JP2017510470A5 - - Google Patents

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JP2017510470A5
JP2017510470A5 JP2016560455A JP2016560455A JP2017510470A5 JP 2017510470 A5 JP2017510470 A5 JP 2017510470A5 JP 2016560455 A JP2016560455 A JP 2016560455A JP 2016560455 A JP2016560455 A JP 2016560455A JP 2017510470 A5 JP2017510470 A5 JP 2017510470A5
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layer
working surface
polishing
land area
contact angle
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JP2016560455A
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JP2017510470A (ja
JP6656162B2 (ja
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Priority claimed from PCT/US2015/023576 external-priority patent/WO2015153601A1/en
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いくつかの実施形態において、研磨層は単一のシートであり得る。単一のシートは、材料の単一層のみを含み(すなわち、ラミネートなどの多層構造ではない)、材料の単一層は単一の組成を有する。この組成は、多成分、例えば、ポリマーブレンド、又はポリマー無機複合物などの多成分を含み得る。単一のシートを、研磨層として使用することは、研磨層を形成するために必要なプロセス工程の数を最小化することによる、コストの利益をもたらし得る。単一のシートを含む研磨層は、成形及びエンボス加工が挙げられるがこれらに限定されない、当該技術分野において既知の技術から作製され得る。正確に成形された突起部、正確に成形された細孔、及び任意によりマクロチャネルを、単一の工程において形成する能力のために、単一のシートが好まれる。

Claims (3)

  1. 作業表面、及び前記作業表面と反対側の第2表面を有する研磨層を備える研磨パッドであって、
    前記作業表面は、ランド領域、並びに複数の正確に成形された細孔、及び複数の正確に成形された突起部の少なくとも一方を含み、
    前記ランド領域の厚さは約5mmよりも小さく、前記研磨層はポリマーを含み、
    前記研磨層は、前記複数の正確に成形された突起部の表面、前記複数の正確に成形された細孔の表面、及び前記ランド領域の表面の少なくとも1つの上に、複数のナノメートルサイズのトポグラフィ特徴部を含
    前記研磨層は、単一のポリマーシートである、研磨パッド。
  2. 作業表面、及び前記作業表面と反対側の第2表面を有する研磨層を備える研磨パッドであって、
    前記作業表面は、ランド領域、並びに複数の正確に成形された細孔、及び複数の正確に成形された突起部の少なくとも一方を含み、
    前記ランド領域の厚さは約5mmよりも小さく、前記研磨層はポリマーを含み、
    前記作業表面は、二次表面層、及びバルク層を含み、前記二次表面層の後退接触角及び前進接触角の少なくとも一方が、前記バルク層の対応する後退接触角、又は前進接触角よりも少なくとも約20°小さい、研磨パッド。
  3. 作業表面、及び前記作業表面と反対側の第2表面を有する研磨層を備える研磨パッドであって、
    前記作業表面は、ランド領域、並びに複数の正確に成形された細孔、及び複数の正確に成形された突起部の少なくとも一方を含み、
    前記ランド領域の厚さは約5mmよりも小さく、前記研磨層はポリマーを含み、
    前記作業表面は、二次表面層及びバルク層を含み、前記作業表面の後退接触角は、約50°未満であ
    前記研磨層は、単一のポリマーシートである、研磨パッド。
JP2016560455A 2014-04-03 2015-03-31 研磨パッド及びシステム、並びにその作製方法及び使用方法 Active JP6656162B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201461974848P 2014-04-03 2014-04-03
US61/974,848 2014-04-03
US201462052729P 2014-09-19 2014-09-19
US62/052,729 2014-09-19
PCT/US2015/023576 WO2015153601A1 (en) 2014-04-03 2015-03-31 Polishing pads and systems and methods of making and using the same

Publications (3)

Publication Number Publication Date
JP2017510470A JP2017510470A (ja) 2017-04-13
JP2017510470A5 true JP2017510470A5 (ja) 2019-07-04
JP6656162B2 JP6656162B2 (ja) 2020-03-04

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JP2016560455A Active JP6656162B2 (ja) 2014-04-03 2015-03-31 研磨パッド及びシステム、並びにその作製方法及び使用方法
JP2016560383A Active JP6640106B2 (ja) 2014-04-03 2015-03-31 研磨パッド及びシステム、並びにその作製方法及び使用方法

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Country Link
US (2) US10252396B2 (ja)
