JP2017129566A - 構造のバリエーションを検知するためのｘ線散乱システムおよび方法 - Google Patents

構造のバリエーションを検知するためのｘ線散乱システムおよび方法 Download PDF

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JP2017129566A
JP2017129566A JP2016223760A JP2016223760A JP2017129566A JP 2017129566 A JP2017129566 A JP 2017129566A JP 2016223760 A JP2016223760 A JP 2016223760A JP 2016223760 A JP2016223760 A JP 2016223760A JP 2017129566 A JP2017129566 A JP 2017129566A
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ray
scattering
variation
control unit
detection system
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JP2017129566A5 (enExample
Inventor
イー．エンゲル ジェームズ
e engel James
イー．エンゲル ジェームズ
ジョージソン ゲイリー
Georgeson Gary
ジョージソン ゲイリー
サファイ モルテザ
Safai Morteza
サファイ モルテザ
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Boeing Co
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Boeing Co
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/20—Investigating strength properties of solid materials by application of mechanical stress by applying steady bending forces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/053—Investigating materials by wave or particle radiation by diffraction, scatter or reflection back scatter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/302—Accessories, mechanical or electrical features comparative arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/303—Accessories, mechanical or electrical features calibrating, standardising
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/615—Specific applications or type of materials composite materials, multilayer laminates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/646—Specific applications or type of materials flaws, defects

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  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2016223760A 2015-11-30 2016-11-17 構造のバリエーションを検知するためのｘ線散乱システムおよび方法 Pending JP2017129566A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US14/953,689 2015-11-30
US14/953,689 US10317349B2 (en) 2015-11-30 2015-11-30 X-ray scatter systems and methods for detecting structural variations

Publications (2)

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JP2017129566A true JP2017129566A (ja) 2017-07-27
JP2017129566A5 JP2017129566A5 (enExample) 2019-12-05

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Country Status (7)

Country Link
US (1) US10317349B2 (enExample)
EP (1) EP3173775B1 (enExample)
JP (1) JP2017129566A (enExample)
KR (1) KR102540116B1 (enExample)
CN (1) CN106940324A (enExample)
AU (1) AU2016228208B2 (enExample)
RU (1) RU2725427C2 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2022093509A (ja) * 2018-04-12 2022-06-23 コニカミノルタ株式会社 Ｘ線撮影システム

Families Citing this family (8)

* Cited by examiner, † Cited by third party
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KR102224682B1 (ko) * 2016-10-20 2021-03-08 볼륨 그래픽스 게엠베하 워크피스의 컴퓨터 단층 촬영 검사를 위한 시스템의 기능 상태 모니터링 방법
CN107356489B (zh) * 2017-07-04 2018-10-26 湖北工业大学 一种基于纳米压痕试验测定花岗岩宏观力学性质的试验方法
CN108227027B (zh) * 2017-12-29 2020-12-01 同方威视技术股份有限公司 车载背散射检查系统
CN108008458B (zh) * 2017-12-29 2020-09-08 同方威视技术股份有限公司 车载背散射检查系统
CN109613031A (zh) 2019-01-04 2019-04-12 清华大学 背散射检查系统和背散射检查方法
CN109916451A (zh) * 2019-03-28 2019-06-21 淮阴师范学院 基于传感器网络的复合材料结构安全管控系统
CN112557438B (zh) * 2020-11-11 2022-05-20 南方电网科学研究院有限责任公司 一种高压交流电缆绝缘用预交联料存储寿命检测方法
CN114898224B (zh) * 2022-05-13 2023-04-21 北京科技大学 一种基于物理散射机制的变化检测方法

Citations (6)

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JPH02216036A (ja) * 1989-02-17 1990-08-28 Hitachi Ltd 構造物余寿命評価方法
JPH11125608A (ja) * 1997-10-22 1999-05-11 Nkk Corp 塗膜下腐食検査方法
JPH11160254A (ja) * 1997-11-28 1999-06-18 Non Destructive Inspection Co Ltd コンプトン散乱放射線撮影装置
JP2009128331A (ja) * 2007-11-28 2009-06-11 Polyplastics Co 成形部品の脆性クリープ破壊余寿命予測法
US20130208850A1 (en) * 2012-02-15 2013-08-15 L-3 Communications Security And Detection Systems, Inc. Determining a material property based on scattered radiation
JP2015517672A (ja) * 2012-05-22 2015-06-22 ザ・ボーイング・カンパニーＴｈｅＢｏｅｉｎｇ Ｃｏｍｐａｎｙ 再構成可能な検出システム

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US7649976B2 (en) 2006-02-10 2010-01-19 The Boeing Company System and method for determining dimensions of structures/systems for designing modifications to the structures/systems
US7508910B2 (en) 2006-05-04 2009-03-24 The Boeing Company System and methods for x-ray backscatter reverse engineering of structures
US7529343B2 (en) 2006-05-04 2009-05-05 The Boeing Company System and method for improved field of view X-ray imaging using a non-stationary anode
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JP2012133897A (ja) * 2010-12-20 2012-07-12 National Institute Of Advanced Industrial & Technology Ｘ線放射装置
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Publication number Priority date Publication date Assignee Title
JPH02216036A (ja) * 1989-02-17 1990-08-28 Hitachi Ltd 構造物余寿命評価方法
JPH11125608A (ja) * 1997-10-22 1999-05-11 Nkk Corp 塗膜下腐食検査方法
JPH11160254A (ja) * 1997-11-28 1999-06-18 Non Destructive Inspection Co Ltd コンプトン散乱放射線撮影装置
JP2009128331A (ja) * 2007-11-28 2009-06-11 Polyplastics Co 成形部品の脆性クリープ破壊余寿命予測法
US20130208850A1 (en) * 2012-02-15 2013-08-15 L-3 Communications Security And Detection Systems, Inc. Determining a material property based on scattered radiation
JP2015517672A (ja) * 2012-05-22 2015-06-22 ザ・ボーイング・カンパニーＴｈｅＢｏｅｉｎｇ Ｃｏｍｐａｎｙ 再構成可能な検出システム

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2022093509A (ja) * 2018-04-12 2022-06-23 コニカミノルタ株式会社 Ｘ線撮影システム
JP7306528B2 (ja) 2018-04-12 2023-07-11 コニカミノルタ株式会社 制御装置、表示方法及び検査方法

Also Published As

Publication number Publication date
EP3173775B1 (en) 2020-12-30
AU2016228208A1 (en) 2017-06-15
EP3173775A1 (en) 2017-05-31
KR102540116B1 (ko) 2023-06-02
KR20170066247A (ko) 2017-06-14
RU2725427C2 (ru) 2020-07-02
RU2016136403A3 (enExample) 2020-01-09
RU2016136403A (ru) 2018-03-15
US10317349B2 (en) 2019-06-11
CN106940324A (zh) 2017-07-11
US20170153188A1 (en) 2017-06-01
AU2016228208B2 (en) 2021-02-18

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