JP2015514211A5 - - Google Patents

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Publication number
JP2015514211A5
JP2015514211A5 JP2015503227A JP2015503227A JP2015514211A5 JP 2015514211 A5 JP2015514211 A5 JP 2015514211A5 JP 2015503227 A JP2015503227 A JP 2015503227A JP 2015503227 A JP2015503227 A JP 2015503227A JP 2015514211 A5 JP2015514211 A5 JP 2015514211A5
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JP
Japan
Prior art keywords
input
output
pulse
circuit
loop
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2015503227A
Other languages
English (en)
Japanese (ja)
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JP2015514211A (ja
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Publication date
Priority claimed from US13/450,123 external-priority patent/US9147620B2/en
Application filed filed Critical
Publication of JP2015514211A publication Critical patent/JP2015514211A/ja
Publication of JP2015514211A5 publication Critical patent/JP2015514211A5/ja
Pending legal-status Critical Current

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JP2015503227A 2012-03-28 2013-03-05 エッジトリガ較正 Pending JP2015514211A (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201213433154A 2012-03-28 2012-03-28
US13/433,154 2012-03-28
US13/450,123 2012-04-18
US13/450,123 US9147620B2 (en) 2012-03-28 2012-04-18 Edge triggered calibration
PCT/US2013/029121 WO2013148085A1 (en) 2012-03-28 2013-03-05 Edge triggered calibration

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2017225875A Division JP2018054628A (ja) 2012-03-28 2017-11-24 エッジトリガ較正

Publications (2)

Publication Number Publication Date
JP2015514211A JP2015514211A (ja) 2015-05-18
JP2015514211A5 true JP2015514211A5 (enExample) 2016-03-31

Family

ID=49235557

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2015503227A Pending JP2015514211A (ja) 2012-03-28 2013-03-05 エッジトリガ較正
JP2017225875A Pending JP2018054628A (ja) 2012-03-28 2017-11-24 エッジトリガ較正

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2017225875A Pending JP2018054628A (ja) 2012-03-28 2017-11-24 エッジトリガ較正

Country Status (5)

Country Link
US (1) US9147620B2 (enExample)
JP (2) JP2015514211A (enExample)
KR (1) KR102135073B1 (enExample)
CN (1) CN104204822B (enExample)
WO (1) WO2013148085A1 (enExample)

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US9244126B2 (en) * 2013-11-06 2016-01-26 Teradyne, Inc. Automated test system with event detection capability
KR20150117775A (ko) * 2014-04-10 2015-10-21 에스케이하이닉스 주식회사 테스트 장치 및 그의 동작 방법
US10996272B2 (en) * 2014-08-27 2021-05-04 Teradyne, Inc. One-shot circuit
US11131706B2 (en) * 2015-12-08 2021-09-28 International Business Machines Corporation Degradation monitoring of semiconductor chips
US12041713B2 (en) 2017-08-23 2024-07-16 Teradyne, Inc. Reducing timing skew in a circuit path
US10276229B2 (en) 2017-08-23 2019-04-30 Teradyne, Inc. Adjusting signal timing
CN109755147A (zh) * 2018-11-26 2019-05-14 北京铂阳顶荣光伏科技有限公司 薄膜光伏组件测试方法及薄膜光伏组件
US10761130B1 (en) 2019-04-25 2020-09-01 Teradyne, Inc. Voltage driver circuit calibration
US11119155B2 (en) 2019-04-25 2021-09-14 Teradyne, Inc. Voltage driver circuit
US11283436B2 (en) 2019-04-25 2022-03-22 Teradyne, Inc. Parallel path delay line
US10942220B2 (en) 2019-04-25 2021-03-09 Teradyne, Inc. Voltage driver with supply current stabilization
US11221365B2 (en) * 2020-03-11 2022-01-11 Teradyne, Inc. Calibrating an interface board
US11681324B2 (en) * 2021-10-01 2023-06-20 Achronix Semiconductor Corporation Synchronous reset deassertion circuit
US12278624B2 (en) * 2022-02-11 2025-04-15 Pratt & Whitney Canada Corp. Logic circuit for providing a signal value after a predetermined time period and method of using same
US11923853B2 (en) 2022-02-25 2024-03-05 Nvidia Corp. Circuit structures to measure flip-flop timing characteristics
CN118409627B (zh) * 2024-06-26 2024-09-27 悦芯科技股份有限公司 一种用于存储芯片ft测试机的校准板卡方法

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IT1204621B (it) * 1987-05-15 1989-03-10 Montedison Spa Circuito flip-flop rs asincrono con scatto comandato dalle transizioni applicate agli ingressi
JPH01144719A (ja) * 1987-11-30 1989-06-07 Toshiba Corp リトリガブル・マルチバイブレータ
JP2813188B2 (ja) * 1989-01-27 1998-10-22 株式会社アドバンテスト Ｉｃ試験装置
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