JP2016100593A5 - - Google Patents

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Publication number
JP2016100593A5
JP2016100593A5 JP2014239390A JP2014239390A JP2016100593A5 JP 2016100593 A5 JP2016100593 A5 JP 2016100593A5 JP 2014239390 A JP2014239390 A JP 2014239390A JP 2014239390 A JP2014239390 A JP 2014239390A JP 2016100593 A5 JP2016100593 A5 JP 2016100593A5
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JP
Japan
Prior art keywords
film
crystalline
structure according
void
forming
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Pending
Application number
JP2014239390A
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English (en)
Japanese (ja)
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JP2016100593A (ja
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Priority to JP2014239390A priority Critical patent/JP2016100593A/ja
Priority claimed from JP2014239390A external-priority patent/JP2016100593A/ja
Publication of JP2016100593A publication Critical patent/JP2016100593A/ja
Publication of JP2016100593A5 publication Critical patent/JP2016100593A5/ja
Priority to JP2019164176A priority patent/JP7344426B2/ja
Pending legal-status Critical Current

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JP2014239390A 2014-11-26 2014-11-26 結晶性積層構造体 Pending JP2016100593A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2014239390A JP2016100593A (ja) 2014-11-26 2014-11-26 結晶性積層構造体
JP2019164176A JP7344426B2 (ja) 2014-11-26 2019-09-10 結晶性積層構造体

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014239390A JP2016100593A (ja) 2014-11-26 2014-11-26 結晶性積層構造体

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2019164176A Division JP7344426B2 (ja) 2014-11-26 2019-09-10 結晶性積層構造体

Publications (2)

Publication Number Publication Date
JP2016100593A JP2016100593A (ja) 2016-05-30
JP2016100593A5 true JP2016100593A5 (enExample) 2018-01-11

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Family Applications (1)

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JP2014239390A Pending JP2016100593A (ja) 2014-11-26 2014-11-26 結晶性積層構造体

Country Status (1)

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JP (1) JP2016100593A (enExample)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2017199535A1 (ja) 2016-05-19 2017-11-23 オリンパス株式会社 生体観察システム
JP6904517B2 (ja) * 2016-06-30 2021-07-14 株式会社Flosfia 結晶性酸化物半導体膜およびその製造方法
WO2018207676A1 (ja) * 2017-05-09 2018-11-15 株式会社Flosfia サーミスタ膜およびその成膜方法
CN109423694B (zh) 2017-08-21 2022-09-09 株式会社Flosfia 结晶膜、包括结晶膜的半导体装置以及制造结晶膜的方法
JP2019034883A (ja) * 2017-08-21 2019-03-07 株式会社Flosfia 結晶膜の製造方法
WO2019208616A1 (ja) * 2018-04-27 2019-10-31 株式会社Flosfia サーミスタ膜、サーミスタ膜を有するサーミスタ素子、およびサーミスタ膜の成膜方法
JP7741487B2 (ja) * 2018-06-26 2025-09-18 株式会社Flosfia 結晶性酸化物膜
WO2020004249A1 (ja) 2018-06-26 2020-01-02 株式会社Flosfia 成膜方法および結晶性積層構造体
JP7315137B2 (ja) 2018-12-26 2023-07-26 株式会社Flosfia 結晶性酸化物膜
JP7315136B2 (ja) 2018-12-26 2023-07-26 株式会社Flosfia 結晶性酸化物半導体
WO2020195497A1 (ja) * 2019-03-28 2020-10-01 日本碍子株式会社 半導体膜
CN113614293B (zh) * 2019-03-28 2024-08-02 日本碍子株式会社 基底基板
JPWO2020261356A1 (enExample) * 2019-06-25 2020-12-30
CN114270531A (zh) * 2019-09-03 2022-04-01 株式会社Flosfia 结晶膜、包含结晶膜的半导体装置以及结晶膜的制造方法
KR102849602B1 (ko) 2019-09-30 2025-08-21 가부시키가이샤 플로스피아 적층 구조체 및 반도체 장치
JP7221410B2 (ja) * 2019-09-30 2023-02-13 日本碍子株式会社 α-Ga2O3系半導体膜
JP7290740B2 (ja) 2019-09-30 2023-06-13 日本碍子株式会社 α-Ga2O3系半導体膜
EP4098781A4 (en) 2020-01-27 2024-05-15 Flosfia Inc. SEMICONDUCTOR COMPONENT AND METHOD FOR PRODUCING A SEMICONDUCTOR COMPONENT
US11694894B2 (en) 2020-04-24 2023-07-04 Flosfia Inc. Crystalline film containing a crystalline metal oxide and method for manufacturing the same under partial pressure
US11804519B2 (en) 2020-04-24 2023-10-31 Flosfia Inc. Crystalline multilayer structure, semiconductor device, and method of manufacturing crystalline structure
JP7598113B2 (ja) * 2020-09-14 2024-12-11 株式会社Flosfia 結晶膜の成長方法および結晶性酸化物膜
US20240395548A1 (en) 2021-09-22 2024-11-28 Shin-Etsu Chemical Co., Ltd. Film-forming method, film-forming apparatus, and crystalline oxide film
KR20250022022A (ko) 2022-06-08 2025-02-14 신에쓰 가가꾸 고교 가부시끼가이샤 성막 방법 및 성막 장치
US12402381B2 (en) 2022-07-12 2025-08-26 Flosfia, Inc. Semiconductor device

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3471685B2 (ja) * 1999-03-17 2003-12-02 三菱電線工業株式会社 半導体基材及びその製造方法
JP5347835B2 (ja) * 2009-08-25 2013-11-20 豊田合成株式会社 Iii族窒化物半導体結晶の製造方法
DE102010011895B4 (de) * 2010-03-18 2013-07-25 Freiberger Compound Materials Gmbh Verfahren zur Herstellung eines semipolaren Gruppe III-Nitrid-Kristalls, Substrat, freistehendes semipolares Substrat und Verwendung der Substrate
JP5343224B1 (ja) * 2012-09-28 2013-11-13 Roca株式会社 半導体装置および結晶

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