JP2015503090A5 - - Google Patents
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- JP2015503090A5 JP2015503090A5 JP2014540550A JP2014540550A JP2015503090A5 JP 2015503090 A5 JP2015503090 A5 JP 2015503090A5 JP 2014540550 A JP2014540550 A JP 2014540550A JP 2014540550 A JP2014540550 A JP 2014540550A JP 2015503090 A5 JP2015503090 A5 JP 2015503090A5
- Authority
- JP
- Japan
- Prior art keywords
- imaging apparatus
- ray imaging
- ray
- layer
- regions
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000003384 imaging method Methods 0.000 claims 34
- 239000000463 material Substances 0.000 claims 13
- 238000001228 spectrum Methods 0.000 claims 10
- 238000000034 method Methods 0.000 claims 9
- 238000000926 separation method Methods 0.000 claims 9
- 239000000126 substance Substances 0.000 claims 4
- 239000002184 metal Substances 0.000 claims 2
- 239000000758 substrate Substances 0.000 claims 2
- 238000003491 array Methods 0.000 claims 1
- 230000001419 dependent effect Effects 0.000 claims 1
- 239000011888 foil Substances 0.000 claims 1
- 230000003094 perturbing effect Effects 0.000 claims 1
- 229910052710 silicon Inorganic materials 0.000 claims 1
- 239000010703 silicon Substances 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB1119257.2 | 2011-11-08 | ||
| GBGB1119257.2A GB201119257D0 (en) | 2011-11-08 | 2011-11-08 | X-ray detection apparatus |
| PCT/GB2012/052772 WO2013068745A2 (en) | 2011-11-08 | 2012-11-08 | X-ray detection apparatus |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2015503090A JP2015503090A (ja) | 2015-01-29 |
| JP2015503090A5 true JP2015503090A5 (enExample) | 2015-12-24 |
| JP6196227B2 JP6196227B2 (ja) | 2017-09-13 |
Family
ID=45421439
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014540550A Expired - Fee Related JP6196227B2 (ja) | 2011-11-08 | 2012-11-08 | X線検知装置 |
Country Status (8)
| Country | Link |
|---|---|
| US (2) | US9519068B2 (enExample) |
| EP (1) | EP2776861A2 (enExample) |
| JP (1) | JP6196227B2 (enExample) |
| KR (1) | KR20140103935A (enExample) |
| CN (1) | CN103975253B (enExample) |
| GB (5) | GB201119257D0 (enExample) |
| TW (1) | TWI586991B (enExample) |
| WO (1) | WO2013068745A2 (enExample) |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB201308876D0 (en) * | 2013-05-16 | 2013-07-03 | Ibex Innovations Ltd | X-Ray imaging apparatus and methods |
| KR102171020B1 (ko) * | 2013-10-16 | 2020-10-29 | 삼성전자주식회사 | 엑스레이 흡수 필터를 갖는 엑스레이 시스템, 반도체 패키지, 및 트레이 |
| DE102014205670A1 (de) * | 2014-03-26 | 2015-10-01 | Siemens Aktiengesellschaft | Röntgenaufnahmesystem mit anpaßbarem Filter |
| US9684083B2 (en) * | 2014-04-01 | 2017-06-20 | General Electric Company | X-ray detector panel |
| GB2529375A (en) * | 2014-05-16 | 2016-02-24 | Ibex Innovations Ltd | Multi-pixel x-ray detector apparatus |
| GB2527505A (en) * | 2014-06-20 | 2015-12-30 | Kirintec Ltd | X-ray imaging method and apparatus |
