JP2017008412A5 - - Google Patents
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- JP2017008412A5 JP2017008412A5 JP2016104837A JP2016104837A JP2017008412A5 JP 2017008412 A5 JP2017008412 A5 JP 2017008412A5 JP 2016104837 A JP2016104837 A JP 2016104837A JP 2016104837 A JP2016104837 A JP 2016104837A JP 2017008412 A5 JP2017008412 A5 JP 2017008412A5
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- JP
- Japan
- Prior art keywords
- tungsten
- substrate
- containing precursor
- layer
- bulk
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 229910052721 tungsten Inorganic materials 0.000 claims description 349
- 239000010937 tungsten Substances 0.000 claims description 349
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 345
- 239000000758 substrate Substances 0.000 claims description 238
- 238000000034 method Methods 0.000 claims description 161
- 239000002243 precursor Substances 0.000 claims description 121
- 238000000151 deposition Methods 0.000 claims description 112
- 238000005229 chemical vapour deposition Methods 0.000 claims description 100
- 230000008021 deposition Effects 0.000 claims description 68
- 230000006911 nucleation Effects 0.000 claims description 63
- 238000010899 nucleation Methods 0.000 claims description 63
- 239000007789 gas Substances 0.000 claims description 52
- 238000012545 processing Methods 0.000 claims description 51
- 239000001257 hydrogen Substances 0.000 claims description 45
- 229910052739 hydrogen Inorganic materials 0.000 claims description 45
- 239000003638 chemical reducing agent Substances 0.000 claims description 41
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 31
- 239000004065 semiconductor Substances 0.000 claims description 23
- 238000011049 filling Methods 0.000 claims description 22
- 150000002431 hydrogen Chemical class 0.000 claims description 14
- 125000002524 organometallic group Chemical group 0.000 claims description 8
- YOUIDGQAIILFBW-UHFFFAOYSA-J tetrachlorotungsten Chemical compound Cl[W](Cl)(Cl)Cl YOUIDGQAIILFBW-UHFFFAOYSA-J 0.000 claims description 5
- 125000004122 cyclic group Chemical group 0.000 claims description 3
- 239000010410 layer Substances 0.000 description 146
- 230000008569 process Effects 0.000 description 69
- 239000010408 film Substances 0.000 description 51
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 39
- 229910052731 fluorine Inorganic materials 0.000 description 39
- 239000011737 fluorine Substances 0.000 description 39
- 238000000231 atomic layer deposition Methods 0.000 description 30
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 29
- 229910000077 silane Inorganic materials 0.000 description 29
- 238000010926 purge Methods 0.000 description 27
- 235000012431 wafers Nutrition 0.000 description 25
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 24
- 238000010586 diagram Methods 0.000 description 24
- 239000000463 material Substances 0.000 description 23
- 239000000376 reactant Substances 0.000 description 23
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 21
- 239000012528 membrane Substances 0.000 description 17
- 238000002474 experimental method Methods 0.000 description 16
- NRTOMJZYCJJWKI-UHFFFAOYSA-N Titanium nitride Chemical compound [Ti]#N NRTOMJZYCJJWKI-UHFFFAOYSA-N 0.000 description 15
- 230000004888 barrier function Effects 0.000 description 14