EP (2) EP3126093B1 (ja)
JP (2) JP6656162B2 (ja)
KR (2) KR102347711B1 (ja)
CN (2) CN106163740B (ja)
SG (2) SG11201608134YA (ja)
TW (2) TWI652142B (ja)
WO (2) WO2015153597A1 (ja)

Families Citing this family (46)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2855144B1 (de) * 2012-06-01 2017-06-21 Covestro Deutschland AG Mehrschichtaufbau als reflektor
JP6703939B2 (ja) * 2013-09-25 2020-06-03 スリーエム イノベイティブ プロパティズ カンパニー 研磨システム
KR102347711B1 (ko) * 2014-04-03 2022-01-06 쓰리엠 이노베이티브 프로퍼티즈 컴파니 폴리싱 패드 및 시스템과 이의 제조 및 사용 방법
US9873180B2 (en) 2014-10-17 2018-01-23 Applied Materials, Inc. CMP pad construction with composite material properties using additive manufacturing processes
US11745302B2 (en) 2014-10-17 2023-09-05 Applied Materials, Inc. Methods and precursor formulations for forming advanced polishing pads by use of an additive manufacturing process
US10875153B2 (en) 2014-10-17 2020-12-29 Applied Materials, Inc. Advanced polishing pad materials and formulations
SG10202002601QA (en) 2014-10-17 2020-05-28 Applied Materials Inc Cmp pad construction with composite material properties using additive manufacturing processes
US10821573B2 (en) 2014-10-17 2020-11-03 Applied Materials, Inc. Polishing pads produced by an additive manufacturing process
US10399201B2 (en) 2014-10-17 2019-09-03 Applied Materials, Inc. Advanced polishing pads having compositional gradients by use of an additive manufacturing process
US10875145B2 (en) 2014-10-17 2020-12-29 Applied Materials, Inc. Polishing pads produced by an additive manufacturing process
TWI769988B (zh) 2015-10-07 2022-07-11 美商3M新設資產公司 拋光墊與系統及其製造與使用方法
WO2017074773A1 (en) 2015-10-30 2017-05-04 Applied Materials, Inc. An apparatus and method of forming a polishing article that has a desired zeta potential
US10593574B2 (en) 2015-11-06 2020-03-17 Applied Materials, Inc. Techniques for combining CMP process tracking data with 3D printed CMP consumables
US10391605B2 (en) 2016-01-19 2019-08-27 Applied Materials, Inc. Method and apparatus for forming porous advanced polishing pads using an additive manufacturing process
TWI629297B (zh) * 2016-07-05 2018-07-11 智勝科技股份有限公司 研磨層及其製造方法以及研磨方法
JP6777475B2 (ja) * 2016-09-07 2020-10-28 富士紡ホールディングス株式会社 研磨パッド
TWI626117B (zh) * 2017-01-19 2018-06-11 智勝科技股份有限公司 研磨墊及研磨方法
JP7227137B2 (ja) * 2017-01-20 2023-02-21 アプライド マテリアルズ インコーポレイテッド Cmp用途向けの薄いプラスチック研磨物品
CN110914016A (zh) * 2017-07-11 2020-03-24 3M创新有限公司 包括可适形涂层的磨料制品和由其制成的抛光系统
US11471999B2 (en) 2017-07-26 2022-10-18 Applied Materials, Inc. Integrated abrasive polishing pads and manufacturing methods
US20200164484A1 (en) * 2017-08-04 2020-05-28 3M Innovative Properties Company Microreplicated polishing surface with enhanced co-planarity
WO2019032286A1 (en) 2017-08-07 2019-02-14 Applied Materials, Inc. ABRASIVE DISTRIBUTION POLISHING PADS AND METHODS OF MAKING SAME
