JP2016524701A - マルチスペクトルｘ線検出装置 - Google Patents

マルチスペクトルｘ線検出装置 Download PDF

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Publication number
JP2016524701A
JP2016524701A JP2016513442A JP2016513442A JP2016524701A JP 2016524701 A JP2016524701 A JP 2016524701A JP 2016513442 A JP2016513442 A JP 2016513442A JP 2016513442 A JP2016513442 A JP 2016513442A JP 2016524701 A JP2016524701 A JP 2016524701A
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Japan
Prior art keywords
ray
gamma
gamma ray
imaging apparatus
regions
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JP2016513442A
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English (en)
Japanese (ja)
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JP2016524701A5 (enExample
Inventor
ギブソン，ゲイリー
スコット，ポール
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Ibex Innovations Ltd
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Ibex Innovations Ltd
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Publication of JP2016524701A publication Critical patent/JP2016524701A/ja
Publication of JP2016524701A5 publication Critical patent/JP2016524701A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G01N23/087—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays using polyenergetic X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2928—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2985—In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
    • G01T1/366—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry with semi-conductor detectors
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/10—Scattering devices; Absorbing devices; Ionising radiation filters

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Molecular Biology (AREA)
  • General Engineering & Computer Science (AREA)
  • Engineering & Computer Science (AREA)
  • Toxicology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
JP2016513442A 2013-05-16 2014-05-16 マルチスペクトルｘ線検出装置 Pending JP2016524701A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB1308851.3 2013-05-16
GBGB1308851.3A GB201308851D0 (en) 2013-05-16 2013-05-16 Multi-spectral x-ray detection apparatus
PCT/GB2014/051506 WO2014184574A1 (en) 2013-05-16 2014-05-16 Multi-spectral x-ray detection apparatus

Publications (2)

Publication Number Publication Date
JP2016524701A true JP2016524701A (ja) 2016-08-18
JP2016524701A5 JP2016524701A5 (enExample) 2017-07-06

Family

ID=48746868

Family Applications (1)

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JP2016513442A Pending JP2016524701A (ja) 2013-05-16 2014-05-16 マルチスペクトルｘ線検出装置

Country Status (4)

Country Link
US (1) US10180506B2 (enExample)
JP (1) JP2016524701A (enExample)
GB (2) GB201308851D0 (enExample)
WO (1) WO2014184574A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2020030097A (ja) * 2018-08-22 2020-02-27 キヤノンメディカルシステムズ株式会社 感度補正方法及び光子計数型検出器

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102277902B1 (ko) * 2014-09-05 2021-07-15 삼성전자주식회사 피검체 접촉압력 측정기와 그 제조 및 측정방법
CN105204059B (zh) * 2015-09-11 2017-12-15 中国工程物理研究院激光聚变研究中心 一种局部区域软x射线辐射流定量测量装置与测量方法
US20240201110A1 (en) * 2022-12-09 2024-06-20 Kub Technologies, Inc. Dba Kubtec System and method for utilization of photon counting in a cabinet x-ray system

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0868864A (ja) * 1994-08-31 1996-03-12 Shimadzu Corp 撮像装置
JP2001017417A (ja) * 1999-06-24 2001-01-23 General Electric Co <Ge> 複数のｘ線システム用の交換可能なモジュール式ファントム
JP2009018154A (ja) * 2007-05-04 2009-01-29 General Electric Co <Ge> オーバーレンジ論理制御を伴う光子計数ｘ線検出器
WO2011110862A1 (en) * 2010-03-12 2011-09-15 Kromek Limited Detector device, inspection apparatus and method

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US3965358A (en) 1974-12-06 1976-06-22 Albert Macovski Cross-sectional imaging system using a polychromatic x-ray source
JPS5817613B2 (ja) * 1977-04-30 1983-04-08 株式会社東芝 Ｘ線断層装置
JPH07122670B2 (ja) * 1986-10-15 1995-12-25 化成オプトニクス株式会社 Ｘ線スペクトル測定装置
US5841835A (en) * 1997-03-31 1998-11-24 General Electric Company Apparatus and method for automatic monitoring and assessment of image quality in x-ray systems
GB9914705D0 (en) 1999-06-23 1999-08-25 Stereo Scan Systems Limited Castellated linear array scintillator system
JP2002102217A (ja) * 2000-09-28 2002-04-09 Ge Medical Systems Global Technology Co Llc Ｘ線ｃｔシステム、ガントリ装置、コンソール端末及びその制御方法及び記憶媒体
AU2003294600A1 (en) 2002-12-10 2004-06-30 Digitome Corporation Volumetric 3d x-ray imaging system for baggage inspection including the detection of explosives
SE527139C2 (sv) * 2003-04-16 2005-12-27 Xcounter Ab Anordning och förfarande för dubbelenergi- och skanningbaserad detektering av joniserade strålning med stackade linjedetektorer och filter
AP2007003993A0 (en) 2004-10-14 2007-06-30 Eklin Medical Systems Inc Polychromic digital radiography detector with patterned mask for single-exposure energy-sensitive-x-ray imaging
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US20080118032A1 (en) 2006-10-06 2008-05-22 Graham Sean A Optimized aperture selection imaging computed tomography system and method
ATE495529T1 (de) * 2006-12-04 2011-01-15 Koninkl Philips Electronics Nv Strahlungsfilter, der die spektrale zusammensetzung der strahlung nicht verändert
WO2008142446A2 (en) 2007-05-17 2008-11-27 Durham Scientific Crystals Ltd Energy dispersive x-ray absorption spectroscopy in scanning transmission mode involving the calculation of the intensity ratios between successive frequency bands
DE102007058447A1 (de) 2007-12-05 2009-06-10 Siemens Ag Röntgendetektor, Röntgengerät und Verfahren zur Erfassung einer Röntgenstrahlung
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US8311182B2 (en) * 2010-09-22 2012-11-13 General Electric Company System and method of notch filtration for dual energy CT
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JP5475925B2 (ja) * 2011-04-20 2014-04-16 富士フイルム株式会社 放射線撮影装置及び画像処理方法

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0868864A (ja) * 1994-08-31 1996-03-12 Shimadzu Corp 撮像装置
JP2001017417A (ja) * 1999-06-24 2001-01-23 General Electric Co <Ge> 複数のｘ線システム用の交換可能なモジュール式ファントム
JP2009018154A (ja) * 2007-05-04 2009-01-29 General Electric Co <Ge> オーバーレンジ論理制御を伴う光子計数ｘ線検出器
WO2011110862A1 (en) * 2010-03-12 2011-09-15 Kromek Limited Detector device, inspection apparatus and method
JP2013522585A (ja) * 2010-03-12 2013-06-13 クロメック リミテッド 検出器デバイス、検査装置および方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2020030097A (ja) * 2018-08-22 2020-02-27 キヤノンメディカルシステムズ株式会社 感度補正方法及び光子計数型検出器
JP7106392B2 (ja) 2018-08-22 2022-07-26 キヤノンメディカルシステムズ株式会社 感度補正方法及び光子計数型検出器

Also Published As

Publication number Publication date
GB2518479A (en) 2015-03-25
US20160084973A1 (en) 2016-03-24
WO2014184574A1 (en) 2014-11-20
GB201408714D0 (en) 2014-07-02
GB2518479B (en) 2018-12-05
US10180506B2 (en) 2019-01-15
GB201308851D0 (en) 2013-07-03

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