| EP3201653A1 (en) | 2014-10-04 | 2017-08-09 | Ibex Innovations Ltd. | Improvements relating to scatter in x-ray apparatus and methods of their use |
| CN105092617A (zh) * | 2015-09-18 | 2015-11-25 | 重庆大学 | 一种基于x射线能谱ct和x射线荧光ct技术的双模态分子成像系统 |
| JP6923562B2 (ja) | 2016-02-19 | 2021-08-18 | エス. カリム、カリム | X線検出システムおよびx線検出方法 |
| CN105807329B (zh) * | 2016-05-30 | 2019-05-17 | 公安部第一研究所 | 一种用于识别包裹中危险液体的x射线检测装置与方法 |
| GB201703291D0 (en) | 2017-03-01 | 2017-04-12 | Ibex Innovations Ltd | Apparatus and method for the correction of scatter in a radiographic system |
| EP3427664A1 (en) | 2017-07-13 | 2019-01-16 | Koninklijke Philips N.V. | A device for scatter correction in an x-ray image and a method for scatter correction in an xray image |
| CN107833820A (zh) * | 2017-11-30 | 2018-03-23 | 中国工程物理研究院激光聚变研究中心 | 一种新型单通道x射线二极管探测系统 |
| EP3521862A1 (en) | 2018-02-02 | 2019-08-07 | Koninklijke Philips N.V. | Multi-spectral x-ray detector |
| GB2576772B (en) | 2018-08-31 | 2023-01-25 | Ibex Innovations Ltd | X-ray Imaging system |
| CN115084175A (zh) * | 2022-05-12 | 2022-09-20 | 上海奕瑞光电子科技股份有限公司 | 一种多能谱滤过层及多能谱平板探测器 |
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| US3965358A (en) * | 1974-12-06 | 1976-06-22 | Albert Macovski | Cross-sectional imaging system using a polychromatic x-ray source |
| JPH07122670B2 (ja) | 1986-10-15 | 1995-12-25 | 化成オプトニクス株式会社 | X線スペクトル測定装置 |
| JPH04194695A (ja) * | 1990-11-27 | 1992-07-14 | Katashi Sasaki | 積分吸収線量測定用フィルター及びこれを用いた放射線線量計 |
| RU2003956C1 (ru) * | 1991-10-09 | 1993-11-30 | Геннадий Тимофеевич Кирин | Преобразователь давлени |
| IL109143A (en) * | 1993-04-05 | 1999-03-12 | Cardiac Mariners Inc | X-rays as a low-dose scanning detector by a digital X-ray imaging system |
| DE69629455T2 (de) | 1995-02-10 | 2004-06-03 | NexRay, Inc., Los Gatos | Abbildungssystem mit röntgenstrahlabtastung |
| GB9704260D0 (en) | 1997-02-28 | 1997-04-16 | Gammex Rmi Ltd | Improvements in and relating to X-Ray measurement |
| US5981959A (en) * | 1997-12-05 | 1999-11-09 | Xerox Corporation | Pixelized scintillation layer and structures incorporating same |
| JPH11218579A (ja) * | 1998-02-02 | 1999-08-10 | Shimadzu Corp | Ct用固体検出器 |
| US6201850B1 (en) | 1999-01-26 | 2001-03-13 | Agilent Technologies, Inc. | Enhanced thickness calibration and shading correction for automatic X-ray inspection |
| GB9914705D0 (en) | 1999-06-23 | 1999-08-25 | Stereo Scan Systems Limited | Castellated linear array scintillator system |
| JP2001013250A (ja) * | 1999-06-30 | 2001-01-19 | Toshiba Corp | 汚染検査装置 |
| DE50015405D1 (de) * | 1999-11-30 | 2008-11-27 | Philips Intellectual Property | Gitter zur Absorption von Röntgenstrahlen |
| IL140460A0 (en) * | 1999-12-30 | 2002-02-10 | Ge Med Sys Global Tech Co Llc | Methods and apparatus for variable thickness multislice ct imaging |
| GB2365522B (en) * | 2000-08-03 | 2005-09-21 | Cambridge Imaging Ltd | Improvements in and relating to material identification using X-rays |