CN111032285B (zh) * 2017-08-25 2022-07-19 3M创新有限公司 表面突起抛光垫
US11685013B2 (en) * 2018-01-24 2023-06-27 Taiwan Semiconductor Manufacturing Company, Ltd. Polishing pad for chemical mechanical planarization
US11878388B2 (en) * 2018-06-15 2024-01-23 Taiwan Semiconductor Manufacturing Company, Ltd. Polishing pad, polishing apparatus and method of manufacturing semiconductor package using the same
CN112654655A (zh) 2018-09-04 2021-04-13 应用材料公司 先进抛光垫配方
KR20200028097A (ko) * 2018-09-06 2020-03-16 에스케이실트론 주식회사 웨이퍼 연마 장치용 연마패드
US11331767B2 (en) 2019-02-01 2022-05-17 Micron Technology, Inc. Pads for chemical mechanical planarization tools, chemical mechanical planarization tools, and related methods
KR102440315B1 (ko) 2020-05-11 2022-09-06 한국생산기술연구원 패턴구조를 갖는 화학기계적 연마용 패드 및 이의 제조방법
KR102221514B1 (ko) 2019-05-29 2021-03-03 한국생산기술연구원 연마액의 유동 저항 구조를 갖는 연마용 패드
KR102222851B1 (ko) 2019-05-29 2021-03-08 한국생산기술연구원 그루브가 형성된 연마용 패드
KR102186895B1 (ko) 2019-05-29 2020-12-07 한국생산기술연구원 마이크로 패턴을 갖는 연마용 패드의 설계방법
JPWO2020255744A1 (ja) * 2019-06-19 2020-12-24
CN114599482A (zh) * 2019-11-04 2022-06-07 3M创新有限公司 抛光制品、抛光系统和抛光方法
US11813712B2 (en) 2019-12-20 2023-11-14 Applied Materials, Inc. Polishing pads having selectively arranged porosity
US11833638B2 (en) * 2020-03-25 2023-12-05 Rohm and Haas Electronic Materials Holding, Inc. CMP polishing pad with polishing elements on supports
US20210394334A1 (en) * 2020-06-19 2021-12-23 Skc Solmics Co., Ltd. Polishing pad, preparation method thereof and method for preparing semiconductor device using same
US11759909B2 (en) * 2020-06-19 2023-09-19 Sk Enpulse Co., Ltd. Polishing pad, preparation method thereof and method for preparing semiconductor device using same
US11806829B2 (en) 2020-06-19 2023-11-07 Applied Materials, Inc. Advanced polishing pads and related polishing pad manufacturing methods
US20230211455A1 (en) * 2020-06-25 2023-07-06 3M Innovative Properties Company Polishing pads and systems for and methods of using same
CN114425743A (zh) * 2020-10-28 2022-05-03 中国科学院微电子研究所 一种抛光垫及化学机械抛光设备
TW202225233A (zh) * 2020-11-02 2022-07-01 美商3M新設資產公司 聚胺甲酸酯、拋光物品及由其製造之拋光系統及其使用方法
US11878389B2 (en) 2021-02-10 2024-01-23 Applied Materials, Inc. Structures formed using an additive manufacturing process for regenerating surface texture in situ
CN117355554A (zh) * 2021-05-28 2024-01-05 3M创新有限公司 聚氨酯、由其制备的抛光制品和抛光系统及其使用方法
CN113246016A (zh) * 2021-06-09 2021-08-13 广东工业大学 一种多层多功能cmp抛光垫及其制备方法和应用
WO2024023618A1 (en) * 2022-07-29 2024-02-01 3M Innovative Properties Company Polyurethanes, polishing articles and polishing systems therefrom and method of use thereof

Family Cites Families (94)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5143528B2 (ja) 1972-12-02 1976-11-22
AT347283B (de) * 1975-03-07 1978-12-27 Collo Gmbh Schaumstoffkoerper fuer reinigungs-, scheuer- und/oder polierzwecke u. dgl.
