JP2015182158A5 - - Google Patents
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- JP2015182158A5 JP2015182158A5 JP2014059445A JP2014059445A JP2015182158A5 JP 2015182158 A5 JP2015182158 A5 JP 2015182158A5 JP 2014059445 A JP2014059445 A JP 2014059445A JP 2014059445 A JP2014059445 A JP 2014059445A JP 2015182158 A5 JP2015182158 A5 JP 2015182158A5
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- circuit element
- upper layer
- semiconductor
- semiconductor circuit
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- 239000004065 semiconductor Substances 0.000 description 4
- 239000000758 substrate Substances 0.000 description 1
Description
このように、蓋部及び半導体回路素子が設けられた半導体基板10の主面を覆う第1の絶縁層91を設けることにより、機能素子を収容するキャビティーの上層にも、半導体回路素子の上層と同様に、標準的な半導体ウエハープロセスを用いて配線層を配置できるようになり、MEMSデバイスの設計自由度が向上する。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2014059445A JP2015182158A (ja) | 2014-03-24 | 2014-03-24 | Memsデバイス |
US14/660,157 US9434607B2 (en) | 2014-03-24 | 2015-03-17 | MEMS device |
CN201510129061.2A CN104944356A (zh) | 2014-03-24 | 2015-03-23 | 微机电系统装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2014059445A JP2015182158A (ja) | 2014-03-24 | 2014-03-24 | Memsデバイス |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2015182158A JP2015182158A (ja) | 2015-10-22 |
JP2015182158A5 true JP2015182158A5 (ja) | 2017-03-16 |
Family
ID=54141419
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2014059445A Withdrawn JP2015182158A (ja) | 2014-03-24 | 2014-03-24 | Memsデバイス |
Country Status (3)
Country | Link |
---|---|
US (1) | US9434607B2 (ja) |
JP (1) | JP2015182158A (ja) |
CN (1) | CN104944356A (ja) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9868628B2 (en) * | 2016-03-10 | 2018-01-16 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method and structure for CMOS-MEMS thin film encapsulation |
US10199424B1 (en) * | 2017-07-19 | 2019-02-05 | Meridian Innovation Pte Ltd | Thermoelectric-based infrared detector having a cavity and a MEMS structure defined by BEOL metals lines |
US10319680B1 (en) | 2018-03-01 | 2019-06-11 | Sandisk Technologies Llc | Metal contact via structure surrounded by an air gap and method of making thereof |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5963788A (en) * | 1995-09-06 | 1999-10-05 | Sandia Corporation | Method for integrating microelectromechanical devices with electronic circuitry |
US6012336A (en) * | 1995-09-06 | 2000-01-11 | Sandia Corporation | Capacitance pressure sensor |
US5798283A (en) * | 1995-09-06 | 1998-08-25 | Sandia Corporation | Method for integrating microelectromechanical devices with electronic circuitry |
DE10017976A1 (de) * | 2000-04-11 | 2001-10-18 | Bosch Gmbh Robert | Mikromechanisches Bauelement und entsprechendes Herstellungsverfahren |
JP2006289520A (ja) * | 2005-04-06 | 2006-10-26 | Toshiba Corp | Mems技術を使用した半導体装置 |
US7417307B2 (en) * | 2005-07-29 | 2008-08-26 | Hewlett-Packard Development Company, L.P. | System and method for direct-bonding of substrates |
JP4988217B2 (ja) * | 2006-02-03 | 2012-08-01 | 株式会社日立製作所 | Mems構造体の製造方法 |
JP2007210083A (ja) * | 2006-02-13 | 2007-08-23 | Hitachi Ltd | Mems素子及びその製造方法 |
US8148811B2 (en) | 2006-08-25 | 2012-04-03 | Semiconductor Components Industries, Llc | Semiconductor device and manufacturing method thereof |
JP5040021B2 (ja) | 2007-08-31 | 2012-10-03 | セイコーインスツル株式会社 | 気密パッケージ及び気密パッケージの製造方法 |
CN102449906B (zh) | 2010-03-18 | 2014-10-01 | 松下电器产业株式会社 | Mems元件以及mems元件的制造方法 |
JP2012096316A (ja) * | 2010-11-02 | 2012-05-24 | Seiko Epson Corp | 電子装置および電子装置の製造方法 |
CN102333254B (zh) * | 2011-09-13 | 2013-11-06 | 华景传感科技(无锡)有限公司 | 一种与cmos电路纵向集成的mems硅麦克风及其制备方法 |
WO2013097135A1 (en) * | 2011-12-29 | 2013-07-04 | Goertek Inc. | A silicon based mems microphone, a system and a package with the same |
CN103248994A (zh) * | 2012-02-06 | 2013-08-14 | 苏州敏芯微电子技术有限公司 | 集成电路与电容式微硅麦克风单片集成的制作方法及芯片 |
CN103373698B (zh) * | 2012-04-26 | 2015-09-16 | 张家港丽恒光微电子科技有限公司 | 制作mems惯性传感器的方法及mems惯性传感器 |
JP6314568B2 (ja) * | 2014-03-18 | 2018-04-25 | セイコーエプソン株式会社 | Memsデバイス及びその製造方法 |
-
2014
- 2014-03-24 JP JP2014059445A patent/JP2015182158A/ja not_active Withdrawn
-
2015
- 2015-03-17 US US14/660,157 patent/US9434607B2/en active Active
- 2015-03-23 CN CN201510129061.2A patent/CN104944356A/zh active Pending
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