JP2017199834A - 半導体パッケージ及び半導体パッケージの製造方法 - Google Patents
半導体パッケージ及び半導体パッケージの製造方法 Download PDFInfo
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- JP2017199834A JP2017199834A JP2016090335A JP2016090335A JP2017199834A JP 2017199834 A JP2017199834 A JP 2017199834A JP 2016090335 A JP2016090335 A JP 2016090335A JP 2016090335 A JP2016090335 A JP 2016090335A JP 2017199834 A JP2017199834 A JP 2017199834A
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Classifications
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Abstract
【解決手段】半導体パッケージの製造方法は、基材に複数の半導体装置を配置し、複数の半導体装置を覆う樹脂絶縁層を形成し、樹脂絶縁層に、複数の半導体装置の各々を囲む溝を形成し、溝に対応する領域において、基材にレーザを照射することで複数の半導体装置の各々を分離する。溝は基材に達していてもよく、溝を形成する際に、溝が形成される位置に対応して基材に凹部を形成してもよい。
【選択図】図1
Description
本発明の実施形態1に係る半導体パッケージの概要について、図1を参照しながら詳細に説明する。図1は、本発明の一実施形態に係る半導体パッケージの断面模式図である。
図1に示すように、半導体パッケージ10は、支持基材100、接着層110、半導体装置120、第1樹脂絶縁層130、配線140、第2樹脂絶縁層150、及びはんだボール160を有する。
図1に示す半導体パッケージ10に含まれる各部材(各層)の材料について詳細に説明する。
図2乃至図23を用いて、本発明の実施形態1に係る半導体パッケージ10の製造方法を説明する。ここで、半導体パッケージ10は大型の金属基材上に複数設けられ、最後に各々の半導体パッケージ10に個片化されるが、ここでは複数の半導体パッケージ10のうちの1つを代表的に例示する。図2乃至図23において、図1に示す要素と同じ要素には同一の符号を付した。ここで、支持基材100としてSUS基材、第1樹脂絶縁層130としてエポキシ系樹脂、第1導電層142及び第2導電層144としてCu、はんだボール160として上記Sn合金を使用して半導体パッケージを作製する製造方法について説明する。
本発明の実施形態2に係る半導体パッケージの概要について、図24を参照しながら詳細に説明する。図24は、本発明の一実施形態に係る半導体パッケージの断面模式図である。
実施形態2に係る半導体パッケージ20は、実施形態1の半導体パッケージ10と類似しているが、アライメントマーカ114が接着層110に設けられた開口部で実現されている点において、半導体パッケージ10と相違する。なお、半導体パッケージ20では、支持基材100には凹部が形成されていない。ただし、この構造に半導体パッケージ10と同様に支持基材100の第1面302に凹部を設けて、補助的なアライメントマーカを形成してもよい。半導体パッケージ20のその他の部材については、半導体パッケージ10と同様であるので、ここでは詳しい説明を省略する。
図25乃至図29を用いて、本発明の実施形態2に係る半導体パッケージ20の製造方法を説明する。図25乃至図29において、図24に示す要素と同じ要素には同一の符号を付した。ここで、半導体パッケージ10と同様に、支持基材100としてSUS基材、第1樹脂絶縁層130としてエポキシ系樹脂、第1導電層142及び第2導電層144としてCu、はんだボール160として上記Sn合金を使用して半導体パッケージを作製する製造方法について説明する。
100:支持基材
102、114:アライメントマーカ
104:粗化領域
110、500:接着層
112、132:開口部
120:半導体装置
122:外部端子
130:第1樹脂絶縁層
140:配線
142:第1導電層
144:第2導電層
146:粗化領域
150:第2樹脂絶縁層
152:開口部
160:はんだボール
200:めっき層
210:フォトレジスト
220:レジストパターン
230:厚膜領域
240:薄膜領域
250:第1溝
260:第2溝
302、502:第1面
304、504:第2面
306、506:第1端部
308、508:第2端部
310、510:側面
320:変曲点
Claims (9)
- 基材に複数の半導体装置を配置し、
前記複数の半導体装置を覆う樹脂絶縁層を形成し、
前記樹脂絶縁層に、前記複数の半導体装置の各々を囲み、前記基材に達する溝を形成し、
前記溝に対応する領域において、前記基材にレーザを照射することで前記複数の半導体装置の各々を分離することを特徴とする半導体パッケージの製造方法。 - 前記溝を形成する際に、前記溝が形成される位置に対応して前記基材に凹部を形成することを特徴とする請求項1に記載の半導体パッケージの製造方法。
- 前記レーザは、前記基材の前記樹脂絶縁層が形成された側とは反対側から前記基材に照射されることを特徴とする請求項1に記載の半導体パッケージの製造方法。
- 前記レーザは、前記溝の幅よりも狭い領域に照射されることを特徴とする請求項1に記載の半導体パッケージの製造方法。
- 前記溝の形成は、ダイシングブレードによって行われることを特徴とする請求項1に記載の半導体パッケージの製造方法。
- 第1面、前記第1面の反対側の第2面、及び前記第1面の第1端部と前記第2面の第2端部とを接続する側面を有する基材と、
前記第1面側に配置された半導体装置と、
前記半導体装置を覆う樹脂絶縁層と、
を有し、
前記側面は、前記第1端部から前記第2端部に向かって湾曲していることを特徴とする半導体パッケージ。 - 前記第2端部は、前記第1端部よりも前記基材の外側に突出していることを特徴とする請求項6に記載の半導体パッケージ。
- 前記側面は、前記第1端部と前記第2端部との間で変曲点を有する湾曲形状であることを特徴とする請求項7に記載の半導体パッケージ。
- 前記第1端部と前記樹脂絶縁層の端部とは連続していることを特徴とする請求項8に記載の半導体パッケージ。
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JP2016090335A JP2017199834A (ja) | 2016-04-28 | 2016-04-28 | 半導体パッケージ及び半導体パッケージの製造方法 |
CN201710231755.6A CN107424960A (zh) | 2016-04-28 | 2017-04-11 | 半导体封装件及半导体封装件的制造方法 |
TW106112545A TW201739027A (zh) | 2016-04-28 | 2017-04-14 | 半導體封裝件及半導體封裝件之製造方法 |
KR1020170049580A KR20170123242A (ko) | 2016-04-28 | 2017-04-18 | 반도체 패키지 및 반도체 패키지의 제조 방법 |
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JP7339819B2 (ja) | 2019-09-04 | 2023-09-06 | 株式会社東芝 | 半導体装置の製造方法および半導体装置 |
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US10529635B2 (en) | 2020-01-07 |
CN107424960A (zh) | 2017-12-01 |
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