JP2016524701A5 - - Google Patents

Download PDF

Info

Publication number
JP2016524701A5
JP2016524701A5 JP2016513442A JP2016513442A JP2016524701A5 JP 2016524701 A5 JP2016524701 A5 JP 2016524701A5 JP 2016513442 A JP2016513442 A JP 2016513442A JP 2016513442 A JP2016513442 A JP 2016513442A JP 2016524701 A5 JP2016524701 A5 JP 2016524701A5
Authority
JP
Japan
Prior art keywords
ray
gamma
imaging apparatus
gamma ray
ray imaging
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2016513442A
Other languages
English (en)
Japanese (ja)
Other versions
JP2016524701A (ja
Filing date
Publication date
Priority claimed from GBGB1308851.3A external-priority patent/GB201308851D0/en
Application filed filed Critical
Publication of JP2016524701A publication Critical patent/JP2016524701A/ja
Publication of JP2016524701A5 publication Critical patent/JP2016524701A5/ja
Pending legal-status Critical Current

Links

JP2016513442A 2013-05-16 2014-05-16 マルチスペクトルｘ線検出装置 Pending JP2016524701A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB1308851.3 2013-05-16
GBGB1308851.3A GB201308851D0 (en) 2013-05-16 2013-05-16 Multi-spectral x-ray detection apparatus
PCT/GB2014/051506 WO2014184574A1 (en) 2013-05-16 2014-05-16 Multi-spectral x-ray detection apparatus

Publications (2)

Publication Number Publication Date
JP2016524701A JP2016524701A (ja) 2016-08-18
JP2016524701A5 true JP2016524701A5 (enExample) 2017-07-06

Family

ID=48746868

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016513442A Pending JP2016524701A (ja) 2013-05-16 2014-05-16 マルチスペクトルｘ線検出装置

Country Status (4)

Country Link
US (1) US10180506B2 (enExample)
JP (1) JP2016524701A (enExample)
GB (2) GB201308851D0 (enExample)
WO (1) WO2014184574A1 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102277902B1 (ko) * 2014-09-05 2021-07-15 삼성전자주식회사 피검체 접촉압력 측정기와 그 제조 및 측정방법
CN105204059B (zh) * 2015-09-11 2017-12-15 中国工程物理研究院激光聚变研究中心 一种局部区域软x射线辐射流定量测量装置与测量方法
JP7106392B2 (ja) * 2018-08-22 2022-07-26 キヤノンメディカルシステムズ株式会社 感度補正方法及び光子計数型検出器
US20240201110A1 (en) * 2022-12-09 2024-06-20 Kub Technologies, Inc. Dba Kubtec System and method for utilization of photon counting in a cabinet x-ray system