US5348788A (en) * 1991-01-30 1994-09-20 Interpore Orthopaedics, Inc. Mesh sheet with microscopic projections and holes
US5152917B1 (en) 1991-02-06 1998-01-13 Minnesota Mining & Mfg Structured abrasive article
US5212910A (en) 1991-07-09 1993-05-25 Intel Corporation Composite polishing pad for semiconductor process
US5435816A (en) 1993-01-14 1995-07-25 Minnesota Mining And Manufacturing Company Method of making an abrasive article
US5441598A (en) * 1993-12-16 1995-08-15 Motorola, Inc. Polishing pad for chemical-mechanical polishing of a semiconductor substrate
US5489233A (en) * 1994-04-08 1996-02-06 Rodel, Inc. Polishing pads and methods for their use
US6099954A (en) * 1995-04-24 2000-08-08 Rodel Holdings, Inc. Polishing material and method of polishing a surface
AU5325596A (en) 1995-04-26 1996-11-18 Minnesota Mining And Manufacturing Company Method and apparatus for step and repeat exposures
US5958794A (en) 1995-09-22 1999-09-28 Minnesota Mining And Manufacturing Company Method of modifying an exposed surface of a semiconductor wafer
JP3324643B2 (ja) 1995-10-25 2002-09-17 日本電気株式会社 研磨パッド
US5778481A (en) 1996-02-15 1998-07-14 International Business Machines Corporation Silicon wafer cleaning and polishing pads
US5876268A (en) * 1997-01-03 1999-03-02 Minnesota Mining And Manufacturing Company Method and article for the production of optical quality surfaces on glass
JPH10225864A (ja) 1997-02-17 1998-08-25 Sony Corp 研磨パッドとその製造方法並びにその研磨パッドを用いたウエハの研磨方法
US5882251A (en) * 1997-08-19 1999-03-16 Lsi Logic Corporation Chemical mechanical polishing pad slurry distribution grooves
US6139402A (en) 1997-12-30 2000-10-31 Micron Technology, Inc. Method and apparatus for mechanical and chemical-mechanical planarization of microelectronic substrates
US6780095B1 (en) * 1997-12-30 2004-08-24 Micron Technology, Inc. Method and apparatus for mechanical and chemical-mechanical planarization of microelectronic substrates
JPH11267961A (ja) 1998-03-23 1999-10-05 Sony Corp 研磨パッド、研磨装置および研磨方法
US6218306B1 (en) * 1998-04-22 2001-04-17 Applied Materials, Inc. Method of chemical mechanical polishing a metal layer
US6372323B1 (en) 1998-10-05 2002-04-16 3M Innovative Properties Company Slip control article for wet and dry applications
US6206759B1 (en) 1998-11-30 2001-03-27 Micron Technology, Inc. Polishing pads and planarizing machines for mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies, and methods for making and using such pads and machines
JP2000158327A (ja) * 1998-12-02 2000-06-13 Rohm Co Ltd 化学的機械的研磨用研磨布およびそれを用いた化学的機械的研磨装置
WO2000043159A1 (en) * 1999-01-21 2000-07-27 Rodel Holdings, Inc. Improved polishing pads and methods relating thereto
JP2000301450A (ja) * 1999-04-19 2000-10-31 Rohm Co Ltd Cmp研磨パッドおよびそれを用いたcmp処理装置
US6234875B1 (en) 1999-06-09 2001-05-22 3M Innovative Properties Company Method of modifying a surface
US6364749B1 (en) 1999-09-02 2002-04-02 Micron Technology, Inc. CMP polishing pad with hydrophilic surfaces for enhanced wetting
US6443809B1 (en) 1999-11-16 2002-09-03 Chartered Semiconductor Manufacturing, Ltd. Polishing apparatus and method for forming an integrated circuit
US6390891B1 (en) 2000-04-26 2002-05-21 Speedfam-Ipec Corporation Method and apparatus for improved stability chemical mechanical polishing
EP1284842B1 (en) 2000-05-27 2005-10-19 Rohm and Haas Electronic Materials CMP Holdings, Inc. Polishing pads for chemical mechanical planarization
