/products/x-ray/scanning/argus/
[7] www.dectris.com/
[8] D. Stutman and M. Finkenthal "K-edge and mirror filtered X-ray grating interferometers" INTERNATIONAL WORKSHOP ON X-RAY AND NEUTRON PHASE IMAGING WITH GRATINGS, Tokyo, Japan, 2012 AIP Conf. Proc. 1466, pp. 229-236
I(n)=A+B・sin(n・x/G・2π+φ)n=1,2,..N
Claims (18)
- マルチセクタ線源格子、ビームスプリッタ格子及びアナライザ格子を含み、前記ビームスプリッタ格子及び前記アナライザ格子の間に物体が配置される干渉計を用いて、前記物体を位相コントラストイメージングするための方法であって、
前記マルチセクタ線源格子にX線ビームを方向付けることであって、前記マルチセクタ線源格子の各セクタは、所定の量によってオフセットされていることと、
一回の露光の間に、前記物体又は前記干渉計を平行移動させることによって複数のイメージを取得することであって、前記複数のイメージは、異なる干渉計フェージングを有することと、
取得された前記複数のイメージを結合して、前記物体の位相コントラストイメージを生成することと、
を含む方法。 - 前記マルチセクタ線源格子は、3個より多い異なるセクタを有する請求項1に記載の方法。
- 前記複数のイメージは、前記物体を介して、異なる角度で取得される請求項1に記載の方法。
- 前記干渉計の長さは、約1.8mである請求項1に記載の方法。
- 前記アナライザ格子の厚さは、約数十cmである請求項1記載の方法。
- 前記複数のイメージは、前記アナライザ格子の背後に配置され、約1cm離された複数のラインスキャン又はスロットスキャン検出器を用いて取得される請求項1に記載の方法。
- 前記複数のイメージの間の角度は、約0.3°である請求項1に記載の方法。
- 四つのイメージの間の角度範囲は、約0.9°である請求項1に記載の方法。
- 前記アナライザ格子は、検出器の長さをカバーするように積層された複数の視射角格子を含む請求項1に記載の方法。
- 物体の位相コントラストイメージングのためのデバイスであって、
マルチセクタ線源格子、ビームスプリッタ格子及びアナライザ格子を含み、前記物体が前記ビームスプリッタ格子及び前記アナライザ格子の間に配置される干渉計と、
前記マルチセクタ線源格子にX線ビーン(bean)を方向付けるよう動作可能なX線源であって、前記マルチセクタ線源格子の各セクタは、所定の量によってオフセットされているX線源と、
前記物体又は前記干渉計を平行移動させるように動作可能な平行移動メカニズムと、
一回の露光の間に前記物体の複数のイメージを取得するように動作可能な検出器と、
取得された前記複数のイメージを結合して、前記物体の位相コントラストイメージを生成するように動作可能なプロセッサと、
を備えるデバイス。 - 前記マルチセクタ線源格子は、3個より多い異なるセクタを有する請求項10に記載のデバイス。
- 前記複数のイメージは、前記物体を介して、異なる角度で取得される請求項10に記載のデバイス。
- 前記干渉計の長さは、約1.8mである請求項10に記載のデバイス。
- 前記アナライザ格子の厚さは、約数十cmである請求項10に記載のデバイス。
- 前記検出器は、ラインスキャン又はスロットスキャン検出器であり、前記複数のイメージは、前記アナライザ格子の背後に配置され、約1cm離された複数の前記ラインスキャン又はスロットスキャン検出器を用いて取得される請求項10に記載のデバイス。
- 前記複数のイメージの間の角度は、約0.3°である請求項10に記載のデバイス。
- 四つのイメージの間の角度範囲は、約0.9°である請求項10に記載のデバイス。
- 前記アナライザ格子は、前記検出器の長さをカバーするように積層された複数の視射角格子を含む請求項10に記載のデバイス。
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US14/701,812 US9632040B2 (en) | 2014-05-09 | 2015-05-01 | System and method for phase-contrast X-ray imaging using a multi-sector source grating |
PCT/US2015/028758 WO2015171451A1 (en) | 2014-05-09 | 2015-05-01 | System and method for phase-contrast x-ray imaging |
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JP2019020313A (ja) * | 2017-07-20 | 2019-02-07 | 株式会社島津製作所 | X線位相イメージング装置および繊維を含む材料の欠陥検出手法 |
JP2020180818A (ja) * | 2019-04-24 | 2020-11-05 | 株式会社島津製作所 | X線位相イメージング装置 |
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US20150117599A1 (en) | 2013-10-31 | 2015-04-30 | Sigray, Inc. | X-ray interferometric imaging system |
US10295485B2 (en) | 2013-12-05 | 2019-05-21 | Sigray, Inc. | X-ray transmission spectrometer system |
US10269528B2 (en) | 2013-09-19 | 2019-04-23 | Sigray, Inc. | Diverging X-ray sources using linear accumulation |
US10297359B2 (en) | 2013-09-19 | 2019-05-21 | Sigray, Inc. | X-ray illumination system with multiple target microstructures |
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