RU2016136403A3 - - Google Patents
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- Publication number
- RU2016136403A3 RU2016136403A3 RU2016136403A RU2016136403A RU2016136403A3 RU 2016136403 A3 RU2016136403 A3 RU 2016136403A3 RU 2016136403 A RU2016136403 A RU 2016136403A RU 2016136403 A RU2016136403 A RU 2016136403A RU 2016136403 A3 RU2016136403 A3 RU 2016136403A3
- Authority
- RU
- Russia
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/20—Investigating strength properties of solid materials by application of mechanical stress by applying steady bending forces
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/203—Measuring back scattering
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
- G01N2223/053—Investigating materials by wave or particle radiation by diffraction, scatter or reflection back scatter
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/10—Different kinds of radiation or particles
- G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
- G01N2223/1016—X-ray
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/302—Accessories, mechanical or electrical features comparative arrangements
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/303—Accessories, mechanical or electrical features calibrating, standardising
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/615—Specific applications or type of materials composite materials, multilayer laminates
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/646—Specific applications or type of materials flaws, defects
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US14/953,689 | 2015-11-30 | ||
| US14/953,689 US10317349B2 (en) | 2015-11-30 | 2015-11-30 | X-ray scatter systems and methods for detecting structural variations |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| RU2016136403A RU2016136403A (ru) | 2018-03-15 |
| RU2016136403A3 true RU2016136403A3 (enExample) | 2020-01-09 |
| RU2725427C2 RU2725427C2 (ru) | 2020-07-02 |
Family
ID=56893824
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| RU2016136403A RU2725427C2 (ru) | 2015-11-30 | 2016-09-09 | Системы и способы обнаружения структурных изменений на основе рассеянного рентгеновского излучения |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US10317349B2 (enExample) |
| EP (1) | EP3173775B1 (enExample) |
| JP (1) | JP2017129566A (enExample) |
| KR (1) | KR102540116B1 (enExample) |
| CN (1) | CN106940324A (enExample) |
| AU (1) | AU2016228208B2 (enExample) |
| RU (1) | RU2725427C2 (enExample) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102224682B1 (ko) * | 2016-10-20 | 2021-03-08 | 볼륨 그래픽스 게엠베하 | 워크피스의 컴퓨터 단층 촬영 검사를 위한 시스템의 기능 상태 모니터링 방법 |
| CN107356489B (zh) * | 2017-07-04 | 2018-10-26 | 湖北工业大学 | 一种基于纳米压痕试验测定花岗岩宏观力学性质的试验方法 |
| CN108227027B (zh) * | 2017-12-29 | 2020-12-01 | 同方威视技术股份有限公司 | 车载背散射检查系统 |
| CN108008458B (zh) * | 2017-12-29 | 2020-09-08 | 同方威视技术股份有限公司 | 车载背散射检查系统 |
| JP7306528B2 (ja) * | 2018-04-12 | 2023-07-11 | コニカミノルタ株式会社 | 制御装置、表示方法及び検査方法 |
| CN109613031A (zh) | 2019-01-04 | 2019-04-12 | 清华大学 | 背散射检查系统和背散射检查方法 |
| CN109916451A (zh) * | 2019-03-28 | 2019-06-21 | 淮阴师范学院 | 基于传感器网络的复合材料结构安全管控系统 |
| CN112557438B (zh) * | 2020-11-11 | 2022-05-20 | 南方电网科学研究院有限责任公司 | 一种高压交流电缆绝缘用预交联料存储寿命检测方法 |
| CN114898224B (zh) * | 2022-05-13 | 2023-04-21 | 北京科技大学 | 一种基于物理散射机制的变化检测方法 |
Family Cites Families (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02216036A (ja) * | 1989-02-17 | 1990-08-28 | Hitachi Ltd | 構造物余寿命評価方法 |
| US7045787B1 (en) * | 1995-10-23 | 2006-05-16 | Science Applications International Corporation | Density detection using real time discrete photon counting for fast moving targets |
