KR102540116B1 - 구조적 변화들을 검출하기 위한 x선 산란 시스템들 및 방법들 - Google Patents

구조적 변화들을 검출하기 위한 x선 산란 시스템들 및 방법들 Download PDF

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KR102540116B1
KR102540116B1 KR1020160160301A KR20160160301A KR102540116B1 KR 102540116 B1 KR102540116 B1 KR 102540116B1 KR 1020160160301 A KR1020160160301 A KR 1020160160301A KR 20160160301 A KR20160160301 A KR 20160160301A KR 102540116 B1 KR102540116 B1 KR 102540116B1
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scattering
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KR20170066247A (ko
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제임스 이. 엥겔
개리 조지슨
모르테자 사파이
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더 보잉 컴파니
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/20—Investigating strength properties of solid materials by application of mechanical stress by applying steady bending forces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/053—Investigating materials by wave or particle radiation by diffraction, scatter or reflection back scatter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/302—Accessories, mechanical or electrical features comparative arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/303—Accessories, mechanical or electrical features calibrating, standardising
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/615—Specific applications or type of materials composite materials, multilayer laminates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/646—Specific applications or type of materials flaws, defects

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  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
KR1020160160301A 2015-11-30 2016-11-29 구조적 변화들을 검출하기 위한 x선 산란 시스템들 및 방법들 Active KR102540116B1 (ko)

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US14/953,689 2015-11-30
US14/953,689 US10317349B2 (en) 2015-11-30 2015-11-30 X-ray scatter systems and methods for detecting structural variations

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KR20170066247A KR20170066247A (ko) 2017-06-14
KR102540116B1 true KR102540116B1 (ko) 2023-06-02

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US (1) US10317349B2 (enExample)
EP (1) EP3173775B1 (enExample)
JP (1) JP2017129566A (enExample)
KR (1) KR102540116B1 (enExample)
CN (1) CN106940324A (enExample)
AU (1) AU2016228208B2 (enExample)
RU (1) RU2725427C2 (enExample)

Families Citing this family (9)

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KR102224682B1 (ko) * 2016-10-20 2021-03-08 볼륨 그래픽스 게엠베하 워크피스의 컴퓨터 단층 촬영 검사를 위한 시스템의 기능 상태 모니터링 방법
CN107356489B (zh) * 2017-07-04 2018-10-26 湖北工业大学 一种基于纳米压痕试验测定花岗岩宏观力学性质的试验方法
CN108008458B (zh) * 2017-12-29 2020-09-08 同方威视技术股份有限公司 车载背散射检查系统
CN108227027B (zh) * 2017-12-29 2020-12-01 同方威视技术股份有限公司 车载背散射检查系统
JP7306528B2 (ja) * 2018-04-12 2023-07-11 コニカミノルタ株式会社 制御装置、表示方法及び検査方法
CN109613031A (zh) 2019-01-04 2019-04-12 清华大学 背散射检查系统和背散射检查方法
CN109916451A (zh) * 2019-03-28 2019-06-21 淮阴师范学院 基于传感器网络的复合材料结构安全管控系统
CN112557438B (zh) * 2020-11-11 2022-05-20 南方电网科学研究院有限责任公司 一种高压交流电缆绝缘用预交联料存储寿命检测方法
CN114898224B (zh) * 2022-05-13 2023-04-21 北京科技大学 一种基于物理散射机制的变化检测方法

Citations (5)

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US20040251415A1 (en) * 1995-10-23 2004-12-16 Verbinski Victor V. Density detection using real time discrete photon counting for fast moving targets
JP2009128331A (ja) * 2007-11-28 2009-06-11 Polyplastics Co 成形部品の脆性クリープ破壊余寿命予測法
US20110170661A1 (en) * 2008-08-26 2011-07-14 General Electric Company Inspection system and method
JP2012133897A (ja) * 2010-12-20 2012-07-12 National Institute Of Advanced Industrial & Technology Ｘ線放射装置
US20130208850A1 (en) 2012-02-15 2013-08-15 L-3 Communications Security And Detection Systems, Inc. Determining a material property based on scattered radiation

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US5763886A (en) 1996-08-07 1998-06-09 Northrop Grumman Corporation Two-dimensional imaging backscatter probe
JP3465561B2 (ja) * 1997-10-22 2003-11-10 Ｊｆｅエンジニアリング株式会社 塗膜下腐食検査方法
JPH11160254A (ja) * 1997-11-28 1999-06-18 Non Destructive Inspection Co Ltd コンプトン散乱放射線撮影装置
GB2382135A (en) * 2001-11-20 2003-05-21 Spectral Fusion Technologies L X-ray apparatus for grading meat samples according to a predetermined meat to fat ratio
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US20040251415A1 (en) * 1995-10-23 2004-12-16 Verbinski Victor V. Density detection using real time discrete photon counting for fast moving targets
JP2009128331A (ja) * 2007-11-28 2009-06-11 Polyplastics Co 成形部品の脆性クリープ破壊余寿命予測法
US20110170661A1 (en) * 2008-08-26 2011-07-14 General Electric Company Inspection system and method
JP2012133897A (ja) * 2010-12-20 2012-07-12 National Institute Of Advanced Industrial & Technology Ｘ線放射装置
US20130208850A1 (en) 2012-02-15 2013-08-15 L-3 Communications Security And Detection Systems, Inc. Determining a material property based on scattered radiation

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Publication number Publication date
KR20170066247A (ko) 2017-06-14
RU2725427C2 (ru) 2020-07-02
US10317349B2 (en) 2019-06-11
US20170153188A1 (en) 2017-06-01
JP2017129566A (ja) 2017-07-27
RU2016136403A (ru) 2018-03-15
CN106940324A (zh) 2017-07-11
AU2016228208A1 (en) 2017-06-15
AU2016228208B2 (en) 2021-02-18
EP3173775B1 (en) 2020-12-30
EP3173775A1 (en) 2017-05-31
RU2016136403A3 (enExample) 2020-01-09

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