WO2001096434A1 (fr) * 2000-06-13 2001-12-20 Toyo Tire & Rubber Co., Ltd. Procede de production de mousse de polyurethanne, mousse de polyurethanne et feuille abrasive
US6852766B1 (en) 2000-06-15 2005-02-08 3M Innovative Properties Company Multiphoton photosensitization system
US6652764B1 (en) 2000-08-31 2003-11-25 Micron Technology, Inc. Methods and apparatuses for making and using planarizing pads for mechanical and chemical-mechanical planarization of microelectronic substrates
US6612916B2 (en) 2001-01-08 2003-09-02 3M Innovative Properties Company Article suitable for chemical mechanical planarization processes
US20020098789A1 (en) * 2001-01-19 2002-07-25 Peter A. Burke Polishing pad and methods for improved pad surface and pad interior characteristics
JP2002246343A (ja) 2001-02-13 2002-08-30 Nikon Corp 研磨装置、この研磨装置を用いた半導体デバイス製造方法及びこの半導体デバイス製造方法により製造された半導体デバイス
JP3359629B1 (ja) * 2001-04-09 2002-12-24 東洋紡績株式会社 ポリウレタン組成物からなる研磨パッド
KR100877385B1 (ko) 2001-11-13 2009-01-07 도요 고무 고교 가부시키가이샤 연마 패드 및 그 제조 방법
CN100540221C (zh) * 2001-11-13 2009-09-16 东洋橡胶工业株式会社 研磨垫及其制造方法
JP2003205451A (ja) 2002-01-07 2003-07-22 Hitachi Ltd 研磨パッド
US20030134581A1 (en) * 2002-01-11 2003-07-17 Wang Hsing Maw Device for chemical mechanical polishing
JP2003225855A (ja) 2002-01-30 2003-08-12 Hitachi Chem Co Ltd 研磨用パッド及びそれを用いた被研磨物の研磨方法
JP2003334753A (ja) 2002-05-15 2003-11-25 Rodel Nitta Co 研磨パッド
US7399516B2 (en) 2002-05-23 2008-07-15 Novellus Systems, Inc. Long-life workpiece surface influencing device structure and manufacturing method
KR100465649B1 (ko) 2002-09-17 2005-01-13 한국포리올 주식회사 일체형 연마 패드 및 그 제조 방법
JP2004140178A (ja) 2002-10-17 2004-05-13 Renesas Technology Corp 化学的機械研磨装置
AU2003285800A1 (en) 2002-12-28 2004-07-22 Skc Co., Ltd. Polishing pad having multi-windows
JP3910921B2 (ja) 2003-02-06 2007-04-25 株式会社東芝 研磨布および半導体装置の製造方法
JP4659338B2 (ja) * 2003-02-12 2011-03-30 Hoya株式会社 情報記録媒体用ガラス基板の製造方法並びにそれに使用する研磨パッド
US20060189269A1 (en) * 2005-02-18 2006-08-24 Roy Pradip K Customized polishing pads for CMP and methods of fabrication and use thereof
JP4790973B2 (ja) * 2003-03-28 2011-10-12 Hoya株式会社 研磨パッドを使用した情報記録媒体用ガラス基板の製造方法及びその方法で得られた情報記録媒体用ガラス基板
US6893328B2 (en) * 2003-04-23 2005-05-17 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Conductive polishing pad with anode and cathode
SG168412A1 (en) * 2003-06-03 2011-02-28 Nexplanar Corp Synthesis of a functionally graded pad for chemical mechanical planarization
KR20050012661A (ko) 2003-07-26 2005-02-02 매그나칩 반도체 유한회사 연마패드 형성방법및 연마패드 구조
US6942549B2 (en) 2003-10-29 2005-09-13 International Business Machines Corporation Two-sided chemical mechanical polishing pad for semiconductor processing
KR100545795B1 (ko) * 2004-02-17 2006-01-24 에스케이씨 주식회사 연마 패드의 기재 패드와 이를 이용한 다층 패드
WO2005077602A1 (en) 2004-02-17 2005-08-25 Skc Co., Ltd. Base pad polishing pad and multi-layer pad comprising the same
JP2005342881A (ja) * 2004-05-07 2005-12-15 Nitta Haas Inc 研磨パッド、研磨方法および研磨装置
US20050277376A1 (en) 2004-06-11 2005-12-15 Harvey Pinder Single component pad backer for polishing head of an orbital chemical mechanical polishing machine and method therefor
JP3769581B1 (ja) * 2005-05-18 2006-04-26 東洋ゴム工業株式会社 研磨パッドおよびその製造方法
WO2006089293A1 (en) 2005-02-18 2006-08-24 Neopad Technologies Corporation Customized polishing pads for cmp and methods of fabrication and use thereof