| FR2820966B1 (fr) | 2001-02-16 | 2003-04-04 | Commissariat Energie Atomique | Procede de radiographie a double energie, et dispositif de calibration pour ce procede |
| US6516044B1 (en) * | 2001-10-23 | 2003-02-04 | Ge Medical Systems Global Technology Co., Llc | Scintillation apparatus and method of light collection for use with a radiation emitting medical imaging scanner |
| AU2002302940A1 (en) * | 2002-05-09 | 2003-11-11 | Philips Medical Systems Technologies Ltd. | Multi-array detection systems in ct |
| DE10237546B4 (de) * | 2002-08-16 | 2007-11-29 | Siemens Ag | Röntgen-Computertomographie-Gerät mit Filter |
| US6907101B2 (en) | 2003-03-03 | 2005-06-14 | General Electric Company | CT detector with integrated air gap |
| JP2004271333A (ja) * | 2003-03-07 | 2004-09-30 | Hamamatsu Photonics Kk | シンチレータパネル、イメージセンサ及びエネルギー弁別器 |
| US9113839B2 (en) * | 2003-04-25 | 2015-08-25 | Rapiscon Systems, Inc. | X-ray inspection system and method |
| US7709805B2 (en) * | 2003-08-01 | 2010-05-04 | General Electric Company | Method for generating optical anisotropy in scintillators using pulsed lasers |
| US7009181B1 (en) * | 2004-08-31 | 2006-03-07 | Battelle Memorial Institute | Apparatus and method for OSL-based, remote radiation monitoring and spectrometry |
| US7260174B2 (en) | 2004-09-13 | 2007-08-21 | General Electric Company | Direct conversion energy discriminating CT detector with over-ranging correction |
| AP2007003993A0 (en) * | 2004-10-14 | 2007-06-30 | Eklin Medical Systems Inc | Polychromic digital radiography detector with patterned mask for single-exposure energy-sensitive-x-ray imaging |
| DE102005010077B4 (de) * | 2005-03-04 | 2007-09-20 | Siemens Ag | Detektor mit einem Szintillator und bildgebendes Gerät, aufweisend einen derartigen Detektor |
| GB0904236D0 (en) | 2009-03-12 | 2009-04-22 | Cxr Ltd | X-ray scanners and x-ray sources thereof |
| US7362849B2 (en) | 2006-01-04 | 2008-04-22 | General Electric Company | 2D collimator and detector system employing a 2D collimator |
| DE102006017291B4 (de) | 2006-02-01 | 2017-05-24 | Paul Scherer Institut | Fokus/Detektor-System einer Röntgenapparatur zur Erzeugung von Phasenkontrastaufnahmen, Röntgensystem mit einem solchen Fokus/Detektor-System sowie zugehöriges Speichermedium und Verfahren |
| JP4995193B2 (ja) * | 2006-04-28 | 2012-08-08 | 株式会社日立メディコ | X線画像診断装置 |
| WO2008142446A2 (en) | 2007-05-17 | 2008-11-27 | Durham Scientific Crystals Ltd | Energy dispersive x-ray absorption spectroscopy in scanning transmission mode involving the calculation of the intensity ratios between successive frequency bands |
| GB0716045D0 (en) * | 2007-08-17 | 2007-09-26 | Durham Scient Crystals Ltd | Method and apparatus for inspection of materials |
| JP2009028100A (ja) * | 2007-07-24 | 2009-02-12 | Samii Kk | 遊技球の製造方法及び当該製造方法により製造された遊技球を用いた弾球遊技機 |
| JP2009028110A (ja) * | 2007-07-25 | 2009-02-12 | Ge Medical Systems Global Technology Co Llc | X線ct装置及びそれに使用するフィルタ板 |
