CN106940324A - 用于检测结构变化的x射线散射系统和方法 - Google Patents

用于检测结构变化的x射线散射系统和方法 Download PDF

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Publication number
CN106940324A
CN106940324A CN201611078723.9A CN201611078723A CN106940324A CN 106940324 A CN106940324 A CN 106940324A CN 201611078723 A CN201611078723 A CN 201611078723A CN 106940324 A CN106940324 A CN 106940324A
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CN
China
Prior art keywords
ray
scattering
change
attribute
attributes
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Pending
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CN201611078723.9A
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English (en)
Chinese (zh)
Inventor
詹姆斯·E·恩格尔
加里·乔治森
莫尔塔扎·萨法伊
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Boeing Co
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Boeing Co
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Publication of CN106940324A publication Critical patent/CN106940324A/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/20—Investigating strength properties of solid materials by application of mechanical stress by applying steady bending forces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/053—Investigating materials by wave or particle radiation by diffraction, scatter or reflection back scatter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/302—Accessories, mechanical or electrical features comparative arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/303—Accessories, mechanical or electrical features calibrating, standardising
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/615—Specific applications or type of materials composite materials, multilayer laminates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/646—Specific applications or type of materials flaws, defects

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  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CN201611078723.9A 2015-11-30 2016-11-29 用于检测结构变化的x射线散射系统和方法 Pending CN106940324A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US14/953,689 2015-11-30
US14/953,689 US10317349B2 (en) 2015-11-30 2015-11-30 X-ray scatter systems and methods for detecting structural variations

Publications (1)

Publication Number Publication Date
CN106940324A true CN106940324A (zh) 2017-07-11

Family

ID=56893824

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201611078723.9A Pending CN106940324A (zh) 2015-11-30 2016-11-29 用于检测结构变化的x射线散射系统和方法

Country Status (7)

Country Link
US (1) US10317349B2 (enExample)
EP (1) EP3173775B1 (enExample)
JP (1) JP2017129566A (enExample)
KR (1) KR102540116B1 (enExample)
CN (1) CN106940324A (enExample)
AU (1) AU2016228208B2 (enExample)
RU (1) RU2725427C2 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109916451A (zh) * 2019-03-28 2019-06-21 淮阴师范学院 基于传感器网络的复合材料结构安全管控系统
CN114898224A (zh) * 2022-05-13 2022-08-12 北京科技大学 一种基于物理散射机制的变化检测方法

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KR102224682B1 (ko) * 2016-10-20 2021-03-08 볼륨 그래픽스 게엠베하 워크피스의 컴퓨터 단층 촬영 검사를 위한 시스템의 기능 상태 모니터링 방법
CN107356489B (zh) * 2017-07-04 2018-10-26 湖北工业大学 一种基于纳米压痕试验测定花岗岩宏观力学性质的试验方法
CN108227027B (zh) * 2017-12-29 2020-12-01 同方威视技术股份有限公司 车载背散射检查系统
CN108008458B (zh) * 2017-12-29 2020-09-08 同方威视技术股份有限公司 车载背散射检查系统
JP7306528B2 (ja) * 2018-04-12 2023-07-11 コニカミノルタ株式会社 制御装置、表示方法及び検査方法
CN109613031A (zh) 2019-01-04 2019-04-12 清华大学 背散射检查系统和背散射检查方法
CN112557438B (zh) * 2020-11-11 2022-05-20 南方电网科学研究院有限责任公司 一种高压交流电缆绝缘用预交联料存储寿命检测方法

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CN102850952A (zh) * 2011-07-01 2013-01-02 波音公司 增强反向散射x射线探测能力的厚掺杂胶带
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109916451A (zh) * 2019-03-28 2019-06-21 淮阴师范学院 基于传感器网络的复合材料结构安全管控系统
CN114898224A (zh) * 2022-05-13 2022-08-12 北京科技大学 一种基于物理散射机制的变化检测方法

Also Published As

Publication number Publication date
EP3173775B1 (en) 2020-12-30
AU2016228208A1 (en) 2017-06-15
EP3173775A1 (en) 2017-05-31
KR102540116B1 (ko) 2023-06-02
KR20170066247A (ko) 2017-06-14
RU2725427C2 (ru) 2020-07-02
RU2016136403A3 (enExample) 2020-01-09
RU2016136403A (ru) 2018-03-15
US10317349B2 (en) 2019-06-11
US20170153188A1 (en) 2017-06-01
AU2016228208B2 (en) 2021-02-18
JP2017129566A (ja) 2017-07-27

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