JP2015051498A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2015051498A5 JP2015051498A5 JP2014178703A JP2014178703A JP2015051498A5 JP 2015051498 A5 JP2015051498 A5 JP 2015051498A5 JP 2014178703 A JP2014178703 A JP 2014178703A JP 2014178703 A JP2014178703 A JP 2014178703A JP 2015051498 A5 JP2015051498 A5 JP 2015051498A5
- Authority
- JP
- Japan
- Prior art keywords
- polishing pad
- isocyanate
- reaction product
- astm
- terminated reaction
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005498 polishing Methods 0.000 claims description 25
- 239000007795 chemical reaction product Substances 0.000 claims description 14
- 229920000642 polymer Polymers 0.000 claims description 8
- DVKJHBMWWAPEIU-UHFFFAOYSA-N toluene 2,4-diisocyanate Chemical compound CC1=CC=C(N=C=O)C=C1N=C=O DVKJHBMWWAPEIU-UHFFFAOYSA-N 0.000 claims description 8
- 239000003795 chemical substances by application Substances 0.000 claims description 6
- VIOMIGLBMQVNLY-UHFFFAOYSA-N 4-[(4-amino-2-chloro-3,5-diethylphenyl)methyl]-3-chloro-2,6-diethylaniline Chemical compound CCC1=C(N)C(CC)=CC(CC=2C(=C(CC)C(N)=C(CC)C=2)Cl)=C1Cl VIOMIGLBMQVNLY-UHFFFAOYSA-N 0.000 claims description 5
- 239000012948 isocyanate Substances 0.000 claims description 5
- -1 aliphatic isocyanate Chemical class 0.000 claims description 4
- 230000003287 optical effect Effects 0.000 claims description 4
- 229920001451 polypropylene glycol Polymers 0.000 claims description 4
- 239000004065 semiconductor Substances 0.000 claims description 4
- 239000000758 substrate Substances 0.000 claims description 4
- 239000011148 porous material Substances 0.000 claims 4
- 239000004005 microsphere Substances 0.000 claims 2
- 238000009472 formulation Methods 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- IBOFVQJTBBUKMU-UHFFFAOYSA-N 4,4'-methylene-bis-(2-chloroaniline) Chemical compound C1=C(Cl)C(N)=CC=C1CC1=CC=C(N)C(Cl)=C1 IBOFVQJTBBUKMU-UHFFFAOYSA-N 0.000 description 2
- PAYRUJLWNCNPSJ-UHFFFAOYSA-N Aniline Chemical compound NC1=CC=CC=C1 PAYRUJLWNCNPSJ-UHFFFAOYSA-N 0.000 description 2
- 241001112258 Moca Species 0.000 description 2
- 239000002861 polymer material Substances 0.000 description 2
- 229920002635 polyurethane Polymers 0.000 description 2
- 239000004814 polyurethane Substances 0.000 description 2
- 230000003750 conditioning effect Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 150000002513 isocyanates Chemical class 0.000 description 1
- 239000000463 material Substances 0.000 description 1
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US14/017,998 US20150059254A1 (en) | 2013-09-04 | 2013-09-04 | Polyurethane polishing pad |
| US14/017,998 | 2013-09-04 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2015051498A JP2015051498A (ja) | 2015-03-19 |
| JP2015051498A5 true JP2015051498A5 (enExample) | 2018-10-18 |
| JP6423205B2 JP6423205B2 (ja) | 2018-11-14 |
Family
ID=52470551
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014178703A Active JP6423205B2 (ja) | 2013-09-04 | 2014-09-03 | ポリウレタン研磨パッド |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US20150059254A1 (enExample) |
| JP (1) | JP6423205B2 (enExample) |
| KR (1) | KR102160987B1 (enExample) |
| CN (1) | CN104416454B (enExample) |
| DE (1) | DE102014013023A1 (enExample) |
| FR (1) | FR3009990A1 (enExample) |
| TW (1) | TW201522404A (enExample) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10086494B2 (en) * | 2016-09-13 | 2018-10-02 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | High planarization efficiency chemical mechanical polishing pads and methods of making |
| US20180345449A1 (en) * | 2017-06-06 | 2018-12-06 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing pads for improved removal rate and planarization |
