JP2015194403A5 - - Google Patents

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Publication number
JP2015194403A5
JP2015194403A5 JP2014072536A JP2014072536A JP2015194403A5 JP 2015194403 A5 JP2015194403 A5 JP 2015194403A5 JP 2014072536 A JP2014072536 A JP 2014072536A JP 2014072536 A JP2014072536 A JP 2014072536A JP 2015194403 A5 JP2015194403 A5 JP 2015194403A5
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JP
Japan
Prior art keywords
sum
detection signal
pulse width
analysis apparatus
predetermined value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2014072536A
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English (en)
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JP2015194403A (ja
JP6237417B2 (ja
Filing date
Publication date
Priority claimed from JP2014072536A external-priority patent/JP6237417B2/ja
Priority to JP2014072536A priority Critical patent/JP6237417B2/ja
Application filed filed Critical
Priority to CN201580014194.3A priority patent/CN106332551B/zh
Priority to EP15772829.6A priority patent/EP3128311B1/en
Priority to PCT/JP2015/057303 priority patent/WO2015151752A1/ja
Publication of JP2015194403A publication Critical patent/JP2015194403A/ja
Publication of JP2015194403A5 publication Critical patent/JP2015194403A5/ja
Priority to US15/271,328 priority patent/US20170010260A1/en
Publication of JP6237417B2 publication Critical patent/JP6237417B2/ja
Application granted granted Critical
Priority to US16/412,807 priority patent/US10627398B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Claims (2)

  1. 前記第１基準値は、前記第１パルス幅と前記検出信号が有する所定値との和であることを特徴とする請求項２に記載の分析装置。
  2. 前記第２基準値は、第２パルス幅と前記検出信号が有する所定値との和であることを特徴とする請求項４に記載の分析装置。
JP2014072536A 2014-03-31 2014-03-31 分析装置及び分析方法 Active JP6237417B2 (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP2014072536A JP6237417B2 (ja) 2014-03-31 2014-03-31 分析装置及び分析方法
CN201580014194.3A CN106332551B (zh) 2014-03-31 2015-03-12 分析装置和分析方法
EP15772829.6A EP3128311B1 (en) 2014-03-31 2015-03-12 Analysis device and analysis method
PCT/JP2015/057303 WO2015151752A1 (ja) 2014-03-31 2015-03-12 分析装置及び分析方法
US15/271,328 US20170010260A1 (en) 2014-03-31 2016-09-21 Analysis device and analysis method
US16/412,807 US10627398B2 (en) 2014-03-31 2019-05-15 Analysis device and analysis method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014072536A JP6237417B2 (ja) 2014-03-31 2014-03-31 分析装置及び分析方法

Publications (3)

Publication Number Publication Date
JP2015194403A JP2015194403A (ja) 2015-11-05
JP2015194403A5 true JP2015194403A5 (ja) 2016-07-21
JP6237417B2 JP6237417B2 (ja) 2017-11-29

Family

ID=54240084

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014072536A Active JP6237417B2 (ja) 2014-03-31 2014-03-31 分析装置及び分析方法

Country Status (5)

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US (2) US20170010260A1 (ja)
EP (1) EP3128311B1 (ja)
JP (1) JP6237417B2 (ja)
CN (1) CN106332551B (ja)
WO (1) WO2015151752A1 (ja)

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* Cited by examiner, † Cited by third party
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CN107367453A (zh) * 2016-05-13 2017-11-21 上海纳衍生物科技有限公司 一种基于直流电阻抗测量的细胞粒子检测方法
JP7218788B2 (ja) * 2018-06-06 2023-02-07 株式会社Ｊｖｃケンウッド 分析用閾値生成装置及び分析用閾値生成方法
JP6962276B2 (ja) * 2018-06-06 2021-11-05 株式会社Ｊｖｃケンウッド 分析用閾値決定装置及び分析用閾値決定方法
JP7000998B2 (ja) * 2018-06-06 2022-01-19 株式会社Ｊｖｃケンウッド 分析用閾値生成装置及び分析用閾値生成方法
JP7208468B2 (ja) * 2018-08-01 2023-01-19 株式会社Ｊｖｃケンウッド 分析装置及び分析方法
WO2022195994A1 (ja) * 2021-03-18 2022-09-22 株式会社Ｊｖｃケンウッド 分析装置及び分析方法

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