Family Cites Families (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3950613A (en) 1973-12-26 1976-04-13 Albert Macovski X-ray encoding and decoding system
US3965358A (en) 1974-12-06 1976-06-22 Albert Macovski Cross-sectional imaging system using a polychromatic x-ray source
JPS5817613B2 (ja) * 1977-04-30 1983-04-08 株式会社東芝 Ｘ線断層装置
JPH07122670B2 (ja) * 1986-10-15 1995-12-25 化成オプトニクス株式会社 Ｘ線スペクトル測定装置
JP3257270B2 (ja) 1994-08-31 2002-02-18 株式会社島津製作所 撮像装置
US5841835A (en) * 1997-03-31 1998-11-24 General Electric Company Apparatus and method for automatic monitoring and assessment of image quality in x-ray systems
GB9914705D0 (en) 1999-06-23 1999-08-25 Stereo Scan Systems Limited Castellated linear array scintillator system
US6231231B1 (en) * 1999-06-24 2001-05-15 General Electric Company Modular interchangeable phantoms for multiple x-ray systems
JP2002102217A (ja) * 2000-09-28 2002-04-09 Ge Medical Systems Global Technology Co Llc Ｘ線ｃｔシステム、ガントリ装置、コンソール端末及びその制御方法及び記憶媒体
AU2003294600A1 (en) 2002-12-10 2004-06-30 Digitome Corporation Volumetric 3d x-ray imaging system for baggage inspection including the detection of explosives
SE527139C2 (sv) * 2003-04-16 2005-12-27 Xcounter Ab Anordning och förfarande för dubbelenergi- och skanningbaserad detektering av joniserade strålning med stackade linjedetektorer och filter
AP2007003993A0 (en) 2004-10-14 2007-06-30 Eklin Medical Systems Inc Polychromic digital radiography detector with patterned mask for single-exposure energy-sensitive-x-ray imaging
US7200201B2 (en) 2004-11-16 2007-04-03 General Electric Company Flat panel detector based slot scanning configuration
US7382853B2 (en) * 2004-11-24 2008-06-03 General Electric Company Method and system of CT data correction
EP1727092A1 (en) 2005-05-23 2006-11-29 GSF-Forschungszentrum für Umwelt und Gesundheit GmbH Method and device for imaging tomography
US8155729B1 (en) 2006-02-17 2012-04-10 General Electric Company Method and apparatus to compensate imaging data with simultaneously acquired motion data
US20080118032A1 (en) 2006-10-06 2008-05-22 Graham Sean A Optimized aperture selection imaging computed tomography system and method
ATE495529T1 (de) * 2006-12-04 2011-01-15 Koninkl Philips Electronics Nv Strahlungsfilter, der die spektrale zusammensetzung der strahlung nicht verändert
IL191154A0 (en) 2007-05-04 2008-12-29 Gen Electric Photon counting x-ray detector with overrange logic control
WO2008142446A2 (en) 2007-05-17 2008-11-27 Durham Scientific Crystals Ltd Energy dispersive x-ray absorption spectroscopy in scanning transmission mode involving the calculation of the intensity ratios between successive frequency bands
DE102007058447A1 (de) 2007-12-05 2009-06-10 Siemens Ag Röntgendetektor, Röntgengerät und Verfahren zur Erfassung einer Röntgenstrahlung
GB0806602D0 (en) 2008-04-11 2008-05-14 Durham Scient Crystals Ltd Imaging apparatus and method
GB0807474D0 (en) 2008-04-24 2008-12-03 Durham Scient Crystals Ltd Determination of Composition of Liquids
US8378310B2 (en) 2009-02-11 2013-02-19 Prismatic Sensors Ab Image quality in photon counting-mode detector systems
ES2487620T3 (es) 2009-05-26 2014-08-22 Kromek Limited Método para la identificación de materiales en un recipiente
JP2011067333A (ja) * 2009-09-25 2011-04-07 Fujifilm Corp 放射線画像撮影装置及び撮影制御装置
US8199875B2 (en) 2009-12-11 2012-06-12 General Electric Company System and method of acquiring multi-energy CT imaging data
GB201004121D0 (en) * 2010-03-12 2010-04-28 Durham Scient Crystals Ltd Detector device, inspection apparatus and method
US8311182B2 (en) * 2010-09-22 2012-11-13 General Electric Company System and method of notch filtration for dual energy CT
CN103200874B (zh) * 2010-11-08 2015-11-25 皇家飞利浦电子股份有限公司 用于相位对比成像的光栅
JP5475925B2 (ja) * 2011-04-20 2014-04-16 富士フイルム株式会社 放射線撮影装置及び画像処理方法

Similar Documents

Publication Publication Date Title
JP4840446B2 (ja) 放射線撮像装置
EP2207047B1 (en) X-ray image obtaining/imaging apparatus and method
US10393890B2 (en) X-ray imaging device
RU2598396C2 (ru) Метод и система комбинированного радиационного неразрушающего контроля
US8520800B2 (en) Method and apparatus for radiation resistant imaging
EP2949272B1 (en) Variable pinhole type collimator and radiation imaging apparatus using same
US20100012845A1 (en) Energy-resolving detection system and imaging system
JP2014226551A (ja) Ｘ線ｃｔ装置及び検出器
JP2015503090A5 (enExample)
JP2016524701A5 (enExample)
CN111133338A (zh) 具有单片闪烁体的多层探测器
US9433391B2 (en) Scintillator and radiation detection device
JP2016030215A (ja) Ｃｔ検出器
US9230702B2 (en) System and method for reducing grid line image artifacts
JP5283382B2 (ja) 核医学用検出器
US20150003589A1 (en) X-ray photographing apparatus and method of operating the same
JP4388899B2 (ja) Ｘ線検査装置
JP2017058191A (ja) 放射線撮像装置
JP6523451B2 (ja) 放射線検出器とそれを備えたｘ線ｃｔ装置
US11249034B2 (en) X-ray Talbot capturing apparatus
CZ307694B6 (cs) Kruhová rentgenka a rentgenové zařízení s kruhovou rentgenkou
JP6533006B2 (ja) 強化されたｘ線放射を用いた撮像
US20200251236A1 (en) Low profile anti scatter and anti charge sharing grid for photon counting computed tomography
CN104090291A (zh) 准直器阵列、工业ct设备线性探测器串扰校正装置及方法
EP3864624B1 (fr) Procédé de correction d'une image spectrale