- 239000012071 phase Substances 0.000 description 14
- 238000004519 manufacturing process Methods 0.000 description 13
- 230000007246 mechanism Effects 0.000 description 13
- 229910052786 argon Inorganic materials 0.000 description 12
- 229910052751 metal Inorganic materials 0.000 description 12
- 239000002184 metal Substances 0.000 description 12
- NXHILIPIEUBEPD-UHFFFAOYSA-H tungsten hexafluoride Chemical compound F[W](F)(F)(F)(F)F NXHILIPIEUBEPD-UHFFFAOYSA-H 0.000 description 12
- UORVGPXVDQYIDP-UHFFFAOYSA-N borane Chemical compound B UORVGPXVDQYIDP-UHFFFAOYSA-N 0.000 description 11
- 239000000543 intermediate Substances 0.000 description 11
- 239000011261 inert gas Substances 0.000 description 10
- 238000012546 transfer Methods 0.000 description 10
- -1 annealing Substances 0.000 description 8
- 238000005137 deposition process Methods 0.000 description 8
- PZPGRFITIJYNEJ-UHFFFAOYSA-N disilane Chemical compound [SiH3][SiH3] PZPGRFITIJYNEJ-UHFFFAOYSA-N 0.000 description 8
- 229910052757 nitrogen Inorganic materials 0.000 description 8
- VEDJZFSRVVQBIL-UHFFFAOYSA-N trisilane Chemical compound [SiH3][SiH2][SiH3] VEDJZFSRVVQBIL-UHFFFAOYSA-N 0.000 description 8
- 239000012159 carrier gas Substances 0.000 description 7
- 229910052710 silicon Inorganic materials 0.000 description 7
- 239000010703 silicon Substances 0.000 description 7
- 229910000085 borane Inorganic materials 0.000 description 6
- 238000006243 chemical reaction Methods 0.000 description 6
- 238000009792 diffusion process Methods 0.000 description 6
- 238000004381 surface treatment Methods 0.000 description 6
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 5
- 230000015572 biosynthetic process Effects 0.000 description 5
- 238000005530 etching Methods 0.000 description 5
- 238000005259 measurement Methods 0.000 description 5
- 239000010936 titanium Substances 0.000 description 5
- ZOCHARZZJNPSEU-UHFFFAOYSA-N diboron Chemical compound B#B ZOCHARZZJNPSEU-UHFFFAOYSA-N 0.000 description 4
- 238000001179 sorption measurement Methods 0.000 description 4
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 description 3
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 3
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 3
- OQPDWFJSZHWILH-UHFFFAOYSA-N [Al].[Al].[Al].[Ti] Chemical compound [Al].[Al].[Al].[Ti] OQPDWFJSZHWILH-UHFFFAOYSA-N 0.000 description 3
- 230000008859 change Effects 0.000 description 3
- 150000001875 compounds Chemical class 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 229910052732 germanium Inorganic materials 0.000 description 3
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 3
- 239000001307 helium Substances 0.000 description 3
- 229910052734 helium Inorganic materials 0.000 description 3
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 3
- 230000000977 initiatory effect Effects 0.000 description 3
- 239000011229 interlayer Substances 0.000 description 3
- 150000004767 nitrides Chemical class 0.000 description 3
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 3
- 229920002120 photoresistant polymer Polymers 0.000 description 3
- 150000004756 silanes Chemical class 0.000 description 3
- 229910052814 silicon oxide Inorganic materials 0.000 description 3
- 229910052719 titanium Inorganic materials 0.000 description 3