| US5763886A (en) | 1996-08-07 | 1998-06-09 | Northrop Grumman Corporation | Two-dimensional imaging backscatter probe |
| JP3465561B2 (ja) * | 1997-10-22 | 2003-11-10 | Ｊｆｅエンジニアリング株式会社 | 塗膜下腐食検査方法 |
| JPH11160254A (ja) * | 1997-11-28 | 1999-06-18 | Non Destructive Inspection Co Ltd | コンプトン散乱放射線撮影装置 |
| GB2382135A (en) * | 2001-11-20 | 2003-05-21 | Spectral Fusion Technologies L | X-ray apparatus for grading meat samples according to a predetermined meat to fat ratio |
| US7649976B2 (en) | 2006-02-10 | 2010-01-19 | The Boeing Company | System and method for determining dimensions of structures/systems for designing modifications to the structures/systems |
| US7508910B2 (en) | 2006-05-04 | 2009-03-24 | The Boeing Company | System and methods for x-ray backscatter reverse engineering of structures |
| US7529343B2 (en) | 2006-05-04 | 2009-05-05 | The Boeing Company | System and method for improved field of view X-ray imaging using a non-stationary anode |
| US7599471B2 (en) | 2007-10-24 | 2009-10-06 | The Boeing Company | Method and apparatus for rotating an anode in an x-ray system |
| JP5090142B2 (ja) * | 2007-11-28 | 2012-12-05 | ポリプラスチックス株式会社 | 成形部品の脆性クリープ破壊余寿命予測法 |
| US20090168958A1 (en) | 2008-01-02 | 2009-07-02 | Cristina Francesca Cozzini | Apparatus and method for identifying components in a container |
| US9895842B2 (en) * | 2008-05-20 | 2018-02-20 | Eos Gmbh Electro Optical Systems | Selective sintering of structurally modified polymers |
| US20110170661A1 (en) * | 2008-08-26 | 2011-07-14 | General Electric Company | Inspection system and method |
| US7835495B2 (en) | 2008-10-31 | 2010-11-16 | Morpho Detection, Inc. | System and method for X-ray diffraction imaging |
| US8027427B2 (en) | 2009-08-31 | 2011-09-27 | Morpho Detection, Inc. | Systems and method for scanning a continuous stream of objects |
| US8094783B2 (en) | 2009-10-02 | 2012-01-10 | Morpho Detection, Inc. | Method and system for performing materials analysis with reflected inelastic scatter |
| JP2012133897A (ja) * | 2010-12-20 | 2012-07-12 | National Institute Of Advanced Industrial & Technology | Ｘ線放射装置 |
| US8366848B2 (en) * | 2011-07-01 | 2013-02-05 | The Boeing Company | Thick doped adhesive tape to enhance backscatter X-ray detectability |
| US9086366B2 (en) * | 2012-02-15 | 2015-07-21 | L-3 Communications Security And Detection Systems, Inc. | Determining a material property based on scattered radiation |
| US8879688B2 (en) | 2012-05-22 | 2014-11-04 | The Boeing Company | Reconfigurable detector system |
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2015
- 2015-11-30 US US14/953,689 patent/US10317349B2/en active Active
-
2016
- 2016-09-08 EP EP16187910.1A patent/EP3173775B1/en active Active
- 2016-09-09 RU RU2016136403A patent/RU2725427C2/ru active
- 2016-09-14 AU AU2016228208A patent/AU2016228208B2/en active Active
- 2016-11-17 JP JP2016223760A patent/JP2017129566A/ja active Pending
- 2016-11-29 KR KR1020160160301A patent/KR102540116B1/ko active Active
- 2016-11-29 CN CN201611078723.9A patent/CN106940324A/zh active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| EP3173775B1 (en) | 2020-12-30 |
| AU2016228208A1 (en) | 2017-06-15 |
| EP3173775A1 (en) | 2017-05-31 |
| KR102540116B1 (ko) | 2023-06-02 |
| KR20170066247A (ko) | 2017-06-14 |
| RU2725427C2 (ru) | 2020-07-02 |
| RU2016136403A (ru) | 2018-03-15 |
| US10317349B2 (en) | 2019-06-11 |
| CN106940324A (zh) | 2017-07-11 |
| US20170153188A1 (en) | 2017-06-01 |
| AU2016228208B2 (en) | 2021-02-18 |
| JP2017129566A (ja) | 2017-07-27 |