KR102540116B1 - 구조적 변화들을 검출하기 위한 x선 산란 시스템들 및 방법들 - Google Patents

구조적 변화들을 검출하기 위한 x선 산란 시스템들 및 방법들 Download PDF

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KR102540116B1
KR102540116B1 KR1020160160301A KR20160160301A KR102540116B1 KR 102540116 B1 KR102540116 B1 KR 102540116B1 KR 1020160160301 A KR1020160160301 A KR 1020160160301A KR 20160160301 A KR20160160301 A KR 20160160301A KR 102540116 B1 KR102540116 B1 KR 102540116B1
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KR20170066247A (ko
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제임스 이. 엥겔
개리 조지슨
모르테자 사파이
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더 보잉 컴파니
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/20—Investigating strength properties of solid materials by application of mechanical stress by applying steady bending forces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/053—Investigating materials by wave or particle radiation by diffraction, scatter or reflection back scatter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/302—Accessories, mechanical or electrical features comparative arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/303—Accessories, mechanical or electrical features calibrating, standardising
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/615—Specific applications or type of materials composite materials, multilayer laminates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/646—Specific applications or type of materials flaws, defects

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  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
KR1020160160301A 2015-11-30 2016-11-29 구조적 변화들을 검출하기 위한 x선 산란 시스템들 및 방법들 Active KR102540116B1 (ko)

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Application Number Priority Date Filing Date Title
US14/953,689 2015-11-30
US14/953,689 US10317349B2 (en) 2015-11-30 2015-11-30 X-ray scatter systems and methods for detecting structural variations

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KR20170066247A KR20170066247A (ko) 2017-06-14
KR102540116B1 true KR102540116B1 (ko) 2023-06-02

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US (1) US10317349B2 (enExample)
EP (1) EP3173775B1 (enExample)
JP (1) JP2017129566A (enExample)
KR (1) KR102540116B1 (enExample)
CN (1) CN106940324A (enExample)
AU (1) AU2016228208B2 (enExample)
RU (1) RU2725427C2 (enExample)

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EP3529600B1 (de) * 2016-10-20 2024-12-04 Volume Graphics GmbH Verfahren zur überwachung des funktionszustands einer anlage zur computertomographischen untersuchung von werkstücken
CN107356489B (zh) * 2017-07-04 2018-10-26 湖北工业大学 一种基于纳米压痕试验测定花岗岩宏观力学性质的试验方法
CN108227027B (zh) * 2017-12-29 2020-12-01 同方威视技术股份有限公司 车载背散射检查系统
CN108008458B (zh) * 2017-12-29 2020-09-08 同方威视技术股份有限公司 车载背散射检查系统
JP7306528B2 (ja) * 2018-04-12 2023-07-11 コニカミノルタ株式会社 制御装置、表示方法及び検査方法
CN109613031A (zh) * 2019-01-04 2019-04-12 清华大学 背散射检查系统和背散射检查方法
CN109916451A (zh) * 2019-03-28 2019-06-21 淮阴师范学院 基于传感器网络的复合材料结构安全管控系统
CN112557438B (zh) * 2020-11-11 2022-05-20 南方电网科学研究院有限责任公司 一种高压交流电缆绝缘用预交联料存储寿命检测方法
CN114898224B (zh) * 2022-05-13 2023-04-21 北京科技大学 一种基于物理散射机制的变化检测方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040251415A1 (en) * 1995-10-23 2004-12-16 Verbinski Victor V. Density detection using real time discrete photon counting for fast moving targets
JP2009128331A (ja) * 2007-11-28 2009-06-11 Polyplastics Co 成形部品の脆性クリープ破壊余寿命予測法
US20110170661A1 (en) * 2008-08-26 2011-07-14 General Electric Company Inspection system and method
JP2012133897A (ja) * 2010-12-20 2012-07-12 National Institute Of Advanced Industrial & Technology Ｘ線放射装置
US20130208850A1 (en) 2012-02-15 2013-08-15 L-3 Communications Security And Detection Systems, Inc. Determining a material property based on scattered radiation

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02216036A (ja) * 1989-02-17 1990-08-28 Hitachi Ltd 構造物余寿命評価方法
US5763886A (en) 1996-08-07 1998-06-09 Northrop Grumman Corporation Two-dimensional imaging backscatter probe
JP3465561B2 (ja) * 1997-10-22 2003-11-10 Ｊｆｅエンジニアリング株式会社 塗膜下腐食検査方法
JPH11160254A (ja) * 1997-11-28 1999-06-18 Non Destructive Inspection Co Ltd コンプトン散乱放射線撮影装置
GB2382135A (en) * 2001-11-20 2003-05-21 Spectral Fusion Technologies L X-ray apparatus for grading meat samples according to a predetermined meat to fat ratio
US7649976B2 (en) 2006-02-10 2010-01-19 The Boeing Company System and method for determining dimensions of structures/systems for designing modifications to the structures/systems
US7508910B2 (en) 2006-05-04 2009-03-24 The Boeing Company System and methods for x-ray backscatter reverse engineering of structures
US7529343B2 (en) 2006-05-04 2009-05-05 The Boeing Company System and method for improved field of view X-ray imaging using a non-stationary anode
US7599471B2 (en) 2007-10-24 2009-10-06 The Boeing Company Method and apparatus for rotating an anode in an x-ray system
US20090168958A1 (en) 2008-01-02 2009-07-02 Cristina Francesca Cozzini Apparatus and method for identifying components in a container
US9895842B2 (en) * 2008-05-20 2018-02-20 Eos Gmbh Electro Optical Systems Selective sintering of structurally modified polymers
US7835495B2 (en) 2008-10-31 2010-11-16 Morpho Detection, Inc. System and method for X-ray diffraction imaging
US8027427B2 (en) 2009-08-31 2011-09-27 Morpho Detection, Inc. Systems and method for scanning a continuous stream of objects
US8094783B2 (en) 2009-10-02 2012-01-10 Morpho Detection, Inc. Method and system for performing materials analysis with reflected inelastic scatter
US8366848B2 (en) * 2011-07-01 2013-02-05 The Boeing Company Thick doped adhesive tape to enhance backscatter X-ray detectability
US8879688B2 (en) 2012-05-22 2014-11-04 The Boeing Company Reconfigurable detector system

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040251415A1 (en) * 1995-10-23 2004-12-16 Verbinski Victor V. Density detection using real time discrete photon counting for fast moving targets
JP2009128331A (ja) * 2007-11-28 2009-06-11 Polyplastics Co 成形部品の脆性クリープ破壊余寿命予測法
US20110170661A1 (en) * 2008-08-26 2011-07-14 General Electric Company Inspection system and method
JP2012133897A (ja) * 2010-12-20 2012-07-12 National Institute Of Advanced Industrial & Technology Ｘ線放射装置
US20130208850A1 (en) 2012-02-15 2013-08-15 L-3 Communications Security And Detection Systems, Inc. Determining a material property based on scattered radiation

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Publication number Publication date
JP2017129566A (ja) 2017-07-27
EP3173775B1 (en) 2020-12-30
AU2016228208A1 (en) 2017-06-15
RU2016136403A3 (enExample) 2020-01-09
KR20170066247A (ko) 2017-06-14
EP3173775A1 (en) 2017-05-31
RU2725427C2 (ru) 2020-07-02
AU2016228208B2 (en) 2021-02-18
US20170153188A1 (en) 2017-06-01
US10317349B2 (en) 2019-06-11
CN106940324A (zh) 2017-07-11
RU2016136403A (ru) 2018-03-15

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