JP2017142207A - 基準面の位置測定方法 - Google Patents
基準面の位置測定方法 Download PDFInfo
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- JP2017142207A JP2017142207A JP2016024770A JP2016024770A JP2017142207A JP 2017142207 A JP2017142207 A JP 2017142207A JP 2016024770 A JP2016024770 A JP 2016024770A JP 2016024770 A JP2016024770 A JP 2016024770A JP 2017142207 A JP2017142207 A JP 2017142207A
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- JP
- Japan
- Prior art keywords
- reference surface
- probe
- fixing jig
- measuring
- axis direction
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/004—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points
- G01B5/008—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
- G01B5/012—Contact-making feeler heads therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
- B23Q17/00—Arrangements for observing, indicating or measuring on machine tools
- B23Q17/22—Arrangements for observing, indicating or measuring on machine tools for indicating or measuring existing or desired position of tool or work
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/004—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points
- G01B5/008—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/28—Measuring arrangements characterised by the use of mechanical techniques for measuring roughness or irregularity of surfaces
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- A Measuring Device Byusing Mechanical Method (AREA)
Abstract
【解決手段】固定用治具Jに支持される基準面RSの位置Xjを測定子Pにより測定する位置測定方法である。基準面RSの複数の異なる位置P1,P2,P3,P4に測定子Pを接触させて基準面RSの高さを測定し、高さが最も高くなる位置Xpを基準面RSの位置として測定する。
【選択図】図4
Description
Claims (2)
- 固定用治具に支持される基準面の位置を測定子により測定する位置測定方法であって、
前記基準面の複数の異なる位置に前記測定子を接触させて前記基準面の高さを測定し、前記高さが最も高くなる位置を前記基準面の位置として測定することを特徴とする基準面の位置測定方法。 - 前記固定用治具によって支持される前記基準面の支持中心位置からの距離に基づいて、前記測定子を接触させる前記複数の異なる位置を決定することを特徴とする請求項1に記載の位置測定方法。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016024770A JP6428667B2 (ja) | 2016-02-12 | 2016-02-12 | 基準面の位置測定方法 |
US15/422,006 US10145665B2 (en) | 2016-02-12 | 2017-02-01 | Position measuring method for reference surface |
CN201710066110.1A CN107084693B (zh) | 2016-02-12 | 2017-02-06 | 基准面的位置测量方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016024770A JP6428667B2 (ja) | 2016-02-12 | 2016-02-12 | 基準面の位置測定方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2017142207A true JP2017142207A (ja) | 2017-08-17 |
JP6428667B2 JP6428667B2 (ja) | 2018-11-28 |
Family
ID=59561408
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP2016024770A Active JP6428667B2 (ja) | 2016-02-12 | 2016-02-12 | 基準面の位置測定方法 |
Country Status (3)
Country | Link |
---|---|
US (1) | US10145665B2 (ja) |
JP (1) | JP6428667B2 (ja) |
CN (1) | CN107084693B (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109458913A (zh) * | 2018-11-02 | 2019-03-12 | 盛瑞传动股份有限公司 | 型腔深度测量方法及油泵盖与油泵转子距离测量方法 |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6361757B1 (ja) * | 2017-02-24 | 2018-07-25 | 株式会社東京精密 | 表面測定機用検出器 |
US10845180B2 (en) * | 2018-12-18 | 2020-11-24 | Mitutoyo Corporation | Measurement apparatus and method for measuring coordinates of columnar workpiece |
JP7136739B2 (ja) * | 2019-04-12 | 2022-09-13 | 三菱重工業株式会社 | タービンの計測方法および計測システム |
Citations (7)
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JPS4899152U (ja) * | 1972-02-21 | 1973-11-22 | ||
JPH039209A (ja) * | 1989-06-07 | 1991-01-17 | Mitsutoyo Corp | 位置決め装置 |
JP2007024571A (ja) * | 2005-07-13 | 2007-02-01 | Olympus Corp | 形状測定機 |
JP2007225380A (ja) * | 2006-02-22 | 2007-09-06 | Mitsutoyo Corp | 表面性状測定機、形状解析プログラムおよび記録媒体 |
US20120096728A1 (en) * | 2009-05-07 | 2012-04-26 | Matthias Reitemeyer | Method and device for measuring a surface profile |