| US10391606B2 (en) | 2017-06-06 | 2019-08-27 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing pads for improved removal rate and planarization |
| US10464187B2 (en) * | 2017-12-01 | 2019-11-05 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | High removal rate chemical mechanical polishing pads from amine initiated polyol containing curatives |
| JP7072429B2 (ja) * | 2018-03-30 | 2022-05-20 | 富士紡ホールディングス株式会社 | 研磨パッド、研磨パッドの製造方法、及び光学材料又は半導体材料の表面を研磨する方法 |
| KR102058877B1 (ko) * | 2018-04-20 | 2019-12-24 | 에스케이씨 주식회사 | 다공성 폴리우레탄 연마패드 및 이의 제조방법 |
| WO2023104041A1 (zh) * | 2021-12-06 | 2023-06-15 | 华为技术有限公司 | 材料及其制备方法、材料的应用、研磨材料 |
| US20230390888A1 (en) * | 2022-06-02 | 2023-12-07 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Cmp pad having ultra expanded polymer microspheres |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3042593B2 (ja) * | 1995-10-25 | 2000-05-15 | 日本電気株式会社 | 研磨パッド |
| SG111222A1 (en) * | 2003-10-09 | 2005-05-30 | Rohm & Haas Elect Mat | Polishing pad |
| US20050171224A1 (en) * | 2004-02-03 | 2005-08-04 | Kulp Mary J. | Polyurethane polishing pad |
| US20060089093A1 (en) * | 2004-10-27 | 2006-04-27 | Swisher Robert G | Polyurethane urea polishing pad |
| US7169030B1 (en) * | 2006-05-25 | 2007-01-30 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing pad |
| US7371160B1 (en) * | 2006-12-21 | 2008-05-13 | Rohm And Haas Electronic Materials Cmp Holdings Inc. | Elastomer-modified chemical mechanical polishing pad |
| JP2009090397A (ja) * | 2007-10-05 | 2009-04-30 | Nitta Haas Inc | 研磨パッド |
| WO2009131106A1 (ja) * | 2008-04-25 | 2009-10-29 | トーヨーポリマー株式会社 | ポリウレタン発泡体及び研磨パッド |
| TWI461450B (zh) * | 2008-09-30 | 2014-11-21 | Dainippon Ink & Chemicals | 研磨墊用2液型胺基甲酸酯樹脂組成物、使用它而成之聚胺基甲酸酯研磨墊、及聚胺基甲酸酯研磨墊之製法 |
| CN102361900B (zh) * | 2009-03-24 | 2014-07-30 | Ppg工业俄亥俄公司 | 聚氨酯、由其制成的制品和涂料及其制造方法 |
| US8697239B2 (en) * | 2009-07-24 | 2014-04-15 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Multi-functional polishing pad |
| US8512427B2 (en) * | 2011-09-29 | 2013-08-20 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Acrylate polyurethane chemical mechanical polishing layer |
-
2013
- 2013-09-04 US US14/017,998 patent/US20150059254A1/en not_active Abandoned
-
2014
- 2014-09-01 TW TW103130077A patent/TW201522404A/zh unknown
- 2014-09-02 DE DE201410013023 patent/DE102014013023A1/de not_active Withdrawn
- 2014-09-03 JP JP2014178703A patent/JP6423205B2/ja active Active
- 2014-09-04 FR FR1458272A patent/FR3009990A1/fr active Pending
- 2014-09-04 KR KR1020140117547A patent/KR102160987B1/ko active Active
- 2014-09-04 CN CN201410448504.XA patent/CN104416454B/zh active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2015051498A5 (enExample) | ||
| KR102338854B1 (ko) | 폴리우레탄 연마층, 연마층을 포함하는 연마 패드, 연마층의 제조 방법 및 재료 평탄화 방법 | |
| TWI329045B (en) | Polishing pad and method of polishing semiconductor substrate | |
| JP2015047691A5 (enExample) | ||
| JP2014097567A5 (enExample) | ||
| TWI325801B (en) | Polishing pad and production method thereof | |
| TWI683855B (zh) | 研磨墊之製造方法 | |
| JP2015109437A5 (enExample) | ||
| TW200835577A (en) | Elastomer-modified chemical mechanical polishing pad | |
| JP2007313640A5 (enExample) | ||
| CN111936268B (zh) | 研磨垫及其制造方法 | |
| JP2019098512A (ja) | アミン開始ポリオール含有硬化剤からの高除去速度ケミカルメカニカルポリッシングパッド | |
| TW201641546A (zh) | 研磨墊及其製造方法 | |
| TW200846381A (en) | Polishing pad | |
| JP6113331B2 (ja) | 研磨パッド及びその製造方法 | |
| JP6423205B2 (ja) | ポリウレタン研磨パッド | |
| JP4722446B2 (ja) | 研磨パッド | |
| JP2015047692A5 (enExample) | ||
| US20160280976A1 (en) | Two-component adhesive | |
| JP2014233833A5 (enExample) | ||
| TWI287481B (en) | Polyurethane urea polishing pad | |
| JP7438658B2 (ja) | 研磨パッド及び研磨加工物の製造方法 | |
| JP2013086509A5 (enExample) | ||
| CN107849293B (zh) | 聚氨酯/脲碳化硅纳米复合材料 | |
| US9463550B2 (en) | Method of manufacturing chemical mechanical polishing layers |