| DE102007058447A1 (de) * | 2007-12-05 | 2009-06-10 | Siemens Ag | Röntgendetektor, Röntgengerät und Verfahren zur Erfassung einer Röntgenstrahlung |
| GB0806602D0 (en) | 2008-04-11 | 2008-05-14 | Durham Scient Crystals Ltd | Imaging apparatus and method |
| GB0807474D0 (en) | 2008-04-24 | 2008-12-03 | Durham Scient Crystals Ltd | Determination of Composition of Liquids |
| JP4847568B2 (ja) * | 2008-10-24 | 2011-12-28 | キヤノン株式会社 | X線撮像装置およびx線撮像方法 |
| KR101504491B1 (ko) * | 2008-12-02 | 2015-03-23 | 삼성전자주식회사 | 엑스선 영상 획득 장치 및 엑스선 영상 획득 방법, 센서 및이미징 장치 |
| RU2493529C2 (ru) * | 2009-03-30 | 2013-09-20 | Директор Дженерал, Дифенс Рисёч Энд Девелопмент Организейшен | Мобильная ракетная пусковая установка и способ запуска ракеты |
| ES2487620T3 (es) * | 2009-05-26 | 2014-08-22 | Kromek Limited | Método para la identificación de materiales en un recipiente |
| CN101937094B (zh) | 2009-06-30 | 2014-03-26 | 同方威视技术股份有限公司 | 双能x射线阵列探测器 |
| JP2011137665A (ja) * | 2009-12-26 | 2011-07-14 | Canon Inc | シンチレータパネル及び放射線撮像装置とその製造方法、ならびに放射線撮像システム |
| GB201004121D0 (en) * | 2010-03-12 | 2010-04-28 | Durham Scient Crystals Ltd | Detector device, inspection apparatus and method |
| JP5646906B2 (ja) * | 2010-08-06 | 2014-12-24 | キヤノン株式会社 | X線装置およびx線測定方法 |
| DE102010040578A1 (de) * | 2010-09-10 | 2012-03-15 | Siemens Aktiengesellschaft | Röntgendetektor |
| EP2625546A2 (en) * | 2010-10-07 | 2013-08-14 | H. Lee Moffitt Cancer Center And Research Institute, Inc. | Method and apparatus for detection of radioactive isotopes |
| CN103200874B (zh) * | 2010-11-08 | 2015-11-25 | 皇家飞利浦电子股份有限公司 | 用于相位对比成像的光栅 |
| WO2013187012A1 (en) * | 2012-06-15 | 2013-12-19 | Canon Kabushiki Kaisha | X-ray apparatus and x-ray measurement method |
-
2011
- 2011-11-08 GB GBGB1119257.2A patent/GB201119257D0/en not_active Ceased
-
2012
- 2012-11-08 CN CN201280056214.XA patent/CN103975253B/zh not_active Expired - Fee Related
- 2012-11-08 JP JP2014540550A patent/JP6196227B2/ja not_active Expired - Fee Related
- 2012-11-08 US US14/356,920 patent/US9519068B2/en not_active Expired - Fee Related
- 2012-11-08 KR KR1020147015293A patent/KR20140103935A/ko not_active Abandoned
- 2012-11-08 GB GB1602219.6A patent/GB2533233B/en not_active Expired - Fee Related
- 2012-11-08 TW TW101141717A patent/TWI586991B/zh not_active IP Right Cessation
- 2012-11-08 GB GB1220128.1A patent/GB2498615B/en not_active Expired - Fee Related
- 2012-11-08 GB GB1602220.4A patent/GB2532897B/en not_active Expired - Fee Related
- 2012-11-08 EP EP12812307.2A patent/EP2776861A2/en not_active Withdrawn
- 2012-11-08 WO PCT/GB2012/052772 patent/WO2013068745A2/en not_active Ceased
- 2012-11-08 GB GB1602216.2A patent/GB2532634B/en not_active Expired - Fee Related
-
2016
- 2016-11-28 US US15/361,793 patent/US9784851B2/en not_active Expired - Fee Related
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