JP2013011547A (ja) * | 2011-06-30 | 2013-01-17 | Mitsutoyo Corp | 円形状特性測定方法、装置及びプログラム |
JP2015232571A (ja) * | 2013-04-26 | 2015-12-24 | 株式会社東京精密 | 形状測定機 |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6280501A (ja) * | 1985-10-04 | 1987-04-14 | Hitachi Ltd | 測長装置 |
US6457366B1 (en) * | 1999-04-02 | 2002-10-01 | Mitutoyo Corporation | Movement control mechanism of contact-type vibrating probe |
US6460261B1 (en) * | 1999-11-18 | 2002-10-08 | Mitutoyo Corporation | V-groove shape measuring method and apparatus by using rotary table |
US6901677B2 (en) * | 2003-05-05 | 2005-06-07 | University Of North Carolina At Charlotte | Method and apparatus using a closed loop controlled actuator for surface profilometry |
US7041963B2 (en) * | 2003-11-26 | 2006-05-09 | Massachusetts Institute Of Technology | Height calibration of scanning probe microscope actuators |
DE102005028788A1 (de) * | 2005-06-16 | 2006-12-21 | Carl Zeiss Industrielle Messtechnik Gmbh | Verfahren zum Bestimmen von Korrekturwerten zum Korrigieren von Positionsmessfehlern bei einer Maschine mit zumindest einer translatorischen Bewegungssache |
JP4727499B2 (ja) * | 2005-07-13 | 2011-07-20 | 日本電子株式会社 | 走査型プローブ顕微鏡及びその動作方法 |
US8302456B2 (en) * | 2006-02-23 | 2012-11-06 | Asylum Research Corporation | Active damping of high speed scanning probe microscope components |
JP4939110B2 (ja) * | 2006-05-16 | 2012-05-23 | 株式会社ミツトヨ | プローブ、および、表面性状測定装置 |
JP5042788B2 (ja) * | 2007-11-22 | 2012-10-03 | オリンパス株式会社 | 光学式3次元計測装置 |
JP5236962B2 (ja) * | 2008-02-18 | 2013-07-17 | 株式会社ミツトヨ | 被測定物の表裏面測定方法 |
JP4612086B2 (ja) | 2008-10-06 | 2011-01-12 | ファナック株式会社 | ワークの計測基準点設定機能を有する工作機械 |
JP4829359B2 (ja) * | 2010-03-31 | 2011-12-07 | ファナック株式会社 | 機上計測装置のプローブ取り付け位置算出方法 |
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JP6052953B2 (ja) | 2012-05-16 | 2016-12-27 | 株式会社ミツトヨ | 三次元測定機、てこ式プローブの位置情報および姿勢情報を取得する方法 |
EP2698599A1 (de) * | 2012-08-17 | 2014-02-19 | Hexagon Technology Center GmbH | Koordinatenmessverfahren und Koordinatenmessmaschine zum Vermessen von Oberflächen mit einem optischen Sensor |
EP2954285B1 (en) * | 2013-02-05 | 2022-04-06 | Renishaw Plc. | Method and apparatus for measuring a part |
WO2014191016A1 (de) * | 2013-05-27 | 2014-12-04 | Carl Zeiss Industrielle Messtechnik Gmbh | Vorrichtung und verfahren zur kalibrierung eines koordinatenmessgeräts |
CN204188149U (zh) * | 2014-09-19 | 2015-03-04 | Ngk(苏州)环保陶瓷有限公司 | 高低差测量装置 |
-
2016
- 2016-02-12 JP JP2016024770A patent/JP6428667B2/ja active Active
-
2017
- 2017-02-01 US US15/422,006 patent/US10145665B2/en active Active
- 2017-02-06 CN CN201710066110.1A patent/CN107084693B/zh active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4899152U (ja) * | 1972-02-21 | 1973-11-22 | ||
JPH039209A (ja) * | 1989-06-07 | 1991-01-17 | Mitsutoyo Corp | 位置決め装置 |
JP2007024571A (ja) * | 2005-07-13 | 2007-02-01 | Olympus Corp | 形状測定機 |
JP2007225380A (ja) * | 2006-02-22 | 2007-09-06 | Mitsutoyo Corp | 表面性状測定機、形状解析プログラムおよび記録媒体 |
US20120096728A1 (en) * | 2009-05-07 | 2012-04-26 | Matthias Reitemeyer | Method and device for measuring a surface profile |
JP2013011547A (ja) * | 2011-06-30 | 2013-01-17 | Mitsutoyo Corp | 円形状特性測定方法、装置及びプログラム |
JP2015232571A (ja) * | 2013-04-26 | 2015-12-24 | 株式会社東京精密 | 形状測定機 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109458913A (zh) * | 2018-11-02 | 2019-03-12 | 盛瑞传动股份有限公司 | 型腔深度测量方法及油泵盖与油泵转子距离测量方法 |
Also Published As
Publication number | Publication date |
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US20170234670A1 (en) | 2017-08-17 |
CN107084693B (zh) | 2019-11-22 |
JP6428667B2 (ja) | 2018-11-28 |
CN107084693A (zh) | 2017-08-22 |
US10145665B2 (en) | 2018-12-04 |
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