TWI378844B (en) * 2005-08-18 2012-12-11 Rohm & Haas Elect Mat Polishing pad and method of manufacture
US7226345B1 (en) * 2005-12-09 2007-06-05 The Regents Of The University Of California CMP pad with designed surface features
US7241206B1 (en) 2006-02-17 2007-07-10 Chien-Min Sung Tools for polishing and associated methods
US20080003935A1 (en) 2006-07-03 2008-01-03 Chung-Chih Feng Polishing pad having surface texture
TWI409136B (zh) 2006-07-19 2013-09-21 Innopad Inc 表面具微溝槽之化學機械平坦化墊
US20080146129A1 (en) 2006-12-08 2008-06-19 Makoto Kouzuma Fast break-in polishing pad and a method of making the same
JP5297096B2 (ja) * 2007-10-03 2013-09-25 富士紡ホールディングス株式会社 研磨布
JP5143528B2 (ja) 2007-10-25 2013-02-13 株式会社クラレ 研磨パッド
US8398462B2 (en) * 2008-02-21 2013-03-19 Chien-Min Sung CMP pads and method of creating voids in-situ therein
JP2009283538A (ja) 2008-05-20 2009-12-03 Jsr Corp 化学機械研磨パッドおよび化学機械研磨方法
JP5596030B2 (ja) 2008-06-26 2014-09-24 スリーエム イノベイティブ プロパティズ カンパニー 多孔質エレメントを有する研磨パッド及びその製造方法と使用方法
JP2010056184A (ja) 2008-08-27 2010-03-11 Jsr Corp 化学機械研磨パッドおよび化学機械研磨方法
WO2010032715A1 (ja) 2008-09-17 2010-03-25 株式会社クラレ 研磨パッド
CN102325718B (zh) 2008-12-30 2013-12-18 3M创新有限公司 制备纳米结构化表面的方法
US20100188751A1 (en) 2009-01-29 2010-07-29 3M Innovative Properties Company Optical films with internally conformable layers and method of making the films
KR101609128B1 (ko) 2009-08-13 2016-04-05 삼성전자주식회사 연마 패드 및 이를 갖는 화학 기계적 연마 장치
US9162340B2 (en) 2009-12-30 2015-10-20 3M Innovative Properties Company Polishing pads including phase-separated polymer blend and method of making and using the same
SG181889A1 (en) 2009-12-30 2012-07-30 3M Innovative Properties Co Organic particulate loaded polishing pads and method of making and using the same
SG185394A1 (en) 2010-05-03 2012-12-28 3M Innovative Properties Co Method of making a nanostructure
US20120171935A1 (en) 2010-12-20 2012-07-05 Diamond Innovations, Inc. CMP PAD Conditioning Tool
JP5711525B2 (ja) 2010-12-22 2015-04-30 富士紡ホールディングス株式会社 研磨パッドおよび研磨パッドの製造方法
US8808573B2 (en) * 2011-04-15 2014-08-19 Cabot Microelectronics Corporation Compositions and methods for selective polishing of silicon nitride materials
US20120302148A1 (en) * 2011-05-23 2012-11-29 Rajeev Bajaj Polishing pad with homogeneous body having discrete protrusions thereon
US20140342646A1 (en) 2011-09-16 2014-11-20 Toray Industries, Inc. Polishing pad
EP2785496B1 (en) * 2011-11-29 2021-11-24 CMC Materials, Inc. Polishing pad with foundation layer and polishing surface layer
JP5917236B2 (ja) 2012-03-30 2016-05-11 富士紡ホールディングス株式会社 研磨パッド用シート及びその製造方法、研磨パッド及びその製造方法、並びに研磨方法
US9597769B2 (en) 2012-06-04 2017-03-21 Nexplanar Corporation Polishing pad with polishing surface layer having an aperture or opening above a transparent foundation layer
JP2014054719A (ja) 2012-09-14 2014-03-27 Toho Engineering Kk 研磨パッド再生加工装置
JP6228546B2 (ja) * 2012-09-28 2017-11-08 富士紡ホールディングス株式会社 研磨パッド
US10160092B2 (en) * 2013-03-14 2018-12-25 Cabot Microelectronics Corporation Polishing pad having polishing surface with continuous protrusions having tapered sidewalls
JP6111797B2 (ja) 2013-03-29 2017-04-12 富士紡ホールディングス株式会社 研磨パッド及び研磨パッドの製造方法
SG11201600606TA (en) 2013-07-26 2016-02-26 3M Innovative Properties Co Method of making a nanostructure and nanostructured articles
KR102347711B1 (ko) 2014-04-03 2022-01-06 쓰리엠 이노베이티브 프로퍼티즈 컴파니 폴리싱 패드 및 시스템과 이의 제조 및 사용 방법

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