- 229910021324 titanium aluminide Inorganic materials 0.000 description 3
- KPGXUAIFQMJJFB-UHFFFAOYSA-H tungsten hexachloride Chemical group Cl[W](Cl)(Cl)(Cl)(Cl)Cl KPGXUAIFQMJJFB-UHFFFAOYSA-H 0.000 description 3
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 2
- XYFCBTPGUUZFHI-UHFFFAOYSA-N Phosphine Chemical compound P XYFCBTPGUUZFHI-UHFFFAOYSA-N 0.000 description 2
- 239000012790 adhesive layer Substances 0.000 description 2
- 238000000137 annealing Methods 0.000 description 2
- 239000006227 byproduct Substances 0.000 description 2
- 238000004422 calculation algorithm Methods 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 2
- 239000000460 chlorine Substances 0.000 description 2
- 229910052801 chlorine Inorganic materials 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 2
- 229910000078 germane Inorganic materials 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 230000004941 influx Effects 0.000 description 2
- 238000001459 lithography Methods 0.000 description 2
- 150000001247 metal acetylides Chemical class 0.000 description 2
- 229910044991 metal oxide Inorganic materials 0.000 description 2
- 150000004706 metal oxides Chemical class 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000000059 patterning Methods 0.000 description 2
- 238000004062 sedimentation Methods 0.000 description 2
- 229910010271 silicon carbide Inorganic materials 0.000 description 2
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical class [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 2
- 238000002791 soaking Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 2
- MTPVUVINMAGMJL-UHFFFAOYSA-N trimethyl(1,1,2,2,2-pentafluoroethyl)silane Chemical compound C[Si](C)(C)C(F)(F)C(F)(F)F MTPVUVINMAGMJL-UHFFFAOYSA-N 0.000 description 2
- WIDQNNDDTXUPAN-UHFFFAOYSA-I tungsten(v) chloride Chemical group Cl[W](Cl)(Cl)(Cl)Cl WIDQNNDDTXUPAN-UHFFFAOYSA-I 0.000 description 2
- RLJUCKFARAQBDA-UHFFFAOYSA-N C(C)C1(C=CC=C1)[W](N=O)(=C=O)=C=O Chemical compound C(C)C1(C=CC=C1)[W](N=O)(=C=O)=C=O RLJUCKFARAQBDA-UHFFFAOYSA-N 0.000 description 1
- OAMOJYZDVHZSDW-UHFFFAOYSA-N CC1(C=CC=C1)[W](N=O)(=C=O)=C=O Chemical compound CC1(C=CC=C1)[W](N=O)(=C=O)=C=O OAMOJYZDVHZSDW-UHFFFAOYSA-N 0.000 description 1
- 229910005883 NiSi Inorganic materials 0.000 description 1
- 208000031481 Pathologic Constriction Diseases 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 229910008484 TiSi Inorganic materials 0.000 description 1
- 238000003848 UV Light-Curing Methods 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 230000004913 activation Effects 0.000 description 1
- 125000000217 alkyl group Chemical group 0.000 description 1
- 150000001343 alkyl silanes Chemical class 0.000 description 1
- TVJORGWKNPGCDW-UHFFFAOYSA-N aminoboron Chemical compound N[B] TVJORGWKNPGCDW-UHFFFAOYSA-N 0.000 description 1
- 239000012298 atmosphere Substances 0.000 description 1
- IVHJCRXBQPGLOV-UHFFFAOYSA-N azanylidynetungsten Chemical compound [W]#N IVHJCRXBQPGLOV-UHFFFAOYSA-N 0.000 description 1
- 230000006399 behavior Effects 0.000 description 1
- FFBHFFJDDLITSX-UHFFFAOYSA-N benzyl N-[2-hydroxy-4-(3-oxomorpholin-4-yl)phenyl]carbamate Chemical compound OC1=C(NC(=O)OCC2=CC=CC=C2)C=CC(=C1)N1CCOCC1=O FFBHFFJDDLITSX-UHFFFAOYSA-N 0.000 description 1
- KCBGPORQPUTBDJ-UHFFFAOYSA-N carbon monoxide;tungsten Chemical compound O=C=[W] KCBGPORQPUTBDJ-UHFFFAOYSA-N 0.000 description 1
- 208000037998 chronic venous disease Diseases 0.000 description 1
- 238000004590 computer program Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 239000000112 cooling gas Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 239000003989 dielectric material Substances 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000010574 gas phase reaction Methods 0.000 description 1
- 125000001475 halogen functional group Chemical group 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 238000011068 loading method Methods 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 230000001151 other effect Effects 0.000 description 1
- 238000013021 overheating Methods 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 229910000073 phosphorus hydride Inorganic materials 0.000 description 1
- 238000001020 plasma etching Methods 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 238000012805 post-processing Methods 0.000 description 1
- 125000002924 primary amino group Chemical group [H]N([H])* 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000003252 repetitive effect Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- FZHAPNGMFPVSLP-UHFFFAOYSA-N silanamine Chemical class [SiH3]N FZHAPNGMFPVSLP-UHFFFAOYSA-N 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 208000037804 stenosis Diseases 0.000 description 1
- 230000036262 stenosis Effects 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 238000000427 thin-film deposition Methods 0.000 description 1
- UONOETXJSWQNOL-UHFFFAOYSA-N tungsten carbide Chemical compound [W+]#[C-] UONOETXJSWQNOL-UHFFFAOYSA-N 0.000 description 1
- 229910001934 tungsten pentoxide Inorganic materials 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 239000012808 vapor phase Substances 0.000 description 1
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US14/723,270 | 2015-05-27 | ||
| US14/723,270 US9613818B2 (en) | 2015-05-27 | 2015-05-27 | Deposition of low fluorine tungsten by sequential CVD process |
| US201662328759P | 2016-04-28 | 2016-04-28 | |
| US62/328,759 | 2016-04-28 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2017008412A JP2017008412A (ja) | 2017-01-12 |
| JP2017008412A5 true JP2017008412A5 (https=) | 2021-08-26 |
| JP7092456B2 JP7092456B2 (ja) | 2022-06-28 |
Family
ID=57573895
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016104837A Active JP7092456B2 (ja) | 2015-05-27 | 2016-05-26 | 連続ｃｖｄプロセスによる低フッ素タングステンの堆積 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JP7092456B2 (https=) |
| KR (1) | KR102397797B1 (https=) |
| TW (1) | TWI747825B (https=) |
Families Citing this family (27)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI672737B (zh) * | 2013-12-27 | 2019-09-21 | Lam Research Corporation | 允許低電阻率鎢特徵物填充之鎢成核程序 |
| JP6788545B2 (ja) * | 2017-04-26 | 2020-11-25 | 東京エレクトロン株式会社 | タングステン膜を形成する方法 |
| WO2018226696A1 (en) * | 2017-06-05 | 2018-12-13 | Applied Materials, Inc. | Methods of lowering wordline resistance |
| US20190017165A1 (en) * | 2017-07-13 | 2019-01-17 | Applied Materials, Inc. | Methods And Apparatus For Depositing Tungsten Nucleation Layers |
| KR102424993B1 (ko) | 2017-09-11 | 2022-07-25 | 에스케이하이닉스 주식회사 | 반도체 장치의 제조방법 |
| US10669160B2 (en) * | 2018-04-30 | 2020-06-02 | L'Air Liquide, Société Anonyme pour l'Etude et l'Exploitation des Procédés Georges Claude | Heterogeneous wet synthesis process for preparation of high purity tungsten pentahalide |
| JP2021523292A (ja) * | 2018-05-03 | 2021-09-02 | ラム リサーチ コーポレーションＬａｍ Ｒｅｓｅａｒｃｈ Ｃｏｒｐｏｒａｔｉｏｎ | ３ｄ ｎａｎｄ構造内にタングステンおよび他の金属を堆積させる方法 |
| KR102513403B1 (ko) * | 2018-07-30 | 2023-03-24 | 주식회사 원익아이피에스 | 텅스텐 증착 방법 |
| WO2020036026A1 (ja) * | 2018-08-17 | 2020-02-20 | セントラル硝子株式会社 | 六フッ化タングステンの製造方法 |
| JP7138518B2 (ja) * | 2018-08-31 | 2022-09-16 | 東京エレクトロン株式会社 | 成膜方法及び成膜システム |
| CN111162039A (zh) * | 2018-11-08 | 2020-05-15 | 长鑫存储技术有限公司 | 金属导电结构及半导体器件的制备方法 |
| US11972952B2 (en) | 2018-12-14 | 2024-04-30 | Lam Research Corporation | Atomic layer deposition on 3D NAND structures |
| KR20200099112A (ko) | 2019-02-13 | 2020-08-21 | 세종대학교산학협력단 | Ald 공정에서 금속 전구체 환원용 환원제 조성물 및 금속 박막의 형성 방법 |
| JP7186855B2 (ja) | 2019-02-20 | 2022-12-09 | 東京エレクトロン株式会社 | 半導体装置の製造方法 |
| JP2022522226A (ja) | 2019-04-11 | 2022-04-14 | ラム リサーチ コーポレーション | 高ステップカバレッジのタングステン堆積 |
| KR102897355B1 (ko) * | 2019-04-19 | 2025-12-08 | 에이에스엠 아이피 홀딩 비.브이. | 층 형성 방법 및 장치 |
| CN113728415B (zh) * | 2019-04-19 | 2025-05-16 | 朗姆研究公司 | 原子层沉积期间的快速冲洗清扫 |
| KR20210158419A (ko) | 2019-05-22 | 2021-12-30 | 램 리써치 코포레이션 | 핵생성-프리 텅스텐 증착 |
| US12077858B2 (en) | 2019-08-12 | 2024-09-03 | Lam Research Corporation | Tungsten deposition |
| JP2021038442A (ja) * | 2019-09-04 | 2021-03-11 | 東京エレクトロン株式会社 | 基板処理方法及び基板処理装置 |
| JP7552984B2 (ja) * | 2020-06-30 | 2024-09-18 | アプライド マテリアルズ インコーポレイテッド | 低温での選択的タングステン堆積 |
| KR102847592B1 (ko) | 2020-11-05 | 2025-08-18 | 세종대학교산학협력단 | 텅스텐 전구체, 이를 이용한 텅스텐 박막 증착 방법 및 증착 장치 |
| WO2022108908A1 (en) * | 2020-11-20 | 2022-05-27 | Lam Research Corporation | Low resistance pulsed cvd tungsten |
| US11515200B2 (en) * | 2020-12-03 | 2022-11-29 | Applied Materials, Inc. | Selective tungsten deposition within trench structures |
| TWI859534B (zh) * | 2021-05-07 | 2024-10-21 | 美商恩特葛瑞斯股份有限公司 | 鉬或鎢材料之沉積方法 |
| CN114420533B (zh) * | 2021-12-08 | 2024-10-18 | 武汉新芯集成电路股份有限公司 | 在半导体晶片上制备钨的方法 |
| CN119230478A (zh) * | 2023-06-30 | 2024-12-31 | 北京北方华创微电子装备有限公司 | 沉积钨塞的工艺方法及半导体器件 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6936538B2 (en) * | 2001-07-16 | 2005-08-30 | Applied Materials, Inc. | Method and apparatus for depositing tungsten after surface treatment to improve film characteristics |
| TW589684B (en) * | 2001-10-10 | 2004-06-01 | Applied Materials Inc | Method for depositing refractory metal layers employing sequential deposition techniques |
| TWI493058B (zh) * | 2007-05-15 | 2015-07-21 | 應用材料股份有限公司 | 鎢材料的原子層沈積法 |
| US8551885B2 (en) * | 2008-08-29 | 2013-10-08 | Novellus Systems, Inc. | Method for reducing tungsten roughness and improving reflectivity |
| KR101356332B1 (ko) * | 2010-03-19 | 2014-02-04 | 노벨러스 시스템즈, 인코포레이티드 | 낮은 저항 및 강한 미소-접착 특성을 가진 텅스텐 박막의 증착 방법 |
| US8975142B2 (en) * | 2013-04-25 | 2015-03-10 | Globalfoundries Inc. | FinFET channel stress using tungsten contacts in raised epitaxial source and drain |
| JP5864503B2 (ja) * | 2013-09-30 | 2016-02-17 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置、プログラム及び記録媒体 |
-
2016
- 2016-05-25 KR KR1020160064157A patent/KR102397797B1/ko active Active
- 2016-05-26 TW TW105116371A patent/TWI747825B/zh active
- 2016-05-26 JP JP2016104837A patent/JP7092456B2/ja active Active
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